JP2000314687A - Sampling probe and probe-washing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a sampling probe capable of removing dust of a filter efficiently and surely, capable of increasing the charge number usable by the same probe to a large extent and capable of reducing replacing frequency. SOLUTION: A (sampling) probe 1 is constituted by providing a cylindrical filter 2, the primary gas flow channel 3 formed to the outer periphery of the filter 2 to allow gas before passing through the filter 2 to flow and the secondary gas flow channel 4 formed to the inner periphery of the filter 2 not only to allow the gas passed through the filter 2 to flow but also to send purge gas to the inner periphery of the filter 2 to a probe main body 1a. A washing nozzle 5 performing the purge for washing the filter is arranged to the outer periphery of the probe main body 1a so as to allow the purge gas to become spiral toward the upstream side of the primary gas flow channel 3.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sampling probe for sampling gas generated from a converter or the like, and more particularly to efficiently and reliably remove dust adhering to a filter provided in the probe. The present invention relates to a sampling probe that can be used.

[0002]

2. Description of the Related Art For example, gas generated at the time of refining in a converter has flammability and is generally recovered and reused. The generated gas is collected by a hood at the upper part of the converter, guided to a dust collecting device by a flue, and after removing dust, is collected by a gas holder. However, since the gas component changes depending on the reaction state of the converter, only the gas component is analyzed by analyzing the gas component sequentially, and the other gas is discharged.

[0003] The gas is subjected to a component analyzer to analyze the components. However, since the response of the component analyzer requires a certain amount of time, the place where the gas is sampled must be as close as possible to the gas generating source. Therefore, the gas to be sampled is a gas before the dust removal treatment, and therefore contains a large amount of dust.

If the gas introduced into the component analyzer does not contain dust, that is, a so-called purified gas, a failure such as clogging of the nozzle of the component analyzer occurs. It has a filter for

However, in the conventional probe, the filter is clogged in about 5 minutes, and the clogging of the filter reduces the sampling flow rate. Therefore,
One charge (Blowing time per converter in the converter = about 30
It is impossible to perform sampling of (minute) with one probe. Therefore, a plurality of probes are installed, and sampling and filter cleaning are alternately repeated.

In cleaning the filter, dust adhering to the filter is supplied with a compressed gas from the inner surface to the outer surface of the filter by a so-called purge, so that a gas flow path before the dust removing surface of the filter, that is, a gas sampling port in the probe is used. The dust is discharged to a flue together with a compressed gas for purging (hereinafter referred to as a purge gas).

Japanese Patent Application Laid-Open No. Hei 10-274606 discloses a probe 51 as shown in FIG. The probe 51 includes a filter 52 for removing dust adhering to the filter 52 in the probe body 51a when the gas flows from the primary gas channel 53 to the secondary gas channel 54.
A perforated nozzle 55 is inserted into the inner surface, and a purge gas is spouted at right angles to the filter 52 to enhance the cleaning effect.

[0008]

However, the above-mentioned probe is effective when the amount of dust adhering to the filter is small or when the dust particles are fine.
Since the purge gas is applied to the dust through the filter, when the entire surface of the filter is covered with the dust, there is a problem that the purge pressure applied to the dust decreases and the dust cannot be sufficiently removed.

The dust removed from the filter is
The dust is discharged from the sampling port to the outside of the probe, but if only the purge from the inner surface of the filter is used, the discharging effect of the removed dust is only its own weight. There is also a problem that dust accumulates in the portion where the sampling has occurred and eventually blocks the sampling port.

[0010] Even if the probe is used by repeating sampling and washing alternately, dust is gradually accumulated in the filter because the filter is not completely washed, and dust removed from the filter is removed from the sampling port. Dust accumulates in the curved portion of the sampling port because it is not completely discharged out of the probe. As a result, when the used charge reaches a certain level, the filter is completely clogged with dust, the sampling flow rate is reduced, and sampling becomes impossible.

Further, the conventional probe has a problem that the operation of the converter must be stopped every time the probe is replaced, which is inefficient. Further, since the installation site is in a very high temperature and in a bad state in which a large amount of dust floats, the replacement work of the probe is very severe for the operator.

The present invention has been made to solve the above-mentioned problem, and it is possible to efficiently and reliably remove dust from a filter, and to greatly increase the number of charges that can be used with the same probe. It is an object of the present invention to provide a sampling probe that can reduce the frequency of replacement.

