JP2001071251A - Grinding work method and device for thin plate member - Google Patents

Grinding work method and device for thin plate member

Info

Publication number
JP2001071251A
JP2001071251A JP24694799A JP24694799A JP2001071251A JP 2001071251 A JP2001071251 A JP 2001071251A JP 24694799 A JP24694799 A JP 24694799A JP 24694799 A JP24694799 A JP 24694799A JP 2001071251 A JP2001071251 A JP 2001071251A
Authority
JP
Japan
Prior art keywords
polishing
thin plate
tape
plate member
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24694799A
Other languages
Japanese (ja)
Inventor
Nobukazu Hosogai
信和 細貝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanshin Co Ltd
Original Assignee
Sanshin Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanshin Co Ltd filed Critical Sanshin Co Ltd
Priority to JP24694799A priority Critical patent/JP2001071251A/en
Publication of JP2001071251A publication Critical patent/JP2001071251A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To obtain a flat ground surface over the whole surface by executing the rough grinding work while moving a grinding tape in the rotational normal direction of a thin plate member, and then executing the finishing grinding work. SOLUTION: A tape moving mechanism 6 determines the moving direction S of a grinding tape T in the rotational tangent direction RT of a thin plate member W by a roughing work moving mechanism 7a of a moving mechanism 7, the rough grinding is executed while moving the grinding tape T in the rotational normal direction RN of the thin plate member W, then after the completion of the rough grinding, the moving direction S of the grinding tape T is determined in the rotational normal direction RN of the thin plate member W by a finishing work moving mechanism 7b, and the finishing grinding is executed while moving the grinding tape in the rotational normal direction RN of the thin plate member W to complete the grinding work. That is, the rough grinding and the finishing grinding work are executed on the surface of the thin plate member W respectively with the different relative directions between the rotating direction of the thin plate member W and the moving direction S of the grinding tape, whereby a smooth ground surface can be provided.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、薄板状部材、例え
ばCDやDVD等の光デイスクの製造過程において、原
盤表面に導電性膜を形成した後、ニッケルメッキし、信
号面を転写した薄金属板としてのいわゆるスタンパの裏
面を研磨する際に用いられる薄板状部材研磨加工方法及
びその装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a thin plate-shaped member, for example, an optical disk such as a CD or DVD, which comprises forming a conductive film on the surface of a master, nickel-plating it, and transferring the signal surface to a thin metal. The present invention relates to a method and apparatus for polishing a thin plate-like member used when polishing the back surface of a so-called stamper as a plate.

【0002】[0002]

【従来の技術】このスタンパは、複製工程でのいわゆる
型として用いられるものであり、光デイスクの複写元と
なる型ゆえに裏面の平坦性及び平滑性が強く要求され
る。
2. Description of the Related Art This stamper is used as a so-called mold in a copying process, and is required to have flatness and smoothness on the back surface because of the mold from which an optical disk is copied.

【0003】従来この種の研磨装置として、例えば特公
平7−100294号公報、特開平4−8468号公
報、特開平3−256660号公報の如く、薄板状部材
を載置可能な回転盤と、回転盤を回転させる回転機構
と、該回転盤の上方にて研磨テープを連続移送させると
共に該研磨テープを折返案内して形成された研磨部をも
つテープ移送機構とを備えてなる構造のものが知られて
いる。
[0003] Conventionally, as this type of polishing apparatus, for example, a rotating disk on which a thin plate-like member can be mounted, as disclosed in Japanese Patent Publication No. 7-100294, Japanese Patent Laid-Open No. 4-86868, and Japanese Patent Laid-Open No. 3-256660, The structure includes a rotating mechanism for rotating the rotating disk, and a tape transferring mechanism having a polishing portion formed by continuously transferring the polishing tape above the rotating disk and guiding the polishing tape back. Are known.

【0004】[0004]

【発明が解決しようとする課題】しかしながら上記従来
構造の場合、上記研磨テープからなる研磨部は研磨圧力
を受ける受圧部材により形成され、薄板状部材を回転さ
せて薄板状部材の表面に研磨テープからなる研磨部を圧
接して研磨することから、半径方向の周速度の相違、す
なわち、内方の周速度よりも外方の周速度が大きく、よ
って、半径方向の傾斜面状の研磨状態が生じ易く、表面
全面に亙って平坦な研磨面を得ることができないことが
あるという不都合を有している。
However, in the case of the above-mentioned conventional structure, the polishing portion made of the polishing tape is formed by a pressure receiving member which receives a polishing pressure, and the thin plate-like member is rotated to apply the polishing tape to the surface of the thin plate-like member. Since the polishing is performed by pressing the polishing portion, the peripheral speed in the radial direction is different, that is, the peripheral speed on the outer side is larger than the peripheral speed on the inner side. This is disadvantageous in that it is not easy to obtain a flat polished surface over the entire surface.

【0005】[0005]

【課題を解決するための手段】本発明はこのような課題
を解決することを目的とするもので、本発明のうち、請
求項1記載の方法の発明は、薄板状部材を回転させて研
磨テープを折返案内して形成された研磨部により研磨加
工するに際し、上記研磨テープの移送方向を上記薄板状
部材の回転接線方向に配置して研磨テープを該薄板状部
材の回転法線方向に移動させて荒研磨加工し、次いで、
研磨テープの移送方向を上記薄板状部材の回転法線方向
に配置して該研磨テープを該薄板状部材の回転法線方向
に移動させて仕上研磨加工することを特徴とする薄板状
部材研磨加工方法にある。
SUMMARY OF THE INVENTION It is an object of the present invention to solve such a problem, and among the present invention, a method according to the first aspect of the present invention is a method of polishing by rotating a thin plate member. When the polishing process is performed by the polishing section formed by guiding the tape back, the polishing tape is moved in the rotation tangential direction of the thin plate member and the polishing tape is moved in the rotation normal direction of the thin plate member. And rough polishing, then
The polishing direction of the polishing tape is arranged in the normal direction of rotation of the thin plate member, and the polishing tape is moved in the normal direction of rotation of the thin plate member to finish polishing the thin plate member. In the way.

