JP2000356608A - Sample exchanger in x-ray analysis device - Google Patents

Sample exchanger in x-ray analysis device

Info

Publication number
JP2000356608A
JP2000356608A JP11166821A JP16682199A JP2000356608A JP 2000356608 A JP2000356608 A JP 2000356608A JP 11166821 A JP11166821 A JP 11166821A JP 16682199 A JP16682199 A JP 16682199A JP 2000356608 A JP2000356608 A JP 2000356608A
Authority
JP
Japan
Prior art keywords
sample
cup
exchange
holder
base plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11166821A
Other languages
Japanese (ja)
Other versions
JP3247665B2 (en
Inventor
Hiroshi Sumii
弘諮 住居
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP16682199A priority Critical patent/JP3247665B2/en
Publication of JP2000356608A publication Critical patent/JP2000356608A/en
Application granted granted Critical
Publication of JP3247665B2 publication Critical patent/JP3247665B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain an x-ray analyzing device capable of easily performing the maintenance work of a sample cup forming a portion of an auxiliary exhaust chamber. SOLUTION: This sample exchanger 9 disposed in a sample inlet 20 in an x-ray analysis device has a sample exchanging hole, delivers a sample holder H holding a sample S from the sample exchanging hole to a sample cup 10 forming a portion of an auxiliary exhaust chamber 3 in the x-ray analyzing device, and receives the sample holder H guided out of the sample cup 10 through the exchanging hole to the sample inlet 20. This sample exchanger 9 is movably set so as to open/close the sample inlet 20. Accordingly, by moving the sample exchanger 9, the sample inlet 20 is opened, so that the maintenance and inspection of the sample cup 10 can be easily performed.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、X線分析装置の試
料搬入口に設けられて試料を交換する試料交換機に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample changer provided at a sample entrance of an X-ray analyzer for exchanging a sample.

【0002】[0002]

【従来の技術】従来から、真空下で試料を分析する分析
室に隣接して試料を外部から搬入する予備排気室を設
け、この予備排気室の内部を真空ポンプにより排気した
のち、予備真空排気室と分析室とを仕切るシャッタを開
放して、試料を予備真空室から分析室に搬入する蛍光X
線分析装置が知られている。
2. Description of the Related Art Conventionally, a preliminary exhaust chamber for carrying a sample from outside is provided adjacent to an analysis chamber for analyzing a sample under vacuum, and the inside of the preliminary exhaust chamber is evacuated by a vacuum pump, and then the preliminary vacuum exhaust is performed. The shutter that separates the chamber from the analysis chamber is opened, and the fluorescent X is transferred from the preliminary vacuum chamber to the analysis chamber.
Line analyzers are known.

【0003】このような予備排気室の内部は、真空引き
およびリークの繰り返しにより、粉体試料の粉、ガラス
ビードやインゴット試料のかけら等により汚染されるの
で、一定周期で清掃などの保守点検作業が行なわれる。
[0003] The interior of such a pre-evacuation chamber is contaminated by powder of powder samples, fragments of glass beads or ingot samples due to repeated evacuation and leaking. Is performed.

【0004】また、予備排気室の下半部を形成する試料
カップは、分析室の下方の予備排気位置から、試料搬入
口に臨む交換位置まで搬送され、この試料搬入口に設け
られた試料交換機によって、順次、新たな試料と交換さ
れる。
A sample cup forming the lower half of the preliminary exhaust chamber is transported from a preliminary exhaust position below the analysis chamber to an exchange position facing the sample entrance, and a sample exchange provided at the sample entrance. Is sequentially replaced with a new sample.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記の
ような従来の装置では、試料交換機を試料搬入口から取
り外すことができないため、試料カップの清掃などの保
守・点検は、一旦、X線源をオフしてX線を遮断し、X
線分析装置の外装パネルを開いて、装置内で行ってい
た。しかしながら、一旦、X線を遮断すると、作業終了
後にX線をオンしてX線が安定するまで時間を要する。
また、外装パネルを開くと分析室内の恒温状態が破壊さ
れ、作業終了後、外装パネルを閉じて、その恒温状態が
安定するまで、さらに時間を要する等、作業に手間と時
間を要し、分析作業を遅延させる問題があった。
However, in the above-described conventional apparatus, since the sample exchanger cannot be removed from the sample entrance, maintenance / inspection such as cleaning of the sample cup is performed by temporarily removing the X-ray source. Turn off to block X-rays, X
The external panel of the X-ray analyzer was opened, and the analysis was performed inside the apparatus. However, once the X-rays are cut off, it takes time until the X-rays are turned on after the work is completed and the X-rays are stabilized.
In addition, when the exterior panel is opened, the temperature inside the analysis chamber is destroyed, and after the work is completed, the exterior panel is closed and it takes more time until the temperature becomes stable. There was a problem that delayed work.

