JP2000310855A - Photosensitive resin composition, photosensitive element using same, production of resist pattern and production of printed circuit board - Google Patents
Photosensitive resin composition, photosensitive element using same, production of resist pattern and production of printed circuit boardInfo
- Publication number
- JP2000310855A JP2000310855A JP28764499A JP28764499A JP2000310855A JP 2000310855 A JP2000310855 A JP 2000310855A JP 28764499 A JP28764499 A JP 28764499A JP 28764499 A JP28764499 A JP 28764499A JP 2000310855 A JP2000310855 A JP 2000310855A
- Authority
- JP
- Japan
- Prior art keywords
- resin composition
- group
- photosensitive resin
- acid
- photosensitive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 60
- 238000004519 manufacturing process Methods 0.000 title claims description 24
- 238000007747 plating Methods 0.000 claims abstract description 28
- 150000001875 compounds Chemical class 0.000 claims abstract description 23
- 239000011230 binding agent Substances 0.000 claims abstract description 16
- 229920000642 polymer Polymers 0.000 claims abstract description 16
- 239000003999 initiator Substances 0.000 claims abstract description 15
- 239000000539 dimer Substances 0.000 claims abstract description 14
- 239000002253 acid Substances 0.000 claims abstract description 11
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims abstract description 6
- 229910052731 fluorine Inorganic materials 0.000 claims abstract description 6
- -1 coumarin compound Chemical class 0.000 claims description 49
- 125000004432 carbon atom Chemical group C* 0.000 claims description 31
- 238000000034 method Methods 0.000 claims description 26
- 125000000217 alkyl group Chemical group 0.000 claims description 17
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 11
- 239000000758 substrate Substances 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 7
- ZYGHJZDHTFUPRJ-UHFFFAOYSA-N benzo-alpha-pyrone Natural products C1=CC=C2OC(=O)C=CC2=C1 ZYGHJZDHTFUPRJ-UHFFFAOYSA-N 0.000 claims description 6
- 238000001035 drying Methods 0.000 claims description 6
- 235000001671 coumarin Nutrition 0.000 claims description 5
- 229960000956 coumarin Drugs 0.000 claims description 5
- 238000010030 laminating Methods 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 125000001153 fluoro group Chemical group F* 0.000 claims description 4
- 125000006165 cyclic alkyl group Chemical group 0.000 claims description 2
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 21
- 239000003513 alkali Substances 0.000 abstract description 12
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 24
- 239000000243 solution Substances 0.000 description 17
- 239000000178 monomer Substances 0.000 description 13
- 239000000126 substance Substances 0.000 description 13
- 239000007864 aqueous solution Substances 0.000 description 12
- 239000001294 propane Substances 0.000 description 12
- 238000011109 contamination Methods 0.000 description 11
- 229920006254 polymer film Polymers 0.000 description 10
- 230000001681 protective effect Effects 0.000 description 10
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 9
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 9
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 9
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 9
- 239000003960 organic solvent Substances 0.000 description 9
- 229910052802 copper Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 8
- HEMHJVSKTPXQMS-UHFFFAOYSA-M sodium hydroxide Inorganic materials [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 8
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- 150000007513 acids Chemical class 0.000 description 5
- 125000003118 aryl group Chemical group 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- CDBYLPFSWZWCQE-UHFFFAOYSA-L sodium carbonate Substances [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 5
- WXUAQHNMJWJLTG-UHFFFAOYSA-N 2-methylbutanedioic acid Chemical compound OC(=O)C(C)CC(O)=O WXUAQHNMJWJLTG-UHFFFAOYSA-N 0.000 description 4
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 4
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 125000005250 alkyl acrylate group Chemical group 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 125000005843 halogen group Chemical group 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 4
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 4
- 238000006386 neutralization reaction Methods 0.000 description 4
- 229920000139 polyethylene terephthalate Polymers 0.000 description 4
- 239000005020 polyethylene terephthalate Substances 0.000 description 4
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 239000007921 spray Substances 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- RNIPJYFZGXJSDD-UHFFFAOYSA-N 2,4,5-triphenyl-1h-imidazole Chemical compound C1=CC=CC=C1C1=NC(C=2C=CC=CC=2)=C(C=2C=CC=CC=2)N1 RNIPJYFZGXJSDD-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 3
- 239000002202 Polyethylene glycol Substances 0.000 description 3
- 125000003545 alkoxy group Chemical group 0.000 description 3
- 239000002518 antifoaming agent Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 150000004775 coumarins Chemical class 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 3
- 239000011976 maleic acid Substances 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 150000007524 organic acids Chemical class 0.000 description 3
- 235000006408 oxalic acid Nutrition 0.000 description 3
- 229920000573 polyethylene Polymers 0.000 description 3
- 229920001223 polyethylene glycol Polymers 0.000 description 3
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Substances [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 150000005846 sugar alcohols Polymers 0.000 description 3
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 3
- 150000007934 α,β-unsaturated carboxylic acids Chemical class 0.000 description 3
- MAOBFOXLCJIFLV-UHFFFAOYSA-N (2-aminophenyl)-phenylmethanone Chemical compound NC1=CC=CC=C1C(=O)C1=CC=CC=C1 MAOBFOXLCJIFLV-UHFFFAOYSA-N 0.000 description 2
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 2
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 2
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 2
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 2
- WDQMWEYDKDCEHT-UHFFFAOYSA-N 2-ethylhexyl 2-methylprop-2-enoate Chemical compound CCCCC(CC)COC(=O)C(C)=C WDQMWEYDKDCEHT-UHFFFAOYSA-N 0.000 description 2
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 2
- MECNWXGGNCJFQJ-UHFFFAOYSA-N 3-piperidin-1-ylpropane-1,2-diol Chemical compound OCC(O)CN1CCCCC1 MECNWXGGNCJFQJ-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- YYVYAPXYZVYDHN-UHFFFAOYSA-N 9,10-phenanthroquinone Chemical compound C1=CC=C2C(=O)C(=O)C3=CC=CC=C3C2=C1 YYVYAPXYZVYDHN-UHFFFAOYSA-N 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 239000004135 Bone phosphate Substances 0.000 description 2
- ILKXMXKNQBDGCJ-UHFFFAOYSA-N C(C)NC=1C(OC2=CC=CC=C2C1C)=O Chemical compound C(C)NC=1C(OC2=CC=CC=C2C1C)=O ILKXMXKNQBDGCJ-UHFFFAOYSA-N 0.000 description 2
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 2
- YNAVUWVOSKDBBP-UHFFFAOYSA-N Morpholine Chemical compound C1COCCN1 YNAVUWVOSKDBBP-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 2
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- 125000002252 acyl group Chemical group 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- 125000003282 alkyl amino group Chemical group 0.000 description 2
- 125000004414 alkyl thio group Chemical group 0.000 description 2
- 150000001408 amides Chemical class 0.000 description 2
- 229910021538 borax Inorganic materials 0.000 description 2
- 230000001680 brushing effect Effects 0.000 description 2
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 2
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 2
- 150000001721 carbon Chemical group 0.000 description 2
- 125000004181 carboxyalkyl group Chemical group 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- 125000004093 cyano group Chemical group *C#N 0.000 description 2
- 125000000753 cycloalkyl group Chemical group 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000004663 dialkyl amino group Chemical group 0.000 description 2
- JXTHNDFMNIQAHM-UHFFFAOYSA-N dichloroacetic acid Chemical compound OC(=O)C(Cl)Cl JXTHNDFMNIQAHM-UHFFFAOYSA-N 0.000 description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 2
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 235000019441 ethanol Nutrition 0.000 description 2
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical compound CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 description 2
- MKVYSRNJLWTVIK-UHFFFAOYSA-N ethyl carbamate;2-methylprop-2-enoic acid Chemical class CCOC(N)=O.CC(=C)C(O)=O.CC(=C)C(O)=O MKVYSRNJLWTVIK-UHFFFAOYSA-N 0.000 description 2
- STVZJERGLQHEKB-UHFFFAOYSA-N ethylene glycol dimethacrylate Chemical compound CC(=C)C(=O)OCCOC(=O)C(C)=C STVZJERGLQHEKB-UHFFFAOYSA-N 0.000 description 2
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 2
- UKFXDFUAPNAMPJ-UHFFFAOYSA-N ethylmalonic acid Chemical compound CCC(C(O)=O)C(O)=O UKFXDFUAPNAMPJ-UHFFFAOYSA-N 0.000 description 2
- 238000005227 gel permeation chromatography Methods 0.000 description 2
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000000623 heterocyclic group Chemical group 0.000 description 2
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 125000002768 hydroxyalkyl group Chemical group 0.000 description 2
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 2
- WMFOQBRAJBCJND-UHFFFAOYSA-M lithium hydroxide Inorganic materials [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 2
- ZIYVHBGGAOATLY-UHFFFAOYSA-N methylmalonic acid Chemical compound OC(=O)C(C)C(O)=O ZIYVHBGGAOATLY-UHFFFAOYSA-N 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 2
- BDJRBEYXGGNYIS-UHFFFAOYSA-N nonanedioic acid Chemical compound OC(=O)CCCCCCCC(O)=O BDJRBEYXGGNYIS-UHFFFAOYSA-N 0.000 description 2
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 235000005985 organic acids Nutrition 0.000 description 2
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 2
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- WLJVNTCWHIRURA-UHFFFAOYSA-N pimelic acid Chemical compound OC(=O)CCCCCC(O)=O WLJVNTCWHIRURA-UHFFFAOYSA-N 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 229920005650 polypropylene glycol diacrylate Polymers 0.000 description 2
- 229920005651 polypropylene glycol dimethacrylate Polymers 0.000 description 2
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 2
- CXMXRPHRNRROMY-UHFFFAOYSA-N sebacic acid Chemical compound OC(=O)CCCCCCCCC(O)=O CXMXRPHRNRROMY-UHFFFAOYSA-N 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- 239000004328 sodium tetraborate Substances 0.000 description 2
- 235000010339 sodium tetraborate Nutrition 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
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- 125000001995 cyclobutyl group Chemical group [H]C1([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- 125000000582 cycloheptyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 1
- GTBGXKPAKVYEKJ-UHFFFAOYSA-N decyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCOC(=O)C(C)=C GTBGXKPAKVYEKJ-UHFFFAOYSA-N 0.000 description 1
- 125000004386 diacrylate group Chemical group 0.000 description 1
- 229960005215 dichloroacetic acid Drugs 0.000 description 1
- PEVJCYPAFCUXEZ-UHFFFAOYSA-J dicopper;phosphonato phosphate Chemical compound [Cu+2].[Cu+2].[O-]P([O-])(=O)OP([O-])([O-])=O PEVJCYPAFCUXEZ-UHFFFAOYSA-J 0.000 description 1
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 description 1
- 235000011180 diphosphates Nutrition 0.000 description 1
- 125000004914 dipropylamino group Chemical group C(CC)N(CCC)* 0.000 description 1
- UQGFMSUEHSUPRD-UHFFFAOYSA-N disodium;3,7-dioxido-2,4,6,8,9-pentaoxa-1,3,5,7-tetraborabicyclo[3.3.1]nonane Chemical compound [Na+].[Na+].O1B([O-])OB2OB([O-])OB1O2 UQGFMSUEHSUPRD-UHFFFAOYSA-N 0.000 description 1
- GMSCBRSQMRDRCD-UHFFFAOYSA-N dodecyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCCCOC(=O)C(C)=C GMSCBRSQMRDRCD-UHFFFAOYSA-N 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 125000000031 ethylamino group Chemical group [H]C([H])([H])C([H])([H])N([H])[*] 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 125000002485 formyl group Chemical group [H]C(*)=O 0.000 description 1
- 239000003205 fragrance Substances 0.000 description 1
- XLYMOEINVGRTEX-UHFFFAOYSA-N fumaric acid monoethyl ester Natural products CCOC(=O)C=CC(O)=O XLYMOEINVGRTEX-UHFFFAOYSA-N 0.000 description 1
- NKHAVTQWNUWKEO-UHFFFAOYSA-N fumaric acid monomethyl ester Natural products COC(=O)C=CC(O)=O NKHAVTQWNUWKEO-UHFFFAOYSA-N 0.000 description 1
- 125000002541 furyl group Chemical group 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- MDNFYIAABKQDML-UHFFFAOYSA-N heptyl 2-methylprop-2-enoate Chemical compound CCCCCCCOC(=O)C(C)=C MDNFYIAABKQDML-UHFFFAOYSA-N 0.000 description 1
- SCFQUKBBGYTJNC-UHFFFAOYSA-N heptyl prop-2-enoate Chemical compound CCCCCCCOC(=O)C=C SCFQUKBBGYTJNC-UHFFFAOYSA-N 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- LNCPIMCVTKXXOY-UHFFFAOYSA-N hexyl 2-methylprop-2-enoate Chemical compound CCCCCCOC(=O)C(C)=C LNCPIMCVTKXXOY-UHFFFAOYSA-N 0.000 description 1
