JP2001082911A - Component inspection apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a component inspection apparatus capable of minimizing the delay of a comparison operation process and a decrease in scanning accuracy. SOLUTION: This component inspection apparatus detects whether or not the shape or nature of each conductor component W is defective, based on a change in magnetic flux of a predetermined magnetic field when the conductor component W is brought close to the predetermined magnetic field. Component supply means 16, 17, 18, 19 are provided for supplying the conductor components into the magnetic field along a certain direction and at a certain timing.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a component inspection apparatus, and more particularly, to a component inspection apparatus capable of performing non-destructive and non-contact inspection using a coil sensor.

[0002]

2. Description of the Related Art As shown in FIG. 2, when an alternating current is applied to a coil, a magnetic flux is generated around the coil. When a component (conductor) to be inspected is brought close to the coil, an eddy current (induced current) is generated in the component in a direction that prevents a change in magnetic flux. This causes a change in the magnetic flux generated by the coil, resulting in a change in the impedance of the coil.

In this case, if there is an abnormality in the shape, dimensions, material, cracks, heat treatment hardness, surface treatment, and other properties of the inspection object, the eddy current value generated in the inspection object is different. An abnormality of the inspection object can be detected as a change in the impedance of the coil.

[0004] This type of inspection apparatus is described in "Material No. 30061 of the Non-Destructive Inspection Association of Japan, No. 30061, issued in May 1994", Japanese Patent Publication No. 6-48180, and Japanese Patent Publication No. 6-48180. -48181.

In the inspection apparatus, data indicating the impedance value when the object to be inspected is “non-defective” and a plurality of characteristic data for each inspection site when the object to be inspected is “defective”. The apparatus learns the data as setting data, and performs a comparison operation between the setting data and the actually measured data to determine whether the product is good or defective. It is supposed to do.

Further, a plurality of photosensors are arranged at regular intervals in an inspection area of an object to be inspected in which a coil is provided so that multipoint position scanning can be performed on one object to be inspected. Has become. By cooperating with the plurality of photosensors, information over the entire length of the inspection object can be obtained.

[0007]

In the above inspection apparatus, when the object to be inspected is brought close to the coil (when the object to be inspected is passed through the coil), the transport direction of the object to be inspected is constant. Otherwise, the number of data obtained in advance by learning in advance needs to be larger. That is, if the forward and reverse directions of the object to be inspected are not unified when transported to the predetermined position near the coil, data generation in both directions, learning work and Data storage is required.

Further, in the present inspection apparatus, it is necessary to retain not only the non-defective patterning data but also a plurality of patterning data characterized for each inspection part. Therefore, if a plurality of data are held and the data amount is twice as large as that in one direction so as to correspond to both the forward and reverse transport directions, the data amount becomes enormous. As a result, it takes time to retrieve data, which causes a delay in comparison processing with measurement data of the part to be inspected, and further delays the entire inspection speed.

As described above, in the present inspection apparatus, a plurality of photosensors are provided at regular intervals to perform multipoint position scanning on one inspection object. It is conceivable that the accuracy of the scanning is reduced due to the irregular transfer interval.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a component inspection apparatus capable of minimizing a delay in comparison operation processing and a decrease in scanning accuracy.

[0011]

According to the present invention, there is provided a component inspection apparatus for detecting whether a shape or a property of a component is good or bad based on a change in magnetic flux of the magnetic field when a conductor component is brought close to a predetermined magnetic field. Wherein a component supply means for supplying the component in the magnetic field in a fixed direction and at a fixed timing is provided.

A component inspection apparatus according to the present invention is a component inspection apparatus for inspecting a conductor component having a small-diameter portion and a large-diameter portion, comprising: a coil; means for applying an alternating current to the coil; Measuring means, non-defective data storage means,
Defective product data storage means and determination means are provided. The transport unit transports the component to a predetermined position near the coil. The measuring means measures the impedance of the coil. The non-defective data storage means stores non-defective data indicating the value of the impedance when the component is non-defective. The defective data storage means stores defective data indicating the value of the impedance when the component is defective. The determining means determines the quality of the component based on the measurement data measured by the measuring means and the non-defective product data or the defective product data. The transport means includes a slide guide member, a rotating roller, a plurality of recesses formed in the rotating roller, a holding member, and a component direction adjusting means. The slide guide member slides the component by its own weight to guide the component to a predetermined position near the coil. The rotation roller is provided above the slide guide member. The plurality of recesses are formed at regular intervals in the circumferential direction on the peripheral surface of the rotary roller, and extend to the end surface in the axial direction so as to open at the axial end surface of the rotary roller, and the small-diameter portion of the component is provided. It is formed to be larger than the large-diameter portion so as to accommodate the component. The holding member is provided on an outer peripheral side of the rotation roller, and the rotation member is housed in the one recess when one of the plurality of recesses faces the slide guide member by rotation of the rotation roller. Only parts are dropped on the slide guide member. The component adjusting means adjusts the direction of the component supplied to the concave portion of the rotary roller such that the large diameter portion is locked to the end surface of the rotary roller and the small diameter portion is stored in the concave portion. I do.

