JP2000346774A - Sample support apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a sample support apparatus capable of simply adjusting the horizontal posture of a long sample when the hardness of the long sample is measured by a hardness tester and capable of enhancing the measuring accuracy of a hardness test by reducing the generation of bending in the long sample by the pressing due to a pressure element. SOLUTION: When the hardness of a long sample S is measured by a hardness tester 1 for measuring the hardness of a sample by pressing a pressure element to the surface of the sample, a sample support apparatus 10 is used in order to support the surface to be measured of the long sample S in an almost horizontal state and has a sample stand 12 for supporting the measuring part of the long sample S and a horizontal posture adjusting means 13 for supporting the long sample S in cooperation with the sample stand 12 and changing the supporting height of the long sample S to adjust the horizontal posture of the long sample S. The upper surface of the sample stand 12 is formed into a curved surface changed in height in the longitudinal direction of the long sample S placed on the sample stand 12.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample support device used to support a surface of a long sample in a substantially horizontal state when measuring the hardness of a long sample using a hardness tester. About.

[0002]

2. Description of the Related Art Conventionally, when the hardness of a long sample is measured by a hardness tester that measures the hardness of the sample by pressing an indenter against the surface of the sample, the surface to be measured of the long sample is generally measured. In order to support the sample in a horizontal state, for example, a sample support device as shown in FIG. 6 is generally used.

FIG. 6 is a front view showing an example of a configuration of a conventional sample supporting device. In FIG. 6, 1 is a hardness tester, 2 is an indenter, 50 is a sample support device, and S is a long sample. The sample support device 50 includes a sample table 51 that supports a measurement portion of the long sample S,
1 and a horizontal attitude adjusting means 13 which adjusts the horizontal attitude of the long sample S by supporting the long sample S and changing the height at which the long sample S is supported in cooperation with the first sample S.
With this sample supporting device 50, the long sample S is placed in a horizontal posture such that the surface to be measured (upper surface) is kept within an angle range of ± 1 degree with respect to the horizontal which is assumed to have no influence on the hardness. Adjustments are made.

[0004]

However, in the above-described conventional sample supporting device 50, the horizontal attitude of the long sample S is adjusted by the horizontal attitude adjusting means 13 while the operator visually confirms it. The fine adjustment was not easy. In addition, since there was no index for determining whether or not the surface to be measured of the long sample was kept in the above-mentioned angle range, the determination often depended on the can. Therefore, there is a possibility that the hardness test may be performed in a state where the measured surface of the long sample S is not kept in the above-mentioned angle range.

[0005] In the conventional sample supporting apparatus 50,
As shown in FIG. 7, when the long sample S is placed on the sample table 51 in a state where the lower surface is inclined with respect to the horizontal (that is, the long sample S and the sample table 51 are not in close contact with each other), Sample table 51
Is separated from the support point c1 for supporting the long sample S and the action point c2 at which the indenter 2 presses the long sample S, and the long sample S is bent by the pressing by the indenter 2. There was something. In that case, the hardness of the long sample S was changed due to the bending, and the hardness of the long sample S could not be measured accurately. Therefore, for example, as shown in FIG. 8, it is conceivable to reduce the size of the sample table 51 so that the support point c1 and the action point c2 are close to each other.
In this case, the inclination angle of the long sample S with respect to the sample table 51,
That is, the inclination angle of the long sample S with respect to the horizontal is difficult to understand, and there is a problem that it is difficult to adjust the horizontal posture of the long sample S.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and when the hardness of a long sample is measured by a hardness tester, the horizontal posture of the long sample is easily adjusted. It is an object of the present invention to provide a sample supporting apparatus capable of reducing the bending of a long sample due to pressing by an indenter and improving the measurement accuracy of a hardness test.

[0007]

Means for Solving the Problems To solve the above-mentioned problems, the invention according to claim 1 uses a hardness tester (1) for measuring the hardness of a sample by pressing an indenter (2) against the surface of the sample. When measuring the hardness of a long sample, a sample support device (10) used to support a surface to be measured of the long sample in a substantially horizontal state, wherein a measurement portion of the long sample is A supporting stage (12), supporting the long sample in cooperation with the sample stage, and adjusting a horizontal attitude of the long sample by changing a height at which the long sample is supported. A horizontal attitude adjusting means (13), wherein the upper surface of the sample stage has a curved surface shape whose height changes in the longitudinal direction of the long sample placed on the sample stage. .

According to the first aspect of the present invention, since the upper surface of the sample stage has a curved shape whose height changes in the longitudinal direction of the long sample placed on the sample stage, When the sample table is placed on the sample table with the lower surface inclined with respect to the horizontal, the support point where the sample table supports the long sample and the action point where the indenter presses the long sample are conventionally It will be possible to get closer. Therefore, it is possible to reduce the occurrence of bending of the long sample due to the pressing by the indenter, thereby improving the measurement accuracy of the hardness test.