【0006】本発明は、このような課題を解決して、予
備排気室の一部を形成する試料カップの保守作業を容易
に行なうことができ、分析業務の能率の向上を図ること
ができるX線分析装置を提供することを目的としてい
る。
The present invention solves such a problem, and can easily perform maintenance work on a sample cup forming a part of a preliminary exhaust chamber, thereby improving the efficiency of analysis work. It is intended to provide a line analyzer.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
に、本発明の試料交換機は、X線分析装置の試料搬入口
に配置されて、交換孔を有し、試料を保持する試料ホル
ダを前記交換孔からX線分析装置内の予備真空室の一部
を形成する試料カップに受け渡すとともに、前記試料カ
ップから前記交換孔を通して導出された試料ホルダを受
け取る試料交換機であって、前記試料搬入口を開閉する
ように移動自在に設定されている。この構成によると、
試料交換機を移動させることによって開口する試料搬入
口から試料カップの保守・点検を容易に行なうことがで
きる。
In order to achieve the above object, a sample exchanger according to the present invention is provided at a sample inlet of an X-ray analyzer, and has a sample holder having an exchange hole and holding a sample. A sample exchange device for delivering a sample holder which is formed from the exchange hole to a sample cup forming a part of a preliminary vacuum chamber in an X-ray analyzer and receiving a sample holder led out from the sample cup through the exchange hole; It is set movably to open and close the mouth. According to this configuration,
By moving the sample exchanger, maintenance and inspection of the sample cup can be easily performed from the sample entrance that opens.

【0008】本発明の好ましい実施形態では、試料交換
機が、前記交換孔を有するベース板と、このベース板に
対して移動自在に設定されて複数の試料ホルダをベース
板上で移動させる移動板と、この移動板を駆動して試料
ホルダを前記交換孔に対応する位置に移動させる駆動機
とを備えている。
[0008] In a preferred embodiment of the present invention, the sample exchanger comprises a base plate having the exchange hole, and a moving plate which is set movably with respect to the base plate and moves a plurality of sample holders on the base plate. A driving device for driving the moving plate to move the sample holder to a position corresponding to the exchange hole.

【0009】また、本発明の好ましい実施形態では、X
線分析装置が、前記試料ホルダを支持する試料カップ
を、試料にX線照射を行う分析室に隣接した予備排気室
の一部を形成する予備排気位置と、前記試料搬入口に臨
む交換位置との間で搬送する搬送手段を備えており、前
記試料カップが、前記搬送手段に対して着脱自在に設定
されている。この構成によれば、試料カップを搬送手段
から離脱させて、試料搬入口から外部に取り出すことが
できるので、試料カップの保守・点検作業が一層容易に
なる。また、複数の試料カップを用意しておけば、試料
カップを交換することによって、分析業務を中断するこ
となく、次の分析作業に移れる。したがって、保守・点
検作業による分析業務の中断時間がなくなり、作業能率
が向上する。
In a preferred embodiment of the present invention, X
X-ray analyzer, a sample cup supporting the sample holder, a preliminary exhaust position forming a part of a preliminary exhaust chamber adjacent to the analysis chamber that performs X-ray irradiation on the sample, and an exchange position facing the sample carry-in port. The sample cup is provided detachably with respect to the transport means. According to this configuration, the sample cup can be detached from the transfer means and taken out from the sample loading port, so that the maintenance and inspection work of the sample cup is further facilitated. Also, if a plurality of sample cups are prepared, the next analysis operation can be performed without interrupting the analysis work by exchanging the sample cups. Therefore, there is no interruption time of the analysis work due to the maintenance / inspection work, and the work efficiency is improved.

【0010】[0010]

【発明の実施の形態】以下、本発明を蛍光X線分析装置
に適用した好ましい実施形態について図面を参照しなが
ら詳述する。図1において、蛍光X線分析装置は、その
外装パネル1の内部に分析室2が設けられ、この分析室
2の下方に予備排気室3が設けられている。予備排気室
3の周壁4は分析室下壁5に固定または一体形成されて
いる。分析室2の上壁にはX線を試料Sに照射するX線
管6が取り付けられ、分析室2と予備排気室3の間の連
通口51が、図示しない駆動機構によって回動もしくは
直線移動するシャッタ8により開閉される。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments in which the present invention is applied to a fluorescent X-ray analyzer will be described below in detail with reference to the drawings. In FIG. 1, the X-ray fluorescence analyzer has an analysis chamber 2 provided inside an exterior panel 1, and a preliminary exhaust chamber 3 provided below the analysis chamber 2. The peripheral wall 4 of the preliminary exhaust chamber 3 is fixed or integrally formed with the lower wall 5 of the analysis chamber. An X-ray tube 6 for irradiating the sample S with X-rays is attached to the upper wall of the analysis chamber 2, and a communication port 51 between the analysis chamber 2 and the preliminary exhaust chamber 3 is rotated or linearly moved by a driving mechanism (not shown). The shutter 8 is opened and closed.

【0011】外装パネル1に形成された試料搬入口20
には、試料交換機9が配置されており、さらに、外装パ
ネル1内には、後述する試料カップ10を試料交換機9
の下方の交換位置と、予備排気室3の下部を形成する予
備排気位置との間で搬送する搬送手段40が設けられて
いる。この搬送手段40は、図示しない昇降機と直線移
送機とで構成されている公知のものである。
A sample entrance 20 formed in the exterior panel 1
Is provided with a sample exchanger 9, and a sample cup 10, which will be described later, is provided in the exterior panel 1.
A transfer means 40 is provided for transferring between an exchange position below the pre-exhaust position and a preliminary exhaust position forming the lower part of the preliminary exhaust chamber 3. The transporting means 40 is a known one comprising an elevator (not shown) and a linear transporter.

