JP2000272960A - Dielectric ceramic composition for microwave use, its production and electronic part for microwave use produced by using the dielectric ceramic composition for microwave use - Google Patents
Dielectric ceramic composition for microwave use, its production and electronic part for microwave use produced by using the dielectric ceramic composition for microwave useInfo
- Publication number
- JP2000272960A JP2000272960A JP2000011412A JP2000011412A JP2000272960A JP 2000272960 A JP2000272960 A JP 2000272960A JP 2000011412 A JP2000011412 A JP 2000011412A JP 2000011412 A JP2000011412 A JP 2000011412A JP 2000272960 A JP2000272960 A JP 2000272960A
- Authority
- JP
- Japan
- Prior art keywords
- mass
- terms
- sro
- ceramic composition
- dielectric ceramic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Filters And Equalizers (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、マイクロ波領域で
使用される誘電体磁器組成物に関し、特に、Qが高く、
温度特性が安定しており、さらに銀や銅といった内部電
極材料との同時焼成が可能な低温焼結性を有する誘電体
磁器組成物およびその製造方法ならびにそれを用いたマ
イクロ波用電子部品に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dielectric porcelain composition used in a microwave region, and more particularly, to a high Q,
The present invention relates to a dielectric ceramic composition which has stable temperature characteristics and has a low-temperature sinterability that can be simultaneously fired with an internal electrode material such as silver or copper, a method for producing the same, and a microwave electronic component using the same.
【0002】[0002]
【従来の技術】近年、自動車電話、携帯電話、衛星放送
など、マイクロ波領域の電磁波を利用する通信技術の進
展に伴い、機器の小型化が要求されている。このために
は、機器を構成する個々の部品が小型化される必要があ
る。2. Description of the Related Art In recent years, with the development of communication technology using electromagnetic waves in the microwave range, such as automobile telephones, mobile telephones, and satellite broadcasting, there has been a demand for miniaturization of devices. For this purpose, it is necessary to reduce the size of individual components constituting the device.
【0003】誘電体磁器組成物は、これらのマイクロ波
機器において、誘電体共振器、フィルタ、積層インダク
ター、または積層コンデンサ、および、これらを複合化
した高周波積層基板用の材料として用いられている。誘
電体共振器の大きさは同じ共振モードを利用する場合、
誘電体材料の持つ誘電率の平方根に逆比例する。このた
め、小型の誘電体共振器を作製するには、高い誘電率を
有する誘電体材料が必要となる。また、他にマイクロ波
用の誘電体材料として求められる特性としては、マイク
ロ波領域での誘電損失tanδ(=1/Q)が小さいこ
と、すなわちQ値が大きいこと、共振周波数の温度係数
τfができるだけ零に近いことなどが要求される。[0003] Dielectric ceramic compositions are used in these microwave devices as materials for dielectric resonators, filters, multilayer inductors or multilayer capacitors, and high-frequency multilayer substrates obtained by combining these. If the size of the dielectric resonator uses the same resonance mode,
It is inversely proportional to the square root of the dielectric constant of the dielectric material. Therefore, in order to manufacture a small-sized dielectric resonator, a dielectric material having a high dielectric constant is required. Other characteristics required as a microwave dielectric material include a small dielectric loss tan δ (= 1 / Q) in the microwave region, that is, a large Q value, and a temperature coefficient τf of the resonance frequency. It must be as close to zero as possible.
【0004】さらに、マイクロ波領域で使用される誘電
体共振器、フィルタ、積層インダクター、又は積層コン
デンサの内部電極等は、マイクロ波帯における抵抗損失
の低い材料で構成される必要があり、従って、銀や銅・
金といった導電率の高い金属材料を用いて構成する必要
がある。また、これらマイクロ波用の電子部品において
は、小型化を図るために、セラミックスと内部電極との
積層構造体を同時焼成して得られる積層型電子部品とす
ることが試みられている。このため、銀(融点961
℃)や銅(融点1083℃)、金(融点1063℃)の
ような融点の低い電極材料を用いて、誘電体材料と同時
焼成する場合、誘電体材料として1000℃以下の温
度、好ましくは900℃以下の温度で焼結する材料であ
ることが必要である。Furthermore, dielectric resonators, filters, multilayer inductors, and internal electrodes of multilayer capacitors used in the microwave region must be made of a material having low resistance loss in the microwave band. Silver or copper
It is necessary to use a metal material having high conductivity such as gold. In addition, in order to reduce the size of these electronic components for microwaves, a multilayer electronic component obtained by simultaneously firing a multilayer structure of ceramics and internal electrodes has been attempted. Therefore, silver (melting point 961)
C.), copper (melting point 1083 ° C.), gold (melting point 1063 ° C.), and an electrode material having a low melting point, and co-firing with a dielectric material, the temperature of the dielectric material is 1000 ° C. or less, preferably 900 ° C. It must be a material that sinters at a temperature of not more than ℃.
【0005】従来のマイクロ波帯で利用されてきた誘電
体材料の一例として、特開平8−325055号公報に
は、Al、Si、Pb、Na、K、Ca、Srの酸化物
から構成される磁器組成物で組成比は、重量%で、Al
2O3 40〜60%、SiO2 25〜40%、Pb
O 5〜15%、Na2O 0.1〜3%、K2O1〜
3%、CaO 1〜6%、SrO 1〜6%から成る低
温焼成磁器組成物が開示されている。これによれば、9
00℃程度での低温焼成が可能である。[0005] As an example of a conventional dielectric material used in the microwave band, JP-A-8-325055 discloses an oxide of Al, Si, Pb, Na, K, Ca and Sr. In the porcelain composition, the composition ratio is Al
2 O 3 40~60%, SiO 2 25~40%, Pb
O 5-15%, Na 2 O 0.1-3%, K 2 O1
A low-temperature fired porcelain composition comprising 3%, 1-6% CaO and 1-6% SrO is disclosed. According to this, 9
Low-temperature baking at about 00 ° C. is possible.
【0006】また、従来のマイクロ波帯で利用されてき
た誘電体材料の他の一例として、特公平6−74166
号公報には、SiO2 25〜80重量%、BaO,S
rOのうち1種または2種が15〜70重量%およびB
2O3 1.5〜5重量%からなる主成分に、Cr2O
3,CuO,NiO,Co2O3およびFe2O3のい
ずれか1種が添加含有された磁器組成物であり、添加物
がCr2O3またはCuOの場合には0.2〜10重量
%の範囲で添加され、添加物がNiO,Co2O3およ
びFe2O3の場合には、1〜10重量%の範囲で添加
される事を特徴とする低温焼成用磁器組成物が開示され
ている。これによれば、900℃程度での低温焼成が可
能である。Another example of a dielectric material used in the conventional microwave band is disclosed in Japanese Patent Publication No. 6-74166.
No. 25-80% by weight of SiO 2 , BaO, S
15 to 70% by weight of one or two of rO and B
Cr 2 O as a main component consisting of 1.5 to 5% by weight of 2 O 3
3 , a porcelain composition to which any one of CuO, NiO, Co 2 O 3 and Fe 2 O 3 is added, and when the additive is Cr 2 O 3 or CuO, 0.2 to 10% by weight %, And when the additives are NiO, Co 2 O 3 and Fe 2 O 3 , they are added in a range of 1 to 10% by weight. Have been. According to this, low-temperature baking at about 900 ° C. is possible.
【0007】[0007]
【発明が解決しようとする課題】この特開平8−325
055号に開示されている磁器組成物では、PbOが5
〜15重量%含有されている。このPbOは、低温で焼
成させるために、このような磁器組成物では一般に用い
られている。しかし、このPbOは有害物質であり、製
造工程中で生じる廃棄物等の処理に費用がかかり、又製
造工程中でのPbOの取り扱いにも注意が必要であっ
た。The problem to be solved by the present invention is disclosed in Japanese Patent Application Laid-Open No. 8-325.
In the porcelain composition disclosed in U.S. Pat.
-15% by weight. This PbO is generally used in such a porcelain composition because it is fired at a low temperature. However, this PbO is a harmful substance, and it is costly to treat waste and the like generated during the manufacturing process, and care must be taken in handling PbO during the manufacturing process.
【0008】また、この特公平6−74166号に開示
されている磁器組成物では、B2O 3が1.5〜5重量
%含有されている。このB2O3は、低温で焼成させる
ために、このような磁器組成物では一般に用いられてい
る。しかし、このB2O3を用いて焼成した場合には、
高周波での誘電損失が増大するため、Qの高い磁器を得
る事が困難であり、さらに、これを多用した場合、仮焼
中にホウ素が蒸発し炉材に損傷を与えたり、焼成時に電
極材料と反応したり、製造工程で水、アルコールに溶解
し、乾燥時に偏析したり、使用する有機バインダーと反
応しバインダーの性能を劣化させる等の課題を解決する
必要があり、高いQ値を有する磁器を得ようとする場
合、また、安定した製造工程を確立しようとする場合に
たくさんの課題を解決する必要があった。[0008] Also disclosed in Japanese Patent Publication No. 6-74166.
In the porcelain composition described, B2O 3Is 1.5 to 5 weight
%. This B2O3Bake at low temperature
Therefore, it is generally used in such a porcelain composition.
You. But this B2O3When firing using
Since the dielectric loss at high frequencies increases, a high Q porcelain is obtained.
It is difficult to use
Boron evaporates during the process, damaging the furnace material,
Reacts with polar materials and dissolves in water and alcohol during the manufacturing process
Segregates during drying or reacts with the organic binder used.
Solving issues such as deteriorating binder performance
Need to obtain porcelain with a high Q factor
And when trying to establish a stable manufacturing process
Many problems had to be solved.