- LNMQRPPRQDGUDR-UHFFFAOYSA-N hexyl prop-2-enoate Chemical compound CCCCCCOC(=O)C=C LNMQRPPRQDGUDR-UHFFFAOYSA-N 0.000 description 1
- 125000004029 hydroxymethyl group Chemical group [H]OC([H])([H])* 0.000 description 1
- 239000012216 imaging agent Substances 0.000 description 1
- 125000001041 indolyl group Chemical group 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001972 isopentyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- NIMLQBUJDJZYEJ-UHFFFAOYSA-N isophorone diisocyanate Chemical compound CC1(C)CC(N=C=O)CC(C)(CN=C=O)C1 NIMLQBUJDJZYEJ-UHFFFAOYSA-N 0.000 description 1
- 150000002531 isophthalic acids Chemical class 0.000 description 1
- PBOSTUDLECTMNL-UHFFFAOYSA-N lauryl acrylate Chemical compound CCCCCCCCCCCCOC(=O)C=C PBOSTUDLECTMNL-UHFFFAOYSA-N 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229940107698 malachite green Drugs 0.000 description 1
- FDZZZRQASAIRJF-UHFFFAOYSA-M malachite green Chemical compound [Cl-].C1=CC(N(C)C)=CC=C1C(C=1C=CC=CC=1)=C1C=CC(=[N+](C)C)C=C1 FDZZZRQASAIRJF-UHFFFAOYSA-M 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 125000002960 margaryl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000005395 methacrylic acid group Chemical group 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- 229940086559 methyl benzoin Drugs 0.000 description 1
- NKHAVTQWNUWKEO-IHWYPQMZSA-N methyl hydrogen fumarate Chemical compound COC(=O)\C=C/C(O)=O NKHAVTQWNUWKEO-IHWYPQMZSA-N 0.000 description 1
- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 1
- 125000000250 methylamino group Chemical group [H]N(*)C([H])([H])[H] 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- OMNKZBIFPJNNIO-UHFFFAOYSA-N n-(2-methyl-4-oxopentan-2-yl)prop-2-enamide Chemical compound CC(=O)CC(C)(C)NC(=O)C=C OMNKZBIFPJNNIO-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 125000001971 neopentyl group Chemical group [H]C([*])([H])C(C([H])([H])[H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- KERTUBUCQCSNJU-UHFFFAOYSA-L nickel(2+);disulfamate Chemical compound [Ni+2].NS([O-])(=O)=O.NS([O-])(=O)=O KERTUBUCQCSNJU-UHFFFAOYSA-L 0.000 description 1
- 125000001196 nonadecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- LKEDKQWWISEKSW-UHFFFAOYSA-N nonyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCOC(=O)C(C)=C LKEDKQWWISEKSW-UHFFFAOYSA-N 0.000 description 1
- MDYPDLBFDATSCF-UHFFFAOYSA-N nonyl prop-2-enoate Chemical compound CCCCCCCCCOC(=O)C=C MDYPDLBFDATSCF-UHFFFAOYSA-N 0.000 description 1
- NZIDBRBFGPQCRY-UHFFFAOYSA-N octyl 2-methylprop-2-enoate Chemical compound CCCCCCCCOC(=O)C(C)=C NZIDBRBFGPQCRY-UHFFFAOYSA-N 0.000 description 1
- 229940065472 octyl acrylate Drugs 0.000 description 1
- ANISOHQJBAQUQP-UHFFFAOYSA-N octyl prop-2-enoate Chemical compound CCCCCCCCOC(=O)C=C ANISOHQJBAQUQP-UHFFFAOYSA-N 0.000 description 1
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 description 1
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002958 pentadecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- GYDSPAVLTMAXHT-UHFFFAOYSA-N pentyl 2-methylprop-2-enoate Chemical compound CCCCCOC(=O)C(C)=C GYDSPAVLTMAXHT-UHFFFAOYSA-N 0.000 description 1
- ULDDEWDFUNBUCM-UHFFFAOYSA-N pentyl prop-2-enoate Chemical compound CCCCCOC(=O)C=C ULDDEWDFUNBUCM-UHFFFAOYSA-N 0.000 description 1
- 125000005561 phenanthryl group Chemical group 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 235000011007 phosphoric acid Nutrition 0.000 description 1
- 238000000016 photochemical curing Methods 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 235000007686 potassium Nutrition 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 229910000160 potassium phosphate Inorganic materials 0.000 description 1
- 235000011009 potassium phosphates Nutrition 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- 125000001501 propionyl group Chemical group O=C([*])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002572 propoxy group Chemical group [*]OC([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- NHARPDSAXCBDDR-UHFFFAOYSA-N propyl 2-methylprop-2-enoate Chemical compound CCCOC(=O)C(C)=C NHARPDSAXCBDDR-UHFFFAOYSA-N 0.000 description 1
- 125000006308 propyl amino group Chemical group 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- PNXMTCDJUBJHQJ-UHFFFAOYSA-N propyl prop-2-enoate Chemical compound CCCOC(=O)C=C PNXMTCDJUBJHQJ-UHFFFAOYSA-N 0.000 description 1
- UORVCLMRJXCDCP-UHFFFAOYSA-N propynoic acid Chemical compound OC(=O)C#C UORVCLMRJXCDCP-UHFFFAOYSA-N 0.000 description 1
- 125000000168 pyrrolyl group Chemical group 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 125000005493 quinolyl group Chemical group 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 235000003441 saturated fatty acids Nutrition 0.000 description 1
- 150000004671 saturated fatty acids Chemical class 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 235000015424 sodium Nutrition 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- MUTNCGKQJGXKEM-UHFFFAOYSA-N tamibarotene Chemical compound C=1C=C2C(C)(C)CCC(C)(C)C2=CC=1NC(=O)C1=CC=C(C(O)=O)C=C1 MUTNCGKQJGXKEM-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- YNJBWRMUSHSURL-UHFFFAOYSA-N trichloroacetic acid Chemical compound OC(=O)C(Cl)(Cl)Cl YNJBWRMUSHSURL-UHFFFAOYSA-N 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- KRLHYNPADOCLAJ-UHFFFAOYSA-N undecyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCCOC(=O)C(C)=C KRLHYNPADOCLAJ-UHFFFAOYSA-N 0.000 description 1
- RRLMGCBZYFFRED-UHFFFAOYSA-N undecyl prop-2-enoate Chemical compound CCCCCCCCCCCOC(=O)C=C RRLMGCBZYFFRED-UHFFFAOYSA-N 0.000 description 1
- 235000021122 unsaturated fatty acids Nutrition 0.000 description 1
- 150000004670 unsaturated fatty acids Chemical class 0.000 description 1
- 125000003774 valeryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229920001567 vinyl ester resin Polymers 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 125000005023 xylyl group Chemical group 0.000 description 1
Landscapes
- Polymerisation Methods In General (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Materials For Photolithography (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、感光性樹脂組成
物、これを用いた感光性エレメント、レジストパターン
の製造法及びプリント配線板の製造法に関する。The present invention relates to a photosensitive resin composition, a photosensitive element using the same, a method for producing a resist pattern, and a method for producing a printed wiring board.
【0002】[0002]
【従来の技術】従来プリント配線板の製造分野におい
て、エッチング、めっき等に用いられるレジスト材料と
しては、感光性樹脂組成物及びそれに支持体と保護フィ
ルムを用いて得られる感光性エレメントが広く用いられ
ている。プリント配線板は、感光性エレメントを銅基板
上にラミネートして、画像状に露光した後、硬化部分を
現像液で除去することによって、レジストパターンを製
造し、エッチング又はめっき処理を施し、硬化部分を基
板上から剥離除去する方法によって製造されている。感
光性エレメントは、近年の印刷配線板の高密度化に伴
い、従来の感光性エレメントに比べて高解像性及び高密
着性に関する要求がますます高くなっている。2. Description of the Related Art Conventionally, in the field of manufacturing printed wiring boards, a photosensitive resin composition and a photosensitive element obtained by using a support and a protective film thereon are widely used as resist materials used for etching, plating and the like. ing. The printed wiring board is formed by laminating a photosensitive element on a copper substrate, exposing it in an image, removing the cured portion with a developing solution, producing a resist pattern, performing an etching or plating process, and performing a curing process. Is manufactured by a method of peeling off from the substrate. 2. Description of the Related Art With the recent increase in density of printed wiring boards, demands for high resolution and high adhesion of photosensitive elements have been increasing as compared with conventional photosensitive elements.
【0003】また、一方では、作業性の向上という点か
ら、高感度、低めっき浴汚染性の感光性樹脂組成物が望
まれており、これらの特性は、使用される光重合開始剤
の種類及び量に依存するものである。高感度の光重合開
始剤は、ドイツ特許第2,027,467号明細書、ヨ
ーロッパ特許公開第11,786号明細書、ヨーロッパ
特許公開第220号明細書、ヨーロッパ特許公開第58
9号明細書、特開平6−69631号公報等に記載され
ているが、これらはめっき浴汚染性を有するという欠点
がある。[0003] On the other hand, a photosensitive resin composition having high sensitivity and low plating bath contamination is desired from the viewpoint of improving workability, and these characteristics depend on the type of photopolymerization initiator used. And the amount. High-sensitivity photopolymerization initiators are described in German Patent No. 2,027,467, European Patent Publication No. 11,786, European Patent Publication No. 220, and European Patent Publication No. 58.
No. 9, JP-A-6-69631, etc., but they have the drawback of having plating bath contamination.
【0004】この他に、めっき浴汚染性の少ない、光重
合開始剤である2,4,5−トリフェニルイミダゾール
二量体と、水素供与性化合物を組み合わせ高感度にした
感光性樹脂組成物が、米国特許第3,479,185号
明細書に記載されているが、要求される感度に調整した
場合、2,4,5−トリフェニルイミダゾール二量体の
使用量を増量すると、レジストの線幅が太るという欠点
があり、水素供与性化合物の使用量を増量すると、銅と
の密着性及び保存安定性が劣るという欠点がある。ま
た、2,4,5−トリフェニルイミダゾール二量体及び
高反応性のエチレン性不飽和基を有するポリエチレング
リコールジメタクリレート等の化合物を使用することが
考えられるが、前記した耐薬品性が著しく劣るという欠
点がある。[0004] In addition, a photosensitive resin composition which has a high sensitivity by combining a dimer of 2,4,5-triphenylimidazole which is a photopolymerization initiator and a hydrogen-donating compound with low plating bath contamination has been proposed. U.S. Pat. No. 3,479,185 describes that, when the required sensitivity is adjusted, the amount of 2,4,5-triphenylimidazole dimer used can be increased to increase the linearity of the resist. There is a disadvantage that the width is large, and when the amount of the hydrogen-donating compound used is increased, there is a disadvantage that adhesion to copper and storage stability are deteriorated. It is also conceivable to use a compound such as polyethylene glycol dimethacrylate having a 2,4,5-triphenylimidazole dimer and a highly reactive ethylenically unsaturated group, but the above-mentioned chemical resistance is extremely poor. There is a disadvantage that.
【0005】[0005]
【発明が解決しようとする課題】本発明は、前記した従
来の技術の問題点を解決するもので、高解像性、高密着
性、高感度、めっき浴汚染性等の優れた感光性樹脂組成
物及びこれを用いた感光性エレメントを提供するもので
ある。請求項1、2、3及び4記載の発明は、感度が極
めて優れ、密着性、耐薬品性、柔軟性及びめっき浴汚染
性に優れる感光性樹脂組成物を提供するものである。請
求項5及び6記載の発明は、請求項1、2、3及び4記
載の発明の効果を奏し、さらにアルカリ現像液による現
像性に優れる感光性樹脂組成物を提供するものである。
請求項7記載の発明は、プリント配線の高密度化及びプ
リント配線板製造の自動化に極めて有用な、感度が極め
て優れ、密着性、耐薬品性、柔軟性、めっき浴汚染性、
アルカリ現像性、機械強度及び作業性に優れる感光性エ
レメントを提供するものである。SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems of the prior art and provides a photosensitive resin excellent in high resolution, high adhesion, high sensitivity, plating bath contamination and the like. It is intended to provide a composition and a photosensitive element using the same. The inventions according to claims 1, 2, 3 and 4 provide a photosensitive resin composition which is extremely excellent in sensitivity, excellent in adhesion, chemical resistance, flexibility and plating bath contamination. The inventions of claims 5 and 6 exhibit the effects of the inventions of claims 1, 2, 3 and 4, and further provide a photosensitive resin composition having excellent developability with an alkali developing solution.
The invention according to claim 7 is extremely useful for increasing the density of printed wiring and automating the production of printed wiring boards, having extremely excellent sensitivity, adhesion, chemical resistance, flexibility, plating bath contamination,
An object of the present invention is to provide a photosensitive element having excellent alkali developability, mechanical strength and workability.
【0006】請求項8記載の発明は、プリント配線の高
密度化及びプリント配線板製造の自動化に極めて有用
な、感度が極めて優れ、密着性、耐薬品性、柔軟性、め
っき浴汚染性、アルカリ現像性、機械強度及び作業性が
優れるレジストパターンの製造法を提供するものであ
る。請求項9記載の発明は、プリント配線の高密度化及
びプリント配線板製造の自動化に極めて有用な、感度が
極めて優れ、密着性、耐薬品性、柔軟性、めっき浴汚染
性、アルカリ現像性、機械強度及び作業性が優れるプリ
ント配線板の製造法を提供するものである。The invention according to claim 8 is extremely useful for increasing the density of printed wiring and automating the production of printed wiring boards, having extremely excellent sensitivity, adhesion, chemical resistance, flexibility, plating bath contamination, and alkali. An object of the present invention is to provide a method for producing a resist pattern having excellent developability, mechanical strength and workability. The invention according to claim 9 is extremely useful for increasing the density of printed wiring and automating the production of printed wiring boards, having extremely high sensitivity, adhesion, chemical resistance, flexibility, plating bath contamination, alkali developability, An object of the present invention is to provide a method for manufacturing a printed wiring board having excellent mechanical strength and workability.
【0007】[0007]
【課題を解決するための手段】本発明は、(A)バイン
ダーポリマー、(B)分子内に少なくとも1つの重合可
能なエチレン性不飽和基を有する光重合性化合物及び
(C)光重合開始剤として一般式(I)The present invention provides (A) a binder polymer, (B) a photopolymerizable compound having at least one polymerizable ethylenically unsaturated group in a molecule, and (C) a photopolymerization initiator. Represented by the general formula (I)
【化6】 (式中、Xは水素原子又はフッ素原子を示し、Rは炭素
数1〜20のアルキル基を示す)で表わされる2,4,
5−トリアリールイミダゾール二量体を含有してなる感
光性樹脂組成物に関する。Embedded image Wherein X represents a hydrogen atom or a fluorine atom, and R represents an alkyl group having 1 to 20 carbon atoms.
