JP2000304702A - 粒状物品位判別方法およびその装置 - Google Patents

粒状物品位判別方法およびその装置

Info

Publication number
JP2000304702A
JP2000304702A JP11540599A JP11540599A JP2000304702A JP 2000304702 A JP2000304702 A JP 2000304702A JP 11540599 A JP11540599 A JP 11540599A JP 11540599 A JP11540599 A JP 11540599A JP 2000304702 A JP2000304702 A JP 2000304702A
Authority
JP
Japan
Prior art keywords
granular
image
granular material
article position
optical information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11540599A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000304702A5 (enExample
Inventor
Satoru Satake
覺 佐竹
Manabu Ikeda
学 池田
Takahiro Doi
貴広 土井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Satake Engineering Co Ltd
Original Assignee
Satake Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Satake Engineering Co Ltd filed Critical Satake Engineering Co Ltd
Priority to JP11540599A priority Critical patent/JP2000304702A/ja
Priority to KR1020000020004A priority patent/KR20000077034A/ko
Priority to CA002306060A priority patent/CA2306060A1/en
Priority to EP00303384A priority patent/EP1046902B1/en
Priority to DE60016304T priority patent/DE60016304D1/de
Priority to AT00303384T priority patent/ATE284029T1/de
Priority to AU28908/00A priority patent/AU771766B2/en
Priority to TW089107491A priority patent/TW477896B/zh
Priority to DK00303384T priority patent/DK1046902T3/da
Priority to US09/556,947 priority patent/US6427128B1/en
Priority to CNB001070177A priority patent/CN1296701C/zh
Publication of JP2000304702A publication Critical patent/JP2000304702A/ja
Publication of JP2000304702A5 publication Critical patent/JP2000304702A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP11540599A 1999-04-22 1999-04-22 粒状物品位判別方法およびその装置 Pending JP2000304702A (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP11540599A JP2000304702A (ja) 1999-04-22 1999-04-22 粒状物品位判別方法およびその装置
KR1020000020004A KR20000077034A (ko) 1999-04-22 2000-04-17 입상물의 품질을 평가하기 위한 장치 및 방법
CA002306060A CA2306060A1 (en) 1999-04-22 2000-04-18 Apparatus and method for evaluating quality of granular object
EP00303384A EP1046902B1 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular objects
DE60016304T DE60016304D1 (de) 1999-04-22 2000-04-20 Vorrichtung und Verfahren zur Auswertung der Qualität von körnigen Objekten
AT00303384T ATE284029T1 (de) 1999-04-22 2000-04-20 Vorrichtung und verfahren zur auswertung der qualität von körnigen objekten
AU28908/00A AU771766B2 (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
TW089107491A TW477896B (en) 1999-04-22 2000-04-20 Apparatus and method for evaluating quality of granular object
DK00303384T DK1046902T3 (da) 1999-04-22 2000-04-20 Apparat og fremgangsmåde til evaluering af kvaliteten af granulære objekter
US09/556,947 US6427128B1 (en) 1999-04-22 2000-04-21 Apparatus and method for evaluating quality of granular object
CNB001070177A CN1296701C (zh) 1999-04-22 2000-04-24 评估颗粒状物体质量的装置和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11540599A JP2000304702A (ja) 1999-04-22 1999-04-22 粒状物品位判別方法およびその装置

Publications (2)

Publication Number Publication Date
JP2000304702A true JP2000304702A (ja) 2000-11-02
JP2000304702A5 JP2000304702A5 (enExample) 2004-10-07

Family

ID=14661767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11540599A Pending JP2000304702A (ja) 1999-04-22 1999-04-22 粒状物品位判別方法およびその装置

Country Status (1)

Country Link
JP (1) JP2000304702A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005506546A (ja) * 2001-10-24 2005-03-03 ペー．アー．エル．エム．マイクロレーザー　テヒノロギース　アーゲー レーザ顕微解剖システム
JP2008502916A (ja) * 2004-06-09 2008-01-31 コグネックス・テクノロジー・アンド・インベストメント・コーポレーション マシンビジョン検出器の設定および試験の方法と装置
JP2010540957A (ja) * 2007-10-01 2010-12-24 大韓民国農村振興庁 白米及び玄米の外観品位測定装置並びに方法
WO2011125927A1 (ja) * 2010-04-01 2011-10-13 新日本製鐵株式会社 粒子測定装置および粒子測定方法
CN113706527A (zh) * 2021-10-27 2021-11-26 南通宝田包装科技有限公司 一种化妆品包装的质量检测方法及系统
CN119044165A (zh) * 2024-10-30 2024-11-29 河北凯阔食品集团股份有限公司 用于亚麻籽油生产的亚麻籽原材料品质检测系统及方法

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005506546A (ja) * 2001-10-24 2005-03-03 ペー．アー．エル．エム．マイクロレーザー　テヒノロギース　アーゲー レーザ顕微解剖システム
JP2008502916A (ja) * 2004-06-09 2008-01-31 コグネックス・テクノロジー・アンド・インベストメント・コーポレーション マシンビジョン検出器の設定および試験の方法と装置
JP2010540957A (ja) * 2007-10-01 2010-12-24 大韓民国農村振興庁 白米及び玄米の外観品位測定装置並びに方法
WO2011125927A1 (ja) * 2010-04-01 2011-10-13 新日本製鐵株式会社 粒子測定装置および粒子測定方法
JP5114690B2 (ja) * 2010-04-01 2013-01-09 新日鐵住金株式会社 粒子測定装置および粒子測定方法
KR101340765B1 (ko) 2010-04-01 2013-12-11 신닛테츠스미킨 카부시키카이샤 입자 측정 장치 및 입자 측정 방법
US9372072B2 (en) 2010-04-01 2016-06-21 Nippon Steel & Sumitomo Metal Corporation Particle measuring device and particle measuring method
CN113706527A (zh) * 2021-10-27 2021-11-26 南通宝田包装科技有限公司 一种化妆品包装的质量检测方法及系统
CN113706527B (zh) * 2021-10-27 2021-12-21 南通宝田包装科技有限公司 一种化妆品包装的质量检测方法及系统
CN119044165A (zh) * 2024-10-30 2024-11-29 河北凯阔食品集团股份有限公司 用于亚麻籽油生产的亚麻籽原材料品质检测系统及方法

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