In the component inspection apparatus according to the present invention, the component direction adjusting means includes two plate members. 2 above
A gap is formed between the plate-like members and is larger than the small-diameter portion of the component and smaller than the large-diameter portion. The small diameter portion of the component is accommodated in the gap. One end surface in the width direction of each of the two plate-like members serves as a contact surface with a large diameter portion of the component.

In the component inspection apparatus according to the present invention, the defective product data storage means stores a plurality of defective product data indicating the value of the impedance for each defective portion when the component is defective. The determining means further detects a defective part of the component based on the plurality of defective data.

[0015]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of a component inspection apparatus according to the present invention will be described with reference to the accompanying drawings.

FIG. 1 shows a schematic configuration of the present embodiment.

As shown in FIG. 1, in the present embodiment, a parts feeder 10 for supplying a component to be inspected, a parts transport mechanism 20 for transporting the parts supplied by the parts feeder 10, and a An inspection mechanism unit 30 for inspection and a distribution unit 40 for distributing the inspection target component into non-defective products and non-defective products according to the results of the inspection are provided.

First, the inspection mechanism 30 will be described.

As shown in FIGS. 3 and 2, in the inspection mechanism 30, two coils are configured as a bridge circuit, and two types of alternating currents i of frequencies fa and fb are applied to the coils. The object to be inspected passes through the coil, and a change in magnetic flux caused by the shape or property of the object to be inspected, that is, a change in impedance of the coil is phase-analyzed for each frequency, and a real part (Real) and an imaginary part (Imag) are analyzed. .) Is obtained from the components X and Y (see FIG. 4). The phase value φ is φ = tan ⁻¹ (Y / X). Is required.

The object to be inspected has a plurality of information, for example, information on morphological characteristics (shape and dimensions) and electromagnetic characteristics (material,
(Surface treatment such as heat treatment hardness, cracking, plating, etc.). Therefore, in the present embodiment, in order to obtain a plurality of different pieces of information from one inspection object, the above-described 2
The types of frequencies fa and fb are used.

As shown in FIG. 5, n kinds of inspection frequencies are
If used, one test frequency f₁Phase value φ₁One
Element and f_nPhase value φ_nPhase value up to φ₁~ Φ_nTo
Combine elements and combine them into a single multi-element vector
φ_αGet. This vector φ _αMeans that one object to be inspected is
2 shows a plurality of pieces of information.

In this case, a plurality of photosensors are arranged at regular intervals in the inspection area of the inspection object where the coil is provided, so that multipoint position scanning can be performed on one inspection object. (Refer to the position detection trip sensor in FIG. 1). By cooperating with the plurality of photosensors, information over the entire length of the inspection object can be obtained.

In the apparatus having the above-described configuration, a part known as a non-defective product (equivalent to the object to be inspected) and a part known as a defective product (equivalent to the object to be inspected) in advance are respectively fixed. By supplying a number of data, a data group of non-defective products and a data group of defective products are obtained.

Next, a comparison is made between the data group of non-defective products and the data group of defective products to evaluate the difference, to extract data characterized for each inspection site, and to pattern the data. As described above, the degree of dispersion of data is statistically processed for each feature of the patterned data that is characterized for each inspection site, and a threshold value (3σ in this example) is calculated.

As shown in FIG. 6, prior learning (teac
(hing), the patterning data for each feature and the measurement data for the unknown component to be inspected are compared, and a comparison operation is performed based on the threshold value to perform an inspection evaluation value for each feature. And determine good / defective products. That is, in the following equation (1), if the inspection evaluation value is less than 100%, it is judged as “good”, and if it is more than that, it is judged as “defective”.

Inspection evaluation value = {| ab | / threshold (3σ)} × 100%. (1) where a is measured data, and b is non-defective pattern data.

The parts feeder 10 and the parts transport mechanism 20 will be described below with reference to FIGS. 7, 8, 9 and 10.