【0009】本発明は、上記のことを鑑みてPbOを含
まず、かつ、ホウ素化合物をも含有しない磁器組成物で
あって、εが6〜8程度で、Q値が高く、τfが小さ
く、しかも1000℃以下の低温、さらに好ましくは、
900℃以下の低温で焼成することが可能なマイクロ波
用誘電体磁器組成物を提供すること、またその製造方法
を提供すること、またそれを用いたマイクロ波用電子部
品を提供することを目的とする。In view of the above, the present invention is a porcelain composition containing no PbO and no boron compound, having a ε of about 6 to 8, a high Q value, a small τf, Moreover, a low temperature of 1000 ° C. or less, more preferably,
An object of the present invention is to provide a dielectric ceramic composition for microwaves that can be fired at a low temperature of 900 ° C. or less, to provide a method for producing the same, and to provide an electronic component for microwaves using the same. And
【0010】[0010]
【課題を解決するための手段】第1の発明は、主成分が
Al,Si,Srの酸化物で構成され、Al,Si,S
rをそれぞれAl2O3、SiO2、SrOに換算し合
計100質量%としたとき、Al2O3換算で10〜6
0質量%、SiO2換算で25〜60質量%、SrO換
算で7.5〜50質量%のAl,Si,Srを含有し、
前記合計100質量%に対し副成分として、Bi2O3
換算で0.1〜10質量%のBiを含有したマイクロ波
用誘電体磁器組成物である。According to a first aspect of the present invention, the main component is composed of an oxide of Al, Si, Sr,
When r is converted to Al 2 O 3 , SiO 2 , and SrO to obtain a total of 100% by mass, r is 10 to 6 in terms of Al 2 O 3.
0% by mass, 25 to 60% by mass in terms of SiO 2 , 7.5 to 50% by mass in terms of SrO, containing Al, Si, Sr,
Bi 2 O 3 as a sub-component with respect to the total 100% by mass
It is a dielectric ceramic composition for microwaves containing 0.1 to 10% by mass of Bi in conversion.
【0011】第2の発明は、主成分がAl,Si,Sr
の酸化物で構成され、Al,Si,SrをそれぞれAl
2O3、SiO2、SrOに換算し合計100質量%と
したとき、Al2O3換算で10〜60質量%、SiO
2換算で25〜60質量%、SrO換算で7.5〜50
質量%のAl,Si,Srを含有し、前記合計100質
量%に対し副成分として、Bi2O3換算で0.1〜1
0質量%のBiを含有し、更にNa2O換算で0.1〜
5質量%のNa、K2O換算で0.1〜5質量%のK、
CoO換算で0.1〜5質量%のCoうち少なくとも1
種以上を含有したマイクロ波用誘電体磁器組成物であ
る。In the second invention, the main components are Al, Si, Sr
Al, Si, and Sr are each converted to Al
When converted to 2 O 3 , SiO 2 and SrO to give a total of 100% by mass, 10 to 60% by mass in terms of Al 2 O 3 and SiO 2
25 to 60% by mass in terms of 2; 7.5 to 50 in terms of SrO
Weight% of Al, Si, and containing Sr, as a sub-component relative to the total 100 mass%, 0.1 to 1 in terms of Bi 2 O 3
Containing 0 mass% of Bi, further 0.1 in terms of Na 2 O
5% by mass of Na, 0.1 to 5% by mass of K in terms of K 2 O,
At least 1% of 0.1 to 5% by mass of Co in terms of CoO
A dielectric ceramic composition for microwaves containing at least one species.
【0012】第3の発明は、主成分がAl,Si,Sr
の酸化物で構成され、Al,Si,SrをそれぞれAl
2O3、SiO2、SrOに換算し合計100質量%と
したとき、Al2O3換算で10〜60質量%、SiO
2換算で25〜60質量%、SrO換算で7.5〜50
質量%のAl,Si,Srを含有し、前記合計100質
量%に対し副成分として、Bi2O3換算で0.1〜1
0質量%のBiを含有し、更にCuO換算で0.01〜
5質量%のCu、MnO2換算で0.01〜5質量%の
Mn、0.01〜5質量%のAgのうち少なくとも1種
以上を含有したマイクロ波用誘電体磁器組成物である。According to a third aspect of the present invention, the main components are Al, Si, Sr
Al, Si, and Sr are each converted to Al
When converted to 2 O 3 , SiO 2 and SrO to give a total of 100% by mass, 10 to 60% by mass in terms of Al 2 O 3 and SiO 2
25 to 60% by mass in terms of 2; 7.5 to 50 in terms of SrO
Weight% of Al, Si, and containing Sr, as a sub-component relative to the total 100 mass%, 0.1 to 1 in terms of Bi 2 O 3
0 mass% Bi, and 0.01 to
5 wt% of Cu, a MnO 2 converted at 0.01 to 5 mass% of Mn, microwave dielectric ceramic composition containing at least one or more of 0.01 to 5 mass% of Ag.
【0013】第4の発明は、主成分がAl,Si,Sr
の酸化物で構成され、Al,Si,SrをそれぞれAl
2O3、SiO2、SrOに換算し合計100質量%と
したとき、Al2O3換算で10〜60質量%、SiO
2換算で25〜60質量%、SrO換算で7.5〜50
質量%のAl,Si,Srを含有し、前記合計100質
量%に対し副成分として、Bi2O3換算で0.1〜1
0質量%のBiを含有し、更にNa2O換算で0.1〜
5質量%のNa、K2O換算で0.1〜5質量%のK、
CoO換算で0.1〜5質量%のCoのうち少なくとも
1種以上を含有し、かつCuO換算で0.01〜5質量
%のCu、MnO2換算で0.01〜5質量%のMn、
0.01〜5質量%のAgのうち少なくとも1種以上を
含有したマイクロ波用誘電体磁器組成物である。According to a fourth aspect of the present invention, the main component is Al, Si, Sr
Al, Si, and Sr are each converted to Al
When converted to 2 O 3 , SiO 2 and SrO to give a total of 100% by mass, 10 to 60% by mass in terms of Al 2 O 3 and SiO 2
25 to 60% by mass in terms of 2; 7.5 to 50 in terms of SrO
Weight% of Al, Si, and containing Sr, as a sub-component relative to the total 100 mass%, 0.1 to 1 in terms of Bi 2 O 3
Containing 0 mass% of Bi, further 0.1 in terms of Na 2 O
5% by mass of Na, 0.1 to 5% by mass of K in terms of K 2 O,
0.1 to 5% by mass of Co in terms of CoO, containing at least one of Co, and 0.01 to 5% by mass of Cu in terms of CuO, 0.01 to 5% by mass of Mn in terms of MnO 2 ,
It is a dielectric ceramic composition for microwaves containing at least one or more of 0.01 to 5% by mass of Ag.
【0014】第5の発明は、主成分がAl,Si,S
r,Tiの酸化物で構成され、Al,Si,Sr,Ti
をそれぞれAl2O3、SiO2、SrO、TiO2に
換算し合計100質量%としたとき、Al2O3換算で
10〜60質量%、SiO2換算で25〜60質量%、
SrO換算で7.5〜50質量%、TiO2換算で20
質量%以下のAl,Si,Sr,Tiを含有し、前記合
計100質量%に対し副成分として、Bi2O3換算で
0.1〜10質量%のBiを含有したマイクロ波用誘電
体磁器組成物である。According to a fifth aspect of the present invention, the main components are Al, Si, S
r, Ti, Al, Si, Sr, Ti
Are converted to Al 2 O 3 , SiO 2 , SrO, and TiO 2 to give a total of 100% by mass, respectively, 10 to 60% by mass in terms of Al 2 O 3 , 25 to 60% by mass in terms of SiO 2 ,
7.5 to 50 wt% in terms of SrO, 20 in terms of TiO 2
Containing mass% or less of Al, Si, Sr, and Ti, the total as a sub-component relative to 100 mass%, Bi 2 O 3 in terms of 0.1 to 10 wt% of a microwave dielectric ceramic containing Bi A composition.
【0015】第6の発明は、主成分がAl,Si,S
r,Tiの酸化物で構成され、Al,Si,Sr,Ti
をそれぞれAl2O3、SiO2、SrO、TiO2に
換算し合計100質量%としたとき、Al2O3換算で
10〜60質量%、SiO2換算で25〜60質量%、
SrO換算で7.5〜50質量%、TiO2換算で20
質量%以下のAl,Si,Sr,Tiを含有し、前記合
計100質量%に対し副成分として、Bi2O3換算で
0.1〜10質量%のBiを含有し、更にNa2O換算
で0.1〜5質量%のNa、K2O換算で0.1〜5質
量%のK、CoO換算で0.1〜5質量%のCoのうち
少なくとも1種以上を含有したマイクロ波用誘電体磁器
組成物である。According to a sixth aspect of the present invention, the main components are Al, Si, S
r, Ti, Al, Si, Sr, Ti
Are converted to Al 2 O 3 , SiO 2 , SrO, and TiO 2 to give a total of 100% by mass, respectively, 10 to 60% by mass in terms of Al 2 O 3 , 25 to 60% by mass in terms of SiO 2 ,
7.5 to 50 wt% in terms of SrO, 20 in terms of TiO 2
Containing mass% or less of Al, Si, Sr, and Ti, as the sub ingredient with respect to the total 100 wt%, and containing Bi of 0.1 to 10 mass% in terms of Bi 2 O 3, further terms of Na 2 O in microwave containing at least one or more of 0.1 to 5 mass% of Na, K 2 O in terms of 0.1 to 5 wt% of K, of 0.1 to 5 mass% in terms of CoO Co It is a dielectric porcelain composition.