【0012】前記分析室2には前記X線管6のほかに、
図示しない分光器および検出器が配置されており、所定
の真空度に保たれた分析室2内の試料SにX線管6から
X線を照射し、試料Sから発生する蛍光X線を分光器で
分光して、分光した蛍光X線の強度を検出器で測定し、
試料Sを分析する。
In the analysis chamber 2, in addition to the X-ray tube 6,
A spectroscope and a detector (not shown) are provided, and the sample S in the analysis chamber 2 maintained at a predetermined vacuum degree is irradiated with X-rays from the X-ray tube 6 to spectrally separate the fluorescent X-rays generated from the sample S. Spectroscopy with a detector, measure the intensity of the separated fluorescent X-rays with a detector,
The sample S is analyzed.

【0013】図6に示すように、試料Sは試料ホルダH
に保持されており、この試料ホルダHが試料カップ10
に支持されている。試料ホルダSは、有底円筒形状の容
器であり、試料Sに上方へ向かう弾性力を付加するコイ
ルスプリング53と、試料Sの上面の一部(分析面)を
露出させ他部を覆うとともに試料Sの突出を押さえるマ
スク54とを備え、その周壁に貫通孔55が設けられて
いる。貫通孔55は、試料ホルダH内の真空度を予備排
気室3内の真空度と同じにするためのものである。
As shown in FIG. 6, the sample S is a sample holder H
The sample holder H is held in the sample cup 10
It is supported by. The sample holder S is a cylindrical container having a bottom and has a coil spring 53 for applying an upward elastic force to the sample S, a portion of an upper surface (analysis surface) of the sample S being exposed to cover other portions, and And a mask 54 for suppressing the protrusion of S, and a through hole 55 is provided in a peripheral wall thereof. The through hole 55 is for making the degree of vacuum in the sample holder H the same as the degree of vacuum in the preliminary exhaust chamber 3.

【0014】前記試料ホルダHを支持する試料カップ1
0は、予備排気室3の周壁4の開口した下端部に押し当
てられて、周壁4とともに予備排気室3を形成する。こ
の試料カップ10は、搬送手段40に載置されて昇降機
により昇降される昇降台41に着脱自在に取付けられて
おり、図4(a)に示すように、カップ本体11に、試
料ホルダHが載置される試料テーブル12と、試料ホル
ダHの下端外周部が嵌め込まれて試料ホルダHの径方向
の位置規制を行うリング状のガイド体13と、試料テー
ブル12およびガイド体13に上方へのばね力を付加す
る第1ばね体14とが装着されている。前記カップ本体
11が、ねじ体66によって昇降台41に着脱自在に取
り付けられている。
A sample cup 1 for supporting the sample holder H
0 is pressed against the open lower end of the peripheral wall 4 of the preliminary exhaust chamber 3 to form the preliminary exhaust chamber 3 together with the peripheral wall 4. The sample cup 10 is removably attached to an elevating table 41 which is placed on the transporting means 40 and raised and lowered by an elevating device. As shown in FIG. A sample table 12 to be placed, a ring-shaped guide body 13 into which the outer peripheral portion of the lower end of the sample holder H is fitted to regulate the position of the sample holder H in the radial direction, and A first spring body 14 for applying a spring force is mounted. The cup main body 11 is detachably attached to the lift table 41 by a screw body 66.

【0015】カップ本体11は、有底円筒形の大径受け
部11aと、その下方の小径首部11bと、フランジ部
11cと、前記受け部11aの内側に同心状に形成され
た軸支部11dと、その上部の当て部11fと、下部の
ばね受け11gとを有している。受け部11aの外径側
の上部に形成された溝15にゴムパッキンからなるシー
ル部材16が嵌合され、軸支部11dには浮遊軸受体1
7が軸方向に移動自在に支持されている。この軸受体1
7は、1対の軸受17a,17aとこれらを保持するホ
ルダ17bとを有しており、ホルダ17bと前記下方の
ばね受け11gとの間に介挿された第2ばね体24によ
り、上方へばね力が付加されて、当て部11fに押し当
てられている。したがって、試料テーブル12は、その
荷重に応じて、軸受体17とともに軸方向下方に移動す
る。軸支部11dと受け部11aとの間に形成された上
方に開口する環状溝18には、前記ガイド体13と第1
ばね体14が嵌入されている。
The cup body 11 has a bottomed cylindrical large-diameter receiving portion 11a, a small-diameter neck portion 11b therebelow, a flange portion 11c, and a shaft supporting portion 11d formed concentrically inside the receiving portion 11a. , And an upper contact portion 11f and a lower spring receiver 11g. A sealing member 16 made of rubber packing is fitted into a groove 15 formed on the outer diameter side of the receiving portion 11a, and the floating bearing 1
7 is supported movably in the axial direction. This bearing 1
7 has a pair of bearings 17a, 17a and a holder 17b for holding them, and is upwardly moved by a second spring body 24 interposed between the holder 17b and the lower spring receiver 11g. A spring force is applied and the spring is pressed against the contact portion 11f. Therefore, the sample table 12 moves axially downward together with the bearing 17 in accordance with the load. An annular groove 18 formed between the shaft support 11d and the receiving part 11a and opening upward has the guide 13 and the first
A spring body 14 is fitted.

