JP2000356680A5 - - Google Patents

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Publication number
JP2000356680A5
JP2000356680A5 JP1999165353A JP16535399A JP2000356680A5 JP 2000356680 A5 JP2000356680 A5 JP 2000356680A5 JP 1999165353 A JP1999165353 A JP 1999165353A JP 16535399 A JP16535399 A JP 16535399A JP 2000356680 A5 JP2000356680 A5 JP 2000356680A5
Authority
JP
Japan
Prior art keywords
charge
semiconductor
threshold value
radiation detection
semiconductor radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999165353A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000356680A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP16535399A priority Critical patent/JP2000356680A/ja
Priority claimed from JP16535399A external-priority patent/JP2000356680A/ja
Publication of JP2000356680A publication Critical patent/JP2000356680A/ja
Publication of JP2000356680A5 publication Critical patent/JP2000356680A5/ja
Pending legal-status Critical Current

Links

JP16535399A 1999-06-11 1999-06-11 半導体放射線検出装置 Pending JP2000356680A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16535399A JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16535399A JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Publications (2)

Publication Number Publication Date
JP2000356680A JP2000356680A (ja) 2000-12-26
JP2000356680A5 true JP2000356680A5 (enExample) 2005-12-22

Family

ID=15810761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16535399A Pending JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Country Status (1)

Country Link
JP (1) JP2000356680A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012083307A (ja) * 2010-10-14 2012-04-26 Fujifilm Corp 放射線検出装置、放射線画像撮影システム、放射線検出プログラム、及び放射線検出方法
JP5725188B2 (ja) * 2011-04-04 2015-05-27 株式会社島津製作所 撮像装置
JP2013057598A (ja) 2011-09-08 2013-03-28 Rigaku Corp 半導体ストリップ検出器

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