FIG. 7 is a plan view showing the parts feeder 10. As shown in FIG.
Is a disk portion 12 formed in a hat shape, and a component passage portion 15 provided in the outer peripheral portion side of the disk portion 12 so as to extend in the circumferential direction.
And

The disk portion 12 is formed in a substantially circular shape in plan view.
The central portion 12c is formed in a "shadow" shape in which the height is the highest and gradually decreases toward the outside in the radial direction. As described above, since the upper surface of the disk portion 12 is formed on the inclined surface that descends toward the outside in the radial direction, the component (rivet W) loaded on the upper surface of the disk portion 12 can be mounted on the inclined surface. Along the outer periphery. The outermost peripheral portion of the disk portion 12 is provided with a rising wall portion 12k so that components collected on the outer peripheral side do not drop from the disk portion 12. Disk part 1
2 is driven to rotate about the central portion 12c.

The component passage portion 15 is formed in a substantially U-shape in a side view, and is formed on the upper outer peripheral side of the disk portion 12 so as to rotate substantially 360 ° along the outer peripheral portion of the disk portion 12. I have. In the component passage portion 15, the inside of the U-shape serves as a component passage. The inner end of the component passage 15 is the disc 1
2 are formed substantially flush with the upper surface.

The disk portion 12 is driven to rotate in the same direction as the turning direction from the inner end 15S of the component passage 15 to the outer end 15E (the direction of the arrow P in the drawing). As a result, the component W placed on the disk portion 12 is smoothly moved from the inner end portion 15S of the component passage portion 15 without any step.
Has been introduced inside. Note that the U-shaped radially inner rising wall 15k of the component passage portion 15 prevents the component W on the disk portion 12 from going further radially outward.

The inside of the component passage portion 15 has a gradually narrower shape in plan view as it goes forward in the turning direction P from the inner end portion (base end portion) 15S to the outer end portion (distal end portion) 15E. (Reference numeral 15H indicates its width). Then, the shape of the component passage portion 15 in a plan view, that is, the inside of the component passage portion 15 is formed to have a size that is slightly larger than the diameter of the component W from the middle of the turning direction P. . Since the inside of the component passage portion 15 is tapered in this way, the component W in the component passage portion 15 naturally follows the axis of the component W in the turning direction P as it moves forward in the turning direction P. It is in a state of being arranged in a line in a vertical direction.

As shown in FIGS. 7 and 8, below the outer end portion 15E of the component passage portion 15, a hopper portion 16 is provided.
Is provided. The component W that has passed through the component passage 15
Is dropped by its own weight and introduced into the hopper 16. An opening 16 </ b> A is provided below the hopper 16.

The opening shape of the opening 16A is formed to be slightly larger than the flange (flange portion, large diameter portion) Wa of the rivet W to be inspected, which is formed in a substantially disk shape. As a result, the rivet W introduced into the hopper 16 falls by its own weight from the opening 16A.

In this case, the opening 16A is only slightly larger than the collar Wa of the rivet W.
The rivet W is allowed to pass (fall) only when the axis of the rivet W is perpendicular to the opening surface of the opening 16A (vertically straight).

Below the hopper section 16, a component direction adjusting means 17 is provided. The component direction adjusting means 17
It has two long plate-like members 17a, 17a. 2
Between the plate-like members 17a, 17a, there is provided a gap portion 17c smaller than the diameter of the flange Wa of the rivet W and larger than the diameter of the small-diameter portion Wb of the rivet W. The plate-like members 17a, 17a are installed in a state where the plate-like members 17a, 17a are gradually inclined downward toward the extending direction of the plate-like members 17a, 17a.

The component direction adjusting means 17 includes a hopper 16
The small-diameter portion Wb of the rivet W, which has fallen vertically from its opening 16A under its own weight, is positioned so as to fit in the gap 17c. In a state where the small diameter portion Wb is accommodated in the gap portion 17c, the collar Wa is connected to one end surface 17b, 17 in the width direction of each of the two plate members 17a, 17a.
b and is locked.

In this case, the opening 16A of the hopper 16
The rivet W that falls after passing through the
6A, the rivet W always falls so that the axis of the rivet W is directed in the vertical direction. However, the falling direction is not limited to one but two.

That is, as described above, the component passage 1
Although the parts that have passed through 5 are aligned in a line, their orientation (wedge Wa or small diameter part Wb first)
Not regulated. Therefore, in the hopper section 16, when the small-diameter portion Wb passes first through the opening 16A and then the collar Wa passes (first case), the collar Wa passes first and the small-diameter portion Wb passes later. There is a case (the second case).