Here, the long sample also includes a sample in which the position of the center of gravity is separated from the measurement portion for measuring hardness.

According to a second aspect of the present invention, in the sample supporting device according to the first aspect, when the inclination of the lower surface of the long sample is within a predetermined angle range with respect to the horizontal, The curvature of the upper surface of the sample table is set so that a gap is formed between both ends of the table in the longitudinal direction and the long sample.

According to the second aspect of the present invention, when the inclination of the lower surface of the long sample is within the range of a predetermined angle with respect to the horizontal, the both ends of the sample table in the longitudinal direction and the length of the sample table are long. Since the curvature of the upper surface of the sample table is set so that a gap is formed between the sample and the long sample, the inclination of the lower surface of the long sample is within a predetermined angle range with respect to the horizontal. Whether or not there is a gap can be determined based on whether or not gaps are formed between both ends of the sample table in the longitudinal direction and the long sample. Therefore, in the case of a sample in which the upper surface that is the measured surface and the lower surface that abuts on the sample stage are parallel, the inclination of the measured surface of the long sample is within a range of a predetermined angle with respect to the horizontal. Can be easily determined. Therefore, it is easy to adjust the horizontal attitude of the long sample.

Specifically, when the inclination of the lower surface of the long sample is within a range of a predetermined angle with respect to the horizontal, each of the long sample and the long sample is disposed between both ends in the longitudinal direction of the sample table. In order for the gap to be formed, for example, the curvature of the upper surface of the sample table may be set so that the inclination of the tangent line at each of both ends in the longitudinal direction of the sample table is the predetermined angle with respect to the horizontal. Good.

[0013]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to FIGS.

FIG. 1 is a front view showing an example of the configuration of a sample support device according to the present invention. FIG. 2 is a front view showing a sample stage included in the sample support device of FIG. FIG. 3 is a front view showing a state where a long sample is placed on the sample stage of FIG. 2,
(A) when the inclination of the lower surface of the long sample is within a predetermined angle θ with respect to the horizontal, (b) when the inclination of the lower surface of the long sample is equal to or more than the predetermined angle θ with respect to the horizontal, Are respectively shown. In FIG. 1, 1 is a hardness tester, 2
Denotes an indenter, 10 denotes a sample supporting device, and S denotes a long sample.

The sample supporting apparatus 10 of this embodiment is provided with a hardness tester 1 for measuring the hardness of a sample by pressing an indenter 2 against the surface of the sample. It is used when measuring the height. This sample support device 1
0 is a square screw 11 and a square screw 1 as shown in FIG.
A sample stage 12 provided at the upper end of the sample stage 1 for supporting a measurement portion of the long sample S, and supporting the long sample S in cooperation with the sample stage 12 and changing a height for supporting the long sample S; It is roughly constituted by a horizontal attitude adjusting means 13 for adjusting the horizontal attitude of the long sample S, and a balance weight 14 for balancing the unbalanced load of the long sample S.

The square screw 11 is erected immediately below the indenter 2 and
The sample table 12 can be moved up and down so that the height of the sample table 12 can be adjusted.

The sample table 12 is arranged at a position facing the tip of the indenter 2. The upper surface of the sample stage 12 has a curved shape whose height changes in the longitudinal direction (the left-right direction in FIG. 1) of the long sample S, and its curvature is, as shown in FIG.
The inclination of the tangent lines b1 and b2 at both ends a1 and a2 in the longitudinal direction of the sample table 12 is a predetermined angle θ with respect to the horizontal.
(For example, once). Therefore, as shown in FIG. 3A, when the inclination of the lower surface of the long sample S is within the range of the predetermined angle θ with respect to the horizontal, the distance between the both ends a1 and a2 of the sample table 12 is For example, while contacting the long sample S at a3, gaps are respectively formed between both ends a1, a2 of the sample table 12 and the long sample S, and as shown in FIG. If the inclination of the lower surface of the sample S is not less than the predetermined angle θ with respect to the horizontal, the sample table 1
At one end (either a1 or a2) of the sample table 2, the long sample S is brought into contact, so that a gap is formed only at one end of the sample table 12. Therefore, whether or not the inclination of the lower surface of the long sample S is within the range of the predetermined angle θ with respect to the horizontal is determined by the contact position between the long sample S and the sample table 12 and both ends a1, The determination can be made based on the gap formed in a2. Further, as shown in FIG. 1, a long sample S in which the upper surface which is the surface to be measured and the lower surface which abuts on the sample stage 12 are parallel.
In this case, it is possible to easily determine whether or not the inclination of the measured surface of the long sample S is within the range of the predetermined angle θ with respect to the horizontal. That is, in the case of such a long sample S, the contact position between the long sample S and the sample table 12 or the gap formed at both ends a1 and a2 of the sample table 12 is determined by the long sample S.
Is an index for determining whether or not the surface to be measured is kept within the range of the predetermined angle θ, and the horizontal posture can be easily adjusted.