【0016】第7の発明は、主成分がAl,Si,S
r,Tiの酸化物で構成され、Al,Si,Sr,Ti
をそれぞれAl2O3、SiO2、SrO、TiO2に
換算し合計100質量%としたとき、Al2O3換算で
10〜60質量%、SiO2換算で25〜60質量%、
SrO換算で7.5〜50質量%、TiO2換算で20
質量%以下のAl,Si,Sr,Tiを含有し、前記合
計100質量%に対し副成分として、Bi2O3換算で
0.1〜10質量%のBiを含有し、更にCuO換算で
0.01〜5質量%のCu、MnO2換算で0.01〜
5質量%のMn、0.01〜5質量%のAgのうち少な
くとも1種以上を含有したマイクロ波用誘電体磁器組成
物である。According to a seventh aspect of the present invention, the main components are Al, Si, S
r, Ti, Al, Si, Sr, Ti
Are converted to Al 2 O 3 , SiO 2 , SrO, and TiO 2 to give a total of 100% by mass, respectively, 10 to 60% by mass in terms of Al 2 O 3 , 25 to 60% by mass in terms of SiO 2 ,
7.5 to 50 wt% in terms of SrO, 20 in terms of TiO 2
Containing mass% or less of Al, Si, Sr, and Ti, as the sub ingredient with respect to the total 100 mass%, Bi 2 O 3 contained 0.1 to 10 mass% of Bi in terms 0 further terms of CuO 0.01 to 5% by mass of Cu and MnO 2 in terms of 0.01 to
It is a dielectric ceramic composition for microwaves containing at least one or more of 5% by mass of Mn and 0.01 to 5% by mass of Ag.
【0017】第8の発明は、主成分がAl,Si,S
r,Tiの酸化物で構成され、Al,Si,Sr,Ti
をそれぞれAl2O3、SiO2、SrO、TiO2に
換算し合計100質量%としたとき、Al2O3換算で
10〜60質量%、SiO2換算で25〜60質量%、
SrO換算で7.5〜50質量%、TiO2換算で20
質量%以下のAl,Si,Sr,Tiを含有し、前記合
計100質量%に対し副成分として、Bi2O3換算で
0.1〜10質量%のBiを含有し、更にNa2O換算
で0.1〜5質量%のNa、K2O換算で0.1〜5質
量%のK、CoO換算で0.1〜5質量%のCoのうち
少なくとも1種以上を含有し、かつCuO換算で0.0
1〜5質量%のCu、MnO2換算で0.01〜5質量
%のMn、0.01〜5質量%のAgのうち少なくとも
1種以上を含有したマイクロ波用誘電体磁器組成物であ
る。According to an eighth aspect of the present invention, the main components are Al, Si, S
r, Ti, Al, Si, Sr, Ti
Are converted to Al 2 O 3 , SiO 2 , SrO, and TiO 2 to give a total of 100% by mass, respectively, 10 to 60% by mass in terms of Al 2 O 3 , 25 to 60% by mass in terms of SiO 2 ,
7.5 to 50 wt% in terms of SrO, 20 in terms of TiO 2
Containing mass% or less of Al, Si, Sr, and Ti, as the sub ingredient with respect to the total 100 wt%, and containing Bi of 0.1 to 10 mass% in terms of Bi 2 O 3, further terms of Na 2 O contains at least one more, and CuO of in 0.1 to 5 mass% of Na, K 2 O in terms of 0.1 to 5 wt% of K, of 0.1 to 5 mass% in terms of CoO Co 0.0 in conversion
1 to 5 mass% of Cu, Mn of 0.01 to 5 mass% with MnO 2 in terms, is a microwave dielectric ceramic composition containing at least one or more of 0.01 to 5 mass% of Ag .
【0018】第9の発明は、Al,Si,Sr又はA
l,Si,Sr,Tiの酸化物を主成分とし、副成分と
してBiを必須とするマイクロ波用誘電体磁器組成物で
あって、組織にAl2O3結晶相と少なくともAl,S
i,Sr又はAl,Si,Sr,Tiを含む化合物結晶
相を備え、fQ値が5THz以上であるマイクロ波用誘
電体磁器組成物である。The ninth invention is directed to Al, Si, Sr or A
A microwave dielectric porcelain composition containing an oxide of l, Si, Sr, and Ti as a main component, and Bi as an auxiliary component, wherein the structure has an Al 2 O 3 crystal phase and at least Al, S
A dielectric ceramic composition for microwaves having a compound crystal phase containing i, Sr or Al, Si, Sr, Ti and having an fQ value of 5 THz or more.
【0019】また第10の発明は、第1の発明乃至第9
の発明のいずれかのマイクロ波用誘電体磁器組成物の製
造方法であって、Al2O3以外の元素をガラス化する
第1の熱処理工程と、当該第1の熱処理工程のしかる後
に、組織にAl2O3の他に少なくともAl,Si,S
r又はAl,Si,Sr,Tiを含む化合物相を形成す
るような、かつfQ値が5THz以上となるような第2
の熱処理工程を有することを特徴とするマイクロ波用誘
電体磁器組成物の製造方法である。このマイクロ波用誘
電体磁器組成物の製造方法において、第2の熱処理工程
を第1の熱処理工程の熱処理温度超、1000℃以下の
熱処理温度で行うことが好ましい。The tenth invention is the first to ninth inventions.
The method for producing a dielectric ceramic composition for microwaves according to any one of claims 1 to 3 , comprising a first heat treatment step for vitrifying elements other than Al 2 O 3 , and after the first heat treatment step, In addition to Al 2 O 3 , at least Al, Si, S
r or a second phase that forms a compound phase containing Al, Si, Sr, and Ti and has an fQ value of 5 THz or more.
A method for producing a dielectric ceramic composition for microwaves, comprising: In this method for producing a dielectric ceramic composition for microwaves, it is preferable that the second heat treatment step is performed at a heat treatment temperature higher than the heat treatment temperature of the first heat treatment step and 1000 ° C. or lower.
【0020】また第11の発明は、第1の発明乃至第9
の発明のいずれかのマイクロ波用誘電体磁器組成物を用
いることを特徴とするマイクロ波用電子部品である。前
記マイクロ波用誘電体磁器組成物からなる誘電体層に電
極を形成し、当該誘電体層を複数積層してマイクロ波用
電子部品を構成してもよい。The eleventh invention is the first to ninth inventions.
An electronic component for microwaves, characterized by using any one of the dielectric ceramic compositions for microwaves according to the present invention. Electrodes may be formed on a dielectric layer made of the dielectric ceramic composition for microwaves, and a plurality of the dielectric layers may be laminated to constitute a microwave electronic component.
【0021】[0021]
【発明の実施の形態】本発明のマイクロ波用誘電体磁器
組成物は、例えば主成分がAl,Si,Sr又はAl,
Si,Sr,Tiの酸化物で構成され、それぞれAl2
O3換算で10〜60質量%、SiO2換算で25〜6
0質量%、SrO換算で10〜50質量%、TiO2換
算で20質量%以下からなり、前記主成分100質量%
に対し副成分として、Bi2O3換算で0.1〜10質
量%のBiを含有し、1000℃以下又は900℃以下
の温度で焼成できるマイクロ波用誘電体磁器組成物であ
る。これにより、本発明の誘電体磁器組成物は、銀や
銅、金といった高い導電率を有する金属材料を内部電極
として用い、一体焼結を行うことができる。よって、本
発明の誘電体材料の有する高いQ値を用い、しかも電気
抵抗による損失を抑えた内部電極を用い、極めて損失の
小さいマイクロ波用電子部品を構成することができる。
これにより、誘電体共振器、フィルタ、積層インダクタ
ー又は積層コンデンサ、および、これらを複合化した高
周波積層基板等に応用して、優れたマイクロ波特性およ
び低損失な回路デバイスを実現することができる。BEST MODE FOR CARRYING OUT THE INVENTION The dielectric ceramic composition for microwaves according to the present invention has, for example, a main component of Al, Si, Sr or Al,
It is composed of oxides of Si, Sr and Ti, each of which contains Al 2
10 to 60% by mass in terms of O 3 , 25 to 6 in terms of SiO 2
0% by mass, 10 to 50% by mass in terms of SrO, 20% by mass or less in terms of TiO 2 , and 100% by mass of the main component
On the other hand, the dielectric ceramic composition for microwaves contains 0.1 to 10% by mass of Bi in terms of Bi 2 O 3 as a sub-component and can be fired at a temperature of 1000 ° C. or lower or 900 ° C. or lower. Thereby, the dielectric ceramic composition of the present invention can be integrally sintered by using a metal material having high conductivity such as silver, copper, or gold as the internal electrode. Therefore, it is possible to configure a microwave electronic component having extremely low loss by using the internal electrode that uses the high Q value of the dielectric material of the present invention and suppresses the loss due to electric resistance.
Thereby, it is possible to realize a circuit device with excellent microwave characteristics and low loss by being applied to a dielectric resonator, a filter, a multilayer inductor or a multilayer capacitor, and a high-frequency multilayer substrate obtained by combining them. .
【0022】また本発明では、前記マイクロ波用誘電体
磁器組成物に更に副成分としてNa(Na2O換算で
0.1〜5質量%)、K(K2O換算で0.1〜5質量
%)、Co(CoO換算で0.1〜5質量%)のうち少
なくとも1種以上を含有させることが好ましい。これら
の副成分は、仮焼工程においてAl2O3以外の成分が
ガラス化する際、このガラスの軟化点を低下させる効果
があり、より低温で収縮を開始する材料が得られる事、
および、焼成工程において、1000℃以下の焼成温度
でQの高い誘電特性を得る事を可能とするものであり、
含有させることが好ましい。In the present invention, the dielectric ceramic composition for microwaves may further contain Na (0.1 to 5% by mass in terms of Na 2 O) and K (0.1 to 5% in terms of K 2 O) as accessory components. %) And Co (0.1 to 5% by mass in terms of CoO). These subcomponents have an effect of lowering the softening point of the glass when components other than Al 2 O 3 are vitrified in the calcining step, and a material that starts shrinking at a lower temperature is obtained.
And in the firing step, it is possible to obtain a high Q dielectric property at a firing temperature of 1000 ° C. or less,
It is preferable to include them.
【0023】また本発明は、更に副成分としてCu(C
uO換算で0.01〜5質量%)、Mn(MnO2換算
で0.01〜5質量%)、Ag:0.01〜5質量%の
うち少なくとも1種以上を含有させることが好ましい。
これらの副成分は、主に焼成工程において誘電体磁器組
成物の結晶化を促進する効果があり、低温焼結を達成す
るために添加されるものである。In the present invention, Cu (C)
0.01 to 5 mass% in uO terms), Mn (0.01 to 5 mass% with MnO 2 in terms), Ag: it is preferable to contain at least one or more of 0.01 to 5 mass%.