The present invention relates to a photosensitive resin composition containing a 5-triarylimidazole dimer.
【0008】また、本発明は、(C)光重合開始剤が下
記式(II)In the present invention, the photopolymerization initiator (C) preferably has the following formula (II):
【化7】 で表される2,4,5−トリアリールイミダゾール二量
体である前記感光性樹脂組成物に関する。Embedded image Wherein the photosensitive resin composition is a 2,4,5-triarylimidazole dimer represented by the formula:
【0009】また、本発明は、(C)光重合開始剤が下
記式(III)In the present invention, the photopolymerization initiator (C) preferably has the following formula (III):
【化8】 で表される2,4,5−トリアリールイミダゾール二量
体である前記感光性樹脂組成物に関する。Embedded image Wherein the photosensitive resin composition is a 2,4,5-triarylimidazole dimer represented by the formula:
【0010】また、本発明は、さらに(D)増感剤とし
て一般式(IV)The present invention further relates to (D) a sensitizer represented by the general formula (IV):
【化9】 (式中、R1及びR2は各々独立に水素原子又は炭素数1
〜6のアルキル基を示し、R3及びR4は各々独立に水素
原子、炭素数1〜6のアルキル基又は炭素数1〜6の環
状アルキル基を示し、R3及びR4は、互いに結合して環
を形成していてもよい)で表されるクマリン系化合物又
は一般式(V)Embedded image (Wherein, R 1 and R 2 each independently represent a hydrogen atom or a carbon atom
And R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 6 carbon atoms or a cyclic alkyl group having 1 to 6 carbon atoms, and R 3 and R 4 are bonded to each other. Or a coumarin compound represented by the general formula (V)
【化10】 (式中、R1及びR2は一般式(IV)におけるR1及びR2
と同意義である)で表されるアルキルアミノベンゾフェ
ノン系化合物を含有してなる前記の感光性樹脂組成物に
関する。Embedded image (Wherein, R 1 and R 2 are R 1 and R 2 in the general formula (IV)
And the above-mentioned photosensitive resin composition comprising an alkylaminobenzophenone-based compound represented by the formula:
【0011】また、本発明は、(A)バインダーポリマ
ーがカルボキシル基を含有するバインダーポリマーであ
る前記感光性樹脂組成物に関する。また、本発明は、
(A)成分の酸価が100〜500mgKOH/gであり、重
量平均分子量20,000〜300,000である前記
感光性樹脂組成物に関する。また、本発明は、前記感光
性樹脂組成物を支持体上に塗布、乾燥、積層してなる感
光性エレメントに関する。[0011] The present invention also relates to the photosensitive resin composition, wherein (A) the binder polymer is a binder polymer containing a carboxyl group. Also, the present invention
(A) The photosensitive resin composition wherein the acid value of the component is 100 to 500 mgKOH / g and the weight average molecular weight is 20,000 to 300,000. The present invention also relates to a photosensitive element obtained by applying, drying and laminating the photosensitive resin composition on a support.
【0012】また、本発明は、前記感光性エレメント
を、回路形成用基板上に感光性樹脂組成物層が密着する
ようにして積層し、活性光線を画像状に照射し、露光部
を光硬化させ、未露光部を現像により除去することを特
徴とするレジストパターンの製造法に関する。また、本
発明は、前記レジストパターンの製造法により、レジス
トパターンの製造された回路形成用基板をエッチング又
はめっきすることを特徴とするプリント配線板の製造法
に関する。Further, the present invention provides a method for manufacturing a semiconductor device, comprising: laminating the photosensitive element on a circuit-forming substrate so that a photosensitive resin composition layer is in close contact with the photosensitive element; And a method of manufacturing a resist pattern, wherein unexposed portions are removed by development. Further, the present invention relates to a method for manufacturing a printed wiring board, wherein a circuit forming substrate on which a resist pattern is manufactured is etched or plated by the method for manufacturing a resist pattern.
【0013】[0013]
【発明の実施の形態】本発明における(A)成分である
バインダーポリマーは、特に制限はなく、例えば、アク
リル系樹脂、スチレン系樹脂、エポキシ系樹脂、アミド
系樹脂、アミドエポキシ系樹脂、アルキド系樹脂、フェ
ノール系樹脂等が挙げられる。アルカリ現像性の見地か
らは、アクリル系樹脂が好ましい。これらは単独で又は
2種以上を組み合わせて用いることができる。BEST MODE FOR CARRYING OUT THE INVENTION The binder polymer as the component (A) in the present invention is not particularly limited, and examples thereof include an acrylic resin, a styrene resin, an epoxy resin, an amide resin, an amide epoxy resin, and an alkyd resin. Resins, phenolic resins and the like. From the viewpoint of alkali developability, an acrylic resin is preferred. These can be used alone or in combination of two or more.
【0014】本発明における(A)成分のバインダーポ
リマーは、例えば、重合性単量体をラジカル重合させる
ことにより製造することができる。重合性単量体として
は、特に制限はなく、例えば、スチレン、ビニルトルエ
ン、α−メチルスチレン等のα−位若しくは芳香族環に
おいて置換されている重合可能なスチレン誘導体、2,
2,3,3−テトラフルオロプロピルアクリレートアク
リルアミド、2,2,3,3−テトラフルオロプロピル
メタクリレートアクリルアミド、ジアセトンアクリルア
ミド等のアクリルアミド、アクリロニトリル、ビニル−
n−ブチルエーテル等のビニルアルコールのエステル
類、アクリル酸アルキルエステル、メタクリル酸アルキ
ルエステル、アクリル酸テトラヒドロフルフリルエステ
ル、メタクリル酸テトラヒドロフルフリルエステル、ア
クリル酸ジメチルアミノエチルエステル、メタクリル酸
ジメチルアミノエチルエステル、アクリル酸ジエチルア
ミノエチルエステル、メタクリル酸ジエチルアミノエチ
ルエステル、アクリル酸グリシジルエステル、メタクリ
ル酸グリシジルエステル、2,2,2−トリフルオロエ
チルアクリレート、2,2,2−トリフルオロエチルメ
タクリレート、2,2,3,3−テトラフルオロプロピ
ルアクリレート、2,2,3,3−テトラフルオロプロ
ピルメタクリレート、アクリル酸、メタクリル酸、α−
ブロモアクリル酸、α−クロルアクリル酸、β−フリル
アクリル酸、β−スチリルアクリル酸、マレイン酸、マ
レイン酸無水物、マレイン酸モノメチル、マレイン酸モ
ノエチル、マレイン酸モノイソプロピル等のマレイン酸
モノエステル、フマール酸、ケイ皮酸、α−シアノケイ
皮酸、イタコン酸、クロトン酸、プロピオール酸などが
挙げられる。上記アクリル酸アルキルエステル又はメタ
クリル酸アルキルエステルとしては、例えば、一般式
(VI)The binder polymer (A) in the present invention can be produced, for example, by radically polymerizing a polymerizable monomer. The polymerizable monomer is not particularly limited, for example, styrene, vinyl toluene, a polymerizable styrene derivative substituted at the α-position or an aromatic ring such as α-methylstyrene, 2,
Acrylamide such as 2,3,3-tetrafluoropropyl acrylate acrylamide, 2,2,3,3-tetrafluoropropyl methacrylate acrylamide, diacetone acrylamide, acrylonitrile, vinyl-
Esters of vinyl alcohol such as n-butyl ether, alkyl acrylate, alkyl methacrylate, tetrahydrofurfuryl acrylate, tetrahydrofurfuryl methacrylate, dimethylaminoethyl acrylate, dimethylaminoethyl methacrylate, acryl Acid diethylaminoethyl ester, methacrylic acid diethylaminoethyl ester, glycidyl acrylate, glycidyl methacrylate, 2,2,2-trifluoroethyl acrylate, 2,2,2-trifluoroethyl methacrylate, 2,2,3,3 -Tetrafluoropropyl acrylate, 2,2,3,3-tetrafluoropropyl methacrylate, acrylic acid, methacrylic acid, α-
Monoesters of maleic acid such as bromoacrylic acid, α-chloroacrylic acid, β-furylacrylic acid, β-styrylacrylic acid, maleic acid, maleic anhydride, monomethyl maleate, monoethyl maleate, monoisopropyl maleate and the like, fumaral Acids, cinnamic acid, α-cyanocinnamic acid, itaconic acid, crotonic acid, propiolic acid and the like. Examples of the alkyl acrylate or alkyl methacrylate include, for example, those represented by the general formula (VI)
【化11】 (式中、R5は水素原子又はメチル基を示し、R6は炭素
数1〜12のアルキル基を示す)で表される化合物、こ
れらの化合物のアルキル基に水酸基、エポキシ基、ハロ
ゲン基等が置換した化合物などが挙げられる。Embedded image (Wherein, R 5 represents a hydrogen atom or a methyl group, and R 6 represents an alkyl group having 1 to 12 carbon atoms), and the alkyl group of these compounds includes a hydroxyl group, an epoxy group, a halogen group, and the like. And the like.
【0015】上記一般式(VI)中のR6としては例え
ば、メチル基、エチル基、プロピル基、ブチル基、ペン
チル基、ヘキシル基、ヘプチル基、オクチル基、ノニル
基、デシル基、ウンデシル基、ドデシル基及びこれらの
構造異性体が挙げられる。上記一般式(VI)で表される
単量体としては、例えば、アクリル酸メチルエステル、
アクリル酸エチルエステル、アクリル酸プロピルエステ
ル、アクリル酸ブチルエステル、アクリル酸ペンチルエ
ステル、アクリル酸ヘキシルエステル、アクリル酸ヘプ
チルエステル、アクリル酸オクチルエステル、アクリル
酸2−エチルヘキシルエステル、アクリル酸ノニルエス
テル、アクリル酸デシルエステル、アクリル酸ウンデシ
ルエステル、アクリル酸ドデシルエステル、メタクリル
酸メチルエステル、メタクリル酸エチルエステル、メタ
クリル酸プロピルエステル、メタクリル酸ブチルエステ
ル、メタクリル酸ペンチルエステル、メタクリル酸ヘキ
シルエステル、メタクリル酸ヘプチルエステル、メタク
リル酸オクチルエステル、メタクリル酸2−エチルヘキ
シルエステル、メタクリル酸ノニルエステル、メタクリ
ル酸デシルエステル、メタクリル酸ウンデシルエステ
ル、メタクリル酸ドデシルエステル等が挙げられる。こ
れらは単独で又は2種以上を組み合わせて用いることが
できる。R 6 in the above general formula (VI) includes, for example, methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, undecyl, Dodecyl groups and their structural isomers. As the monomer represented by the general formula (VI), for example, acrylic acid methyl ester,
Ethyl acrylate, propyl acrylate, butyl acrylate, pentyl acrylate, hexyl acrylate, heptyl acrylate, octyl acrylate, 2-ethylhexyl acrylate, nonyl acrylate, decyl acrylate Ester, undecyl acrylate, dodecyl acrylate, methyl methacrylate, ethyl methacrylate, propyl methacrylate, butyl methacrylate, pentyl methacrylate, hexyl methacrylate, heptyl methacrylate, methacrylic acid Octyl ester, 2-ethylhexyl methacrylate, nonyl methacrylate, decyl methacrylate , Methacrylic acid undecyl ester, and methacrylic acid dodecyl ester. These can be used alone or in combination of two or more.
【0016】また、本発明における(A)成分であるバ
インダーポリマーは、アルカリ現像性の見地から、カル
ボキシル基を含有させることが好ましく、例えば、カル
ボキシル基を有する重合性単量体とその他の重合性単量
体をラジカル重合させることにより製造することができ
る。また、本発明における(A)成分であるバインダー
ポリマーは、可とう性の見地からスチレン又はスチレン
誘導体を重合性単量体として含有させることが好まし
い。これらのバインダーポリマーは、単独で又は2種類
以上を組み合わせて使用される。The binder polymer (A) in the present invention preferably contains a carboxyl group from the viewpoint of alkali developability. For example, a polymerizable monomer having a carboxyl group and another polymerizable monomer may be used. It can be produced by radical polymerization of a monomer. Further, the binder polymer as the component (A) in the present invention preferably contains styrene or a styrene derivative as a polymerizable monomer from the viewpoint of flexibility. These binder polymers are used alone or in combination of two or more.
【0017】本発明における(A)成分のバインダーポ
リマーがカルボキシル基を有する場合、酸価は、30〜
200mgKOH/gであることが好ましく、50〜100mgK
OH/gであることが特に好ましい。酸価が、30mgKOH/g
未満では、現像時間が長くなる傾向があり、200mgKO
H/gを超えると、光硬化したレジストの耐現像液性が低
下する傾向がある。ゲルパーミエーションクロマトグラ
フィー(GPC)で測定し、標準ポリスチレンを用いた
検量線により換算した重量平均分子量は、20,000
〜300,000であることが好ましく、40,000
〜150,000であることが特に好ましい。この重量
平均分子量が、20,000未満では、耐現像液性が低
下する傾向があり、300,000を越えると、現像時
間が長くなる傾向がある。When the binder polymer of the component (A) in the present invention has a carboxyl group, the acid value is from 30 to
200 mgKOH / g, preferably 50-100 mgK
Particularly preferred is OH / g. Acid value is 30mgKOH / g
If less than 200mgKO
If it exceeds H / g, the developer resistance of the photocured resist tends to decrease. The weight average molecular weight measured by gel permeation chromatography (GPC) and converted by a calibration curve using standard polystyrene was 20,000.
300300,000, preferably 40,000
Particularly preferred is 〜150,000. If the weight average molecular weight is less than 20,000, the developer resistance tends to decrease, and if it exceeds 300,000, the development time tends to be long.