As shown in FIG. 1, the horizontal attitude adjusting means 13 includes a pair of horizontal arms 13a, 13a mounted so as to sandwich the square screw 11 back and forth, and the horizontal arms 13a, 13a.
The movable table 13b is provided with a movable table 13b that can move horizontally along the movable table 13a, and a support table 13c that can move vertically with respect to the movable table 13b and that can support one end of the long sample S. That is, the horizontal attitude adjusting means 13 changes the height at which the long sample S is supported by moving the support table 13c in the vertical direction, adjusts the horizontal attitude of the long sample S, and moves the movable table 13b. Is horizontally moved along the horizontal arms 13a, 13a to adjust the horizontal position at which the long sample S is supported. That is, the horizontal position and height of the long sample S that can be supported can be adjusted in accordance with the shape and size of the sample S.

The balance weight 14 is connected to the horizontal arm 13
a, 13a, and is arranged on the other end side of the movable base 13b. By adjusting the mounting position and mass of the balance weight 14 based on the mass and the center of gravity of the long sample S, the hardness tester 1 is balanced against the unbalanced load of the long sample S. be able to.

When the hardness of the long sample S is measured using the sample supporting device 10 having the above-described configuration, the long sample S is set before setting the long sample S in the sample supporting device 10. The height of the sample table 12 and the mass of the balance weight 14 are adjusted based on the length and shape, the position of the measurement portion, and the like. The horizontal position and height of the support 13c and the horizontal position of the balance weight 14 are roughly adjusted. After each adjustment is completed, the measurement portion of the long sample S is placed on the sample table 12 and the other end of the measurement portion is supported on the support 13.
c. Next, the movable table 13b is moved to the horizontal arms 13a and 13a so that the long sample S can be stably supported.
By moving horizontally along 3a, the horizontal position of the support 13c is adjusted, and the horizontal position of the balance weight 14 is finely adjusted. Then, based on the contact position between the long sample S and the sample table 12 and the gaps formed at both ends a1 and a2 of the sample table 12, the measured surface of the long sample S is within the range of the predetermined angle θ. Is determined, if the result of the determination is within the range of the predetermined angle θ, the support base 13c is fixed at that height. Fine-tune the height. In this way, the horizontal attitude of the long sample S is finely adjusted so that the surface to be measured of the long sample S is within the range of the predetermined angle θ. The hardness measurement of the sample S is started.

According to the sample supporting apparatus 10 of this embodiment, the upper surface of the sample table 12 is curved so that the height changes in the longitudinal direction of the long sample S. When the sample is placed on the sample table 12 in a state inclined with respect to the horizontal, the support point at which the sample table 12 supports the long sample S and the indenter 2 of the hardness tester 1 press the long sample S. Operating point can be brought closer than before. Therefore, it is possible to reduce the occurrence of the bending of the long sample S due to the pressing by the indenter 2, thereby improving the measurement accuracy of the hardness test. In addition, when the inclination of the lower surface of the long sample S is within a range of a predetermined angle θ with respect to the horizontal, both ends a1 of the sample table 12 in the longitudinal direction,
Since the curvature of the upper surface of the sample stage 12 is set so that a gap is formed between each of the a2 and the long sample S,
The inclination of the lower surface of the long sample S is the predetermined angle θ with respect to the horizontal.
Can be determined based on whether or not gaps are formed between both ends a1 and a2 of the sample table 12 in the longitudinal direction and the long sample S, respectively. . Therefore, in the case of a long sample in which the upper surface, which is the surface to be measured, and the lower surface in contact with the sample table 12 are parallel, the inclination of the surface to be measured of the long sample is within the range of the predetermined angle θ with respect to the horizontal. Whether or not there is can be easily determined. Therefore, it becomes easy to adjust the horizontal attitude of the long sample.

It should be noted that the present invention is not limited to the sample supporting device 10 shown in this embodiment, but can be applied to other sample supporting devices. For example, the horizontal attitude adjusting means can adjust the horizontal attitude of the long sample S by supporting the long sample S in cooperation with the sample table 12 and changing the height at which the long sample S is supported. Any configuration is possible if possible. If the mass of the long sample S is sufficiently smaller than the mass of the hardness tester 1, the balance weight 14 can be omitted.