These subcomponents have an effect of promoting crystallization of the dielectric ceramic composition mainly in the firing step, and are added to achieve low-temperature sintering.
【0024】本発明において、各成分範囲を特定した理
由は以下のとおりである。AlがAl2O3換算で10
質量%より少ないと、1000℃以下の低温焼成では、
焼結密度が十分上昇しないために、磁器が多孔質とな
り、吸湿等により良好な特性が得られない。又、60質
量%より多いと、やはり1000℃以下の低温焼成で
は、焼結密度が十分上昇しないために、磁器が多孔質と
なり、吸湿等により良好な特性が得られない。In the present invention, the reasons for specifying each component range are as follows. Al is 10 in terms of Al 2 O 3
If the amount is less than 10% by mass, low-temperature firing at 1000 ° C. or lower
Since the sintering density does not sufficiently increase, the porcelain becomes porous, and good characteristics cannot be obtained due to moisture absorption or the like. On the other hand, if the content is more than 60% by mass, the sintering density is not sufficiently increased even at a low temperature of 1000 ° C. or less, so that the porcelain becomes porous and good characteristics cannot be obtained due to moisture absorption or the like.
【0025】また、SiがSiO2換算で25質量%よ
り少ないと、1000℃以下の低温焼成では、焼結密度
が十分上昇しないために、磁器が多孔質となり、吸湿等
により良好な特性が得られない。又、60質量%より多
いと、やはり1000℃以下の低温焼成では、焼結密度
が十分上昇しないために、磁器が多孔質となり、吸湿等
により良好な特性が得られない。When the content of Si is less than 25% by mass in terms of SiO 2 , the sintered density does not increase sufficiently at a low temperature of 1000 ° C. or lower, so that the porcelain becomes porous and good characteristics are obtained by moisture absorption and the like. I can't. On the other hand, if the content is more than 60% by mass, the sintering density is not sufficiently increased even at a low temperature of 1000 ° C. or less, so that the porcelain becomes porous and good characteristics cannot be obtained due to moisture absorption or the like.
【0026】また、SrがSrO換算で10質量%より
少ないと、1000℃以下の低温焼成では、焼結密度が
十分上昇しないために、磁器が多孔質となり、吸湿等に
より良好な特性が得られない。又、50質量%より多い
と、やはり1000℃以下の低温焼成では、焼結密度が
十分上昇しないために、磁器が多孔質となり、吸湿等に
より良好な特性が得られない。When Sr is less than 10% by mass in terms of SrO, the sintering density does not increase sufficiently at a low temperature of 1000 ° C. or less, so that the porcelain becomes porous and good characteristics are obtained by moisture absorption and the like. Absent. On the other hand, if the content is more than 50% by mass, the sintering density is not sufficiently increased even at a low temperature of 1000 ° C. or lower, so that the porcelain becomes porous and good characteristics cannot be obtained due to moisture absorption or the like.
【0027】また、TiがTiO2換算で20質量%よ
り多いと、1000℃以下の低温焼成では、焼結密度が
十分上昇しないために、磁器が多孔質となり、吸湿等に
より良好な特性が得られないと同時に、磁器の共振周波
数の温度係数が,Tiの含有量増加と共に大きくなり良
好な特性が得られない。Tiが含有してない場合の磁器
の共振周波数の温度係数τfは−20〜−40ppm/℃に
対し、Tiの配合量を多くしていくにつれて増加し、τ
fを0ppm/℃に調整する事も容易である。If Ti is more than 20% by mass in terms of TiO 2 , the sintering density does not increase sufficiently at a low temperature of 1000 ° C. or less, so that the porcelain becomes porous and good characteristics are obtained by moisture absorption and the like. At the same time, the temperature coefficient of the resonance frequency of the porcelain increases with an increase in the Ti content, and good characteristics cannot be obtained. The temperature coefficient τf of the resonance frequency of the porcelain in the case where Ti is not contained increases from −20 to −40 ppm / ° C. as the blending amount of Ti increases, and
It is also easy to adjust f to 0 ppm / ° C.
【0028】また、本発明に係る誘電体磁器組成物は、
その製造工程中の仮焼工程において、誘電体磁器組成物
を構成する各成分のうちAl2O3を除くSiO2、S
rO、および副成分添加物がガラス化する事により、そ
の後の焼成工程において、生成されたガラス材料が焼結
促進剤として機能し、緻密化が達成されると同時に、A
l2O3を含む成分が結晶化してQの高い誘電特性を発
現するものと考えられる。Further, the dielectric porcelain composition according to the present invention comprises:
In the calcining step in the manufacturing process, SiO 2 , S, excluding Al 2 O 3 , among the components constituting the dielectric ceramic composition
By vitrification of the rO and the additive of the accessory component, in the subsequent firing step, the generated glass material functions as a sintering accelerator, and densification is achieved.
It is considered that the component containing l 2 O 3 is crystallized to exhibit a high Q dielectric property.
【0029】また、Biは、低温焼結を達成するために
添加される。つまり、このBiを添加することにより、
仮焼工程においてAl2O3以外の成分がガラス化する
際、このガラスの軟化点を低下させる効果があり、より
低温で収縮を開始する材料が得られる事、および、焼成
工程において、1000℃以下の焼成温度でQの高い誘
電特性を得る事を可能とするものである。しかしなが
ら、Bi2O3換算で10質量%より多いと、Q値が小
さくなる。このため、10質量%以下が望ましい。更に
好ましくは5質量%以下である。一方、0.1質量%よ
り少ないと添加効果が少なく、より低温での結晶化が困
難になるため、0.1質量%以上が好ましい。更に好ま
しくは0.2質量%以上である。Bi is added to achieve low temperature sintering. That is, by adding this Bi,
When the components other than Al 2 O 3 are vitrified in the calcining step, the softening point of the glass is reduced, and a material that starts shrinking at a lower temperature is obtained. It is possible to obtain high Q dielectric characteristics at the following firing temperatures. However, when the content is more than 10% by mass in terms of Bi 2 O 3 , the Q value becomes small. For this reason, 10 mass% or less is desirable. More preferably, it is at most 5% by mass. On the other hand, if it is less than 0.1% by mass, the effect of addition is small and crystallization at lower temperatures becomes difficult. It is more preferably at least 0.2% by mass.
【0030】また、Naは、Biと同様に、Na2O換
算で0.1質量%未満の場合、ガラスの軟化点が高くな
り低温での焼結が困難となる。このため、1000℃以
下の焼成では緻密な材料が得られない。また、5質量%
を超えると誘電損失が大きくなり過ぎ、実用性が無くな
る。このため、Na2O換算で0.1〜5質量%が好ま
しい。When Na is less than 0.1% by mass in terms of Na 2 O, similarly to Bi, the softening point of the glass increases and sintering at low temperatures becomes difficult. Therefore, a dense material cannot be obtained by firing at 1000 ° C. or lower. In addition, 5% by mass
If it exceeds, the dielectric loss becomes too large and practicality is lost. Therefore, the content is preferably 0.1 to 5% by mass in terms of Na 2 O.
【0031】また、KもNaと同様にK2O換算で0.
1質量%未満の場合、ガラスの軟化点が高くなり焼結が
困難となり緻密な材料が得られず、5質量%を超えると
誘電損失が大きくなり過ぎ、実用性がない。このため、
K2O換算で0.1〜5質量%が好ましい。K is, like Na, 0.1 K in terms of K 2 O.
If the amount is less than 1% by mass, the softening point of the glass becomes high and sintering becomes difficult, so that a dense material cannot be obtained. If the amount exceeds 5% by mass, the dielectric loss becomes too large, which is not practical. For this reason,
0.1 to 5 wt% in K 2 O in terms are preferred.
【0032】また、Coは、Naと同じく仮焼工程で生
成されるガラスの軟化点を低下させる効果があり、低温
焼結を達成するために添加されるが、CoO換算で0.
1質量%未満の場合、その添加効果は小さく、このた
め、900℃以下の焼成では緻密な材料を得る事が困難
となる。また、5質量%を超えると結晶化する温度が1
000℃以上となり、1000℃以下で誘電損失が大き
くなり過ぎ、実用性が無くなる。このため、CoO換算
で0.1〜5質量%が好ましい。Co, like Na, has the effect of lowering the softening point of the glass produced in the calcining step, and is added to achieve low-temperature sintering.
If the amount is less than 1% by mass, the effect of the addition is small, so that it is difficult to obtain a dense material by firing at 900 ° C. or lower. If it exceeds 5% by mass, the crystallization temperature will be 1
When the temperature becomes 000 ° C. or higher, the dielectric loss becomes too large at 1000 ° C. or lower, and practicality is lost. Therefore, the content is preferably 0.1 to 5% by mass in terms of CoO.
【0033】また、AgもNaと同様に添加する事によ
り、ガラスの軟化点を低下させると同時に、結晶化を促
進する効果があり、低温焼結を達成するために添加され
るが、5質量%を超えると誘電損失が大きくなり過ぎ、
実用性がない。このため、Agは5質量%以下の添加が
好ましい。さらに好ましくは2質量%以下である。Ag is added in the same manner as Na to lower the softening point of the glass and to promote crystallization, and is added to achieve low-temperature sintering. %, The dielectric loss becomes too large,
Not practical. For this reason, it is preferable to add 5 mass% or less of Ag. More preferably, it is at most 2% by mass.
【0034】また、Cuは、焼成工程において誘電体磁
器組成物の結晶化を促進する効果があり、低温焼結を達
成するために添加されるが、CuO換算で0.01質量
%未満の場合、その添加効果は小さく、900℃以下で
の焼成ではQの高い材料を得る事が困難になる。また、
5質量%を超えると低温焼結性が損なわれるため、Cu
O換算で0.01〜5質量%が好ましい。Further, Cu has an effect of promoting crystallization of the dielectric ceramic composition in the firing step, and is added to achieve low-temperature sintering. The effect of the addition is small, and it is difficult to obtain a material having a high Q by firing at 900 ° C. or lower. Also,
If the content exceeds 5% by mass, the low-temperature sinterability is impaired.