【0006】又、請求項2記載の発明は、上記研磨テー
プをテープ移送方向に対して直交する方向に揺振運動さ
せることを特徴とするものであり、又、請求項3記載の
発明は、上記荒研磨時に薄板状部材の回転速度が研磨テ
ープの揺振速度より早くなる関係に設定すると共に逆に
上記仕上研磨時には研磨テープの揺振速度が薄板状部材
の回転速度より早くなる関係に設定すること特徴とする
ものである。
Further, the invention according to claim 2 is characterized in that the polishing tape is caused to oscillate in a direction orthogonal to the tape transport direction. During the rough polishing, the rotation speed of the thin plate member is set to be faster than the oscillation speed of the polishing tape. On the contrary, during the finish polishing, the oscillation speed of the polishing tape is set to be faster than the rotation speed of the thin plate member. It is characterized by doing.

【0007】又、請求項4記載の装置の発明にあって
は、薄板状部材を載置可能な回転盤と、該回転盤を回転
させる回転機構と、該回転盤の上方にて研磨テープを連
続移送させると共に該研磨テープを受圧部材により折返
案内して形成された研磨部をもつテープ移送機構と、該
テープ移送機構を移動させる移動機構と、該テープ移送
機構を上下動作させる上下動機構とを備えてなり、上記
移動機構は上記研磨テープの移送方向を上記薄板状部材
の回転接線方向に配置して研磨テープを該薄板状部材の
回転法線方向に移動させる荒加工移動機構と、該研磨テ
ープの移送方向を上記薄板状部材の回転法線方向に配置
して該研磨テープを該薄板状部材の回転法線方向に移動
させる仕上加工移動機構とにより構成したことを特徴と
するものである。
Further, according to the invention of an apparatus according to claim 4, a rotating disk on which a thin plate member can be mounted, a rotating mechanism for rotating the rotating disk, and a polishing tape above the rotating disk. A tape transport mechanism having a polishing section formed by continuously transporting and returning the polishing tape by a pressure receiving member, a moving mechanism for moving the tape transport mechanism, and a vertical movement mechanism for vertically moving the tape transport mechanism. A roughing moving mechanism for moving the polishing tape in a rotation normal direction of the thin plate member by disposing a transfer direction of the polishing tape in a rotation tangential direction of the thin plate member; and A polishing tape transfer direction is arranged in a rotation normal direction of the thin plate member, and the polishing tape is moved in a rotation normal direction of the thin plate member. is there.

【0008】又、請求項5記載の発明は、上記研磨テー
プをテープ移送方向に対して直交する方向に揺振運動さ
せる揺振機構を具備してなることを特徴とするものであ
り、又、請求項6記載の発明は、上記荒加工時に薄板状
部材の回転速度が研磨テープの揺振速度より早くなる関
係に設定すると共に逆に上記仕上加工時には研磨テープ
の揺振速度が薄板状部材の回転速度より早くなる関係に
設定することを特徴とするものであり、又、請求項7記
載の発明は、上記受圧部材の回転軸線の傾動動作を許容
すると共に受圧部材の回転軸線の内方位置及び外方位置
の研磨圧力を調節可能な研磨圧調節機構を具備したこと
を特徴とするものであり、又、請求項8記載の発明は、
上記研磨圧調節機構は、上記受圧部材の回転軸線の内方
位置を保持する圧力制御可能な圧力制御用シリンダ及び
該受圧ロールの回転軸線の外方位置を保持する圧力制御
可能な圧力制御用シリンダからなることを特徴とするも
のである。
According to a fifth aspect of the present invention, there is provided a vibration mechanism for oscillating the polishing tape in a direction perpendicular to the tape transport direction. According to a sixth aspect of the present invention, the rotation speed of the thin plate member is set to be higher than the oscillation speed of the polishing tape during the roughing, and the oscillation speed of the polishing tape is decreased during the finishing operation. The rotation speed is set to be faster than the rotation speed, and the invention according to claim 7 allows the tilting operation of the rotation axis of the pressure receiving member and the inner position of the rotation axis of the pressure receiving member. And a polishing pressure adjusting mechanism capable of adjusting a polishing pressure at an outer position.
The polishing pressure adjusting mechanism includes a pressure controllable pressure control cylinder that holds an inner position of a rotation axis of the pressure receiving member and a pressure controllable pressure control cylinder that holds an outer position of a rotation axis of the pressure receiving roll. It is characterized by consisting of.

【0009】[0009]

【発明の実施の形態】図1乃至図11は本発明の実施の
形態例を示し、1は回転盤、2は回転機構であって、こ
の場合、機台3の中央部に回転軸4を軸受5により縦設
し、回転軸4の上端部に回転盤1を取付け、回転盤1上
に薄板状部材Wを固定する図示省略の着脱機構を設け、
この着脱機構としては、例えばクランプ構造や負圧吸着
構造が用いられ、機台3の下部に図示省略の回転用モー
タを取付け、回転用モータにより回転盤1を回転中心O
を中心として回転Rさせるように構成している。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 1 to 11 show an embodiment of the present invention, in which 1 is a rotating disk, 2 is a rotating mechanism, and in this case, a rotating shaft 4 is provided at the center of a machine base 3. The rotating disk 1 is installed vertically at the upper end of the rotating shaft 4 by the bearing 5, and a detaching mechanism (not shown) for fixing the thin plate member W on the rotating disk 1 is provided.
As the attachment / detachment mechanism, for example, a clamp structure or a negative pressure suction structure is used. A rotation motor (not shown) is attached to the lower portion of the machine base 3 and the rotation plate 1 is rotated by the rotation motor to rotate the rotation center O.
Is made to rotate around the center.