[0013]

In order to achieve the above object, the present invention uses a secondary gas flow path for sending a purge gas to an inner surface of a filter, and further includes a secondary gas flow passage on the outer periphery of the probe body for cleaning the filter. The cleaning nozzle for performing the purge is arranged and provided so that the purge gas spirals toward the upstream side of the primary gas flow path. By doing this,
Since dust attached to the outer surface of the filter can be blown off, the dust can be reliably pushed out from the inner surface of the filter, and the pushed-out dust can be efficiently removed.

[0014] To clean the probe of the present invention, the dust attached to the outer surface of the filter is removed by purging from the cleaning nozzle, and then the dust clogged in the filter is purged by purging from the secondary gas flow path. While extruding to the outer surface of the filter, the extruded dust is
It is blown off to the next gas flow path. By doing so, first, dust adhering to the outer surface of the filter is blown off, so that the injection pressure of the purge gas from the secondary gas passage can be reduced, and the dust can be reliably removed.

[0015]

BEST MODE FOR CARRYING OUT THE INVENTION A sampling probe of the present invention comprises a cylindrical filter, a primary gas passage formed on the outer periphery of the filter, and through which gas before passing through the filter flows.
A secondary gas flow path formed on the inner periphery of the filter, through which gas passing through the filter flows, and for sending a purge gas to the inner periphery of the filter, is provided on the probe main body. The cleaning nozzle for purging is disposed and arranged such that the purge gas spirals toward the upstream side of the primary gas flow path.

According to the above configuration, the sampling probe of the present invention has a cleaning nozzle in which the purge gas injected toward the outer surface of the filter is spiraled toward the upstream side of the primary gas flow path. Because it was arranged and provided
When the purge gas is jetted from the cleaning nozzle, the purge gas spirally flows in the probe body, that is, flows uniformly over the entire outer periphery of the filter, and dust adhering to the outer surface of the filter can be effectively removed.

Further, the purge gas from the cleaning nozzle flows toward the primary gas flow path, so that the dust removed from the filter can be easily and reliably discharged to the outside of the probe main body, so that the primary gas flow path is improved. No dust accumulates at the curved portion of the first gas passage, and therefore the primary gas flow path is not blocked with dust.

Further, in the probe cleaning method of the present invention, when cleaning the above-described sampling probe of the present invention, dust attached to the outer surface of the filter by purging from the cleaning nozzle is blown off to the primary gas flow path, and thereafter, And purging the dust clogged by the filter from the secondary gas flow channel to the outer surface of the filter, and blowing the pushed dust out to the primary gas flow channel by the cleaning nozzle.

According to the probe cleaning method of the present invention, even if the entire surface of the filter is covered with dust, dust attached to the outer surface of the filter is removed by the cleaning nozzle. When the dust clogged in the filter is pushed out, the purge pressure applied to the dust is not reduced, so that the dust can be sufficiently removed. Since the gas is blown off to the primary gas passage by the purge from the dust, dust can be efficiently removed.

Further, since the purging effect from the cleaning nozzle is large, it is not necessary to newly provide a nozzle inside the filter for purging as in the prior art. Therefore, the secondary gas flow path is used for sampling and cleaning. And the piping equipment can be simplified.

[0021]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A sampling probe and a probe cleaning method according to the present invention will be described below with reference to FIGS. FIG. 1 shows a schematic configuration of a sampling probe (hereinafter, referred to as a probe) of the present invention. FIG. 2 shows the arrangement of the probe of the present invention. FIG. 3 shows equipment used for cleaning the probe of the present invention. FIG. 4 shows an example of cleaning the probe of the present invention.

The probe 1 of the present invention is for sampling a gas generated from, for example, a converter P or the like, and is formed on a cylindrical filter 2 and an outer periphery of the filter 2. A primary gas flow path 3 through which the gas before passing passes, and a secondary gas flow path formed on the inner periphery of the filter 2 for passing the gas passing through the filter 2 and sending the purge gas to the inner periphery of the filter 2 4 are provided on the probe main body 1a.

In the probe 1 of the present invention, a cleaning nozzle 5 for purging gas when cleaning the filter 2 is provided on the outer periphery of the probe main body 1 a with the purge gas directed to the upstream side of the primary gas flow path 3. It is provided in an inclined shape so that it can be spirally ejected. In the present embodiment, for example, three cleaning nozzles 5 are provided at predetermined intervals on the outer circumference of the probe main body 1a. In FIG. 1, the flow of the purge gas from the cleaning nozzle 5 is indicated by a dotted line in the secondary gas flow path 4.
The flow of the purge gas from is indicated by broken lines.