【0018】本発明における(B)重合可能なエチレン
性不飽和基を有する光重合性化合物としては、例えば、
多価アルコール、多価アルコールにα,β−不飽和カル
ボン酸を反応させて得られる化合物、2,2−ビス(4
−(アクリロキシポリエトキシ)フェニル)プロパン、
2,2−ビス(4−(メタクリロキシポリエトキシ)フ
ェニル)プロパン、グリシジル基含有化合物にα、β−
不飽和カルボン酸を反応させで得られる化合物、ウレタ
ンモノマー、ノニルフェニルジオキシレンアクリレー
ト、ノニルフェニルジオキシレンメタクリレート、γ−
クロロ−β−ヒドロキシプロピル−β′−アクリロイル
オキシエチル−o−フタレート、γ−クロロ−β−ヒド
ロキシプロピル−β′−メタクリロイルオキシエチル−
o−フタレート、β−ヒドロキシエチル−β′−アクリ
ロイルオキシエチル−o−フタレート、β−ヒドロキシ
エチル−β′−メタクリロイルオキシエチル−o−フタ
レート、アクリル酸アルキルエステル、メタクリル酸ア
ルキルエステル等が挙げられる。The (B) photopolymerizable compound having a polymerizable ethylenically unsaturated group in the present invention includes, for example,
Polyhydric alcohol, a compound obtained by reacting an α, β-unsaturated carboxylic acid with a polyhydric alcohol, 2,2-bis (4
-(Acryloxypolyethoxy) phenyl) propane,
2,2-bis (4- (methacryloxypolyethoxy) phenyl) propane, α-, β-
Compounds obtained by reacting unsaturated carboxylic acids, urethane monomers, nonylphenyldioxylene acrylate, nonylphenyldioxylene methacrylate, γ-
Chloro-β-hydroxypropyl-β′-acryloyloxyethyl-o-phthalate, γ-chloro-β-hydroxypropyl-β′-methacryloyloxyethyl-
o-phthalate, β-hydroxyethyl-β′-acryloyloxyethyl-o-phthalate, β-hydroxyethyl-β′-methacryloyloxyethyl-o-phthalate, alkyl acrylate, alkyl methacrylate and the like.
【0019】上記多価アルコールにα,β−不飽和カル
ボン酸を反応させて得られる化合物としては、例えば、
エチレン基の数が2〜14であるポリエチレングリコー
ルジアクリレート、エチレン基の数が2〜14であるポ
リエチレングリコールジメタクリレート、プロピレン基
の数が2〜14であるポリプロピレングリコールジアク
リレート、プロピレン基の数が2〜14であるポリプロ
ピレングリコールジメタクリレート、トリメチロールプ
ロパンジアクリレート、トリメチロールプロパンジメタ
クリレート、トリメチロールプロパントリアクリレー
ト、トリメチロールプロパントリメタクリレート、トリ
メチロールプロパンエトキシトリアクリレート、トリメ
チロールプロパンエトキシトリメタクリレート、テトラ
メチロールメタントリアクリレート、テトラメチロール
メタントリメタクリレート、テトラメチロールメタンテ
トラアクリレート、テトラメチロールメタンテトラメタ
クリレート、プロピレン基の数が2〜14であるポリプ
ロピレングリコールジアクリレート、プロピレン基の数
が2〜14であるポリプロピレングリコールジメタクリ
レート、ジペンタエリスリトールペンタアクリレート、
ジペンタエリスリトールペンタメタクリレート、ジペン
タエリスリトールヘキサアクリレート、ジペンタエリス
リトールヘキサメタクリレート等が挙げられる。Examples of the compound obtained by reacting the above polyhydric alcohol with an α, β-unsaturated carboxylic acid include, for example,
Polyethylene glycol diacrylate having 2 to 14 ethylene groups, polyethylene glycol dimethacrylate having 2 to 14 ethylene groups, polypropylene glycol diacrylate having 2 to 14 propylene groups, and the number of propylene groups 2-14 which are polypropylene glycol dimethacrylate, trimethylolpropane diacrylate, trimethylolpropane dimethacrylate, trimethylolpropane triacrylate, trimethylolpropane trimethacrylate, trimethylolpropaneethoxytriacrylate, trimethylolpropaneethoxytrimethacrylate, tetramethylol Methane triacrylate, tetramethylol methane trimethacrylate, tetramethylol methane tetraacrylate, Tiger methylol methane tetramethacrylate, polypropylene glycol diacrylate number of propylene is 2 to 14, polypropylene glycol dimethacrylate number of propylene is 2 to 14, dipentaerythritol pentaacrylate,
Examples thereof include dipentaerythritol pentamethacrylate, dipentaerythritol hexaacrylate, and dipentaerythritol hexamethacrylate.
【0020】上記α,β−不飽和カルボン酸としては、
例えば、アクリル酸及びメタクリル酸が拳げられる。上
記2,2−ビス(4−(アクリロキシポリエトキシ)フ
ェニル)プロパンとしては、例えば、2,2−ビス(4
−(アクリロキシジエトキシ)フェニル)プロパン、
2,2−ビス(4−(アクリロキシトリエトキシ)フェ
ニル)プロパン、2,2−ビス(4−(アクリロキシペ
ンタエトキシ)フェニル)プロパン、2,2−ビス(4
−(アクリロキシデカエトキシ)フェニル)等が挙げら
れる。上記2,2−ビス(4−(メタクリロキシポリエ
トキシ)フェニル)プロパンとしては、例えば、2,2
−ビス(4−(メタクリロキシジエトキシ)フェニル)
プロパン、2,2−ビス(4−(メタクリロキシトリエ
トキシ)フェニル)プロパン、2,2−ビス(4−(メ
タクリロキシペンタエトキシ)フェニル)プロパン、
2,2−ビス(4−(メタクリロキシデカエトキシ)フ
ェニル)プロパン等が挙げられ、2,2−ビス(4−
(メタクリロキシペンタエトキシ)フェニル)プロパン
は、BPE−500(新中村化学工業(株)製、製品名)
として商業的に入手可能である。The above α, β-unsaturated carboxylic acids include:
For example, acrylic acid and methacrylic acid are used. Examples of the 2,2-bis (4- (acryloxypolyethoxy) phenyl) propane include, for example, 2,2-bis (4
-(Acryloxydiethoxy) phenyl) propane,
2,2-bis (4- (acryloxytriethoxy) phenyl) propane, 2,2-bis (4- (acryloxypentaethoxy) phenyl) propane, 2,2-bis (4
-(Acryloxydecaethoxy) phenyl) and the like. Examples of the 2,2-bis (4- (methacryloxypolyethoxy) phenyl) propane include, for example, 2,2
-Bis (4- (methacryloxydiethoxy) phenyl)
Propane, 2,2-bis (4- (methacryloxytriethoxy) phenyl) propane, 2,2-bis (4- (methacryloxypentaethoxy) phenyl) propane,
2,2-bis (4- (methacryloxydecaethoxy) phenyl) propane and the like, and 2,2-bis (4-
(Methacryloxypentaethoxy) phenyl) propane is BPE-500 (product name, manufactured by Shin-Nakamura Chemical Co., Ltd.)
It is commercially available as
【0021】上記グリシジル基含有化合物としては、例
えば、トリメチロールプロパントリグリシジルエーテル
トリアクリレート、トリメチロールプロパントリグリシ
ジルエーテルトリメタクリレート、2,2−ビス(4−
アクリロキシ−2−ヒドロキシ−プロピルオキシ)フェ
ニル、2,2−ビス(4−メタクリロキシ−2−ヒドロ
キシ−プロピルオキシ)フェニル等が拳げられる。上記
ウレタンモノマーとしては、例えば、β位にOH基を有
するアクリルモノマー又はそれに対応するメタクリルモ
ノマーとイソホロンジイソシアネート、2,6−トルエ
ンジイソシアネート、2,4−トルエンジイソシアネー
ト、1,6−ヘキサメチレンジイソシアネート等との付
加反応物、トリス(メタクリロキシテトラエチレングリ
コールイソシアネート)ヘキサメチレンイソシアヌレー
ト、EO変性ウレタンジメタクリレート、EO,PO変
性ウレタンジメタクリレート等が挙げられる。なお、E
Oはエチレンオキサイドを示し、EO変性された化合物
はエチレンオキサイド基のブロック構造を有する。ま
た、POはプロピレンオキサイドを示し、PO変性され
た化合物はプロピレンオキサイド基のブロック構造を有
する。Examples of the glycidyl group-containing compound include, for example, trimethylolpropane triglycidyl ether triacrylate, trimethylolpropane triglycidyl ether trimethacrylate, 2,2-bis (4-
Acryloxy-2-hydroxy-propyloxy) phenyl, 2,2-bis (4-methacryloxy-2-hydroxy-propyloxy) phenyl and the like can be used. Examples of the urethane monomer include, for example, an acrylic monomer having an OH group at the β-position or a methacrylic monomer corresponding thereto and isophorone diisocyanate, 2,6-toluene diisocyanate, 2,4-toluene diisocyanate, 1,6-hexamethylene diisocyanate, and the like. And tris (methacryloxytetraethylene glycol isocyanate) hexamethylene isocyanurate, EO-modified urethane dimethacrylate, EO, PO-modified urethane dimethacrylate, and the like. Note that E
O represents ethylene oxide, and the EO-modified compound has a block structure of an ethylene oxide group. PO represents propylene oxide, and the PO-modified compound has a block structure of a propylene oxide group.
【0022】上記アクリル酸アルキルエステルとして
は、例えば、アクリル酸メチルエステル、アクリル酸エ
チルエステル、アクリル酸ブチルエステル、アクリル酸
2−エチルヘキシルエステル等が挙げられる。上記メタ
クリル酸アルキルエステルとしては、例えば、メタクリ
ル酸メチルエステル、メタクリル酸エチルエステル、メ
タクリル酸ブチルエステル、メタクリル酸2−エチルヘ
キシルエステル等が挙げられる。これらは単独で又は2
種類以上を組み合わせて使用される。Examples of the alkyl acrylate include methyl acrylate, ethyl acrylate, butyl acrylate, 2-ethylhexyl acrylate and the like. Examples of the alkyl methacrylate include methyl methacrylate, ethyl methacrylate, butyl methacrylate, 2-ethylhexyl methacrylate, and the like. These can be used alone or 2
Used in combination of more than one type.
【0023】本発明における(C)成分である前記一般
式(I)で表される2,4,5−トリアリールイミダゾ
ール二量体中のXは水素原子又はフッ素原子を示す。感
度特性の見地からはXの少なくとも一つがフッ素原子で
あることが好ましく、それらの化合物としては、例え
ば、前記一般式(II)又は前記一般式(III)で表され
る2,4,5−トリアリールイミダゾール二量体が挙げ
られる。X in the 2,4,5-triarylimidazole dimer represented by the general formula (I), which is the component (C) in the present invention, represents a hydrogen atom or a fluorine atom. From the standpoint of sensitivity characteristics, it is preferable that at least one of X is a fluorine atom, and examples of such a compound include 2,4,5- and -4,5-, which are represented by the general formula (II) or (III). And triarylimidazole dimers.
【0024】また、本発明における(C)成分である前
記一般式(I)、前記一般式(II)及び前記一般式(II
I)で表される2,4,5−トリアリールイミダゾール
二量体、本発明における(D)成分である前記一般式
(IV)で表されるクマリン系化合物並びに前記一般式
(V)で表されるアルキルアミノベンゾフェノン系化合
物におけるフェニル基はハロゲン原子、炭素数1〜20
のアルキル基、炭素数3〜10のシクロアルキル基、炭
素数6〜14のアリール基、アミノ基、炭素数1〜10
のアルキルアミノ基、炭素数2〜20のジアルキルアミ
ノ基、ニトロ基、シアノ基、メルカプト基、炭素数1〜
10のアルキルメルカプト基、アリル基、炭素数1〜2
0のヒドロキシアルキル基、アルキル基の炭素数が1〜
10のカルボキシアルキル基、アルキル基の炭素数が1
〜10のアシル基、炭素数1〜20のアルコキシ基又は
複素環を含む基等により置換されていてもよい。また、
上記置換基におけるアルキル基の水素原子がハロゲン原
子に置換されていてもよい。In the present invention, the components represented by the general formula (I), the general formula (II) and the general formula (II)
The 2,4,5-triarylimidazole dimer represented by I), the coumarin compound represented by the general formula (IV) as the component (D) in the present invention, and the compound represented by the general formula (V) The phenyl group in the alkylaminobenzophenone-based compound is a halogen atom, having 1 to 20 carbon atoms.
Alkyl group, cycloalkyl group having 3 to 10 carbon atoms, aryl group having 6 to 14 carbon atoms, amino group, 1 to 10 carbon atoms
Alkylamino group, dialkylamino group having 2 to 20 carbon atoms, nitro group, cyano group, mercapto group,
10 alkylmercapto groups, allyl groups, 1-2 carbon atoms
0 hydroxyalkyl group, alkyl group having 1 to 1 carbon atoms
10 carboxyalkyl groups, alkyl groups having 1 carbon atom
It may be substituted with an acyl group having 10 to 10, an alkoxy group having 1 to 20 carbon atoms, a group containing a heterocyclic ring or the like. Also,
The hydrogen atom of the alkyl group in the above substituent may be substituted with a halogen atom.
【0025】前記一般式(I)中のRの炭素数1〜20
のアルキル基としては、例えば、メチル基、エチル基、
n−プロピル基、イソプロピル基、n−ブチル基、イソ
ブチル基、sec−ブチル基、tert−ブチル基、ペンチル
基、イソペンチル基、ネオペンチル基、ヘキシル基、ヘ
プチル基、オクチル基、ノニル基、デシル基、ウンデシ
ル基、ドデシル基、トリデシル基、テトラデシル基、ペ
ンタデシル基、ヘキサデシル基、ヘプタデシル基、オク
タデシル基、ノナデシル基、イコシル基等が挙げられ
る。製造容易性及び入手容易性の見地からは、メチル
基、エチル基及びn−プロピル基及びイソプロピル基で
あることが好ましい。また、5つのXは、各々同一して
いても相異していてもよい。In formula (I), R has 1 to 20 carbon atoms.