【0010】6はテープ移送機構、7は移動機構、8は
上下動機構であって、この移動機構7は、下段の荒加工
移動機構7a及び上段の仕上加工移動機構7bからな
り、この場合、上記機台3上に摺動部9aにより回転盤
1に向かって前後方向となる上記薄板状部材Wの回転法
線方向RNに移動自在に前後スライド台10aを配設
し、この前後スライド台10aを前後移動用モータ11
a及びボールネジ機構12aにより移動可能に設け、か
つ、上記前後スライド台10a上に摺動部9bにより回
転盤1に向かって左右方向となる上記薄板状部材Wの回
転接線方向RTに移動自在に左右スライド台10bを配
設し、この左右スライド台10bを左右移動用モータ1
1b及びボールネジ機構12bにより移動可能に設けて
構成され、又、上下動機構8は左右スライド台10b上
に支持台13を立設し、支持台13に取付台14を取付
け、取付台14に摺動部15により上下動自在に上下ス
ライド台16を配設し、この上下スライド台16を上下
動用シリンダ17により上下動可能に設けて構成してい
る。
Reference numeral 6 denotes a tape transfer mechanism, 7 denotes a moving mechanism, and 8 denotes a vertical movement mechanism. The moving mechanism 7 comprises a lower roughing moving mechanism 7a and an upper finishing moving mechanism 7b. was disposed movably back and forth sliding table 10a in the rotation normal direction R N of the thin plate-like member W to be back and forth toward the turntable one direction by the sliding portion 9a on the machine base 3, sliding base before and after this 10a is a motor 11 for moving back and forth
a and a ball screw mechanism 12a so as to be movable, and freely movable in a rotational tangential direction RT of the thin plate member W in the left-right direction toward the turntable 1 by a sliding portion 9b on the front and rear slide table 10a. A left and right slide table 10b is provided, and the left and right slide table 10b is
1b and a ball screw mechanism 12b so as to be movable. The vertical movement mechanism 8 has a support 13 standing on a left and right slide table 10b, a mounting table 14 is mounted on the support table 13, and a slide is mounted on the mounting table 14. A vertical slide base 16 is provided so as to be vertically movable by a moving part 15, and the vertical slide base 16 is provided so as to be vertically movable by a vertical movement cylinder 17.

【0011】18は傾斜調節機構であって、この場合上
記上下スライド台16に保持台19を突設し、保持台1
9に支点軸20により保持部材21を傾斜動作自在に枢
着し、上下スライド台16の上部に係止板22を突設
し、係止板22に保持部材21の前面に当接可能なスト
ッパーボルト23を取付けると共に係止板22と保持部
材21の前面との間にバネ部材24を介装し、かつ保持
部材21に保持台19に設けた当接ボルト25に当接可
能な調節ネジ体26を取付け、調節ネジ体26及びスト
ッパーボルト23により保持部材21を支点軸20を中
心として前傾又は後傾の傾斜調節自在に設けて構成して
いる。
Numeral 18 denotes an inclination adjusting mechanism, in which a holding table 19 is protruded from the vertical slide table 16 to hold the holding table 1.
9, a holding member 21 is pivotally supported by a fulcrum shaft 20 so as to be tiltable, a locking plate 22 is protruded above the vertical slide base 16, and a stopper that can abut the locking plate 22 on the front surface of the holding member 21. An adjusting screw body having a bolt 23 mounted thereon, a spring member 24 interposed between the locking plate 22 and the front surface of the holding member 21, and an abutment bolt 25 provided on the holding base 19 on the holding member 21. The holding member 21 is provided so as to be capable of adjusting the tilt forward or backward about the fulcrum shaft 20 by an adjusting screw body 26 and a stopper bolt 23.

【0012】27は揺振機構であって、上記保持部材2
1に支持ブラケット28を取付け、かつ保持部材21に
支持枠体29を取付け、支持枠体29と保持部材21と
に二本のガイド軸30を架設し、ガイド軸30に揺振台
31を揺振スライド自在に設け、揺振台31の上面に揺
振板32を取付け、支持ブラケット28に揺振用モータ
33を横設し、揺振用モータ33の主軸に偏心輪34を
取付け、揺振板32に偏心輪34を挟装する状態で一対
の案内板35を立設し、揺振台31を偏心輪34の偏心
回転と一対の案内板35との作用により研磨テープTを
テープ移送方向Sに対して直交する方向M方向に揺振運
動させるように構成している。
Reference numeral 27 denotes a swinging mechanism, and the holding member 2
1, a support bracket 29 is mounted on the holding member 21, a support frame 29 is mounted on the holding member 21, two guide shafts 30 are installed on the support frame 29 and the holding member 21, and the shaking table 31 is rocked on the guide shaft 30. A swing plate 32 is mounted on the upper surface of the swing table 31, a swing motor 33 is horizontally mounted on the support bracket 28, and an eccentric wheel 34 is mounted on the main shaft of the swing motor 33, A pair of guide plates 35 are erected while the eccentric ring 34 is sandwiched between the plates 32, and the oscillating table 31 is moved eccentrically by the eccentric ring 34 and the action of the pair of guide plates 35 to move the polishing tape T in the tape transport direction. The oscillating motion is made in a direction M orthogonal to S.

【0013】又、テープ移送機構6は、この場合上記保
持部材21に支持板36を取付け、支持板36の左右側
部にポリエステルフィルム、メタル、クロス等の基材に
酸化アルミニュウム、酸化クロム、シリコンカーバイ
ド、ダイヤモンド等の所定粒度の研磨粒子をコーティン
グ又は結合してなる研磨テープTの実巻リール37及び
巻取リール38を軸着し、実巻リール37を繰出回転さ
せる繰出用モータ37aを設け、かつ巻取ロール39を
巻取回転させる巻取用モータ40を設け、巻取用モータ
40によりベルト41を介して巻取リール38を巻取回
転させ、実巻リール37から引き出した研磨テープTを
ロール42を介してロール状の受圧部材43により折り
返し、これにより研磨テープTからなる研磨部Kを形成
し、ロール44、45、46及び巻取ロール39と挟着
ロール47との間、ロール47aを経て巻取リール38
に巻回し、実巻リール37及び巻取リール38を回転さ
せながら巻取ロール39により研磨テープTを一方向に
連続又は間欠的に移送させるように構成している。
In this case, the tape transport mechanism 6 has a support plate 36 attached to the holding member 21 and aluminum oxide, chromium oxide, and silicon on base materials such as polyester film, metal, and cloth on the left and right sides of the support plate 36. Carbide, a winding motor 37a is provided for rotating the actual winding reel 37 by rotating the actual winding reel 37 and the winding reel 38 around a polishing tape T formed by coating or bonding abrasive particles of a predetermined particle size such as diamond. A winding motor 40 for winding and rotating the winding roll 39 is provided. The winding motor 40 rotates the winding reel 38 via the belt 41 to rotate the polishing tape T pulled out from the actual winding reel 37. It is folded back by a roll-shaped pressure receiving member 43 via a roll 42, thereby forming a polishing portion K made of a polishing tape T. , Between 46 and winding roll 39 and clamped roll 47, the take-up reel 38 via the roll 47a
The polishing tape T is continuously or intermittently transferred in one direction by a winding roll 39 while rotating the actual winding reel 37 and the winding reel 38.