As shown in FIG. 2, the gas generated during the refining in the converter P is supplied to a hood P1 provided in the upper part of the converter.
After being collected by a flue P2 and guided to a dust collector P4 by a flue P2 to remove dust, and then collected by a gas holder (not shown). The probe 1 of the present invention is provided with a plurality of, for example, two in the present embodiment, in the middle of the path of the flue P2, and collects a gas containing a large amount of dust in the flue P2.
The dust is removed by the filter 2 inside.

The gas containing a large amount of dust is supplied to one of the probes 1 by a primary gas passage 3 connected to the flue P2, a filter 2 in the probe body 1a, and a secondary gas passage 4
And is sent to the analyzer 17 (see FIG. 3). At this time, the other probe 1 has been washed.

Regarding the usage of such a probe 1,
This will be described with reference to FIGS. 3 and 4
In FIG. 1, one probe 1 is referred to as a probe 1A and the other probe 1 is referred to as a probe 1B, and A or B is attached to the reference number of the corresponding member.

At this time, the probe 1A is sampling, and at this time, the valve 11A is closed and the valve 14A is closed. For example, the cleaning nozzle 5A (FIG. 1) is supplied from the inert gas cylinders 12A and 16 storing nitrogen gas or the like. 3 is not shown) and the purge gas is prevented from flowing into the probe 1A via the secondary gas flow path 4A. On the other hand, by opening the valve 13A, the probe 1A is pumped by the pump 15 to the analyzer 17 via the primary gas channel 3A, the filter 2 (not shown in FIG. 3), and the secondary gas channel 4A. Gas is led.

The probe 1B is being washed, and at this time, the valve 13B is closed first, whereby the analyzer 17B is closed.
Then, the valve 11B is opened, and the purge gas sent from the inert gas cylinder 12B is intermittently ejected from the cleaning nozzle 5B at, for example, 5 kgf / cm ² as shown in FIG. . As a result, dust attached to the outer surface of the filter 2 is blown off.

Subsequently, the valve 14B is opened, and the purge gas sent from the inert gas cylinder 16 is, for example, 4 kgf /
Injected from the secondary gas channel 4B in cm ² . This allows
Dust is pushed out to the outer surface of the filter 2B. Then, the dust pushed out to the outer surface of the filter 2B by the purge from the cleaning nozzle 5B already started is blown off to the primary gas flow path 3B.

Although the purge gas from the cleaning nozzle 5B can be jetted uniformly for a predetermined period of time, the effect is sufficient. However, if the jet is intermittently jetted as in the present embodiment, the inner surface of the filter 2B is better. Extrusion of dust from the air and blowing of dust to the primary gas flow path 3B are performed alternately, so that dust can be removed more effectively.

At this time, by supplying a purge gas having an appropriate pressure as described above from the cleaning nozzle 5B, a helical flow is reliably formed on the outer periphery of the filter 2B, and the dust pushed out to the outer surface of the filter 2B is also removed. The purge gas is blown off in the direction of the primary gas flow path 3B,
It is discharged from the primary gas passage 3B.

If sampling and washing are alternately performed by the probe 1A and the probe 1B for a predetermined time, for example, every five minutes as shown in FIG. 4, sampling can be continuously performed. When cleaning the probe 1A, the valve 13A is closed and the valve 1A is closed.
Open in the order of 1A and 14A. When sampling with the probe 1B, the valves 11B and 14B are closed and the valve 13B is opened.

By the way, two probes 51 shown in FIG. 5 are used as a conventional example, and washing and sampling are performed alternately every 5 minutes, and the probes 1A and 1B of the present invention are used.
Compared to the case where cleaning and sampling were alternately performed as shown in FIG. 4, the conventional probe 51 could not be sampled by about 250 charges, whereas the probe 1 of the present invention could not Sampling beyond charge was able to be performed.

As described above, the probe 1 of the present invention is used to purge the secondary gas flow path 4 to the inner surface of the filter 2, and the cleaning nozzle 5 is used to purge the secondary gas flow path 4 from the upstream side of the primary gas flow path 3. The purge gas is arranged so as to be spirally sprayed toward the filter 2 so that the purge gas flows uniformly spirally over the entire circumference of the outer surface of the filter 2, and the purge gas from the cleaning nozzle 5 is Since the dust flows toward the flow path 3, the dust removed from the outer surface of the filter 2 is easily discharged, and the dust does not accumulate in the curved portion of the filter 2 or the primary gas flow path 3.