Examples of the alkyl group include a methyl group, an ethyl group,
n-propyl group, isopropyl group, n-butyl group, isobutyl group, sec-butyl group, tert-butyl group, pentyl group, isopentyl group, neopentyl group, hexyl group, heptyl group, octyl group, nonyl group, decyl group, Undecyl, dodecyl, tridecyl, tetradecyl, pentadecyl, hexadecyl, heptadecyl, octadecyl, nonadecyl, and icosyl groups. From the viewpoint of ease of production and availability, a methyl group, an ethyl group, an n-propyl group, and an isopropyl group are preferred. The five Xs may be the same or different.
【0026】上記ハロゲン原子としては、例えば、フッ
素、塩素、臭素、ヨウ素、アスタチン等が挙げられる。
上記炭素数3〜10のシクロアルキル基としては、例え
ば、シクロプロピル基、シクロブチル基、シクロペンチ
ル基、シクロヘキシル基、シクロヘプチル基、シクロオ
クチル基等が挙げられる。上記炭素数6〜14のアリー
ル基としては、例えば、フェニル基、トリル基、キシリ
ル基、ビフェニル基、ナフチル基、アントリル基、フェ
ナントリル基等が挙げられ、ハロゲン原子、アミノ基、
ニトロ基、シアノ基、メルカプト基、アリル基、炭素数
1〜20のアルキル基等で置換されていてもよい。上記
炭素数1〜10のアルキルアミノ基としては、例えば、
メチルアミノ基、エチルアミノ基、プロピルアミノ基、
イソプロピルアミノ基等が挙げられる。Examples of the halogen atom include fluorine, chlorine, bromine, iodine, and astatine.
Examples of the cycloalkyl group having 3 to 10 carbon atoms include a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the aryl group having 6 to 14 carbon atoms include a phenyl group, a tolyl group, a xylyl group, a biphenyl group, a naphthyl group, an anthryl group, and a phenanthryl group.
It may be substituted with a nitro group, a cyano group, a mercapto group, an allyl group, an alkyl group having 1 to 20 carbon atoms, or the like. Examples of the alkylamino group having 1 to 10 carbon atoms include, for example,
Methylamino group, ethylamino group, propylamino group,
And an isopropylamino group.
【0027】上記炭素数2〜20のジアルキルアミノ基
としては、例えば、ジメチルアミノ基、ジエチルアミノ
基、ジプロピルアミノ基、ジイソプロピルアミノ基等が
挙げられる。上記炭素数1〜10のアルキルメルカプト
基としては、例えば、メチルメルカプト基、エチルメル
カプト基、プロピルメルカプト基等が挙げられる。上記
炭素数1〜20のヒドロキシアルキル基としては、例え
ば、ヒドロキシメチル基、ヒドロキシエチル基、ヒドロ
キシプロピル基、ヒドロキシイソプロピル基、ヒドロキ
シブチル基等が挙げられる。上記アルキル基の炭素数が
1〜10のカルボキシアルキル基としては、例えば、カ
ルボキシメチル基、カルボキシエチル基、カルボキシプ
ロピル基、カルボキシブチル基等が挙げられる。Examples of the dialkylamino group having 2 to 20 carbon atoms include a dimethylamino group, a diethylamino group, a dipropylamino group and a diisopropylamino group. Examples of the alkyl mercapto group having 1 to 10 carbon atoms include a methyl mercapto group, an ethyl mercapto group, and a propyl mercapto group. Examples of the hydroxyalkyl group having 1 to 20 carbon atoms include a hydroxymethyl group, a hydroxyethyl group, a hydroxypropyl group, a hydroxyisopropyl group, a hydroxybutyl group, and the like. Examples of the carboxyalkyl group having 1 to 10 carbon atoms in the alkyl group include a carboxymethyl group, a carboxyethyl group, a carboxypropyl group, and a carboxybutyl group.
【0028】上記アルキル基の炭素数が1〜10のアシ
ル基としては、例えば、ホルミル基、アセチル基、プロ
ピオニル基、ブチリル基、イソブチリル基、バレリル
基、イソバレリル基、ピバロイル基等が挙げられる。上
記炭素数1〜20のアルコキシ基としては、例えば、メ
トキシ基、エトキシ基、プロポキシ基、ブトキシ基等が
挙げられる。上記複素環を含む基としては、例えば、フ
リル基、チエニル基、ピロリル基、チアゾリル基、イン
ドリル基、キノリル基等が挙げられる。Examples of the acyl group having 1 to 10 carbon atoms in the alkyl group include a formyl group, an acetyl group, a propionyl group, a butyryl group, an isobutyryl group, a valeryl group, an isovaleryl group, and a pivaloyl group. Examples of the alkoxy group having 1 to 20 carbon atoms include a methoxy group, an ethoxy group, a propoxy group, and a butoxy group. Examples of the group containing a heterocyclic ring include a furyl group, a thienyl group, a pyrrolyl group, a thiazolyl group, an indolyl group, and a quinolyl group.
【0029】前記一般式(I)で表わされる2,4,5
−トリアリールイミダゾール二量体としては、例えば、
2,2′−ビス(2−フルオロフェニル)−4,4′,
5,5′−テトラキス(3−メトキシフェニル)イミダ
ゾール二量体、2,2′−ビス(2,3−ジフルオロメ
チルフェニル)−4,4′,5,5′−テトラキス(3
−メトキシフェニル)イミダゾール二量体、2,2′−
ビス(2,4−ジフルオロフェニル)−4,4′,5,
5′−テトラキス(3−メトキシフェニル)イミダゾー
ル二量体、2,2′−ビス(2,5−ジフルオロフェニ
ル)−4,4′,5,5′−テトラキス(3−メトキシ
フェニル)イミダゾール二量体、2,2′−ビス(2,
6−ジフルオロフェニル)−4,4′,5,5′−テト
ラキス(3−メトキシフェニル)イミダゾール二量体、
2,2′−ビス(2,3,4−トリフルオロフェニル)
−4,4′,5,5′−テトラキス(3−メトキシフェ
ニル)イミダゾール二量体、2,2′−ビス(2,3,
5−トリフルオロフェニル)−4,4′,5,5′−テ
トラキス(3−メトキシフェニル)イミダゾール二量
体、2,2′−ビス(2,3,6−トリフルオロフェニ
ル)−4,4′,5,5′−テトラキス(3−メトキシ
フェニル)イミダゾール二量体、2,2′−ビス(2,
4,5−トリフルオロフェニル)−4,4′,5,5′
−テトラキス(3−メトキシフェニル)イミダゾール二
量体、2,2′−ビス(2,4,6−トリフルオロフェ
ニル)−4,4′,5,5′−テトラキス(3−メトキ
シフェニル)イミダゾール二量体、2,2′−ビス
(2,3,4,5−テトラフルオロフェニル)−4,
4′,5,5′−テトラキス(3−メトキシフェニル)
イミダゾール二量体、2,2′−ビス(2,3,4,6
−テトラフルオロフェニル)−4,4′,5,5′−テ
トラキス(3−メトキシフェニル)イミダゾール二量
体、2,2′−ビス(2,3,4,5,6−ペンタフル
オロフェニル)−4,4′,5,5′−テトラキス(3
−メトキシフェニル)イミダゾール二量体等が挙げられ
る。これらは単独で又は2種以上を組み合わせて使用さ
れる。2,4,5 represented by the above general formula (I)
-As the triarylimidazole dimer, for example,
2,2'-bis (2-fluorophenyl) -4,4 ',
5,5'-tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,3-difluoromethylphenyl) -4,4 ', 5,5'-tetrakis (3
-Methoxyphenyl) imidazole dimer, 2,2'-
Bis (2,4-difluorophenyl) -4,4 ', 5
5'-tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,5-difluorophenyl) -4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer Body, 2,2′-bis (2,
6-difluorophenyl) -4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer,
2,2'-bis (2,3,4-trifluorophenyl)
-4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,3
5-trifluorophenyl) -4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,3,6-trifluorophenyl) -4,4 ', 5,5'-Tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,
4,5-trifluorophenyl) -4,4 ', 5,5'
-Tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,4,6-trifluorophenyl) -4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer Monomer, 2,2'-bis (2,3,4,5-tetrafluorophenyl) -4,
4 ', 5,5'-tetrakis (3-methoxyphenyl)
Imidazole dimer, 2,2'-bis (2,3,4,6
-Tetrafluorophenyl) -4,4 ', 5,5'-tetrakis (3-methoxyphenyl) imidazole dimer, 2,2'-bis (2,3,4,5,6-pentafluorophenyl)- 4,4 ', 5,5'-tetrakis (3
-Methoxyphenyl) imidazole dimer and the like. These are used alone or in combination of two or more.
【0030】本発明の感光性樹脂組成物は、さらに
(D)増感剤として前記一般式(IV)で表されるクマリ
ン系化合物又は前記一般式(V)で表されるアルキルア
ミノベンゾフェノン系化合物を含有することが好まし
い。前記一般式(IV)及び前記一般式(V)におけるR
1及びR2は各々独立に水素原子又は炭素数1〜6のアル
キル基を示し、R3及びR4は各々独立に水素原子、炭素
数1〜6のアルキル基又は炭素数1〜6の環状アルキル
基を示し、R3及びR4は、互いに結合して環を形成して
いてもよい。The photosensitive resin composition of the present invention further comprises (D) a coumarin compound represented by formula (IV) or an alkylaminobenzophenone compound represented by formula (V) as a sensitizer. Is preferable. R in the general formula (IV) and the general formula (V)
1 and R 2 each independently represent a hydrogen atom or an alkyl group having 1 to 6 carbon atoms; R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 6 carbon atoms or a cyclic group having 1 to 6 carbon atoms; It represents an alkyl group, and R 3 and R 4 may combine with each other to form a ring.
【0031】本発明における(D)成分である増感剤で
あるクマリン系化合物としては7−N,N−ジエチルア
ミノ−4−メチルクマリン、7−N,N−エチルアミノ
−4−メチルクマリン、7−N,N−ジエチルアミノシ
クロペンタ[c]クマリン等が挙げられる。また、本発
明における(D)成分である増感剤であるアルキルアミ
ノベンゾフェノン系化合物としては、4,4′−(N,
N−ジメチル)アミノベンゾフェノン、4,4′−
(N,N−ジエチル)アミノベンゾフェノン、4,4′
−(N−エチル,N−メチル)アミノベンゾフェノン等
が挙げられる。The coumarin compounds which are sensitizers which are component (D) in the present invention include 7-N, N-diethylamino-4-methylcoumarin, 7-N, N-ethylamino-4-methylcoumarin and 7-N, N-ethylamino-4-methylcoumarin. —N, N-diethylaminocyclopenta [c] coumarin and the like. In the present invention, the alkylaminobenzophenone-based compound as a sensitizer, which is the component (D), includes 4,4 ′-(N,
N-dimethyl) aminobenzophenone, 4,4'-
(N, N-diethyl) aminobenzophenone, 4,4 '
-(N-ethyl, N-methyl) aminobenzophenone and the like.
【0032】本発明の感光性樹脂組成物には前記一般式
(I)、前記一般式(IV)及び前記一般式(V)以外の
光重合開始剤又は増感剤を含有させることができる。そ
れらの光重合開始剤又は増感剤としては、例えば、ベン
ゾフェノン、4−メトキシ−4′−ジメチルアミノベン
ゾフェノン、2−ベンジル−2−ジメチルアミノ−1−
(4−モルホリノフェニル)−ブタノン−1、2−エチ
ルアントラキノン、フェナントレンキノン、2−メチル
−[4−(メチルチオ)フェニル]−2−モルフォリノ
−1−プロパノン等の芳香族ケトン、ベンゾインメチル
エーテル、ベンゾインエチルエーテル、ベンゾインフェ
ニルエーテル等のベンゾインエーテル化合物、メチルベ
ンゾイン、エチルベンゾイン等のベンゾイン化合物、ベ
ンジルジメチルケタール等のベンジル誘導体、前記一般
式(I)で表される2,4,5−トリアリールイミダゾ
ール二量体以外の2,4,5−トリアリールイミダゾー
ル二量体、9−フェニルアクリジン、1,7−ビス
(9,9′−アクリジニル)ヘプタン等のアクリジン誘
導体、N−フェニルグリシン、前記一般式(IV)で表さ
れるクマリン系化合物以外のクマリン系化合物などが挙
げられる。これらは、単独で又は2種類以上を組み合わ
せて使用される。The photosensitive resin composition of the present invention may contain a photopolymerization initiator or a sensitizer other than the general formulas (I), (IV) and (V). Examples of such photopolymerization initiators or sensitizers include benzophenone, 4-methoxy-4'-dimethylaminobenzophenone, 2-benzyl-2-dimethylamino-1-
Aromatic ketones such as (4-morpholinophenyl) -butanone-1, 2-ethylanthraquinone, phenanthrenequinone, 2-methyl- [4- (methylthio) phenyl] -2-morpholino-1-propanone, benzoin methyl ether, benzoin Benzoin ether compounds such as ethyl ether and benzoin phenyl ether, benzoin compounds such as methyl benzoin and ethyl benzoin, benzyl derivatives such as benzyl dimethyl ketal, and 2,4,5-triarylimidazole represented by the general formula (I) 2,4,5-triarylimidazole dimer other than monomer, 9-phenylacridine, acridine derivative such as 1,7-bis (9,9'-acridinyl) heptane, N-phenylglycine, the general formula ( Coumarin compounds represented by IV) Etc. outside the coumarin compounds. These are used alone or in combination of two or more.