【0016】前記試料テーブル12は、試料ホルダHの
底面とほぼ同一外径の円形であり、その下面中央に回転
軸61が連結されている。回転軸61は、試料テーブル
12に固定された固定部61aと、固定部61aにピン
61bによって揺動自在に連結された揺動部61cとか
らなる。回転軸61の固定部61aは前記軸受17に支
持され、揺動部61cの下端には、図4(b)に示すよ
うに、径方向に沿って延びる連結溝62が形成されてい
る。試料テーブル12に付加される荷重に応じて、回転
軸61とともに軸受体17が軸方向に移動する。
The sample table 12 has a circular shape having substantially the same outer diameter as the bottom surface of the sample holder H, and a rotating shaft 61 is connected to the center of the lower surface. The rotating shaft 61 includes a fixed portion 61a fixed to the sample table 12, and a swing portion 61c that is swingably connected to the fixed portion 61a by a pin 61b. The fixed portion 61a of the rotating shaft 61 is supported by the bearing 17, and a connecting groove 62 extending in the radial direction is formed at the lower end of the swinging portion 61c, as shown in FIG. 4B. The bearing 17 moves in the axial direction together with the rotating shaft 61 according to the load applied to the sample table 12.

【0017】図4(a)に示した首部11bは、略円筒
形状で、受け部11aよりも外径が小さく、その内径側
に設けた嵌合孔11eに、昇降台41の嵌合用突起41
aが嵌入されて、昇降台41との芯合わせがなされる。
フランジ部11cは円板形状であり、受け部11aより
も大きい外径を有し、図5に示すように、着脱用孔65
が2つ点対称な位置に形成されている。一方、搬送手段
40の昇降台41に形成された取付け孔41bには、ね
じ体66が2つ点対称な位置に取り付けられており、ね
じ体66の下端に大径の抜止め部66a(図4(a))
が取り付けられている。この抜止め部66aとねじ頭部
66bとにより、ねじ体66は昇降台41から完全に外
れることがない。前記着脱用孔65は、ねじ体66の頭
部66bを貫通させる大きさを有する略円形の大径貫通
部65aと、大径貫通部65aよりも小さく、ねじ体6
6のねじ部66cよりも若干大きい幅を有しフランジ部
11cの周方向に延びる長溝締着部65bとからなる。
The neck 11b shown in FIG. 4 (a) has a substantially cylindrical shape, and has an outer diameter smaller than that of the receiving portion 11a, and is fitted into a fitting hole 11e provided on the inner diameter side thereof.
a is inserted and the center of the lift table 41 is aligned.
The flange portion 11c has a disk shape, has an outer diameter larger than that of the receiving portion 11a, and as shown in FIG.
Are formed at two point symmetric positions. On the other hand, a screw body 66 is attached to a mounting hole 41b formed in the elevating table 41 of the transport means 40 at two point symmetric positions, and a large diameter retaining portion 66a (see FIG. 4 (a))
Is attached. With the retaining portion 66a and the screw head 66b, the screw body 66 is not completely detached from the elevator 41. The attachment / detachment hole 65 has a substantially circular large-diameter penetrating portion 65a having a size to penetrate the head 66b of the screw member 66, and a smaller diameter than the large-diameter penetrating portion 65a.
6 and a long groove fastening portion 65b having a width slightly larger than the threaded portion 66c and extending in the circumferential direction of the flange portion 11c.

【0018】搬送手段40の昇降台41は、四角形の板
状であり、その中心部に前記嵌合用突起41aが形成さ
れており、下面に、前記スピン用モータ42が取り付け
られて、その駆動軸43は、上面の嵌合用突起41aの
中心から上方に向けて突出している。駆動軸43の上端
面には、径方向に延びる連結突起44が形成されてい
る。この連結突起44が、前記連結溝62とともに、着
脱自在な連結手段を構成する。
The elevating table 41 of the conveying means 40 has a rectangular plate shape, the fitting projection 41a is formed at the center thereof, and the spin motor 42 is mounted on the lower surface thereof, and its drive shaft is provided. 43 protrudes upward from the center of the fitting protrusion 41a on the upper surface. A connection protrusion 44 extending in the radial direction is formed on the upper end surface of the drive shaft 43. The connecting projections 44 together with the connecting grooves 62 constitute a detachable connecting means.

【0019】図6に示すシャッタ8を開けて、分析室2
内に試料Sを望ませた状態で、前記昇降台41の下面に
固定されたスピン用モータ42を駆動することにより、
試料カップ10内の試料テーブル12を回転させ、この
試料テーブル12に載置された試料ホルダH、つまり試
料Sを回転させながら、X線分析を行なう。
Opening the shutter 8 shown in FIG.
By driving the spin motor 42 fixed to the lower surface of the lift table 41 in a state where the sample S is desired inside,
The X-ray analysis is performed while rotating the sample table 12 in the sample cup 10 and rotating the sample holder H mounted on the sample table 12, that is, the sample S.

【0020】試料カップ10のシール部材16は、予備
排気室3の周壁4の下端部に接触して、予備排気室3内
を気密に保持する。周壁4の内径面の上部には、試料ホ
ルダHの高さ方向における位置決めのストッパーである
試料ホルダ押え56が、軸受58によって回転自在に支
持されており、試料ホルダ押え56は、試料ホルダHの
分析時の回転を妨げないように押さえる。
The seal member 16 of the sample cup 10 contacts the lower end of the peripheral wall 4 of the preliminary exhaust chamber 3 to keep the interior of the preliminary exhaust chamber 3 airtight. A sample holder retainer 56, which is a stopper for positioning the sample holder H in the height direction, is rotatably supported by a bearing 58 above the inner diameter surface of the peripheral wall 4, and the sample holder retainer 56 is Hold down so as not to hinder rotation during analysis.