【0014】48は研磨圧調節機構であって、この場
合、上記揺振台31に左右一対の摺動部49により回転
盤1の半径方向の内方及び外方位置にしてそれぞれ軸受
体50・51を上下摺動自在に取付け、この50・51
の間に受圧部材43のロール軸43aを自在軸受52に
より回転軸線Lを回転盤1の半径方向にして回転自在に
軸架し、上記揺振板32に空圧シリンダからなる二個の
圧力制御用シリンダ53・54を縦設し、この二個の圧
力制御用シリンダ53・54の各ロッド53a・54a
を自在継手55を介して上記軸受体50・51に連結
し、この圧力制御用シリンダ53・54に図示省略の圧
力制御弁を接続し、各圧力制御用シリンダ53・54へ
の供給空圧を圧力制御弁により調節し、二個の圧力制御
用シリンダ53・54の各ロッド53a・54aの押力
を各別に調節し、これにより受圧部材43の回転軸線L
の傾動動作を許容すると共に受圧部材43の回転軸線L
の内方位置及び外方位置の研磨圧力を各別に調節可能に
構成している。
Reference numeral 48 denotes a polishing pressure adjusting mechanism. In this case, a pair of left and right sliding portions 49 are provided on the shaking table 31 so as to be positioned inward and outward in the radial direction of the turntable 1, respectively. 51 is slidably mounted vertically.
The roller shaft 43a of the pressure receiving member 43 is rotatably supported by the free bearing 52 with the rotation axis L being set in the radial direction of the turntable 1, and two pressure control units each including a pneumatic cylinder are mounted on the vibration plate 32. Cylinders 53 and 54 are provided vertically, and the rods 53a and 54a of the two pressure control cylinders 53 and 54 are provided.
Is connected to the bearing bodies 50 and 51 via a universal joint 55, and a pressure control valve (not shown) is connected to the pressure control cylinders 53 and 54 to reduce the supply air pressure to each of the pressure control cylinders 53 and 54. The pressure is controlled by a pressure control valve, and the pressing forces of the rods 53a and 54a of the two pressure control cylinders 53 and 54 are separately adjusted, whereby the rotation axis L of the pressure receiving member 43 is adjusted.
Of the pressure receiving member 43 and the rotation axis L of the pressure receiving member 43.
The polishing pressures at the inner position and the outer position are individually adjustable.

【0015】この実施の形態例は上記構成であるから、
人為的又は自動的に回転盤1上に研磨すべきスタンパと
しての薄板状部材Wを載置固定し、回転盤1を回転機構
2により回転中心Oを中心として回転させ、先ず、テー
プ移送機構6を移動機構7の荒加工移動機構7aによ
り、図9、図10の如く、研磨テープTの移送方向Sが
薄板状部材Wの回転接線方向RTとなるように配置し、
上下動機構8によりテープ移送機構6を下降させて研磨
テープTを薄板状部材Wの回転法線方向RNに移動させ
ることにより連続又は間欠移送される研磨テープTから
なる研磨部Kはスタンパの裏面としての薄板状部材Wの
表面に圧接され、研磨テープTの移送S及び回転盤1の
回転Rの相互作用により薄板状部材Wの表面は研磨加工
され、この研磨圧力は受圧部材43が受けることにな
り、この研磨テープTの移送方向Sが薄板状部材Wの回
転接線方向RTに配置されて研磨テープTを薄板状部材
Wの回転法線方向RNに移動させる荒研磨が完了する
と、テープ移送機構6は上下動機構8により上昇すると
共に移動機構7の荒加工移動機構7aにより後退移動
し、次いで、図11の如く、仕上加工移動機構7bによ
り研磨テープTの移送方向Sが薄板状部材Wの回転法線
方向RNとなるように配置し、上下動機構8によりテー
プ移送機構6を下降させて研磨テープTを薄板状部材W
の回転法線方向RNに移動させることにより研磨テープ
Tからなる研磨部Kはスタンパの裏面としての薄板状部
材Wの表面に圧接され、研磨テープTの移送S及び回転
盤1の回転Rの相互作用により薄板状部材Wの表面は研
磨加工され、研磨テープTの移送方向Sが薄板状部材W
の回転法線方向RNに配置されて研磨テープTを薄板状
部材Wの回転法線方向RNに移動させる仕上研磨がなさ
れ、この研磨加工の完了により、そのテープ移送機構6
は上下動機構8により上昇すると共に仕上加工移動機構
7bにより後退移動し、これにより薄板状部材Wの表面
は薄板状部材Wの回転方向と研磨テープTの移送方向S
との相対方向が異なる荒研磨及び仕上研磨加工がなされ
ることになる。
Since this embodiment has the above configuration,
A thin plate member W as a stamper to be polished is artificially or automatically placed and fixed on the rotating disk 1, and the rotating disk 1 is rotated about the rotation center O by the rotating mechanism 2. Are arranged by the roughing movement mechanism 7a of the movement mechanism 7 such that the transport direction S of the polishing tape T is in the rotational tangential direction RT of the thin plate member W as shown in FIGS.
The vertical movement mechanism 8 polishing unit K consisting of the abrasive tape T which is continuously or intermittently transferred by moving the abrasive tape T is lowered the tape transport mechanism 6 in the rotational direction normal R N of the thin plate member W is a stamper The surface of the thin plate member W is pressed against the surface of the thin plate member W as the back surface, and the surface of the thin plate member W is polished by the interaction of the transfer S of the polishing tape T and the rotation R of the turntable 1, and the polishing pressure is received by the pressure receiving member 43. will be, when the transfer direction S of the abrasive tape T is rotated tangentially R T rough polishing for moving the placed in polishing tape T in the rotation normal direction R N of the thin plate member W on completion of the thin plate member W The tape transfer mechanism 6 is moved up by the vertical movement mechanism 8 and moved backward by the roughing movement mechanism 7a of the movement mechanism 7, and then, as shown in FIG. 11, the transfer direction of the polishing tape T by the finishing movement mechanism 7b. Rotation normal direction R N and arranged such that, the thin plate member W to the polishing tape T is lowered the tape transport mechanism 6 by vertically moving mechanism 8 but the thin plate member W
Rotating polishing unit K consisting of the polishing tape T by moving in the normal direction R N is pressed against the surface of the thin plate member W as the rear surface of the stamper, the transfer S and rotation of the rotating disk 1 R abrasive tape T The surface of the thin plate member W is polished by the interaction, and the transport direction S of the polishing tape T is
Rotational direction normal disposed R N and finish moving the abrasive tape T in the rotation normal direction R N of the thin plate member W polishing is performed by the completion of the polishing, the tape transport mechanism 6
Is raised by the vertical movement mechanism 8 and retreated by the finishing movement mechanism 7b, whereby the surface of the thin plate member W is rotated in the rotation direction of the thin plate member W and the transfer direction S of the polishing tape T.
Rough polishing and finish polishing are performed in different directions.