【0033】本発明における(A)成分の配合量は、
(A)成分及び(B)成分の総量100重量部に対し
て、40〜80重量部とすることが好ましく、40〜6
0重量部とすることがより好ましい。この配合量が、4
0重量部未満では、光硬化物が脆くなり易く、感光性エ
レメントとして用いた場合、塗膜性に劣る傾向があり、
80重量部を超えると、感度が不充分となる傾向があ
る。The amount of the component (A) in the present invention is as follows:
The total amount of the components (A) and (B) is preferably 40 to 80 parts by weight based on 100 parts by weight, and 40 to 6 parts by weight.
More preferably, it is 0 parts by weight. When this blending amount is 4
If the amount is less than 0 parts by weight, the photocured product tends to become brittle, and when used as a photosensitive element, tends to have poor coating properties.
If it exceeds 80 parts by weight, sensitivity tends to be insufficient.
【0034】本発明における(B)成分の配合量は、
(A)成分及び(B)成分の総量100重量部に対し
て、20〜60重量部とすることが好ましく、40〜6
0重量部とすることがより好ましい。この配合量が、2
0重量部未満では、感度が不充分となる傾向があり、6
0重量部を超えると光硬化物が脆くなる傾向がある。In the present invention, the amount of the component (B) is as follows:
The total amount of the components (A) and (B) is preferably 20 to 60 parts by weight based on 100 parts by weight, and 40 to 6 parts by weight.
More preferably, it is 0 parts by weight. This blending amount is 2
If the amount is less than 0 parts by weight, the sensitivity tends to be insufficient, and
If the amount exceeds 0 parts by weight, the photocured product tends to become brittle.
【0035】本発明における(C)成分の配合量は、
(A)成分及び(B)成分の総量100重量部に対し
て、0.1〜10.0重量部とすることが好ましく、
0.5〜6.0重量部とすることがより好ましい。この
配合量が0.1重量部未満では、本発明によって得られ
る効果が小さくなる傾向があり、10重量部を超える
と、解像度が悪化する傾向がある。The amount of the component (C) in the present invention is as follows:
Preferably, the amount is 0.1 to 10.0 parts by weight based on 100 parts by weight of the total of the components (A) and (B).
More preferably, the amount is 0.5 to 6.0 parts by weight. When the amount is less than 0.1 part by weight, the effect obtained by the present invention tends to decrease, and when the amount exceeds 10 parts by weight, the resolution tends to deteriorate.
【0036】本発明における(D)成分の配合量は、
(A)成分及び(B)成分の総量100重量部に対し
て、0.03〜1重量部とすることが好ましく、0.1
〜0.5重量部にすることがより好ましい。この配合量
が0.03重量部未満では、パターンのすそ引きによっ
て解像度が悪化する傾向があり、1重量部を超えると、
露光の際に組成物の表面での吸収が増大して内部の光硬
化が不充分となる傾向がある。In the present invention, the amount of the component (D) is as follows:
The amount is preferably 0.03 to 1 part by weight based on 100 parts by weight of the total of the components (A) and (B), and is preferably 0.1 to 1 part by weight.
More preferably, it is set to 0.5 parts by weight. When the amount is less than 0.03 parts by weight, the resolution tends to be deteriorated due to the trailing of the pattern.
At the time of exposure, the absorption on the surface of the composition tends to increase and the photocuring inside tends to be insufficient.
【0037】また、本発明の感光性樹脂組成物には、必
要に応じて、マラカイトグリーン等の染料、ロイコクリ
スタルバイオレット等の発色剤、熱発色防止剤、可塑
剤、顔料、充填剤、消泡剤、難燃剤、安定剤、密着性付
与剤、レベリング剤、剥離促進剤、酸化防止剤、香料、
イメージング剤、熱架橋剤などを(A)成分及び(C)
成分の総量100重量部に対して各々0.01〜20重
量部程度含有することができる。これらは、単独で又は
2種類以上を組み合わせて使用される。The photosensitive resin composition of the present invention may contain, if necessary, a dye such as malachite green, a coloring agent such as leuco crystal violet, a thermal coloring inhibitor, a plasticizer, a pigment, a filler, an antifoam. Agents, flame retardants, stabilizers, adhesion promoters, leveling agents, release accelerators, antioxidants, fragrances,
Imaging agent, thermal crosslinking agent, etc.
Each component can be contained in an amount of about 0.01 to 20 parts by weight based on 100 parts by weight of the total amount of the components. These are used alone or in combination of two or more.
【0038】本発明の感光性樹脂組成物は、必要に応じ
て、メタノール、エタノール、アセトン、メチルエチル
ケトン、メチルセロソルブ、エチルセロソルブ、プロピ
レングリコールモノメチルエーテル、N,N−ジメチル
ホルムアミド等の溶剤又はこれらの混合溶剤に溶解して
固形分30〜60重量%程度の溶液として塗布すること
ができる。If necessary, the photosensitive resin composition of the present invention may contain a solvent such as methanol, ethanol, acetone, methyl ethyl ketone, methyl cellosolve, ethyl cellosolve, propylene glycol monomethyl ether, N, N-dimethylformamide, or a mixture thereof. It can be dissolved in a solvent and applied as a solution having a solid content of about 30 to 60% by weight.
【0039】本発明の感光性樹脂組成物は、特に制限は
ないが、金属面、例えば、銅、銅系合金、ニッケル、ク
ロム、鉄、ステンレス等の鉄系合金、好ましくは銅、銅
系合金、鉄系合金の表面上に、液状レジストとして塗布
して乾燥後、必要に応じて保護フィルムを被覆して用い
るか、感光性エレメントの形態で用いられることが好ま
しい。The photosensitive resin composition of the present invention is not particularly limited, but is preferably a metal surface, for example, an iron-based alloy such as copper, copper-based alloy, nickel, chromium, iron, and stainless steel, and preferably copper or copper-based alloy. Preferably, it is applied as a liquid resist on the surface of the iron-based alloy and dried, and then coated with a protective film if necessary, or used in the form of a photosensitive element.
【0040】また、感光性樹脂組成物層の厚みは、用途
により異なるが、乾燥後の厚みで1〜200μmである
ことが好ましく、1〜100μmであることがより好ま
しく、1〜30μmであることが特に好ましい。この厚
みが1μm未満では工業的に塗工困難な傾向があり、1
00μmを超える場合では本発明の効果が小さく、また
感度が不十分となる傾向があり、200μmを超えると
レジスト底部の光硬化性が悪化する傾向がある。液状レ
ジストに保護フィルムを被覆して用いる場合は、保護フ
ィルムとして、ポリエチレン、ポリプロピレン等の不活
性なポリオレフィンフィルム等が用いられるが、感光性
樹脂組成物層からの剥離性の見地から、ポリエチレンフ
ィルムが好ましい。The thickness of the photosensitive resin composition layer varies depending on the application, but is preferably from 1 to 200 μm, more preferably from 1 to 100 μm, and more preferably from 1 to 30 μm in terms of thickness after drying. Is particularly preferred. If the thickness is less than 1 μm, it tends to be industrially difficult to apply,
If it exceeds 00 μm, the effect of the present invention tends to be small and the sensitivity tends to be insufficient. If it exceeds 200 μm, the photocurability at the bottom of the resist tends to deteriorate. When a liquid resist is coated with a protective film, the protective film is, for example, an inactive polyolefin film such as polyethylene and polypropylene.However, from the standpoint of releasability from the photosensitive resin composition layer, a polyethylene film is used. preferable.
【0041】上記感光性エレメントは、支持体として、
ポリエチレンテレフタレート、ポリプロピレン、ポリエ
チレン、ポリエステル等の耐熱性及び耐溶剤性を有する
重合体フィルム上に感光性樹脂組成物を塗布、乾燥する
ことにより得られる。透明性の見地からは、ポリエチレ
ンテレフタレートフィルムを用いることが好ましい。上
記塗布は、ロールコータ、コンマコータ、グラビアコー
タ、エアーナイフコータ、ダイコータ、バーコータ、ス
レーコータ等の公知の方法で行うことができる。また、
乾燥は、70〜150℃、5〜30分程度で行うことが
できる。また、感光性樹脂組成物層中の残存有機溶剤量
は、後の工程での有機溶剤の拡散を防止する点から、2
重量%以下とすることが好ましい。The photosensitive element is used as a support,
It can be obtained by applying and drying a photosensitive resin composition on a polymer film having heat resistance and solvent resistance, such as polyethylene terephthalate, polypropylene, polyethylene and polyester. From the viewpoint of transparency, it is preferable to use a polyethylene terephthalate film. The coating can be performed by a known method such as a roll coater, a comma coater, a gravure coater, an air knife coater, a die coater, a bar coater, and a sleigh coater. Also,
Drying can be performed at 70 to 150 ° C. for about 5 to 30 minutes. In addition, the amount of the residual organic solvent in the photosensitive resin composition layer is 2 to prevent diffusion of the organic solvent in a later step.
% By weight or less.
【0042】また、これらの重合体フィルムは、後に感
光性樹脂組成物層から除去可能でなくてはならないた
め、除去が不可能となるような表面処理が施されたもの
であったり、材質であったりしてはならない。これらの
重合体フィルムの厚みは、1〜100μmとすることが
好ましく、1〜30μmとすることがより好ましい。こ
の厚みが1μm未満の場合、機械的強度が低下し、塗工
時に重合体フィルムが破れるなどの問題が発生する傾向
があり、30μmを超えると解像度が低下し、価格が高
くなる傾向がある。これらの重合体フィルムの一つは感
光性樹脂組成物層の支持フィルムとして、他の一つは感
光性樹脂組成物の保護フィルムとして感光性樹脂組成物
層の両面に積層してもよい。保護フィルムとしては、感
光性樹脂組成物層及び支持体の接着力よりも、感光性樹
脂組成物層及び保護フィルムの接着力の方が小さいもの
が好ましい。Further, since these polymer films must be removable from the photosensitive resin composition layer later, they may be subjected to a surface treatment that makes removal impossible, or may be made of a material. Don't be. The thickness of these polymer films is preferably 1 to 100 μm, more preferably 1 to 30 μm. If the thickness is less than 1 μm, the mechanical strength tends to decrease, and problems such as breakage of the polymer film during coating tend to occur. If the thickness exceeds 30 μm, the resolution tends to decrease and the price tends to increase. One of these polymer films may be laminated on both surfaces of the photosensitive resin composition layer as a support film for the photosensitive resin composition layer, and the other as a protective film for the photosensitive resin composition layer. As the protective film, one having a smaller adhesive force between the photosensitive resin composition layer and the protective film than the adhesive force between the photosensitive resin composition layer and the support is preferable.
【0043】このようにして得られる感光性樹脂組成物
層と重合体フィルムとの2層からなる本発明の感光性エ
レメントは、そのまま又は感光性樹脂組成物層の他の面
に保護フィルムをさらに積層してロール状に巻きとって
貯蔵される。The photosensitive element of the present invention comprising the two layers of the photosensitive resin composition layer and the polymer film thus obtained may be further provided with a protective film as it is or on the other surface of the photosensitive resin composition layer. They are stacked, wound into a roll, and stored.
【0044】上記感光性エレメントを用いてレジストパ
ターンを製造するに際しては、前記の保護フィルムが存
在している場合には、保護フィルムを除去後、感光性樹
脂組成物層を加熱しながら回路形成用基板に圧着するこ
とにより積層する方法などが挙げられ、密着性及び追従
性の見地から減圧下で積層することが好ましい。積層さ
れる表面は、通常金属面であるが、特に制限はない。感
光性樹脂組成物層の加熱温度は70〜130℃とするこ
とが好ましく、圧着圧力は、0.1〜1.0MPa(1〜
10kg/cm2)とすることが好ましいが、これらの条件に
は特に制限はない。また、感光性樹脂組成物層を前記の
ように70〜130℃に加熱すれば、予め回路形成用基
板を予熱処理することは必要ではないが、積層性をさら
に向上させるために、回路形成用基板の予熱処理を行う
こともできる。In producing a resist pattern using the photosensitive element, if the above-mentioned protective film is present, the protective film is removed and the photosensitive resin composition layer is heated while forming a circuit. For example, a method of laminating by press-bonding to a substrate may be mentioned, and it is preferable to laminate under reduced pressure from the viewpoint of adhesion and followability. The surface to be laminated is usually a metal surface, but is not particularly limited. The heating temperature of the photosensitive resin composition layer is preferably set to 70 to 130 ° C., and the pressing pressure is set to 0.1 to 1.0 MPa (1 to 1.0 MPa).
It is preferably 10 kg / cm 2 ), but these conditions are not particularly limited. In addition, if the photosensitive resin composition layer is heated to 70 to 130 ° C. as described above, it is not necessary to pre-heat the circuit forming substrate in advance. Preheating of the substrate can also be performed.