In the component direction adjusting means 17, the gap 17c
Width 17b is smaller than the diameter of the collar Wa, and the small diameter portion Wb
, The rivet W according to the second case is excluded. In other words, the rivet W according to the second case is released to the side of the component direction adjusting means 17 after the collar Wa has collided with the one end surface 17b in the width direction of the plate-like members 17a, 17a, and is released in the component direction. Adjusting means 17
It is not supplied downstream in the transport direction. Note that the plurality of rivets W released at this time are collected under the rivets W and re-entered into the parts feeder 10.

On the other hand, the rivet W according to the first case
Slides under its own weight in the inclined direction of the plate members 17a, 17a while the collar Wa is locked to the one end surfaces of the plate members 17a, 17a.

FIG. 9 shows the above-mentioned plate members 17a, 17a.
FIG. 5 is a view showing a slide moving end of FIG. As shown in FIG. 9, a rotary roller 18 is rotatably provided at the leading end of the plate-like members 17a, 17a in the extending direction. A recess 18 a is formed on the peripheral surface of the rotating roller 18.

A plurality (four in this example) of recesses 18a are provided at regular intervals in the circumferential direction on the peripheral surface of the rotating roller 18. The concave portion 18a extends in the axial direction to the end surface 18b so as to open on the axial end surface 18b of the rotating roller 18 (the opening is indicated by reference numeral 18c).

The width of the recess 18a is smaller than the diameter of the small-diameter portion Wb so that the small-diameter portion Wb can be stored with the small-diameter portion Wb of the rivet W extending along the extending direction of the recess 18a. It is formed large. However, it goes without saying that the width of the recess 18a is smaller than the diameter of the collar Wa.
When the small diameter portion Wb of the rivet W is stored in the concave portion 18a, the collar Wa escapes from the opening 18c to the outside of the rotary roller 18, and the collar Wa and the end face 18b come into surface contact.

The rotating roller 18 is provided with a component direction adjusting means 17.
Direction Q of small diameter portion Wb of rivet W conveyed by
It is installed so that the position of the concave portion 18a corresponds to the extension line. Thereby, when the position of the concave portion 18a on the peripheral surface of the rotating roller 18 matches the position of the moving path (gap portion 17c) of the component direction adjusting means 17 with the rotation of the rotating roller 18, End face 18 of rotating roller 18
The brim Wa of the rivet W is locked to b, and the small-diameter portion Wb is stored in the recess 18a.

Below the rotating roller 18, an L-shaped member (slide guide member) 19 extending to the inspection mechanism 30 is provided.
Is provided. The L-shaped member 19 is
The rivet W which has been separated from the concave portion 18a and dropped by its own weight is supplied to the inside. In the L-shaped member 19, the rivet W is placed on the L-shaped member 19 by its own weight.
To guide the rivet W to the inside of the coil of the inspection mechanism 30 (a predetermined position near the coil) (see FIG. 10).

On the outer peripheral side of the rotating roller 18, a semi-cylindrical member (holding member) 18E having an inner diameter slightly larger than the diameter of the rotating roller 18 is provided. The semi-cylindrical member 18 </ b> E has an opening at a portion facing the gap 17 c and a portion facing the L-shaped member 19 on the outer peripheral portion of the rotating roller 18. The rivet W is introduced into and discharged from the recess 18a.

That is, when one of the plurality of recesses 18a faces the L-shaped member 19 due to the rotation of the rotary roller 18, the semi-cylindrical member 18E receives the rivet stored in the one recess 18a. Only the W is dropped on the L-shaped member 19 to prevent the other rivets W stored in the recess 18a from coming off the recess 18a.

According to the above configuration, if the rotating roller 18 is rotated at a constant speed, the rivet W in a fixed direction is supplied to the inspection mechanism 30 at a fixed speed. Reduction can be minimized.

In this embodiment, the inspection mechanism 3
The coil sensor of 0 is not limited to the penetration type as shown in FIG. 11, and may be a seat type or a probe type.

[0051]

According to the component inspection apparatus of the present invention, there is provided a component inspection apparatus for detecting whether or not the shape or property of the component is good based on a change in magnetic flux of the magnetic field when the conductor component is brought close to a predetermined magnetic field. Since the component supply means for supplying the component in the magnetic field in a fixed direction and at a fixed timing is provided, it is possible to minimize the delay of the comparison operation processing and the deterioration of the scanning accuracy.