Further, in the probe cleaning method of the present invention, when cleaning the probe 1 described above, the probe 1 is first purged from the cleaning nozzle 5 to blow off dust adhering to the outer surface of the filter 2 and then purged from the inner surface of the filter 2. Then, the dust clogged in the filter 2 is pushed out, and the pushed-out dust is further blown off to the primary gas passage 3 by the purge gas from the cleaning nozzle 5, so that the dust can be more effectively removed. .

The present invention is not limited to the above, and may be modified. For example, a plurality of cleaning nozzles 5 may be provided, or a plurality of cleaning nozzles 5 may be provided on the side of the secondary gas flow path 4 of the probe main body 1a. Is also good.

The injection pressure of the purge gas is not limited to the above, but the injection pressure of the purge gas from the secondary gas flow path 4 is smaller than the injection pressure of the purge gas from the cleaning nozzle 5. Is more preferably not so large. The reason for this is that if the injection pressure of the purge gas from the secondary gas flow path 4 is higher than the injection pressure of the purge gas from the cleaning nozzle 5, a spiral flow is less likely to be formed on the outer surface of the filter 2. .

In the above description, the sampling probe and the probe cleaning method of the present invention have been described by way of example in the case where they are employed when sampling gas generated during refining in a converter. However, the present invention is not limited to this. The present invention is also effective when applied to a general sampling process for sampling gas containing dust and impurities.

[0039]

As described above, the sampling probe of the present invention uses the secondary gas flow path for sending the purge gas to the inner surface of the filter, and further performs the purging for cleaning the filter on the outer periphery of the probe body. Nozzle is arranged so that the purge gas spirals toward the upstream side of the primary gas flow path, so that dust on the filter can be reliably removed, and the number of charges that can be used with the same probe is reduced. It can be greatly increased, and the frequency of replacement can be reduced. Further, since the secondary gas flow path can be used for sampling and cleaning, the piping equipment can be simplified.

Further, in the cleaning method of the present invention for cleaning the above-described probe, after purging from the cleaning nozzle to remove dust adhering to the outer surface of the filter, purging from the secondary gas passage and clogging the filter. While the extruded dust was pushed out to the outer surface of the filter, the extruded dust was blown off to the primary gas flow path by the cleaning nozzle.
Even if the injection pressure of the purge gas from the secondary gas passage is lowered,
Dust can be reliably pushed out from the inner surface of the filter to the outer surface of the filter, and the dust can be efficiently and reliably removed.

[Brief description of the drawings]

FIG. 1 is a diagram showing a sampling probe of the present invention.

FIG. 2 is a diagram showing an arrangement state of a sampling probe of the present invention.

FIG. 3 is a diagram showing equipment when sampling and cleaning are alternately performed by the sampling probe of the present invention.

FIG. 4 is a diagram showing timing when sampling and cleaning are alternately performed by the sampling probe of the present invention.

FIG. 5 is a diagram showing a conventional probe.

[Explanation of symbols]

 Reference Signs List 1 (for sampling) probe 1a Probe body 2 Filter 3 Primary gas flow path 4 Secondary gas flow path 5 Cleaning nozzle

 ────────────────────────────────────────────────── ─── Continued on the front page (72) Inventor Tadaaki Kitajima 1850 Minato, Wakayama City, Wakayama Prefecture Sumitomo Metal Industries Co., Ltd. Wakayama Works F-term (reference) 2G055 AA30 BA02 DA31 EA10

Claims (2)

[Claims] 1. A sampling probe for collecting gas containing dust, a cylindrical filter, a primary gas passage formed on an outer periphery of the filter and through which gas before passing through the filter flows, Formed on the inner circumference,
A secondary gas flow path through which the gas passing through the filter flows and a purge gas is sent to the inner periphery of the filter is provided on the probe main body, and a cleaning nozzle for purging the filter is provided on the outer periphery of the probe main body. Wherein the purge gas is spirally arranged toward the upstream side of the primary gas flow path. 2. When the sampling probe according to claim 1 is washed, dust attached to the outer surface of the filter by purging from the washing nozzle is blown off to the primary gas passage, and then purged from the secondary gas passage. A method for cleaning a probe, comprising: pushing out dust clogged in a filter to the outer surface of the filter, and blowing the pushed dust out to a primary gas flow path by a washing nozzle.