【0045】このようにして積層が完了した感光性樹脂
組成物層は、アートワークと呼ばれるネガ又はポジマス
クパターンを通して活性光線が画像状に照射される。こ
の際、感光性樹脂組成物層上に存在する重合体フィルム
が透明の場合には、そのまま、活性光線を照射してもよ
く、また、不透明の場合には、当然除去する必要があ
る。感光性樹脂組成物層の保護という点からは、重合体
フィルムは透明で、この重合体フィルムを残存させたま
ま、それを通して、活性光線を照射することが好まし
い。活性光線の光源としては、公知の光源、例えば、カ
ーボンアーク灯、水銀蒸気アーク灯、超高圧水銀灯、高
圧水銀灯、キセノンランプ等の紫外線を有効に放射する
ものが用いられる。また、写真用フラッド電球、太陽ラ
ンプ等の可視光を有効に放射するものも用いられる。感
光性樹脂組成物層に含まれる光重合開始剤の感受性は、
通常紫外線領域において最大であるので、その場合は、
活性光線の光源に紫外線を有効に放射するべきものを使
用することが好ましい。これに対し、可視光線において
感受性の高い9,10−フェナンスレンキノン等の光重
合性開始剤を組み合わせて用いる場合は、活性光線の光
源に可視光を有効に放射するべきものを使用することが
好ましい。The photosensitive resin composition layer thus completed is irradiated with actinic rays imagewise through a negative or positive mask pattern called an artwork. At this time, when the polymer film present on the photosensitive resin composition layer is transparent, it may be irradiated with actinic light as it is, and when it is opaque, it is necessary to remove it naturally. From the viewpoint of protecting the photosensitive resin composition layer, it is preferable that the polymer film is transparent, and that the polymer film is irradiated with actinic rays through the polymer film while remaining. As a light source of the actinic ray, a known light source, for example, a carbon arc lamp, a mercury vapor arc lamp, an ultra-high pressure mercury lamp, a high pressure mercury lamp, a xenon lamp, or the like that effectively emits ultraviolet rays is used. In addition, those that effectively emit visible light, such as a flood light bulb for photography and a sun lamp, are also used. Sensitivity of the photopolymerization initiator contained in the photosensitive resin composition layer,
Since it is usually the maximum in the ultraviolet region, in that case,
It is preferable to use an actinic light source that should emit ultraviolet rays effectively. In contrast, when a photopolymerizable initiator such as 9,10-phenanthrenequinone which is highly sensitive to visible light is used in combination, an actinic light source that should emit visible light effectively should be used. Is preferred.
【0046】次いで、露光後、感光性樹脂組成物層上に
支持体が存在している場合には、支持体を除去した後、
ウエット現像、ドライ現像等で未露光部を除去して現像
し、レジストパターンを製造する。ウエット現像の場合
は、アルカリ性水溶液、水系現像液、有機溶剤等の感光
性樹脂組成物に対応した現像液を用いて、例えば、スプ
レー、揺動浸漬、ブラッシング、スクラッピング等の公
知の方法により現像する。Next, after exposure, if a support is present on the photosensitive resin composition layer, the support is removed.
Unexposed portions are removed by wet development, dry development, or the like, and developed to produce a resist pattern. In the case of wet development, using a developer corresponding to a photosensitive resin composition such as an alkaline aqueous solution, an aqueous developer, or an organic solvent, for example, developing by a known method such as spraying, rocking immersion, brushing, and scraping. I do.
【0047】現像液としては、アルカリ性水溶液等の安
全かつ安定であり、操作性が良好なものが用いられる。
上記アルカリ性水溶液の塩基としては、例えば、リチウ
ム、ナトリウム又はカリウムの水酸化物等の水酸化アル
カリ、リチウム、ナトリウム、カリウム若しくはアンモ
ニウムの炭酸塩又は重炭酸塩等の炭酸アルカリ、リン酸
カリウム、リン酸ナトリウム等のアルカリ金属リン酸
塩、ピロリン酸ナトリウム、ピロリン酸カリウム等のア
ルカリ金属ピロリン酸塩などが用いられる。また、現像
に用いるアルカリ性水溶液としては、0.1〜5重量%
炭酸ナトリウムの希薄溶液、0.1〜5重量%炭酸カリ
ウムの希薄溶液、0.1〜5重量%水酸化ナトリウムの
希薄溶液、0.1〜5重量%四ホウ酸ナトリウムの希薄
溶液等が好ましい。また、現像に用いるアルカリ性水溶
液のpHは9〜11の範囲とすることが好ましく、その温
度は、感光性樹脂組成物層の現像性に合わせて調節され
る。As the developer, a safe and stable one having good operability, such as an alkaline aqueous solution, is used.
As the base of the alkaline aqueous solution, for example, alkali hydroxides such as lithium, sodium or potassium hydroxide, alkali carbonates such as lithium, sodium, potassium or ammonium carbonate or bicarbonate, potassium phosphate, phosphoric acid Alkali metal phosphates such as sodium and alkali metal pyrophosphates such as sodium pyrophosphate and potassium pyrophosphate are used. The alkaline aqueous solution used for development is 0.1 to 5% by weight.
A dilute solution of sodium carbonate, a dilute solution of 0.1 to 5% by weight of potassium carbonate, a dilute solution of 0.1 to 5% by weight of sodium hydroxide, a dilute solution of 0.1 to 5% by weight of sodium tetraborate and the like are preferable. . The pH of the alkaline aqueous solution used for development is preferably in the range of 9 to 11, and the temperature is adjusted according to the developability of the photosensitive resin composition layer.
【0048】また、アルカリ性水溶液中には、表面活性
剤、消泡剤、現像を促進させるための少量の有機溶剤等
を混入させてもよい。上記水系現像液としては、水又は
アルカリ水溶液と一種以上の有機溶剤とからなる。ここ
でアルカリ物質としては、前記物質以外に、例えば、ホ
ウ砂やメタケイ酸ナトリウム、水酸化テトラメチルアン
モニウム、エタノールアミン、エチレンジアミン、ジエ
チレントリアミン、2ーアミノ−2−ヒドロキシメチル
−1、3−プロパンジオール、1、3−ジアミノプロパ
ノール−2、モルホリン等が挙げられる。現像液のpH
は、レジストの現像が充分にできる範囲でできるだけ小
さくすることが好ましく、pH8〜12とすることが好ま
しく、pH9〜10とすることがより好ましい。上記有機
溶剤としては、例えば、三アセトンアルコール、アセト
ン、酢酸エチル、炭素数1〜4のアルコキシ基をもつア
ルコキシエタノール、エチルアルコール、イソプロピル
アルコール、ブチルアルコール、ジエチレングリコール
モノメチルエーテル、ジエチレングリコールモノエチル
エーテル、ジエチレングリコールモノブチルエーテル等
が挙げられる。これらは、単独で又は2種類以上を組み
合わせて使用される。A surfactant, an antifoaming agent, a small amount of an organic solvent for accelerating development, and the like may be mixed in the alkaline aqueous solution. The aqueous developer comprises water or an aqueous alkaline solution and one or more organic solvents. Here, as the alkaline substance, other than the above substances, for example, borax, sodium metasilicate, tetramethylammonium hydroxide, ethanolamine, ethylenediamine, diethylenetriamine, 2-amino-2-hydroxymethyl-1,3-propanediol, , 3-diaminopropanol-2, morpholine and the like. Developer pH
Is preferably as small as possible within a range where the development of the resist can be sufficiently performed, preferably pH 8 to 12, and more preferably pH 9 to 10. Examples of the organic solvent include triacetone alcohol, acetone, ethyl acetate, alkoxyethanol having an alkoxy group having 1 to 4 carbon atoms, ethyl alcohol, isopropyl alcohol, butyl alcohol, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, and diethylene glycol monoethyl ether. Butyl ether and the like. These are used alone or in combination of two or more.
【0049】有機溶剤の濃度は、通常、2〜90重量%
とすることが好ましく、その温度は、現像性にあわせて
調整することができる。また、水系現像液中には、界面
活性剤、消泡剤等を少量混入することもできる。単独で
用いる有機溶剤系現像液としては、例えば、1,1,1
−トリクロロエタン、N−メチルピロリドン、N,N−
ジメチルホルムアミド、シクロヘキサノン、メチルイソ
ブチルケトン、γ−ブチロラクトン等が挙げられる。こ
れらの有機溶剤は、引火防止のため、1〜20重量%の
範囲で水を添加することが好ましい。また、必要に応じ
て2種以上の現像方法を併用してもよい。現像の方式に
は、ディップ方式、バトル方式、スプレー方式、ブラッ
シング、スラッピング等があり、高圧スプレー方式が解
像度向上のためには最も適している。The concentration of the organic solvent is usually 2 to 90% by weight.
The temperature can be adjusted in accordance with the developing property. Further, a small amount of a surfactant, an antifoaming agent and the like can be mixed in the aqueous developer. As the organic solvent-based developer used alone, for example, 1,1,1
-Trichloroethane, N-methylpyrrolidone, N, N-
Examples include dimethylformamide, cyclohexanone, methyl isobutyl ketone, γ-butyrolactone, and the like. It is preferable to add water to these organic solvents in a range of 1 to 20% by weight to prevent ignition. If necessary, two or more developing methods may be used in combination. Development methods include a dip method, a battle method, a spray method, brushing, and slapping, and a high-pressure spray method is most suitable for improving resolution.
【0050】現像後の処理として、必要に応じて60〜
250℃程度の加熱又は0.2〜10mJ/cm2程度の露光
を行うことによりレジストパターンをさらに硬化して用
いてもよい。これらの露光及び加熱を行う順番には特に
制限はない。また、アルカリ物質を用いて現像を行った
場合においては、現像後、残存するアルカリ物質を中和
して除去する工程を加えることもできる。中和には、無
機酸又は有機酸の両方を用いることができるが、通常、
有機酸が用いられる。中和に使用される有機酸として
は、例えば、飽和脂肪酸、不飽和脂肪酸、脂肪族二塩基
酸、芳香族二塩基酸、脂肪族三塩基酸、芳香族三塩基酸
等が挙げられる。As processing after development, if necessary,
The resist pattern may be further cured by heating at about 250 ° C. or exposure at about 0.2 to 10 mJ / cm 2 . The order of performing these exposure and heating is not particularly limited. In the case where development is performed using an alkaline substance, a step of neutralizing and removing the remaining alkaline substance after the development can be added. For neutralization, both inorganic and organic acids can be used, but usually,
Organic acids are used. Examples of the organic acid used for neutralization include saturated fatty acids, unsaturated fatty acids, aliphatic dibasic acids, aromatic dibasic acids, aliphatic tribasic acids, and aromatic tribasic acids.
【0051】具体的には、例えば、ぎ酸、酢酸、クロロ
酢酸、ジクロロ酢酸、トリクロロ酢酸、プロピオン酸、
しゅう酸、マロン酸、メチルマロン酸、エチルマロン
酸、こはく酸、メチルこはく酸、アジピン酸、メチルア
ジピン酸、ピメリン酸、スベリン酸、アゼライン酸、セ
バシン酸、マレイン酸、イタコン酸、フタル酸、イソフ
タル酸、テレフタル酸、トリメリト酸、クエン酸等が挙
げられる。これらの中でも、中和の効果が高い点から、
しゅう酸、マロン酸、メチルマロン酸、エチルマロン
酸、こはく酸、メチルこはく酸、クエン酸等が好まし
く、しゅう酸、マロン酸、クエン酸等がより好ましい。
これらは単独で又は2種類以上を組み合わせて使用され
る。さらに、中和の工程の後、水洗する工程を加えるこ
ともできる。Specifically, for example, formic acid, acetic acid, chloroacetic acid, dichloroacetic acid, trichloroacetic acid, propionic acid,
Oxalic acid, malonic acid, methyl malonic acid, ethyl malonic acid, succinic acid, methyl succinic acid, adipic acid, methyl adipic acid, pimelic acid, suberic acid, azelaic acid, sebacic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid Acids, terephthalic acid, trimellitic acid, citric acid and the like. Among these, from the point of high neutralization effect,
Oxalic acid, malonic acid, methylmalonic acid, ethylmalonic acid, succinic acid, methylsuccinic acid, citric acid and the like are preferable, and oxalic acid, malonic acid, citric acid and the like are more preferable.
These are used alone or in combination of two or more. Further, after the neutralization step, a water washing step may be added.
【0052】現像後に行われる金属面のエッチングには
塩化第二銅溶液、塩化第二鉄溶液、アルカリエッチング
溶液、過酸化水素系エッチング液を用いることができる
が、エッチファクタが良好な点から塩化第二鉄溶液を用
いることが望ましい。For the etching of the metal surface after the development, a cupric chloride solution, a ferric chloride solution, an alkaline etching solution, and a hydrogen peroxide-based etching solution can be used. It is desirable to use a ferric solution.
【0053】本発明の感光性エレメントを用いてプリン
ト配線板を製造する場合、現像されたレジストパターン
をマスクとして、回路形成用基板の表面を、エッチン
グ、めっき等の公知方法で処理する。上記めっき法とし
ては、例えば、硫酸銅めっき、ピロリン酸銅めっき等の
銅めっき、ハイスローはんだめっき等のはんだめっき、
ワット浴(硫酸ニッケル−塩化ニッケル)めっき、スル
ファミン酸ニッケルめっき等のニッケルめっき、ハード
金めっき、ソフト金めっき等の金めっきなどがある。次
いで、レジストパターンは、通常、現像に用いたアルカ
リ性水溶液よりさらに強アルカリ性の水溶液で剥離され
る。この強アルカリ性の水溶液としては、例えば、1〜
10重量%水酸化ナトリウム水溶液、1〜10重量%水
酸化カリウム水溶液等が用いられる。剥離方式として
は、例えば、浸漬方式、スプレイ方式等が挙げられ、浸
漬方式及びスプレイ方式を単独で使用してもよいし、併
用してもよい。また、レジストパターンが形成されたプ
リント配線板は、多層プリント配線板でもよい。When a printed wiring board is manufactured using the photosensitive element of the present invention, the surface of the circuit forming substrate is treated by a known method such as etching or plating using the developed resist pattern as a mask. Examples of the plating method include copper plating such as copper sulfate plating and copper pyrophosphate, solder plating such as high-throw solder plating,
There are nickel plating such as Watt bath (nickel sulfate-nickel chloride) plating and nickel sulfamate plating, and gold plating such as hard gold plating and soft gold plating. Next, the resist pattern is usually stripped with a more alkaline aqueous solution than the alkaline aqueous solution used for development. As the strong alkaline aqueous solution, for example, 1 to
A 10% by weight aqueous solution of sodium hydroxide, a 1 to 10% by weight aqueous solution of potassium hydroxide, or the like is used. Examples of the peeling method include an immersion method and a spray method. The immersion method and the spray method may be used alone or in combination. Further, the printed wiring board on which the resist pattern is formed may be a multilayer printed wiring board.