It is preferably 0.01 to 5% by mass in terms of O.
【0035】また、Mnは、Cuと同じく焼成工程にお
いて誘電体磁器組成物の結晶化を促進する効果があり、
低温焼結を達成するために添加されるが、MnO2換算
で0.01質量%未満の場合、その添加効果は小さく、
900℃以下での焼成ではQの高い材料を得る事が困難
になる。また、5質量%を超えると低温焼結性が損なわ
れるため、MnO2換算で0.01〜5質量%が好まし
い。Mn has an effect of promoting crystallization of the dielectric ceramic composition in the firing step, similarly to Cu.
It is added to achieve low-temperature sintering, but if it is less than 0.01% by mass in terms of MnO 2 , the effect of addition is small,
Firing at 900 ° C. or lower makes it difficult to obtain a high Q material. If the content exceeds 5% by mass, low-temperature sinterability is impaired. Therefore, the content is preferably 0.01 to 5% by mass in terms of MnO 2 .
【0036】本発明では、上記の特定の成分組成によ
り、εが6〜8程度、τfの絶対値が小さく(50pp
m/℃以下)、fQ(fは共振周波数)値が5000G
Hz(5THz)以上で、しかも1000℃以下の温度
で焼結することができるマイクロ波用誘電体磁器組成物
を得ることができる。In the present invention, ε is about 6 to 8 and the absolute value of τf is small (50 pp) by the above specific component composition.
m / ° C or less), fQ (f is the resonance frequency) value is 5000G
It is possible to obtain a dielectric ceramic composition for microwaves that can be sintered at a temperature of not less than 1000 Hz and not less than 5 Hz (5 THz).
【0037】このように1000℃以下又は900℃以
下の温度で焼成できるため、本発明の誘電体磁器組成物
は、銀や銅、金といった高い導電率を有する金属材料を
内部電極として用い、一体焼結を行うことができる。よ
って、本発明の誘電体材料の有する高いQ値と、内部電
極の電気抵抗による損失を抑えることにより、極めて損
失の小さいマイクロ波用電子部品を構成することができ
る。これにより、誘電体共振器、フィルタ、積層インダ
クター又は積層コンデンサ、および、これらを複合化し
た高周波積層基板等に応用して、優れたマイクロ波特性
および低損失な回路デバイスを実現することができる。As described above, since firing can be performed at a temperature of 1000 ° C. or less or 900 ° C. or less, the dielectric ceramic composition of the present invention uses a metal material having high conductivity, such as silver, copper, or gold, as an internal electrode, and Sintering can be performed. Thus, by suppressing the loss due to the high Q value of the dielectric material of the present invention and the electrical resistance of the internal electrode, it is possible to configure a microwave electronic component with extremely small loss. Thereby, it is possible to realize a circuit device with excellent microwave characteristics and low loss by being applied to a dielectric resonator, a filter, a multilayer inductor or a multilayer capacitor, and a high-frequency multilayer substrate obtained by combining them. .
【0038】一方で、この銅を内部電極材料として用い
る場合は、焼成雰囲気の調整が必要となるが、銀を内部
電極材料として用いる場合は、焼成時の雰囲気を空気中
で行うことができ、工数の低減が可能である。本発明の
誘電体磁器組成物は、900℃での焼成も可能であり、
銀を用いて、空気中での一体焼結が可能であるという特
徴も有する。On the other hand, when copper is used as the internal electrode material, the firing atmosphere needs to be adjusted. When silver is used as the internal electrode material, the firing can be performed in air. Man-hours can be reduced. The dielectric ceramic composition of the present invention can be fired at 900 ° C.
Another feature is that silver can be integrally sintered in air using silver.
【0039】[0039]
【実施例】以下、実施例について詳細に説明する。 (実施例1)出発原料として、純度99.9%、平均粒
径0.5μmのAl2O3粉末、純度99.9%以上、
平均粒径0.5μm以下のSiO2粉末、純度99.9
%、平均粒径0.5μmのSrO粉末、純度99.9
%、平均粒径0.5μmのTiO2粉末、純度99.9
%、平均粒径0.5〜5μmのBi2O3粉末、Na2
CO3粉末、K2CO3粉末、CuO粉末、Ag粉末、
MnO2粉末、Co3O 4粉末を用い、表1,表2,表
3に示す質量比率に従って秤量する。The embodiments will be described below in detail. (Example 1) As starting materials, purity: 99.9%, average grain size
0.5 μm diameter Al2O3Powder, purity 99.9% or more,
SiO with an average particle size of 0.5 μm or less2Powder, purity 99.9
%, SrO powder having an average particle size of 0.5 μm, purity 99.9
%, TiO2 powder having an average particle diameter of 0.5 μm, purity 99.9
%, Bi having an average particle size of 0.5 to 5 μm2O3Powder, Na2
CO3Powder, K2CO3Powder, CuO powder, Ag powder,
MnO2 powder, Co3O 4Using powder, Table 1, Table 2, Table
Weigh according to the mass ratio shown in 3.
【0040】[0040]
【表1】 [Table 1]
【0041】[0041]
【表2】 [Table 2]
【0042】[0042]
【表3】 [Table 3]
【0043】これらの粉末をポリエチレン製のボールミ
ルに投入し更に酸化ジルコニウム製のボールと純水を投
入して20時間湿式混合を行う。混合スラリーを加熱乾
燥し水分を蒸発させた後ライカイ機で解砕し、アルミナ
製のるつぼに入れて、700〜850℃で2時間仮焼す
る。仮焼粉末は、前述のボールミルに投入し20〜40
時間湿式粉砕を行い、乾燥させ原料粉体とする。この粉
体にバインダとしてポリビニルアルコールの10%水溶
液を10〜20質量%添加し、乳鉢に混練後、32メッ
シュのふるいを通過させ整粒し、造粒粉末を得る。この
粉末を金型に投入し、2GPaの圧力で加圧成形し、円
柱形状の成形体試料を得た。These powders are charged into a polyethylene ball mill, and further, zirconium oxide balls and pure water are charged, and wet mixing is performed for 20 hours. After heating and drying the mixed slurry to evaporate the water, the mixed slurry is crushed by a raikai machine, placed in an alumina crucible, and calcined at 700 to 850 ° C for 2 hours. The calcined powder is put into the above-mentioned ball mill and is charged at 20 to 40.
Wet pulverization is carried out for an hour and dried to obtain a raw material powder. 10% by mass of a 10% aqueous solution of polyvinyl alcohol is added as a binder to the powder, and the mixture is kneaded in a mortar, passed through a 32-mesh sieve, and sized to obtain a granulated powder. This powder was charged into a mold and pressed under a pressure of 2 GPa to obtain a columnar shaped sample.
【0044】この試料を空気中にて、600℃まで10
0℃/hで昇温し、2時間持続後800〜900℃まで
200℃/hの速度で昇温し、さらに2時間持続後、2
00℃/hの速度で冷却して焼成を行い、得られた焼結
体の寸法と質量から焼結密度を算出した。また、誘電体
共振器法により、共振周波数f0と無負荷Q値Q0を求
めた。焼成体の寸法とf0、Q0より、比誘電率及び誘
電損失係数tanδの逆数とf0の積よりf・Q値を算
出した。共振周波数は8〜14GHzであった。これら
の結果を表4、表5、表6に示す。焼成雰囲気は空気中
に限定されるものではなく、窒素などの非還元性雰囲気
下でも同じ誘電特性を示す。又、試料の結晶化状態は、
X線回折装置により、ガラス化、結晶化の状態を測定
し、確認した。尚、試料番号に*印のないものが本発明
の実施例であり、試料番号に*印のあるものは本発明の
範囲外の比較例である。This sample was heated to 600 ° C. in air for 10 minutes.
The temperature was raised at 0 ° C./h, and after 2 hours, the temperature was raised from 800 to 900 ° C. at a rate of 200 ° C./h.
Sintering was performed by cooling at a rate of 00 ° C./h, and the sintered density was calculated from the dimensions and mass of the obtained sintered body. Further, the resonance frequency f 0 and the no-load Q value Q 0 were obtained by the dielectric resonator method. From the dimensions of the fired body and f 0 and Q 0 , the f · Q value was calculated from the product of f 0 and the reciprocal of the relative dielectric constant and the dielectric loss coefficient tan δ. The resonance frequency was 8 to 14 GHz. The results are shown in Tables 4, 5, and 6. The firing atmosphere is not limited to air, and the same dielectric characteristics are exhibited even in a non-reducing atmosphere such as nitrogen. The crystallization state of the sample is
The state of vitrification and crystallization was measured and confirmed with an X-ray diffractometer. Samples with no * mark are examples of the present invention, and sample numbers with * marks are comparative examples outside the scope of the present invention.
【0045】試料番号に*印を付した比較例によれば、
発明の実施の形態で述べた通り、本発明で規定した発明
の範囲外で作製した試料においては、1000℃以下の
低温の焼成温度においては緻密化していないために試料
が多孔質となったり、緻密化しても結晶化しないために
fQ値が低く誘電特性の測定が不能であることが明らか
である。一方、試料番号に*印のない実施例において
は、本発明で規定した組成の範囲内であるため、100
0℃以下、さらには900℃以下の焼成温度いおいても
緻密化し、誘電率が6〜9、fQ値が5THz以上の誘
電特性が得られ、さらにTiO2の配合量により共振周
波数の温度係数を制御可能であり、0ppm/℃に近づ
けることが出来ることが明らかである。According to the comparative example in which the sample number is marked with *,
As described in the embodiment of the present invention, in a sample prepared outside the scope of the invention defined in the present invention, the sample is porous at a low firing temperature of 1000 ° C. or less because the sample is not densified, It is clear that the fQ value is low and the dielectric properties cannot be measured because the crystal is not crystallized even if it is densified. On the other hand, in the examples in which the sample number is not marked with *, the composition is within the range of the composition specified in the present invention.