【0021】予備排気室3は、その周壁4に形成された
連通孔49を介して真空ポンプ50に連結されており、
分析室2および予備排気室3内は、開閉弁V1,V2を
介して、真空ポンプ50によって真空に引かれる。予備
排気室3内の真空度が、分析室2内の真空度と等しい状
態になると、シャッタ8を開いて試料Sの分析を行な
う。試料Sの分析が終わると、シャッタ8を閉じ、予備
排気室3の内部を大気圧に戻し、予備排気室3の周壁4
から試料カップ10を離脱させ、搬送手段40で試料カ
ップ10を試料搬入口20(図1参照)に搬送する。
The preliminary exhaust chamber 3 is connected to a vacuum pump 50 through a communication hole 49 formed in the peripheral wall 4 thereof.
The interior of the analysis chamber 2 and the preliminary exhaust chamber 3 is evacuated by the vacuum pump 50 via the on-off valves V1 and V2. When the degree of vacuum in the preliminary exhaust chamber 3 becomes equal to the degree of vacuum in the analysis chamber 2, the shutter 8 is opened and the sample S is analyzed. When the analysis of the sample S is completed, the shutter 8 is closed, the inside of the preliminary exhaust chamber 3 is returned to the atmospheric pressure, and the peripheral wall 4 of the preliminary exhaust chamber 3 is opened.
The sample cup 10 is separated from the sample cup, and the sample cup 10 is transported to the sample entrance 20 (see FIG. 1) by the transport means 40.

【0022】次に、試料交換機9を、図1〜図3に基づ
いて説明する。図1に示すように、試料交換機9は、外
装パネル1に形成された導入口19の上方を覆うように
設けられたフード(外装パネルの一部)31の上壁31
aに取り付けられており、この上壁31aに試料搬入口
20が形成されている。フード31の内部は試料交換室
35を形成している。試料搬入口20は、試料交換機9
を移動させることによって開閉される。試料交換室35
は、試料交換機9と導入口19との間に試料カップ10
の全体が納まるような高さを有する。
Next, the sample changer 9 will be described with reference to FIGS. As shown in FIG. 1, the sample exchanger 9 includes an upper wall 31 of a hood (a part of the outer panel) 31 provided so as to cover an inlet 19 formed in the outer panel 1.
The sample carrying port 20 is formed in the upper wall 31a. The inside of the hood 31 forms a sample exchange chamber 35. The sample entrance 20 is connected to the sample exchange 9
It is opened and closed by moving. Sample exchange chamber 35
Is a sample cup 10 between the sample exchanger 9 and the inlet 19.
Has a height such that the whole of the can be accommodated.

【0023】図3に示すように、試料交換機9は、ベー
ス板21と、滑り部材22を介してベース板21に対し
て相対回転可能に支持された移動板23とを備えてい
る。滑り部材22はベース板21の上面に固定されてお
り、後述する交換口21aに対応する部分が切欠された
環状の板材である。移動板23はベース板21の中央部
に取り付けられた軸受32に回転自在に支持された軸体
33に固定されている。前記ベース板21は、試料搬入
口20よりも若干大きい外形を持ち、ヒンジ26によっ
て、フード31に回動可能に取り付けられて、試料搬入
口20を開閉する。ヒンジ26は、ヒンジピン26a
と、ヒンジピン26aを中心に相対回転する固定板26
bと回転板26cからなる。固定板26bは、フード3
1の上壁31aの裏面に固定され、回転板26cは、ベ
ース板21に固定された支持枠27に取り付けられてい
る。この支持枠27は、左右1対設けられている(図2
参照)。
As shown in FIG. 3, the sample changer 9 includes a base plate 21 and a movable plate 23 supported by a slide member 22 so as to be rotatable relative to the base plate 21. The sliding member 22 is an annular plate member fixed to the upper surface of the base plate 21 and having a portion corresponding to an exchange port 21a to be described later cut out. The moving plate 23 is fixed to a shaft 33 rotatably supported by a bearing 32 attached to the center of the base plate 21. The base plate 21 has a slightly larger outer shape than the sample carrying port 20, and is rotatably attached to the hood 31 by a hinge 26 to open and close the sample carrying port 20. The hinge 26 is a hinge pin 26a.
And a fixed plate 26 which relatively rotates about a hinge pin 26a.
b and the rotating plate 26c. The fixing plate 26b is a hood 3
The rotating plate 26 c is fixed to the back surface of the upper wall 31 a and is attached to a support frame 27 fixed to the base plate 21. This support frame 27 is provided as a pair of left and right (FIG. 2).
reference).