[Brief description of the drawings]

FIG. 1 is a diagram illustrating a schematic configuration of a component inspection apparatus according to an embodiment of the present invention.

FIG. 2 is a modeled diagram for explaining a measurement principle of the present embodiment.

FIG. 3 is a diagram illustrating a configuration of a coil sensor according to the present embodiment.

FIG. 4 is a graph showing a relationship between an impedance value and a phase value in the present embodiment.

FIG. 5 is a diagram illustrating vector composition of phase values in the present embodiment.

FIG. 6 is a flowchart illustrating a calculation process of inspection evaluation according to the present embodiment.

FIG. 7 is a plan view showing the parts feeder of the present embodiment.

FIG. 8 is a perspective view showing a component direction adjusting unit of the present embodiment.

FIG. 9 is a perspective view showing a rotating roller of the present embodiment.

FIG. 10 is a perspective view showing a detection unit using a coil according to the embodiment.

FIG. 11 is a perspective view showing another example of the coil sensor.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 10 ... Part feeder 12 ... Disc part 15 ... Part passage part 16 ... Hopper part 16A ... Opening part 17 ... Parts direction adjustment means 17a ... Plate member 17c ... Gap part 18 ... Rotating roller 18a ... Concave part 18b ... End surface 18c ... Opening 18E: Cylindrical member, holding member 19: L-shaped member, slide guide member 20: Component transfer mechanism 30: Inspection mechanism 40: Distributing part a: Measurement data b: Good pattern data fa: Frequency fb frequency W ... rivet Wa ... flange, the large diameter portion Wb ... small diameter portion phi _{1 ...} phase values phi _{2 ...} phase value phi _{n ...} phase value phi _alpha ... multi-element vector

Continued on the front page F term (reference) 2F063 AA41 AA50 BA01 BA30 BB02 BD20 CA11 CA40 DA01 DB04 DD03 GA04 GA05 GA06 GA08 GA33 LA01 LA04 LA23 LA25 LA27 LA29 2G053 AA11 AB21 BB03 BB05 BB08 BC14 CA03 CA17 CB21 DA02 DB06

Claims (4)

[Claims] 1. A component inspection apparatus for detecting whether or not the shape or property of a component is good based on a change in magnetic flux of the magnetic field when the conductor component is brought close to a predetermined magnetic field, wherein the component is oriented in a fixed direction during the magnetic field. And a component supply means for supplying the component at a constant timing. 2. A component inspection apparatus for inspecting a conductor component having a small-diameter portion and a large-diameter portion, comprising: a coil; means for applying an alternating current to the coil; Transport means for transporting the component; measuring means for measuring the impedance of the coil; non-defective data storage means for storing non-defective data indicating the value of the impedance when the component is non-defective; Defective product data storing means for storing defective product data indicating the value of the impedance in a certain case; and determining whether the component is good or bad based on the measurement data measured by the measuring means and the non-defective product data or the defective product data. Determining means for performing the determination, wherein the transport means slides the component by its own weight to move the component to a predetermined position near the coil. A sliding guide member for guiding the rotating roller, a plurality of rotating rollers provided above the sliding guiding member, a plurality of rotating rollers being formed on the circumferential surface of the rotating roller at regular intervals in the circumferential direction, and an opening at an axial end surface of the rotating roller. A concave portion that is formed to be larger than the small diameter portion of the component and smaller than the large diameter portion so as to be able to store the component, and is provided on the outer peripheral side of the rotating roller. A holding member for dropping only the components housed in the one recess into the slide guide member when one of the plurality of recesses faces the slide guide member by rotation of the rotation roller; The large diameter portion is locked to the end face of the rotating roller, and the direction of the component supplied to the concave portion of the rotating roller is adjusted so that the small diameter portion is housed in the concave portion. A component inspection apparatus comprising: a component direction adjusting means for adjusting. 3. The component inspection apparatus according to claim 2, wherein the component direction adjusting means includes two plate members, and a small diameter portion of the component is provided between the two plate members. A gap formed to be larger than the large-diameter portion is provided, the small-diameter portion of the component is accommodated in the gap, and one end in the width direction of each of the two plate-shaped members is the component. Inspection device that is the contact surface with the large-diameter part. 4. The part inspection apparatus according to claim 2, wherein the defective part data storage means stores a plurality of defective part data indicating a value of the impedance for each defective part when the part is a defective part. And a component inspection device that further detects a defective part of the component based on the plurality of defective product data.