0 ℃ or less, and even densified below sintering temperature Ioi 900 ° C., a dielectric constant of 6 to 9, fQ value or more is obtained dielectric properties 5 THz, further the temperature coefficient of the resonant frequency by the amount of TiO 2 Is clearly controllable and can be approached to 0 ppm / ° C.
【0046】また試料No.73の組成を有するマイク
ロ波用誘電体磁器組成物について、800℃で仮焼した
後のX線回折パターンを図2に、これを900℃で焼結
した後のX線回折パターンを図1に示す。800℃仮焼
のX線回折パターンでは、一部未反応の元素等の微小ピ
ークがあるものの、おおよそAl2O3結晶以外の元素
がガラス化したハローなパターンであった。これを更に
900℃で焼結した後のX線回折パターンでは、ハロー
なパターンが減少し、新たにSrAl2Si2O8やN
aやKを含む長石族の固溶体と考えられる結晶相が析出
した。The sample No. FIG. 2 shows the X-ray diffraction pattern of the dielectric ceramic composition for microwave having the composition No. 73 after calcining at 800 ° C., and FIG. 1 shows the X-ray diffraction pattern after sintering it at 900 ° C. Show. The X-ray diffraction pattern of the 800 ° C. calcination showed a halo pattern in which elements other than the Al 2 O 3 crystal were vitrified, although there were some small peaks of unreacted elements and the like. In the X-ray diffraction pattern after further sintering at 900 ° C., halo patterns are reduced, and SrAl 2 Si 2 O 8 and N
A crystal phase considered to be a feldspar-group solid solution containing a and K was precipitated.
【0047】[0047]
【表4】 [Table 4]
【0048】[0048]
【表5】 [Table 5]
【0049】[0049]
【表6】 [Table 6]
【0050】(実施例2)以下本発明のマイクロ波用誘
電体磁器組成物を用いて構成したマイクロ波用電子部品
の一例として、積層型ローパスフィルタについて図3及
び図4にもとづいて説明する。図3は当該積層型ローパ
スフィルタの斜視図であり、図4はその内部構造を示し
た分解斜視図である。Embodiment 2 Hereinafter, a laminated low-pass filter will be described with reference to FIGS. 3 and 4 as an example of an electronic component for microwave constituted by using the dielectric ceramic composition for microwave according to the present invention. FIG. 3 is a perspective view of the laminated low-pass filter, and FIG. 4 is an exploded perspective view showing the internal structure thereof.
【0051】実施例1で得られた粉砕粉を所定量のバイ
ンダー(例えばポリビニルブチラール)、可塑剤ととも
にポリエチレン製のボールミルに投入し更に酸化ジルコ
ニウム製のボールと溶媒(例えばエチルアルコールとブ
タノール)を投入して20時間湿式混合を行ったスラリ
ーを真空濃縮処理して粘度を調整した。次に、このスラ
リーをドクターブレード法によりフィルム上に塗布、乾
燥してグリーンシートを得た。このシートを所定の大き
さに切断し、部品回路上必要なスルーホール5,6を形
成するとともに、Ag電極ペーストを印刷塗布してイン
ダクタを構成する導体パターン1,2,3,4およびコ
ンデンサを構成する導体パターン7,8,9とアース電
極10,11を形成した。さらに各層12〜17を積層
圧着し、所定の寸法に切断した。得られたチップを、脱
脂焼成、バレル研磨を施した後、回路基板に電気結合さ
せるための外部電極20a〜20jを形成した。外部電
極が銀系の場合、はんだ食われが生じて電気部品として
の機械的、電気的信頼性に悪影響を及ぼす可能性がある
ので、Niめっきを被膜する。更に、はんだ濡れ性向上
のために、はんだめっきを形成する。このようにして2
つのインダクタと3つのコンデンサをπ型接続した積層
型ローパスフィルタ18を得た。この積層型ローパスフ
ィルタの電気的特性を測定したところ通過帯域での挿入
損失が0.2dB程度と優れた特性が得られた。また本
発明のマイクロ波用誘電体磁器組成物を用いて他のマイ
クロ波用電子部品を構成したが、同様に優れた電気的特
性が得られた。The pulverized powder obtained in Example 1 is put into a polyethylene ball mill together with a predetermined amount of a binder (for example, polyvinyl butyral) and a plasticizer, and further a zirconium oxide ball and a solvent (for example, ethyl alcohol and butanol) are put. The slurry subjected to wet mixing for 20 hours was subjected to vacuum concentration treatment to adjust the viscosity. Next, this slurry was applied on a film by a doctor blade method and dried to obtain a green sheet. This sheet is cut into a predetermined size to form through holes 5 and 6 necessary for the component circuit, and an Ag electrode paste is applied by printing to form conductor patterns 1, 2, 3, 4 and a capacitor constituting an inductor. Constituent conductor patterns 7, 8, 9 and ground electrodes 10, 11 were formed. Further, the respective layers 12 to 17 were laminated and pressure-bonded, and cut into predetermined dimensions. After the obtained chip was subjected to degreasing firing and barrel polishing, external electrodes 20a to 20j for electrical coupling to a circuit board were formed. If the external electrode is silver-based, Ni plating is applied because solder erosion may occur and adversely affect the mechanical and electrical reliability of the electrical component. Further, solder plating is formed to improve solder wettability. In this way 2
A laminated low-pass filter 18 in which three inductors and three capacitors were connected in a π-type was obtained. When the electrical characteristics of this laminated low-pass filter were measured, excellent characteristics were obtained in which the insertion loss in the pass band was about 0.2 dB. Further, other electronic components for microwaves were formed using the dielectric ceramic composition for microwaves of the present invention, and similarly excellent electrical characteristics were obtained.
【0052】このように、本発明の誘電体磁器組成物
は、種々の製造方法においても1000℃以下又は90
0℃以下の焼成温度で緻密な焼結体を得ることが出来,
かつ誘電率εが6〜9程度で、τfの絶対値が50pp
m/℃以下で、fQ値が5THz以上の値を得ることが
出来た。これにより、銀又は銅、金を内部電極用の材料
として用いることができ、各種マイクロ波部品用として
有用である。As described above, the dielectric ceramic composition of the present invention can be used at a temperature of 1000 ° C. or lower or 90 ° C. even in various production methods.
A dense sintered body can be obtained at a firing temperature of 0 ° C or less,
And the dielectric constant ε is about 6 to 9, and the absolute value of τf is 50 pp.
At m / ° C. or less, a fQ value of 5 THz or more could be obtained. Thereby, silver, copper, or gold can be used as a material for the internal electrode, and is useful for various microwave components.
【0053】[0053]
【発明の効果】本発明によれば、マイクロ波用誘電体磁
器組成物として、1000℃以下又は900℃以下で焼
結可能な材料であって、誘電率が約6〜9で、Q値の高
い誘電体材料を得ることができる。これにより、マイク
ロ波用の誘電体共振器、フィルタ、積層インダクター、
積層コンデンサなど、マイクロ波部品として優れたマイ
クロ波特性と低損失を得ることができる。特に、銀又は
銅などの電極材料と同時焼成して内部回路を構成する積
層型のマイクロ波部品用、および、これらを複合化した
高周波積層基板用として、優れた材料である。また、本
発明の材料は、マイクロ波より低い周波数においても、
同様に高性能な積層回路基板が形成出来る材料であり、
さらに、電極材料と同時焼成を行わない材料としても用
いる事が可能である。According to the present invention, a dielectric ceramic composition for microwaves is a material which can be sintered at 1000 ° C. or lower or 900 ° C. or lower, has a dielectric constant of about 6 to 9, and has a Q value of A high dielectric material can be obtained. As a result, dielectric resonators for microwaves, filters, multilayer inductors,
Excellent microwave characteristics and low loss as a microwave component such as a multilayer capacitor can be obtained. In particular, it is an excellent material for a laminated microwave component that forms an internal circuit by co-firing with an electrode material such as silver or copper, and for a high-frequency laminated substrate in which these are combined. Also, the material of the present invention, even at frequencies lower than microwaves,
Similarly, it is a material that can form a high-performance laminated circuit board,
Further, it can be used as a material that is not co-fired with the electrode material.
【図1】 本発明マイクロ波用誘電体の焼結後のX線回
折パターン図。FIG. 1 is an X-ray diffraction pattern diagram of a microwave dielectric of the present invention after sintering.
【図2】 本発明マイクロ波用誘電体の焼結前のX線回
折パターン図。FIG. 2 is an X-ray diffraction pattern diagram of a microwave dielectric of the present invention before sintering.
【図3】 本発明の一実施例のマイクロ波用電子部品の
斜視図。FIG. 3 is a perspective view of a microwave electronic component according to one embodiment of the present invention.
【図4】 本発明の一実施例のマイクロ波用電子部品の
分解斜視図。FIG. 4 is an exploded perspective view of a microwave electronic component according to one embodiment of the present invention.
フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H03H 7/075 H03H 7/075 A Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat II (reference) H03H 7/075 H03H 7/075 A
Claims (13)
成され、Al,Si,SrをそれぞれAl2O3、Si
O2、SrOに換算し合計100質量%としたとき、A
l2O3換算で10〜60質量%、SiO2換算で25
〜60質量%、SrO換算で7.5〜50質量%のA
l,Si,Srを含有し、前記合計100質量%に対し
副成分として、Bi2O3換算で0.1〜10質量%の
Biを含有していることを特徴とするマイクロ波用誘電
体磁器組成物。1. The method according to claim 1, wherein the main component is composed of oxides of Al, Si, and Sr, and Al, Si, and Sr are replaced by Al 2 O 3 and Si, respectively.
When converted to O 2 and SrO to give a total of 100% by mass, A
10 to 60% by mass in terms of l 2 O 3 , 25 in terms of SiO 2
6060% by mass, 7.5 to 50% by mass of A in terms of SrO
l, Si, contains Sr, the total as a sub-component relative to 100 mass%, Bi 2 O 3 microwave dielectric, characterized by containing 0.1 to 10 mass% of Bi in terms of Porcelain composition.