【0024】図2に示すように、ベース板21には、1
つの交換口21aが、移動板23には、周方向に並んだ
複数(図示例では6個)の嵌合孔23aがそれぞれ設け
られている。交換口21aおよび嵌合孔23aの大きさ
は、試料ホルダSの外径よりも僅かに大きくなってお
り、嵌合孔23aを通してべース板21上に試料ホルダ
Sが保持され、移動板23の回転移動に伴って、ベース
板21の交換口21aに運ばれる。交換口21aの真下
に、図3に2点鎖線で示すように、試料カップ10が、
搬送手段40の昇降台41によって持ち上げられて待機
している。試料カップ10の待機している状態では、図
4に示したガイド体13がベース板21の下面の交換口
21aの周縁に押し付けられることで、第1ばね体14
のばね力に抗して下方へ後退しており、これによって、
試料テーブル12の上面がベース板21の上面と略一致
した状態となっている。したがって、ベース板21上を
スライドしてくる試料ホルダHを、試料テーブル12で
容易に受け取ることができる。
As shown in FIG. 2, the base plate 21 has
In the moving plate 23, a plurality of (six in the illustrated example) fitting holes 23a are provided in the moving plate 23. The size of the exchange port 21a and the fitting hole 23a is slightly larger than the outer diameter of the sample holder S, and the sample holder S is held on the base plate 21 through the fitting hole 23a. Is carried to the exchange port 21a of the base plate 21 with the rotational movement of. As shown by the two-dot chain line in FIG.
It is lifted by the elevating table 41 of the transport means 40 and stands by. In a state where the sample cup 10 is on standby, the guide body 13 shown in FIG. 4 is pressed against the periphery of the exchange port 21 a on the lower surface of the base plate 21, so that the first spring body 14 is formed.
Retreats downward against the spring force of
The upper surface of the sample table 12 is substantially in agreement with the upper surface of the base plate 21. Therefore, the sample table 12 can easily receive the sample holder H sliding on the base plate 21.

【0025】前記軸体33の上端に設けられた摘み部3
4は、移動板23より首部34aを経て上方に突出して
おり、首部34aよりも外径の大きな六角形状を呈して
いる。試料カップ10の保守・点検時には、摘み部34
を摘んで引き上げることにより試料交換機9を上方へ回
動させて、試料搬入口20を開放する。軸体33の下端
に設けられた大径の被駆動歯車36は、ベース板21の
下面に取付金具37によって固定されたモータからなる
交換用の駆動機38の駆動歯車39と噛合し、制御手段
70による駆動機38の制御により、移動板23を回転
移動させて、試料ホルダHを交換孔21aに対応する位
置に移動させる。交換孔21aに達した試料ホルダH
は、交換孔21aに臨む交換位置で待機している試料カ
ップ10の試料テーブル12上に乗り移り、搬送手段4
0によって、予備排気室3に搬送される。
The knob 3 provided at the upper end of the shaft 33
4 protrudes upward from the movable plate 23 via the neck 34a, and has a hexagonal shape having an outer diameter larger than that of the neck 34a. At the time of maintenance and inspection of the sample cup 10, the knob 34
The sample changer 9 is pivoted upward by pulling and lifting the sample, and the sample entrance 20 is opened. A large-diameter driven gear 36 provided at the lower end of the shaft 33 meshes with a driving gear 39 of a replacement driving device 38 composed of a motor fixed to a lower surface of the base plate 21 by a mounting bracket 37, and Under the control of the driving device 38 by 70, the moving plate 23 is rotated to move the sample holder H to a position corresponding to the exchange hole 21a. Sample holder H that has reached the exchange hole 21a
Move onto the sample table 12 of the sample cup 10 waiting at the exchange position facing the exchange hole 21a, and
By 0, it is conveyed to the preliminary exhaust chamber 3.

【0026】試料Sの測定が完了すると、試料Sを保持
した試料ホルダHが試料カップ10に支持されて、搬送
手段40により搬送され、導入口19を通って試料交換
室31内に入り、ベース板21の交換孔21aおよび移
動板23の嵌合孔23aから試料ホルダHを外部に押し
上げる。このとき、前述のとおり、試料テーブル12の
上面がベース板21の上面と略一致した状態となってお
り、駆動機38によって移動板23が回転することで、
測定済みの試料ホルダHを交換孔21aから外れる位置
に円滑に移動させる。
When the measurement of the sample S is completed, the sample holder H holding the sample S is supported by the sample cup 10 and transported by the transport means 40, enters the sample exchange chamber 31 through the introduction port 19, and moves to the base. The sample holder H is pushed up from the exchange hole 21a of the plate 21 and the fitting hole 23a of the moving plate 23. At this time, as described above, the upper surface of the sample table 12 is substantially coincident with the upper surface of the base plate 21, and the movable plate 23 is rotated by the driving device 38,
The measured sample holder H is smoothly moved to a position outside the exchange hole 21a.

【0027】上記構成において、図1に示す試料Sを保
持した試料ホルダHは、試料カップ10によって支持さ
れた状態で、搬送手段40により、試料交換機9の下方
の交換位置と、予備排気室3の下部を形成する予備排気
位置との間で搬送される。新しい試料Sは、試料ホルダ
Hに保持された状態で、手作業または自動搬送機によ
り、試料交換機9の移動板23の嵌合孔23aに嵌め込
まれる形で試料交換機9に載置され、前述の動作で、順
次、試料カップ10に受け渡されて予備排気室3へ運ば
れる。測定済みの試料Sを保持した試料ホルダHは、試
料カップ10に支持されて、前述の要領で試料交換機9
の交換孔21aを通って、試料搬入口20から導出され
る。
In the above-described configuration, the sample holder H holding the sample S shown in FIG. Is transported to and from a preliminary exhaust position that forms the lower part of The new sample S, which is held in the sample holder H, is placed on the sample exchanger 9 by manual or automatic transfer so as to be fitted into the fitting hole 23a of the moving plate 23 of the sample exchanger 9, and In operation, they are sequentially delivered to the sample cup 10 and carried to the preliminary exhaust chamber 3. The sample holder H holding the measured sample S is supported by the sample cup 10, and the sample exchange 9
Through the exchange hole 21a.