【0016】従って、上記研磨テープTの移送方向Sを
薄板状部材Wの回転接線方向RTに配置して研磨テープ
Tを薄板状部材Wの回転法線RN方向に移動させて荒研
磨加工し、次いで、研磨テープTの移送方向Sを薄板状
部材Wの回転法線RN方向に配置して研磨テープTを薄
板状部材Wの回転法線方向RNに移動させて仕上研磨加
工することができ、即ち、薄板状部材Wの表面を薄板状
部材Wの回転方向と研磨テープTの移送方向Sとの相対
方向が異なる荒研磨及び仕上研磨加工を行うことがで
き、それだけ平滑な研磨面を得ることができ、良好な研
磨加工を行うことができる。
[0016] Therefore, rough grinding and the polishing tape T is moved in the rotation normal R N direction of the thin plate member W by the transfer direction S of the polishing tape T placed in the rotation tangential direction R T of the thin plate member W and, then, moved to polished finish in the rotation normal direction R N of the rotary normal R N arranged in a direction abrasive tape T a thin plate member W in the transfer direction S of the polishing tape T thin plate member W That is, it is possible to perform rough polishing and finish polishing on the surface of the thin plate member W in which the rotation direction of the thin plate member W and the relative direction of the transport direction S of the polishing tape T are different, and the smooth polishing is performed accordingly. A surface can be obtained, and good polishing can be performed.

【0017】又、この場合、上記研磨テープTをテープ
移送方向Sに対して直交する方向の揺振方向Mに揺振運
動させる揺振機構27を具備してなるから、研磨テープ
Tの揺振運動により一層良好に研磨加工を行うことがで
き、この研磨テープTの揺振運動により上記荒研磨のと
きに薄板状部材Wの表面に円周方向の波形状が露呈する
ことがあるが上記仕上研磨により波形状が取り去られ、
揺振運動を加えたとしても上記仕上研磨により良好な研
磨面を得ることができ、又、この場合、上記荒研磨時に
薄板状部材の回転速度が研磨テープの揺振速度より早く
なる関係に設定すると共に逆に上記仕上研磨時には研磨
テープの揺振速度が薄板状部材の回転速度より早くなる
関係に設定され、即ち、上記荒研磨時に薄板状部材Wの
回転速度Vと研磨テープTの揺振速度Fとの関係をV>
Fとし、逆に上記仕上研磨時には薄板状部材Wの回転速
度Vと揺振速度Fとの関係をV<Fとすることにより一
層良好な研磨面を得ることができる。
Further, in this case, since there is provided a vibration mechanism 27 for oscillating the polishing tape T in a vibration direction M perpendicular to the tape transport direction S, the vibration of the polishing tape T is controlled. The polishing process can be performed more favorably by the motion, and the oscillating motion of the polishing tape T may cause a circumferential wave shape to be exposed on the surface of the thin plate member W during the rough polishing. The wave shape is removed by polishing,
A good polished surface can be obtained by the above-mentioned finish polishing even if a rocking motion is applied, and in this case, the relationship is set so that the rotation speed of the thin plate member becomes faster than the rocking speed of the polishing tape during the rough polishing. At the same time, during the finish polishing, the oscillation speed of the polishing tape is set to be faster than the rotation speed of the thin plate member. That is, the rotation speed V of the thin plate member W and the oscillation speed of the polishing tape T during the rough polishing are set. The relationship with the speed F is V>
F, and conversely, a better polished surface can be obtained by setting the relationship between the rotation speed V and the oscillation speed F of the thin plate member W to V <F during the finish polishing.

【0018】又、この場合、研磨圧調節機構48によ
り、受圧部材43の回転軸線Lは傾動動作可能に設けら
れていると共に受圧部材43の回転軸線Lの内方位置及
び外方位置の研磨圧力が調節可能に設けられているの
で、回転盤1を回転させた状態で研磨テープTからなる
研磨部Kを薄板状部材Wの表面に圧接させて研磨加工す
る際において、薄板状部材Wの半径方向の周速度の差に
伴う半径方向内方及び外方位置の研磨状態の相違に追従
することができ、それだけ半径方向内方及び外方位置の
表面全面に亙って均一な研磨面を得ることができる。
In this case, the rotation axis L of the pressure receiving member 43 is provided so as to be tiltable by the polishing pressure adjusting mechanism 48, and the polishing pressure at the inner position and the outer position of the rotation axis L of the pressure receiving member 43 is also set. Is provided so as to be adjustable. When the polishing portion K made of the polishing tape T is pressed against the surface of the thin plate-like member W while the turntable 1 is rotated to perform the polishing, the radius of the thin plate-like member W is adjusted. The difference in the polishing condition at the radially inner and outer positions due to the difference in the peripheral speed in the direction can be followed, and a uniform polished surface can be obtained over the entire surface at the radially inner and outer positions. be able to.