Further, in this embodiment, as the long sample, the long sample S in which the upper surface which is the surface to be measured and the lower surface in contact with the sample table 12 are parallel is illustrated.
As shown in the figure, a long sample S1 whose upper surface and lower surface are not parallel
It is also possible to apply to That is, the sample stage 12
Has a curved surface shape whose height changes in the longitudinal direction of the long sample S1, so that even if the long sample S1 has an upper surface and a lower surface that are not parallel, the upper surface, which is the surface to be measured, is substantially horizontal. It is possible to support in a proper state. In the case of such a sample, the curvature of the upper surface of the sample stage 12 is set based on the angle between the upper surface and the lower surface of the long sample S.

In the case where the long sample S is substantially cylindrical, for example, by forming a sample stage as shown in FIG. 5, the long sample S is fixed in a state where it is positioned so as not to roll. It is possible. In FIG. 5, the sample stage 22 includes a pair of curved portions 22a, 22a.
b. The curved portion 22a has a substantially semicircular cross-sectional shape, and is formed so that its outer diameter becomes smaller as approaching both end surfaces. That is, the curved portion 2
2a has a curved surface shape whose height changes in the longitudinal direction of the long sample S, and the contour of the upper surface viewed from the front (A direction in FIG. 5) corresponds to the sample stage 12 shown in FIGS. Similarly, it has an arc shape. Therefore, the curved portion 22a and the curved portion 22
The long sample S can be placed on the concave portion 22c formed between the two positions a. In this state, the long sample S can be fixed while being positioned so as not to roll.

[0025]

According to the first aspect of the present invention, since the upper surface of the sample stage is a curved surface whose height changes in the longitudinal direction of the long sample placed on the sample stage, When the lower surface of the long sample is placed on the sample table in a state inclined with respect to the horizontal, the support point where the sample table supports the long sample, and the action point where the indenter presses the long sample, It becomes possible to approach closer than before. Therefore, it is possible to reduce the occurrence of bending of the long sample due to the pressing by the indenter, thereby improving the measurement accuracy of the hardness test.

According to the second aspect of the present invention, when the inclination of the lower surface of the long sample is within the range of a predetermined angle with respect to the horizontal, the both ends of the sample table in the longitudinal direction are elongated. Since the curvature of the upper surface of the sample stage is set so that a gap is formed between the sample and the sample, the inclination of the lower surface of the long sample is within a predetermined angle range with respect to the horizontal. It can be determined whether or not gaps are formed between both ends of the sample table in the longitudinal direction and the long sample. Therefore, in the case of a sample in which the upper surface that is the measured surface and the lower surface that abuts on the sample stage are parallel, the inclination of the measured surface of the long sample is within a range of a predetermined angle with respect to the horizontal. Can be easily determined. Therefore, it is easy to adjust the horizontal attitude of the long sample.

[Brief description of the drawings]

FIG. 1 is a front view showing a configuration example of a sample support device according to the present invention.

FIG. 2 is a front view showing a sample stage included in the sample support device of FIG.

3A and 3B are front views showing a state where a long sample is placed on the sample stage of FIG. 2; FIG. 3A shows a case where the inclination of the lower surface of the long sample is within a range of a predetermined angle θ with respect to the horizontal; (B), when the inclination of the lower surface of the long sample is not less than a predetermined angle θ with respect to the horizontal,
Are respectively shown.

FIG. 4 is a front view showing a state in which a long sample whose upper surface and lower surface are not parallel is supported in the sample support device of FIG. 1;

FIG. 5 is a perspective view showing one configuration example of a sample stage used when supporting a substantially columnar sample.

FIG. 6 is a front view showing a configuration example of a conventional sample support device.

FIG. 7 is a front view showing a sample stage included in the sample support device of FIG. 6;

8 is a front view of the sample stage when the upper surface of the sample stage of FIG. 7 is reduced.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Hardness tester 2 Indenter 10 Sample support device 11 Square screw 12 Sample stand 13 Horizontal attitude adjustment means 14 Balance weight

Claims (2)

[Claims] In a case where the hardness of a long sample is measured by a hardness tester for measuring the hardness of the sample by pressing an indenter against the surface of the sample, the surface to be measured of the long sample is substantially horizontal. A sample support device used to support the long sample, and a sample table that supports a measurement portion of the long sample, and cooperates with the sample table to support the long sample, Horizontal attitude adjusting means for adjusting a horizontal attitude of the long sample by changing a supporting height, wherein an upper surface of the sample stage is in a longitudinal direction of the long sample placed on the sample stage. A sample supporting device having a curved surface with a variable height. 2. When the inclination of the lower surface of the long sample is within a range of a predetermined angle with respect to the horizontal, a distance between both ends of the sample table in the longitudinal direction and the long sample is set. 2. The sample support device according to claim 1, wherein the curvature of the upper surface of the sample stage is set so that a gap is formed.