【0028】試料ホルダHが導出された試料カップ10
の保守・点検を行う場合、図3に示す試料交換機9の摘
み部34を摘んで、試料交換機9を、二点鎖線で示すよ
うに回動させて、試料搬入口20を開放する。このと
き、移動板23を回転させる駆動機38を含む回転駆動
機構もベース板21とともに上方へ回動するので、試料
交換室35の内部には大きなスペースが生じる。この状
態で、工具を用いて、図4(a)に示す試料カップ10
の下部のねじ体66を緩め、手で試料カップ10を昇降
台41上で垂直軸心回りに回転させて、図5に示す着脱
用孔65の大径貫通部65aをねじ体66に合わせ、試
料カップ10を上方へ抜き出す。こうして取り外された
試料カップ10を装置外部で清掃する。なお、試料カッ
プ10を昇降台41に取り付けたままで清掃してもよ
い。このように、試料交換機9を移動させて試料搬入口
20を開放できるから、試料カップ10の保守・点検が
容易となる。
The sample cup 10 from which the sample holder H has been drawn out
When the maintenance / inspection is performed, the knob 34 of the sample exchanger 9 shown in FIG. 3 is pinched, and the sample exchanger 9 is rotated as shown by a two-dot chain line to open the sample entrance 20. At this time, the rotation driving mechanism including the driving device 38 for rotating the moving plate 23 also rotates upward together with the base plate 21, so that a large space is created inside the sample exchange chamber 35. In this state, the sample cup 10 shown in FIG.
5 is loosened, and the sample cup 10 is rotated about the vertical axis on the elevating table 41 by hand, so that the large-diameter through-hole 65a of the attaching / detaching hole 65 shown in FIG. Withdraw the sample cup 10 upward. The sample cup 10 thus removed is cleaned outside the apparatus. The cleaning may be performed while the sample cup 10 is attached to the elevating table 41. As described above, since the sample exchange 9 can be moved to open the sample carry-in port 20, the maintenance and inspection of the sample cup 10 becomes easy.

【0029】清掃が済んだ試料カップ10を昇降台41
に取り付ける際は、図4(a)に示す回転軸61の連結
溝62を駆動機42の駆動軸43の連結突起に嵌合させ
ながら、試料カップ10の嵌合孔11eを移動台41の
嵌合用突起41aに嵌め込む。こうして、試料カップ1
0を昇降台41に中心合わせした状態で、カップ本体1
1を垂直軸心の回りに回転させて、図5に示す着脱用孔
65の大径貫通部65aをねじ体66の頭部66bに挿
通させ、試料カップ10を移動台41に載置する。さら
に、試料カップ10を回転させて、幅の狭い長溝締着部
65bにねじ体66を入り込ませ、ねじ体66を工具で
締めつけて試料カップ10を昇降台41に固定する。
The cleaned sample cup 10 is placed on the lift 41
4A, the fitting groove 11e of the sample cup 10 is fitted to the movable table 41 while the connecting groove 62 of the rotating shaft 61 shown in FIG. Fit into the joint projection 41a. Thus, sample cup 1
0 with the cup body 1
5 is rotated about the vertical axis, the large-diameter through-hole 65 a of the mounting hole 65 shown in FIG. 5 is inserted through the head 66 b of the screw body 66, and the sample cup 10 is placed on the movable table 41. Further, the sample cup 10 is rotated so that the screw body 66 is inserted into the narrow narrow groove fastening portion 65b, and the screw body 66 is tightened with a tool to fix the sample cup 10 to the lift table 41.

【0030】ここで、複数の試料カップ10を用意し
て、保守・点検の際に試料カップ10を交換すれば、分
析業務を中断することなく、次の分析作業に移れる。し
たがって、保守・点検作業による分析業務の中断時間が
なくなり、作業能率が一層向上する。
Here, if a plurality of sample cups 10 are prepared and the sample cups 10 are replaced at the time of maintenance and inspection, the next analysis operation can be performed without interrupting the analysis work. Therefore, there is no interruption time of the analysis work due to the maintenance / inspection work, and the work efficiency is further improved.

【0031】なお、上記実施形態では、蛍光X線分析装
置について説明したが、本発明の試料交換機は、回折X
線分析装置など、他のX線分析装置にも使用できる。
In the above embodiment, the X-ray fluorescence analyzer has been described.
It can be used for other X-ray analyzers such as a X-ray analyzer.

【0032】[0032]

【発明の効果】本発明の請求項1に係る発明によれば、
試料交換機を移動させることによって試料搬入口が開放
されるから、試料カップの保守・点検を容易に行なうこ
とができる。また、試料カップを搬送手段に対して着脱
自在とした場合、試料カップを取り外した状態で保守・
点検作業を一層容易に行うことができる。
According to the first aspect of the present invention,
Since the sample entrance is opened by moving the sample exchanger, maintenance and inspection of the sample cup can be easily performed. If the sample cup is made detachable with respect to the transport means, maintenance and maintenance should be performed with the sample cup removed.
Inspection work can be performed more easily.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態に係るX線分析装置の概略
を示す縦断面図である。
FIG. 1 is a longitudinal sectional view schematically showing an X-ray analyzer according to one embodiment of the present invention.