【0019】又、この場合、上記研磨圧調節機構48
は、上記受圧部材43の回転軸線Lの内方位置を保持す
る圧力制御可能な圧力制御用シリンダ53及び受圧部材
43の回転軸線Lの外方位置を保持する圧力制御可能な
圧力制御用シリンダ54から構成されているので、構造
を簡素化することができると共に例えば圧力制御弁の手
動又は自動操作によりそれぞれの圧力圧力制御用シリン
ダ53・54の内圧調整によって受圧部材43の回転軸
線Lの内方位置及び外方位置の研磨圧力を容易に調節す
ることができる。
In this case, the polishing pressure adjusting mechanism 48 is used.
Are pressure controllable pressure control cylinders 53 for holding the inner position of the rotation axis L of the pressure receiving member 43 and pressure controllable pressure control cylinders 54 for holding the outer position of the rotation axis L of the pressure receiving member 43. , The structure can be simplified and, for example, by adjusting the internal pressure of the pressure-pressure control cylinders 53 and 54 by manual or automatic operation of the pressure control valve, the inner side of the rotation axis L of the pressure-receiving member 43 is adjusted. The polishing pressure at the position and the outer position can be easily adjusted.

【0020】尚、本発明は上記実施の形態例に限られる
ものではなく、例えば、研磨加工時に研磨液を噴射して
研磨する湿式方式や研磨液を用いない乾式構造とするこ
ともあり、又、揺振機構として受圧部材のみでなくテー
プ移送機構を揺振運動させる構造も採用され、、又、移
動機構7、上下動機構8、テープ移送機構6、揺振機構
27等の構造は適宜変更して設計されるものである。
The present invention is not limited to the above-described embodiment, but may be, for example, a wet type in which a polishing liquid is sprayed at the time of polishing, or a dry type in which a polishing liquid is not used. In addition, a structure in which not only the pressure receiving member but also the tape transfer mechanism is oscillated as the oscillating mechanism is employed, and the structures of the moving mechanism 7, the vertical moving mechanism 8, the tape transferring mechanism 6, the oscillating mechanism 27, and the like are appropriately changed. It is designed to be.

【0021】[0021]

【発明の効果】本発明は上述の如く、請求項1又は4記
載の発明にあっては、研磨テープの移送方向を薄板状部
材の回転接線方向に配置して研磨テープを薄板状部材の
回転法線方向に移動させて荒研磨加工し、次いで、研磨
テープの移送方向を薄板状部材の回転法線方向に配置し
て研磨テープを薄板状部材の回転法線方向に移動させて
仕上研磨加工することができ、即ち、薄板状部材の表面
を薄板状部材の回転方向と研磨テープの移送方向との相
対方向が異なる荒研磨及び仕上研磨加工を行うことがで
き、それだけ平滑な研磨面を得ることができ、良好な研
磨加工を行うことができる。
As described above, according to the present invention, the polishing tape is transported in the rotation tangential direction of the thin plate member and the polishing tape is rotated by the rotation of the thin plate member. Finish polishing by moving the polishing tape in the normal direction of the thin plate and moving the polishing tape in the normal direction of the thin plate. That is, it is possible to perform rough polishing and finish polishing on the surface of the thin plate member in which the relative direction between the rotation direction of the thin plate member and the transport direction of the polishing tape is different, and obtain a smoother polishing surface accordingly. And good polishing can be performed.

【0022】又、請求項2又は5記載の発明にあって
は、上記研磨テープをテープ移送方向に対して直交する
方向の揺振方向に揺振運動させる揺振機構を具備してな
るから、研磨テープの揺振運動により一層良好に研磨加
工を行うことができ、この研磨テープの揺振運動により
上記荒研磨のときに薄板状部材の表面に円周方向の波形
状が露呈することがあるが上記仕上研磨により波形状が
取り去られ、揺振運動を加えたとしても上記仕上研磨に
より良好な研磨面を得ることができ、又、請求項3又は
6記載の発明にあっては、上記荒研磨時に薄板状部材の
回転速度が研磨テープの揺振速度より早くなる関係に設
定すると共に逆に上記仕上研磨時には研磨テープの揺振
速度が薄板状部材の回転速度より早くなる関係に設定し
ているので一層良好な研磨面を得ることができる。
According to the second or fifth aspect of the present invention, there is provided a rocking mechanism for rocking the polishing tape in a rocking direction perpendicular to the tape transport direction. The polishing process can be performed more favorably by the oscillation motion of the polishing tape, and the oscillation motion of the polishing tape may cause a circumferential wave shape to be exposed on the surface of the thin plate member during the rough polishing. However, a wave shape is removed by the finish polishing, and a good polished surface can be obtained by the finish polishing even if a swinging motion is applied. In the invention according to claim 3 or 6, At the time of rough polishing, the rotation speed of the thin plate member is set to be faster than the oscillation speed of the polishing tape, and conversely, at the time of finish polishing, the oscillation speed of the polishing tape is set to be faster than the rotation speed of the thin plate member. Better It is possible to obtain a polishing surface.

【0023】又、請求項7記載の発明にあっては、研磨
圧調節機構により、受圧部材の回転軸線は傾動動作可能
に設けられていると共に受圧部材の回転軸線の内方位置
及び外方位置の研磨圧力が調節可能に設けられているの
で、回転盤を回転させた状態で研磨テープからなる研磨
部を薄板状部材の表面に圧接させて研磨加工する際にお
いて、薄板状部材の半径方向の周速度の差に伴う半径方
向内方及び外方位置の研磨状態の相違に追従することが
でき、それだけ半径方向内方及び外方位置の表面全面に
亙って均一な研磨面を得ることができ、又、請求項8記
載の発明にあっては、上記研磨圧調節機構は、上記受圧
部材の回転軸線の内方位置を保持する圧力制御可能な圧
力制御用シリンダ及び受圧部材の回転軸線の外方位置を
保持する圧力制御可能な圧力制御用シリンダから構成さ
れているので、構造を簡素化することができると共に例
えば圧力制御弁の手動又は自動操作によりそれぞれの圧
力圧力制御用シリンダの内圧調整によって受圧部材の回
転軸線の内方位置及び外方位置の研磨圧力を容易に調節
することができる。
According to the present invention, the rotation axis of the pressure receiving member is provided so as to be tiltable by the polishing pressure adjusting mechanism, and the inner and outer positions of the rotation axis of the pressure receiving member. Since the polishing pressure is provided so as to be adjustable, the polishing portion made of a polishing tape is pressed against the surface of the thin plate-like member while the rotating disk is rotated, and the polishing process is performed in the radial direction of the thin plate member. It is possible to follow the difference in the polishing state at the radially inner and outer positions due to the difference in the peripheral speed, thereby obtaining a uniform polished surface over the entire surface at the radially inner and outer positions. Further, in the invention according to claim 8, the polishing pressure adjusting mechanism includes a pressure controllable pressure control cylinder that holds an inner position of the rotation axis of the pressure receiving member, and a rotation axis of the pressure receiving member. Pressure control to keep outside position The pressure control cylinders, the structure can be simplified and the internal pressure of each pressure / pressure control cylinder can be adjusted by manual or automatic operation of the pressure control valve. The polishing pressure at the outer position and the outer position can be easily adjusted.