成され、Al,Si,SrをそれぞれAl2O3、Si
O2、SrOに換算し合計100質量%としたとき、A
l2O3換算で10〜60質量%、SiO2換算で25
〜60質量%、SrO換算で7.5〜50質量%のA
l,Si,Srを含有し、前記合計100質量%に対し
副成分として、Bi2O3換算で0.1〜10質量%の
Biを含有し、更にNa2O換算で0.1〜5質量%の
Na、K2O換算で0.1〜5質量%のK、CoO換算
で0.1〜5質量%のCoうち少なくとも1種以上を含
有していることを特徴とするマイクロ波用誘電体磁器組
成物。2. The main component is composed of oxides of Al, Si and Sr, and Al, Si and Sr are replaced by Al 2 O 3 and Si, respectively.
When converted to O 2 and SrO to give a total of 100% by mass, A
10 to 60% by mass in terms of l 2 O 3 , 25 in terms of SiO 2
6060% by mass, 7.5 to 50% by mass of A in terms of SrO
l, Si, contains Sr, as a sub-component relative to the total 100 wt%, and containing Bi of 0.1 to 10 mass% in terms of Bi 2 O 3, further terms of Na 2 O 0.1-5 mass% of Na, K 2 O in terms of 0.1 to 5 wt% of K, microwave, characterized by containing the above at least one of 0.1 to 5 mass% of Co in terms of CoO Dielectric porcelain composition.
成され、Al,Si,SrをそれぞれAl2O3、Si
O2、SrOに換算し合計100質量%としたとき、A
l2O3換算で10〜60質量%、SiO2換算で25
〜60質量%、SrO換算で7.5〜50質量%のA
l,Si,Srを含有し、前記合計100質量%に対し
副成分として、Bi2O3換算で0.1〜10質量%の
Biを含有し、更にCuO換算で0.01〜5質量%の
Cu、MnO2換算で0.01〜5質量%のMn、0.
01〜5質量%のAgのうち少なくとも1種以上を含有
していることを特徴とするマイクロ波用誘電体磁器組成
物。3. The main component is composed of oxides of Al, Si, and Sr, and Al, Si, and Sr are replaced by Al 2 O 3 and Si, respectively.
When converted to O 2 and SrO to give a total of 100% by mass, A
10 to 60% by mass in terms of l 2 O 3 , 25 in terms of SiO 2
6060% by mass, 7.5 to 50% by mass of A in terms of SrO
l, Si, contains Sr, as a sub-component relative to the total 100 mass%, Bi 2 O 3 contained 0.1 to 10 mass% of Bi in terms of further 0.01 to 5 mass% in terms of CuO Of Cu, MnO of 0.01 to 5% by mass in terms of MnO 2 .
A dielectric ceramic composition for microwaves, comprising at least one of Ag in an amount of from 1 to 5% by mass.
成され、Al,Si,SrをそれぞれAl2O3、Si
O2、SrOに換算し合計100質量%としたとき、A
l2O3換算で10〜60質量%、SiO2換算で25
〜60質量%、SrO換算で7.5〜50質量%のA
l,Si,Srを含有し、前記合計100質量%に対し
副成分として、Bi2O3換算で0.1〜10質量%の
Biを含有し、更にNa2O換算で0.1〜5質量%の
Na、K2O換算で0.1〜5質量%のK、CoO換算
で0.1〜5質量%のCoのうち少なくとも1種以上を
含有し、かつCuO換算で0.01〜5質量%のCu、
MnO2換算で0.01〜5質量%のMn、0.01〜
5質量%のAgのうち少なくとも1種以上を含有してい
ることを特徴とするマイクロ波用誘電体磁器組成物。4. The main component is composed of oxides of Al, Si, and Sr, and Al, Si, and Sr are converted to Al 2 O 3 and Si, respectively.
When converted to O 2 and SrO to give a total of 100% by mass, A
10 to 60% by mass in terms of l 2 O 3 , 25 in terms of SiO 2
6060% by mass, 7.5 to 50% by mass of A in terms of SrO
l, Si, contains Sr, as a sub-component relative to the total 100 wt%, and containing Bi of 0.1 to 10 mass% in terms of Bi 2 O 3, further terms of Na 2 O 0.1-5 contains at least one or more of the mass% of Na, K 2 O in terms of 0.1 to 5 wt% of K, of 0.1 to 5 mass% in terms of CoO Co, and 0.01 in terms of CuO 5% by mass of Cu,
Mn of 0.01 to 5% by mass in terms of MnO 2 , 0.01 to
A dielectric ceramic composition for microwaves, comprising at least one of 5% by mass of Ag.
物で構成され、Al,Si,Sr,TiをそれぞれAl
2O3、SiO2、SrO、TiO2に換算し合計10
0質量%としたとき、Al2O3換算で10〜60質量
%、SiO2換算で25〜60質量%、SrO換算で
7.5〜50質量%、TiO2換算で20質量%以下の
Al,Si,Sr,Tiを含有し、前記合計100質量
%に対し副成分として、Bi2O3換算で0.1〜10
質量%のBiを含有していることを特徴とするマイクロ
波用誘電体磁器組成物。5. The method according to claim 1, wherein the main component is composed of oxides of Al, Si, Sr, and Ti.
2 O 3 , SiO 2 , SrO, TiO 2 , and total 10
When set to 0 wt%, Al 2 O 3 10 to 60 wt% in terms of 25 to 60 wt% in terms of SiO 2, from 7.5 to 50 mass% in terms of SrO, 20 mass% of Al in terms of TiO 2 , Si, Sr, containing Ti, relative to the total 100 wt% as an auxiliary component, calculated as Bi 2 O 3 0.1-10
What is claimed is: 1. A dielectric ceramic composition for microwaves, comprising Bi by mass.
物で構成され、Al,Si,Sr,TiをそれぞれAl
2O3、SiO2、SrO、TiO2に換算し合計10
0質量%としたとき、Al2O3換算で10〜60質量
%、SiO2換算で25〜60質量%、SrO換算で
7.5〜50質量%、TiO2換算で20質量%以下の
Al,Si,Sr,Tiを含有し、前記合計100質量
%に対し副成分として、Bi2O3換算で0.1〜10
質量%のBiを含有し、更にNa 2O換算で0.1〜5
質量%のNa、K2O換算で0.1〜5質量%のK、C
oO換算で0.1〜5質量%のCoのうち少なくとも1
種以上を含有していることを特徴とするマイクロ波用誘
電体磁器組成物。6. Oxidation of main components Al, Si, Sr, Ti
Al, Si, Sr, and Ti are each
2O3, SiO2, SrO, TiO2Converted to 10
0% by mass, Al2O310-60 mass in conversion
%, SiO225-60 mass% in conversion, SrO conversion
7.5 to 50% by mass, TiO220% by mass or less in conversion
Al, Si, Sr, Ti, 100 mass in total
% As an accessory component to Bi2O30.1 to 10 in conversion
% Bi by mass and Na 20.1-5 in O conversion
Mass% Na, K20.1 to 5% by mass of K and C in terms of O
at least one of 0.1 to 5% by mass of Co in terms of oO;
Microwave induction characterized by containing at least one species
Electric porcelain composition.
物で構成され、Al,Si,Sr,TiをそれぞれAl
2O3、SiO2、SrO、TiO2に換算し合計10
0質量%としたとき、Al2O3換算で10〜60質量
%、SiO2換算で25〜60質量%、SrO換算で
7.5〜50質量%、TiO2換算で20質量%以下の
Al,Si,Sr,Tiを含有し、前記合計100質量
%に対し副成分として、Bi2O3換算で0.1〜10
質量%のBiを含有し、更にCuO換算で0.01〜5
質量%のCu、MnO2換算で0.01〜5質量%のM
n、0.01〜5質量%のAgのうち少なくとも1種以
上を含有していることを特徴とするマイクロ波用誘電体
磁器組成物。7. The main component is composed of oxides of Al, Si, Sr and Ti, and Al, Si, Sr and Ti are
2 O 3 , SiO 2 , SrO, TiO 2 , and total 10
When set to 0 wt%, Al 2 O 3 10 to 60 wt% in terms of 25 to 60 wt% in terms of SiO 2, from 7.5 to 50 mass% in terms of SrO, 20 mass% of Al in terms of TiO 2 , Si, Sr, containing Ti, relative to the total 100 wt% as an auxiliary component, calculated as Bi 2 O 3 0.1-10
% Of Bi, and 0.01 to 5 in terms of CuO.
% Of Cu, 0.01 to 5% by weight of M in terms of MnO 2
n. A dielectric ceramic composition for microwaves, comprising at least one or more of Ag of 0.01 to 5% by mass.
物で構成され、Al,Si,Sr,TiをそれぞれAl
2O3、SiO2、SrO、TiO2に換算し合計10
0質量%としたとき、Al2O3換算で10〜60質量
%、SiO2換算で25〜60質量%、SrO換算で
7.5〜50質量%、TiO2換算で20質量%以下の
Al,Si,Sr,Tiを含有し、前記合計100質量
%に対し副成分として、Bi2O3換算で0.1〜10
質量%のBiを含有し、更にNa 2O換算で0.1〜5
質量%のNa、K2O換算で0.1〜5質量%のK、C
oO換算で0.1〜5質量%のCoのうち少なくとも1
種以上を含有し、かつCuO換算で0.01〜5質量%
のCu、MnO2換算で0.01〜5質量%のMn、
0.01〜5質量%のAgのうち少なくとも1種以上を
含有していることを特徴とするマイクロ波用誘電体磁器
組成物。8. Oxidation of Al, Si, Sr, and Ti as main components
Al, Si, Sr, and Ti are each
2O3, SiO2, SrO, TiO2Converted to 10
0% by mass, Al2O310-60 mass in conversion
%, SiO225-60 mass% in conversion, SrO conversion
7.5 to 50% by mass, TiO220% by mass or less in conversion
Al, Si, Sr, Ti, 100 mass in total
% As an accessory component to Bi2O30.1 to 10 in conversion
% Bi by mass and Na 20.1-5 in O conversion
Mass% Na, K20.1 to 5% by mass of K and C in terms of O
at least one of 0.1 to 5% by mass of Co in terms of oO;
At least 0.01% by mass in terms of CuO
Cu, MnO2Mn of 0.01 to 5% by mass in conversion,
At least one or more of 0.01 to 5% by mass of Ag
Microwave dielectric porcelain characterized by containing
Composition.
r,Tiの酸化物を主成分とし、副成分としてBiを必
須とするマイクロ波用誘電体磁器組成物であって、組織
にAl2O3結晶相と少なくともAl,Si,Sr又は
Al,Si,Sr,Tiを含む化合物結晶相を備え、f
Q値が5THz以上であることを特徴とするマイクロ波
用誘電体磁器組成物。9. Al, Si, Sr or Al, Si, S
A dielectric ceramic composition for microwaves comprising an oxide of r and Ti as a main component and Bi as an auxiliary component, wherein the structure has an Al 2 O 3 crystal phase and at least Al, Si, Sr or Al, Si. , Sr, Ti
A dielectric ceramic composition for microwaves having a Q value of 5 THz or more.
