JP2001084936A5 - - Google Patents

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Publication number
JP2001084936A5
JP2001084936A5 JP1999263200A JP26320099A JP2001084936A5 JP 2001084936 A5 JP2001084936 A5 JP 2001084936A5 JP 1999263200 A JP1999263200 A JP 1999263200A JP 26320099 A JP26320099 A JP 26320099A JP 2001084936 A5 JP2001084936 A5 JP 2001084936A5
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JP
Japan
Prior art keywords
electromagnetic
corrector
electron microscope
system lens
astigmatism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1999263200A
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Japanese (ja)
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JP3757702B2 (en
JP2001084936A (en
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Application filed filed Critical
Priority to JP26320099A priority Critical patent/JP3757702B2/en
Priority claimed from JP26320099A external-priority patent/JP3757702B2/en
Publication of JP2001084936A publication Critical patent/JP2001084936A/en
Publication of JP2001084936A5 publication Critical patent/JP2001084936A5/ja
Application granted granted Critical
Publication of JP3757702B2 publication Critical patent/JP3757702B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Claims (1)

電子銃、照射系レンズ、結像系レンズ、光軸調整用電磁偏向器、非点補正用電磁補正器、等から構成される電子顕微鏡において、電磁偏向器および/または、電磁非点補正器に閉巻き線式ショートコイルを1つ以上装備したことを特徴とする電子顕微鏡。In an electron microscope comprising an electron gun, an irradiation system lens, an imaging system lens, an optical axis adjustment electromagnetic deflector, an astigmatism correction electromagnetic corrector, etc., the electromagnetic deflector and / or electromagnetic astigmatism corrector An electron microscope equipped with one or more closed winding short coils.
JP26320099A 1999-09-17 1999-09-17 electronic microscope Expired - Fee Related JP3757702B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26320099A JP3757702B2 (en) 1999-09-17 1999-09-17 electronic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26320099A JP3757702B2 (en) 1999-09-17 1999-09-17 electronic microscope

Publications (3)

Publication Number Publication Date
JP2001084936A JP2001084936A (en) 2001-03-30
JP2001084936A5 true JP2001084936A5 (en) 2005-04-07
JP3757702B2 JP3757702B2 (en) 2006-03-22

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ID=17386180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26320099A Expired - Fee Related JP3757702B2 (en) 1999-09-17 1999-09-17 electronic microscope

Country Status (1)

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JP (1) JP3757702B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5388999B2 (en) * 2010-12-01 2014-01-15 株式会社日立ハイテクノロジーズ Charged particle beam equipment
US11004650B2 (en) * 2017-08-28 2021-05-11 Hitachi High-Tech Corporation Multipole lens, aberration corrector using the same, and charged particle beam apparatus

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