【0024】以上、所期の目的を充分達成することがで
きる。
As described above, the intended purpose can be sufficiently achieved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態例の全体側断面図である。FIG. 1 is an overall side sectional view of an embodiment of the present invention.

【図2】本発明の実施の形態例の全体平面図である。FIG. 2 is an overall plan view of an embodiment of the present invention.

【図3】本発明の実施の形態例のテープ移送機構の正面
図である。
FIG. 3 is a front view of the tape transport mechanism according to the embodiment of the present invention.

【図4】本発明の実施の形態例の部分拡大側断面図であ
る。
FIG. 4 is a partially enlarged side sectional view of the embodiment of the present invention.

【図5】本発明の実施の形態例の部分拡大側断面図であ
る。
FIG. 5 is a partially enlarged side sectional view of the embodiment of the present invention.

【図6】本発明の実施の形態例の部分拡大平面図であ
る。
FIG. 6 is a partially enlarged plan view of the embodiment of the present invention.

【図7】本発明の実施の形態例の部分拡大正面図であ
る。
FIG. 7 is a partially enlarged front view of the embodiment of the present invention.

【図8】本発明の実施の形態例の部分拡大平断面図であ
る。
FIG. 8 is a partially enlarged plan sectional view of the embodiment of the present invention.

【図9】本発明の実施の形態例の荒研磨状態の説明斜視
図である。
FIG. 9 is an explanatory perspective view of a rough polishing state according to the embodiment of the present invention.

【図10】本発明の実施の形態例の荒研磨状態の説明平
面図である。
FIG. 10 is an explanatory plan view of a rough polishing state according to the embodiment of the present invention.

【図11】本発明の実施の形態例の仕上研磨状態の説明
平面図である。
FIG. 11 is an explanatory plan view of a finish polishing state according to the embodiment of the present invention.

【符号の説明】[Explanation of symbols]

W 薄板状部材 T 研磨テープ K 研磨部 L 回転軸線 S テープ移送方向 R 回転方向 RT 回転接線方向 RN 回転法線方向 M 揺振方向 1 回転盤 2 回転機構 6 テープ移送機構 7 移動機構 7a 荒加工移動機構 7b 仕上加工移動機構 8 上下動機構 27 揺振機構 43 受圧部材 48 研磨圧調節機構 53 圧力制御用シリンダ 54 圧力制御用シリンダW Thin plate member T Polishing tape K Polishing section L Rotation axis S Tape transport direction R Rotation direction R T Rotation tangential direction R N Rotation normal direction M Shaking direction 1 Rotary disk 2 Rotary mechanism 6 Tape transport mechanism 7 Moving mechanism 7a Rough Processing moving mechanism 7b Finishing processing moving mechanism 8 Vertical movement mechanism 27 Oscillating mechanism 43 Pressure receiving member 48 Polishing pressure adjusting mechanism 53 Pressure control cylinder 54 Pressure control cylinder

