JP2000277493A5 - - Google Patents

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Publication number
JP2000277493A5
JP2000277493A5 JP1999084088A JP8408899A JP2000277493A5 JP 2000277493 A5 JP2000277493 A5 JP 2000277493A5 JP 1999084088 A JP1999084088 A JP 1999084088A JP 8408899 A JP8408899 A JP 8408899A JP 2000277493 A5 JP2000277493 A5 JP 2000277493A5
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JP
Japan
Prior art keywords
manufacturing
semiconductor
semiconductor device
etching
plasma etching
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Pending
Application number
JP1999084088A
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English (en)
Japanese (ja)
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JP2000277493A (ja
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Priority to JP8408899A priority Critical patent/JP2000277493A/ja
Priority claimed from JP8408899A external-priority patent/JP2000277493A/ja
Publication of JP2000277493A publication Critical patent/JP2000277493A/ja
Publication of JP2000277493A5 publication Critical patent/JP2000277493A5/ja
Pending legal-status Critical Current

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JP8408899A 1999-03-26 1999-03-26 半導体基板のプラズマエッチング方法および半導体エッチング基板 Pending JP2000277493A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8408899A JP2000277493A (ja) 1999-03-26 1999-03-26 半導体基板のプラズマエッチング方法および半導体エッチング基板

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8408899A JP2000277493A (ja) 1999-03-26 1999-03-26 半導体基板のプラズマエッチング方法および半導体エッチング基板

Publications (2)

Publication Number Publication Date
JP2000277493A JP2000277493A (ja) 2000-10-06
JP2000277493A5 true JP2000277493A5 (enrdf_load_stackoverflow) 2005-09-15

Family

ID=13820760

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8408899A Pending JP2000277493A (ja) 1999-03-26 1999-03-26 半導体基板のプラズマエッチング方法および半導体エッチング基板

Country Status (1)

Country Link
JP (1) JP2000277493A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2003067293A1 (ja) 2002-02-06 2005-06-02 松下電器産業株式会社 光導波路の製造方法
JP6328898B2 (ja) * 2013-09-22 2018-05-23 国立大学法人名古屋大学 Iii族窒化物半導体のエッチング方法およびiii族窒化物半導体装置の製造方法
JP7262375B2 (ja) * 2019-11-26 2023-04-21 東京エレクトロン株式会社 プラズマ処理方法及びプラズマ処理装置

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