【0054】[0054]
【実施例】以下、本発明を実施例により説明する。 実施例1、2及び比較例1〜2 表1に示す材料を配合し、溶液を得た。次いで、得られ
た溶液に表2に示す(C)成分及び(D)成分を溶解さ
せて、感光性樹脂組成物の溶液を得た。The present invention will be described below with reference to examples. Examples 1 and 2 and Comparative Examples 1 and 2 The materials shown in Table 1 were blended to obtain a solution. Next, the components (C) and (D) shown in Table 2 were dissolved in the obtained solution to obtain a solution of the photosensitive resin composition.
【0055】[0055]
【表1】 [Table 1]
【0056】*1:* 1:
【化12】 Embedded image
【0057】[0057]
【表2】 [Table 2]
【0058】次いで、この感光性樹脂組成物の溶液を、
16μm厚のポリエチレンテレフタレートフィルム上に
均一に塗布し、100℃の熱風対流式乾燥器で、10分
間乾燥して、感光性エレメントを得た。感光性樹脂組成
物層の膜厚は、20μmであった。Next, the solution of the photosensitive resin composition is
The composition was uniformly coated on a 16 μm-thick polyethylene terephthalate film and dried with a hot air convection dryer at 100 ° C. for 10 minutes to obtain a photosensitive element. The thickness of the photosensitive resin composition layer was 20 μm.
【0059】一方、銅箔(厚さ35μm)を両面に積層
したガラスエポキシ材である銅張り積層板(日立化成工
業(株)製、商品名MCL−E−61)の銅表面を、♯6
00相当のブラシを持つ研磨機(三啓(株)製)を用いて
研磨し、水洗後、空気流で乾燥し、得られた銅張り積層
板を80℃に加温し、その銅表面上に、前記感光性樹脂
組成物層を、110℃に加熱しながらラミネートした。
次に、高圧水銀灯ランプを有する露光機(オーク(株)
製)を用いて、ネガとして、41段ステップタブレット
を試験片の上に置いで60mJ/cm2で露光した。次に、ポ
リエチレンテレフタレートフィルムを剥離し、30℃で
1重量%炭酸ナトリウム水溶液を20秒間スプレーする
ことにより、未露光部分を除去した。さらに、銅張り積
層板上に形成された光硬化膜のステップタブレットの段
数を測定することにより、感光性樹脂組成物の感度を評
価し、その結果を表3に示した。感度は、ステップタブ
レットの段数で示され、このステップタブレットの段数
が高いほど、感度が高いことを示す。On the other hand, the copper surface of a copper-clad laminate (manufactured by Hitachi Chemical Co., Ltd., trade name: MCL-E-61), which is a glass epoxy material having a copper foil (thickness: 35 μm) laminated on both sides, is made of # 6.
Polishing using a polishing machine with a brush equivalent to 00 (manufactured by Sankei Co., Ltd.), washing with water, drying with an air stream, heating the obtained copper-clad laminate to 80 ° C. Then, the photosensitive resin composition layer was laminated while being heated to 110 ° C.
Next, an exposure machine equipped with a high-pressure mercury lamp (Oak Co., Ltd.)
As a negative, a 41-step tablet was placed on the test piece and exposed at 60 mJ / cm 2 . Next, the polyethylene terephthalate film was peeled off, and an unexposed portion was removed by spraying a 1% by weight aqueous solution of sodium carbonate at 30 ° C. for 20 seconds. Furthermore, the sensitivity of the photosensitive resin composition was evaluated by measuring the number of steps of the step tablet of the photocurable film formed on the copper-clad laminate, and the results are shown in Table 3. The sensitivity is indicated by the number of steps of the step tablet. The higher the number of steps of the step tablet, the higher the sensitivity.
【0060】[0060]
【表3】 [Table 3]
【0061】[0061]
【発明の効果】請求項1、2、3及び4記載の感光性樹
脂組成物は、感度が極めて優れ、密着性、耐薬品性、柔
軟性及びめっき浴汚染性に優れ、液状レジスト及び感光
性エレメントとしての用途に極めて好適である。請求項
5及び6記載の感光性樹脂組成物は、請求項1、2、3
及び4記載の感光性樹脂組成物の効果を奏し、さらにア
ルカリ現像液による現像性に優れ、液状レジスト及び感
光性エレメントとしての用途に極めて好適である。請求
項7記載の感光性エレメントは、感度が極めて優れ、密
着性、耐薬品性、柔軟性、めっき浴汚染性、アルカリ現
像性、機械強度及び作業性に優れ、プリント配線の高密
度化及びプリント配線板製造の自動化に極めて有用であ
る。The photosensitive resin compositions according to the first, second, third and fourth aspects are extremely excellent in sensitivity, excellent in adhesion, chemical resistance, flexibility and plating bath contamination, and are suitable for liquid resists and photosensitive compositions. It is extremely suitable for use as an element. The photosensitive resin composition according to any one of claims 5 and 6,
And 4 exhibit the effects of the photosensitive resin composition described above, and are further excellent in developability with an alkali developing solution, and are extremely suitable for use as a liquid resist and a photosensitive element. The photosensitive element according to claim 7 is extremely excellent in sensitivity, excellent in adhesion, chemical resistance, flexibility, plating bath stainability, alkali developability, mechanical strength and workability, high density of printed wiring and printing. It is extremely useful for automation of wiring board production.
【0062】請求項8記載のレジストパターンの製造法
は、プリント配線の高密度化及びプリント配線板製造の
自動化に極めて有用な感度が極めて優れ、密着性、耐薬
品性、柔軟性、めっき浴汚染性、アルカリ現像性、機械
強度及び作業性が優れるレジストパターンの製造法であ
る。請求項7記載のプリント配線板の製造法は、プリン
ト配線の高密度化及びプリント配線板製造の自動化に極
めて有用な感度が極めて優れ、密着性、耐薬品性、柔軟
性、めっき浴汚染性、アルカリ現像性、機械強度及び作
業性が優れるプリント配線板の製造法である。The method for producing a resist pattern according to the eighth aspect has extremely excellent sensitivity, which is extremely useful for increasing the density of printed wiring and automating the production of printed wiring boards, and has excellent adhesion, chemical resistance, flexibility, and plating bath contamination. This is a method for producing a resist pattern having excellent properties, alkali developability, mechanical strength and workability. The method for producing a printed wiring board according to claim 7 is extremely excellent in sensitivity, which is extremely useful for increasing the density of printed wiring and automating the production of printed wiring boards, and has excellent adhesion, chemical resistance, flexibility, plating bath contamination, This is a method for producing a printed wiring board having excellent alkali developability, mechanical strength and workability.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H05K 3/18 H05K 3/18 D ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H05K 3/18 H05K 3/18 D
Claims (9)
内に少なくとも1つの重合可能なエチレン性不飽和基を
有する光重合性化合物及び(C)光重合開始剤として一
般式(I) 【化1】 (式中、Xは水素原子又はフッ素原子を示し、Rは炭素
数1〜20のアルキル基を示す)で表わされる2,4,
5−トリアリールイミダゾール二量体を含有してなる感
光性樹脂組成物。1. A photopolymerizable compound having (A) a binder polymer, (B) a photopolymerizable compound having at least one polymerizable ethylenically unsaturated group in a molecule, and (C) a photopolymerization initiator represented by the general formula (I): 1) Wherein X represents a hydrogen atom or a fluorine atom, and R represents an alkyl group having 1 to 20 carbon atoms.
A photosensitive resin composition comprising a 5-triarylimidazole dimer.
体である請求項1記載の感光性樹脂組成物。2. The photopolymerization initiator (C) has the following formula (II): The photosensitive resin composition according to claim 1, which is a 2,4,5-triarylimidazole dimer represented by the following formula:
体である請求項1記載の感光性樹脂組成物。(C) The photopolymerization initiator is represented by the following formula (III): The photosensitive resin composition according to claim 1, which is a 2,4,5-triarylimidazole dimer represented by the following formula:
〜6のアルキル基を示し、R3及びR4は各々独立に水素
原子、炭素数1〜6のアルキル基又は炭素数1〜6の環
状アルキル基を示し、R3及びR4は、互いに結合して環
を形成していてもよい)で表されるクマリン系化合物又
は一般式(V) 【化5】 (式中、R1及びR2は一般式(IV)におけるR1及びR2
と同意義である)で表されるアルキルアミノベンゾフェ
ノン系化合物を含有してなる請求項1、2又は3記載の
感光性樹脂組成物。4. A sensitizer of the general formula (IV): (Wherein, R 1 and R 2 each independently represent a hydrogen atom or a carbon atom
And R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 6 carbon atoms or a cyclic alkyl group having 1 to 6 carbon atoms, and R 3 and R 4 are bonded to each other. A coumarin compound represented by the general formula (V): (Wherein, R 1 and R 2 are R 1 and R 2 in the general formula (IV)
The photosensitive resin composition according to claim 1, which comprises an alkylaminobenzophenone-based compound represented by the following formula:
ル基を含有するバインダーポリマーである請求項1、
2、3又は4記載の感光性樹脂組成物。5. The method according to claim 1, wherein (A) the binder polymer is a binder polymer containing a carboxyl group.
5. The photosensitive resin composition according to 2, 3 or 4.
H/gであり、重量平均分子量20,000〜300,0
00である請求項5記載の感光性樹脂組成物。6. The component (A) having an acid value of 100 to 500 mg KO.
H / g, and a weight average molecular weight of 20,000 to 300,0
The photosensitive resin composition according to claim 5, which is 00.
感光性樹脂組成物を支持体上に塗布、乾燥、積層してな
る感光性エレメント。7. A photosensitive element obtained by applying, drying and laminating the photosensitive resin composition according to claim 1, 2, 3, 4, 5 or 6 on a support.
路形成用基板上に感光性樹脂組成物層が密着するように
して積層し、活性光線を画像状に照射し、露光部を光硬
化させ、未露光部を現像により除去することを特徴とす
るレジストパターンの製造法。8. The photosensitive element according to claim 7, which is laminated on the substrate for circuit formation so that the photosensitive resin composition layer is in close contact with the photosensitive element, and is irradiated with actinic rays in an image-like manner, and the exposed portion is photocured. And removing unexposed portions by development.
法により、レジストパターンの製造された回路形成用基
板をエッチング又はめっきすることを特徴とするプリン
ト配線板の製造法。9. A method for manufacturing a printed wiring board, comprising etching or plating a circuit-forming substrate on which a resist pattern has been manufactured by the method for manufacturing a resist pattern according to claim 8.
Priority Applications (1)
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JP28764499A JP4135126B2 (en) | 1999-02-26 | 1999-10-08 | Photosensitive resin composition, photosensitive element using the same, resist pattern manufacturing method, and printed wiring board manufacturing method |
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JP5148199 | 1999-02-26 | ||
JP11-51481 | 1999-02-26 | ||
JP28764499A JP4135126B2 (en) | 1999-02-26 | 1999-10-08 | Photosensitive resin composition, photosensitive element using the same, resist pattern manufacturing method, and printed wiring board manufacturing method |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003050459A (en) * | 2001-08-07 | 2003-02-21 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern and method for producing printed wiring board |
JP2005338375A (en) * | 2004-05-26 | 2005-12-08 | Mitsubishi Chemicals Corp | Photopolymerizable composition, photosensitive image forming medium, photosensitive image forming material and image forming method therefor |
WO2006043314A1 (en) * | 2004-10-19 | 2006-04-27 | Hitachi Chemical Co., Ltd. | Photosensitive element, resist pattern forming method and method for manufacturing printed circuit board |
US7220533B2 (en) * | 2000-03-21 | 2007-05-22 | Hitachi Chemical Co., Ltd. | Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern, and method for producing printed wiring board |
JP2011095765A (en) * | 2010-12-16 | 2011-05-12 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern, and method for manufacturing printed wiring board |
CN106607091A (en) * | 2016-10-10 | 2017-05-03 | 湘潭大学 | Microporous polymer-nano-metal particle catalyst and its preparation method and use |
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1999
- 1999-10-08 JP JP28764499A patent/JP4135126B2/en not_active Expired - Fee Related
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7220533B2 (en) * | 2000-03-21 | 2007-05-22 | Hitachi Chemical Co., Ltd. | Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern, and method for producing printed wiring board |
US7232647B2 (en) | 2000-03-21 | 2007-06-19 | Hitachi Chemical Co., Ltd. | Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern and method for producing printed wiring board |
JP2003050459A (en) * | 2001-08-07 | 2003-02-21 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern and method for producing printed wiring board |
JP2005338375A (en) * | 2004-05-26 | 2005-12-08 | Mitsubishi Chemicals Corp | Photopolymerizable composition, photosensitive image forming medium, photosensitive image forming material and image forming method therefor |
WO2006043314A1 (en) * | 2004-10-19 | 2006-04-27 | Hitachi Chemical Co., Ltd. | Photosensitive element, resist pattern forming method and method for manufacturing printed circuit board |
JPWO2006043314A1 (en) * | 2004-10-19 | 2008-05-22 | 日立化成工業株式会社 | Photosensitive element, resist pattern forming method, and printed wiring board manufacturing method |
JP4555945B2 (en) * | 2004-10-19 | 2010-10-06 | 日立化成工業株式会社 | Photosensitive element, resist pattern forming method, and printed wiring board manufacturing method |
JP2011095765A (en) * | 2010-12-16 | 2011-05-12 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern, and method for manufacturing printed wiring board |
CN106607091A (en) * | 2016-10-10 | 2017-05-03 | 湘潭大学 | Microporous polymer-nano-metal particle catalyst and its preparation method and use |
CN106607091B (en) * | 2016-10-10 | 2019-03-19 | 湘潭大学 | Microporous polymer-nanometer metal particle catalyst and its preparation method and application |
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