【図2】同X線分析装置の試料交換機を示す平面図であ
る。
FIG. 2 is a plan view showing a sample exchanger of the X-ray analyzer.

【図3】図2のIII−III線断面図である。FIG. 3 is a sectional view taken along line III-III of FIG. 2;

【図4】同X線分析装置の試料カップの昇降台への装着
状態を示す断面図である。
FIG. 4 is a cross-sectional view showing a state where the sample cup of the X-ray analyzer is mounted on a lifting table.

【図5】同試料カップと昇降台の連結構造を示す要部の
斜視図である。
FIG. 5 is a perspective view of a main part showing a connection structure between the sample cup and a lift table.

【図6】同X線分析装置の分析室および予備排気室を示
す断面図である。
FIG. 6 is a sectional view showing an analysis chamber and a preliminary exhaust chamber of the X-ray analyzer.

【符号の説明】[Explanation of symbols]

1…外装パネル、2…分析室、3…予備排気室、6…X
線管、9…試料交換機、10…試料カップ、20…試料
搬入口、21…ベース板、21a…交換孔、23…移動
板、38…交換用の駆動機、40…搬送手段、41…昇
降台、42…スピン用モータ、H…試料ホルダ、S…試
DESCRIPTION OF SYMBOLS 1 ... Exterior panel, 2 ... Analysis room, 3 ... Preliminary exhaust room, 6 ... X
Wire tube, 9 ... Sample exchange machine, 10 ... Sample cup, 20 ... Sample entrance, 21 ... Base plate, 21a ... Exchange hole, 23 ... Movement plate, 38 ... Driver for exchange, 40 ... Transportation means, 41 ... Table, 42 ... Spin motor, H ... Sample holder, S ... Sample

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 X線分析装置の試料搬入口に配置され
て、交換孔を有し、試料を保持する試料ホルダを前記交
換孔からX線分析装置内の予備真空室の一部を形成する
試料カップに受け渡すとともに、前記試料カップから前
記交換孔を通して導出された試料ホルダを受け取る試料
交換機であって、 前記試料搬入口を開閉するように移動自在に設定されて
いるX線分析装置における試料交換機。
1. A sample holder which is arranged at a sample carrying-in port of an X-ray analyzer and has an exchange hole and holds a sample, forms a part of a preliminary vacuum chamber in the X-ray analyzer from the exchange hole. A sample exchange device that receives a sample holder drawn out of the sample cup through the exchange hole while transferring the sample holder to the sample cup, wherein the sample in the X-ray analyzer is movably set to open and close the sample loading port. switch.
【請求項2】 請求項1において、前記交換孔を有する
ベース板と、このベース板に対して移動自在に設定され
て複数の試料ホルダをベース板上で移動させる移動板
と、この移動板を駆動して試料ホルダを前記交換孔に対
応する位置に移動させる駆動機とを備えているX線分析
装置における試料交換機。
2. The method according to claim 1, wherein the base plate having the exchange hole, a movable plate that is set to be movable with respect to the base plate and moves a plurality of sample holders on the base plate, And a drive for driving the sample holder to a position corresponding to the exchange hole.
【請求項3】 請求項1または2において、X線分析装
置は、前記試料ホルダを支持する試料カップを、試料に
X線照射を行う分析室に隣接した予備排気室の一部を形
成する予備排気位置と前記試料搬入口に臨む交換位置と
の間で搬送する搬送手段を備えており、前記試料カップ
が、前記搬送手段に対して着脱自在に設定されているX
線分析装置における試料交換機。
3. The X-ray analyzer according to claim 1, wherein the sample cup supporting the sample holder forms a part of a preliminary exhaust chamber adjacent to an analysis chamber for irradiating the sample with X-rays. X is provided with a transport unit for transporting between an exhaust position and an exchange position facing the sample loading port, wherein the sample cup is detachably set to the transport unit.
Sample changer in X-ray analyzer.
JP16682199A 1999-06-14 1999-06-14 Sample exchange in X-ray analyzer Expired - Fee Related JP3247665B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16682199A JP3247665B2 (en) 1999-06-14 1999-06-14 Sample exchange in X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16682199A JP3247665B2 (en) 1999-06-14 1999-06-14 Sample exchange in X-ray analyzer

Publications (2)

Publication Number Publication Date
JP2000356608A true JP2000356608A (en) 2000-12-26
JP3247665B2 JP3247665B2 (en) 2002-01-21

Family

ID=15838301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16682199A Expired - Fee Related JP3247665B2 (en) 1999-06-14 1999-06-14 Sample exchange in X-ray analyzer

Country Status (1)

Country Link
JP (1) JP3247665B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022093242A (en) * 2020-12-11 2022-06-23 東莞理工学院 Sample environment installations easily converting product to be measured
CN114778169A (en) * 2022-06-23 2022-07-22 季华实验室 Sampling device and sampling method

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JP3928014B2 (en) * 2004-01-23 2007-06-13 理学電機工業株式会社 X-ray fluorescence analyzer

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022093242A (en) * 2020-12-11 2022-06-23 東莞理工学院 Sample environment installations easily converting product to be measured
JP7116505B2 (en) 2020-12-11 2022-08-10 東莞理工学院 Sample environment equipment for easy conversion of the product under test
CN114778169A (en) * 2022-06-23 2022-07-22 季华实验室 Sampling device and sampling method

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