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 薄板状部材を回転させて研磨テープを折
返案内して形成された研磨部により研磨加工するに際
し、上記研磨テープの移送方向を上記薄板状部材の回転
接線方向に配置して該研磨テープを該薄板状部材の回転
法線方向に移動させて荒研磨加工し、次いで、該研磨テ
ープの移送方向を上記薄板状部材の回転法線方向に配置
して該研磨テープを該薄板状部材の回転法線方向に移動
させて仕上研磨加工することを特徴とする薄板状部材研
磨加工方法。
When the polishing process is performed by a polishing section formed by rotating a thin plate member to guide a polishing tape in a folded manner, the transport direction of the polishing tape is arranged in a rotational tangential direction of the thin plate member. The polishing tape is moved in the rotation normal direction of the thin plate member to perform rough polishing, and then the polishing tape is transferred in the rotation normal direction of the thin plate member, and the polishing tape is placed in the thin plate shape. A method of polishing a thin plate-like member, wherein the polishing is performed by moving the member in the direction of the rotation normal line.
【請求項2】 上記研磨テープをテープ移送方向に対し
て直交する方向に揺振運動させることを特徴とする請求
項1記載の薄板状部材研磨加工方法。
2. The method of polishing a thin plate member according to claim 1, wherein the polishing tape is caused to oscillate in a direction perpendicular to the tape transport direction.
【請求項3】 上記荒研磨時に薄板状部材の回転速度が
研磨テープの揺振速度より早くなる関係に設定すると共
に逆に上記仕上研磨時には研磨テープの揺振速度が薄板
状部材の回転速度より早くなる関係に設定することを特
徴とする請求項2記載の薄板状部材研磨加工方法。
3. The rotation speed of the thin plate member is set to be higher than the oscillation speed of the polishing tape during the rough polishing, and the oscillation speed of the polishing tape is set lower than the rotation speed of the thin plate member during the finish polishing. 3. The method according to claim 2, wherein the relationship is set to be faster.
【請求項4】 薄板状部材を載置可能な回転盤と、該回
転盤を回転させる回転機構と、該回転盤の上方にて研磨
テープを連続移送させると共に該研磨テープを受圧部材
により折返案内して形成された研磨部をもつテープ移送
機構と、該テープ移送機構を移動させる移動機構と、該
テープ移送機構を上下動作させる上下動機構とを備えて
なり、上記移動機構は研磨テープの移送方向を上記薄板
状部材の回転接線方向に配置して研磨テープを該薄板状
部材の回転法線方向に移動させる荒加工移動機構と、該
研磨テープの移送方向を上記薄板状部材の回転法線方向
に配置して該研磨テープを該薄板状部材の回転法線方向
に移動させる仕上加工移動機構とにより構成したことを
特徴とする薄板状部材研磨加工装置。
4. A rotating plate on which a thin plate-like member can be placed, a rotating mechanism for rotating the rotating plate, a polishing tape continuously transferred above the rotating plate, and the polishing tape is folded back by a pressure receiving member. A tape transport mechanism having a polishing section formed by the above, a moving mechanism for moving the tape transport mechanism, and a vertical movement mechanism for vertically moving the tape transport mechanism, wherein the moving mechanism transports the polishing tape. A roughing moving mechanism for moving the polishing tape in the rotation normal direction of the thin plate member by disposing the polishing tape in the rotation tangent direction of the thin plate member, and changing the transfer direction of the polishing tape to the normal rotation direction of the thin plate member A finishing processing moving mechanism for moving the polishing tape in a direction normal to the rotation of the thin plate member by disposing the polishing tape in the direction of the thin plate member.
【請求項5】 上記研磨テープをテープ移送方向に対し
て直交する方向に揺振運動させる揺振機構を具備してな
ることを特徴とする請求項4記載の薄板状部材研磨加工
装置。
5. The apparatus for polishing a thin plate member according to claim 4, further comprising a swinging mechanism for swinging the polishing tape in a direction orthogonal to the tape transport direction.
【請求項6】 上記荒加工時に薄板状部材の回転速度が
研磨テープの揺振速度より早くなる関係に設定すると共
に逆に上記仕上加工時には研磨テープの揺振速度が薄板
状部材の回転速度より早くなる関係に設定することを特
徴とする請求項5記載の薄板状部材研磨加工装置。
6. The rotation speed of the thin plate member is set to be higher than the oscillation speed of the polishing tape during the roughing, and the oscillation speed of the polishing tape is set to be smaller than the rotation speed of the thin plate member during the finishing operation. 6. The apparatus for polishing a thin plate member according to claim 5, wherein the relationship is set to be faster.
【請求項7】 上記受圧部材の回転軸線の傾動動作を許
容すると共に受圧部材の回転軸線の内方位置及び外方位
置の研磨圧力を調節可能な研磨圧調節機構を具備したこ
とを特徴とする請求項4〜6のいずれか1項に記載の薄
板状部材研磨加工装置。
7. A polishing pressure adjusting mechanism which allows a tilting operation of the rotation axis of the pressure receiving member and adjusts a polishing pressure at an inner position and an outer position of the rotation axis of the pressure receiving member. The thin plate-like member polishing apparatus according to any one of claims 4 to 6.
【請求項8】 上記研磨圧調節機構は、上記受圧部材の
回転軸線の内方位置を保持する圧力制御可能な圧力制御
用シリンダ及び該受圧ロールの回転軸線の外方位置を保
持する圧力制御可能な圧力制御用シリンダからなること
を特徴とする請求項7記載の薄板状部材研磨加工装置。
8. A pressure control cylinder for controlling the pressure, which holds an inner position of a rotation axis of the pressure receiving member, and a pressure controllable for holding an outer position of a rotation axis of the pressure receiving roll, the polishing pressure adjusting mechanism. 8. The thin plate-like member polishing apparatus according to claim 7, comprising a pressure control cylinder.
JP24694799A 1999-09-01 1999-09-01 Grinding work method and device for thin plate member Pending JP2001071251A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24694799A JP2001071251A (en) 1999-09-01 1999-09-01 Grinding work method and device for thin plate member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24694799A JP2001071251A (en) 1999-09-01 1999-09-01 Grinding work method and device for thin plate member

Publications (1)

Publication Number Publication Date
JP2001071251A true JP2001071251A (en) 2001-03-21

Family

ID=17156116

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24694799A Pending JP2001071251A (en) 1999-09-01 1999-09-01 Grinding work method and device for thin plate member

Country Status (1)

Country Link
JP (1) JP2001071251A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012111022A (en) * 2010-11-26 2012-06-14 Sanshin Co Ltd Band plate material grinding device
JP2016185592A (en) * 2012-09-25 2016-10-27 株式会社荏原製作所 Polishing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012111022A (en) * 2010-11-26 2012-06-14 Sanshin Co Ltd Band plate material grinding device
JP2016185592A (en) * 2012-09-25 2016-10-27 株式会社荏原製作所 Polishing device

Similar Documents

Publication Publication Date Title
JP2719855B2 (en) Mirror chamfering device around wafer
JPH05131359A (en) Device for polishing both surfaces at equal speed and method for its use
JP2003151935A (en) Polishing pad conditioner of chemical mechanical polisher, and method of conditioning polishing pad
JPH05329759A (en) Wafer material edge face polishing device
JP2000263416A (en) Dressing device and polishing device provided with this dressing device
JPH06270052A (en) Mirror surface polishing device for semiconductor wafer
JP2001071251A (en) Grinding work method and device for thin plate member
WO1999043467A1 (en) Work outer periphery polishing device
JPH081494A (en) Wafer material edge end part polishing device
JPH1199458A (en) Plate-like member corner edge chamfering device
JPH1133888A (en) Mirror finished surface chamfering device for wafer
JP2849904B2 (en) Work chamfering machine, perimeter machining device and chamfering / perimeter machining device
JPH0283160A (en) Grinding device for belt stock
JPH11129151A (en) Grinding device for thin plate shaped member
JP2000198057A (en) Device for mirror-finishing chamfered surface of semiconductor wafer
JP2000263433A (en) Wafer conveyer, wafer polisher and manufacture of wafer
JPH06763A (en) Polishing method for semiconductor wafer
JP2001162505A (en) Linear-drive belt type polishing device
JP4122800B2 (en) Semiconductor wafer polishing method
JP3821944B2 (en) Wafer single wafer polishing method and apparatus
JP2000317790A (en) Chamfered face polishing device for semiconductor wafer and its method
JPH0453662B2 (en)
JP2003109923A (en) Device for polishing semiconductor wafer
JP2001150311A (en) Circumference processing method and processing device for thin disc
JPH1177497A (en) Both faces grinding method of semiconductor wafer and both faces grindings device