イクロ波用誘電体磁器組成物の製造方法であって、Al
2O3以外の元素をガラス化する第1の熱処理工程と、
当該第1の熱処理工程のしかる後に、組織にAl2O3
の他に少なくともAl,Si,Sr又はAl,Si,S
r,Tiを含む化合物結晶相を形成するような、かつf
Q値が5THz以上となるような第2の熱処理工程を有
することを特徴とするマイクロ波用誘電体磁器組成物の
製造方法。10. The method for producing a dielectric ceramic composition for microwave according to any one of claims 1 to 9, wherein
A first heat treatment step for vitrifying elements other than 2 O 3 ,
After the first heat treatment step, Al 2 O 3 is added to the structure.
In addition to at least Al, Si, Sr or Al, Si, S
forming a compound crystal phase containing r and Ti, and f
A method for producing a dielectric ceramic composition for microwaves, comprising a second heat treatment step so that the Q value becomes 5 THz or more.
工程の熱処理温度超、1000℃以下の熱処理温度で行
うことを特徴とする請求項10に記載のマイクロ波用誘
電体磁器組成物の製造方法。11. The microwave dielectric ceramic composition according to claim 10, wherein the second heat treatment step is performed at a heat treatment temperature higher than the heat treatment temperature of the first heat treatment step and 1000 ° C. or less. Production method.
イクロ波用誘電体磁器組成物を用いることを特徴とする
マイクロ波用電子部品。12. An electronic component for microwaves, comprising using the dielectric ceramic composition for microwaves according to any one of claims 1 to 9.
らなる誘電体層に電極を形成し、当該誘電体層を複数積
層してなることを特徴とする請求項12に記載のマイク
ロ波用電子部品。13. The microwave electron according to claim 12, wherein an electrode is formed on a dielectric layer made of the dielectric ceramic composition for microwave, and a plurality of the dielectric layers are laminated. parts.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000011412A JP4392633B2 (en) | 1999-01-20 | 2000-01-20 | DIELECTRIC CERAMIC COMPOSITION FOR MICROWAVE AND ITS MANUFACTURING METHOD |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11-11286 | 1999-01-20 | ||
JP1128699 | 1999-01-20 | ||
JP2000011412A JP4392633B2 (en) | 1999-01-20 | 2000-01-20 | DIELECTRIC CERAMIC COMPOSITION FOR MICROWAVE AND ITS MANUFACTURING METHOD |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2000272960A true JP2000272960A (en) | 2000-10-03 |
JP2000272960A5 JP2000272960A5 (en) | 2006-10-12 |
JP4392633B2 JP4392633B2 (en) | 2010-01-06 |
Family
ID=26346689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000011412A Expired - Lifetime JP4392633B2 (en) | 1999-01-20 | 2000-01-20 | DIELECTRIC CERAMIC COMPOSITION FOR MICROWAVE AND ITS MANUFACTURING METHOD |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4392633B2 (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002173362A (en) * | 2000-12-06 | 2002-06-21 | Murata Mfg Co Ltd | Dielectric ceramic composition and multilayer substrate using the same |
JP2002368531A (en) * | 2001-06-06 | 2002-12-20 | Hitachi Metals Ltd | Surface mounting type antenna and its production method |
WO2004052804A1 (en) * | 2002-12-06 | 2004-06-24 | Hitachi Metals, Ltd. | Ceramic composition being fired at low temperature and having high strength and method for preparing the same, and laminated electronic parts using the same |
JP2004182576A (en) * | 2002-12-06 | 2004-07-02 | Hitachi Metals Ltd | Low temperature firing dielectric material for high frequency and laminated electronic component for high frequency |
JP2004196652A (en) * | 2002-12-06 | 2004-07-15 | Hitachi Metals Ltd | High-strength low-temperature firing ceramic composition, its manufacturing method, and laminated electronic component using it |
WO2005039263A1 (en) * | 2003-10-17 | 2005-04-28 | Hitachi Metals, Ltd. | Multi-layer ceramic substrate, method for manufacturng the same and electronic device using the same |
JP2006001755A (en) * | 2004-06-15 | 2006-01-05 | Hitachi Metals Ltd | High strength low temperature-firing ceramic composition and laminated electronic component using the same |
JP2006135012A (en) * | 2004-11-04 | 2006-05-25 | Hitachi Metals Ltd | Multilayer ceramic substrate and manufacturing method thereof |
US20100311563A1 (en) * | 2007-11-28 | 2010-12-09 | Kyocera Corporation | Alumina sintered article |
JP2011162437A (en) * | 2011-03-10 | 2011-08-25 | Hitachi Metals Ltd | High strength low temperature-fired ceramic and method for manufacturing high strength low temperature-fired ceramic substrate |
JP2011230968A (en) * | 2010-04-28 | 2011-11-17 | Nikko Co | Low temperature-fired high strength low thermal expansion ceramic and method for producing the same |
CN108975868A (en) * | 2018-09-10 | 2018-12-11 | 郑红升 | A kind of material for high temperature microwave |
-
2000
- 2000-01-20 JP JP2000011412A patent/JP4392633B2/en not_active Expired - Lifetime
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002173362A (en) * | 2000-12-06 | 2002-06-21 | Murata Mfg Co Ltd | Dielectric ceramic composition and multilayer substrate using the same |
JP4714986B2 (en) * | 2000-12-06 | 2011-07-06 | 株式会社村田製作所 | Dielectric ceramic composition and multilayer substrate using the same |
JP2002368531A (en) * | 2001-06-06 | 2002-12-20 | Hitachi Metals Ltd | Surface mounting type antenna and its production method |
JP2004196652A (en) * | 2002-12-06 | 2004-07-15 | Hitachi Metals Ltd | High-strength low-temperature firing ceramic composition, its manufacturing method, and laminated electronic component using it |
JP4688016B2 (en) * | 2002-12-06 | 2011-05-25 | 日立金属株式会社 | High-strength low-temperature fired ceramic composition and multilayer electronic component using the same |
JP2004182576A (en) * | 2002-12-06 | 2004-07-02 | Hitachi Metals Ltd | Low temperature firing dielectric material for high frequency and laminated electronic component for high frequency |
US7285507B2 (en) | 2002-12-06 | 2007-10-23 | Hitachi Metals, Ltd. | Ceramic composition being fired at low temperature and having high strength and method for preparing the same, and laminated electronic parts using the same |
WO2004052804A1 (en) * | 2002-12-06 | 2004-06-24 | Hitachi Metals, Ltd. | Ceramic composition being fired at low temperature and having high strength and method for preparing the same, and laminated electronic parts using the same |
JP4688013B2 (en) * | 2002-12-06 | 2011-05-25 | 日立金属株式会社 | Low-frequency firing dielectric material for high frequency and multilayer electronic component for high frequency |
WO2005039263A1 (en) * | 2003-10-17 | 2005-04-28 | Hitachi Metals, Ltd. | Multi-layer ceramic substrate, method for manufacturng the same and electronic device using the same |
JP2006001755A (en) * | 2004-06-15 | 2006-01-05 | Hitachi Metals Ltd | High strength low temperature-firing ceramic composition and laminated electronic component using the same |
JP2006135012A (en) * | 2004-11-04 | 2006-05-25 | Hitachi Metals Ltd | Multilayer ceramic substrate and manufacturing method thereof |
US20100311563A1 (en) * | 2007-11-28 | 2010-12-09 | Kyocera Corporation | Alumina sintered article |
US8247337B2 (en) * | 2007-11-28 | 2012-08-21 | Kyocera Corporation | Alumina sintered article |
JP2011230968A (en) * | 2010-04-28 | 2011-11-17 | Nikko Co | Low temperature-fired high strength low thermal expansion ceramic and method for producing the same |
JP2011162437A (en) * | 2011-03-10 | 2011-08-25 | Hitachi Metals Ltd | High strength low temperature-fired ceramic and method for manufacturing high strength low temperature-fired ceramic substrate |
CN108975868A (en) * | 2018-09-10 | 2018-12-11 | 郑红升 | A kind of material for high temperature microwave |
Also Published As
Publication number | Publication date |
---|---|
JP4392633B2 (en) | 2010-01-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4371141B2 (en) | Insulator ceramic composition, insulating ceramic sintered body, and multilayer ceramic electronic component | |
JP4108836B2 (en) | Dielectric porcelain composition | |
CN107986774B (en) | Low-temperature sintered high-dielectric-constant microwave dielectric ceramic material and preparation method thereof | |
WO1997002221A1 (en) | Dielectric porcelain, process for production thereof, and electronic parts produced therefrom | |
JP4632534B2 (en) | Dielectric porcelain and manufacturing method thereof | |
JP4392633B2 (en) | DIELECTRIC CERAMIC COMPOSITION FOR MICROWAVE AND ITS MANUFACTURING METHOD | |
JP2001114554A (en) | Low-temperature burnable ceramic composition and ceramic multilayer substrate | |
JP4482939B2 (en) | Dielectric ceramic composition, dielectric ceramic, and multilayer ceramic component using the same | |
JP3033568B1 (en) | Low temperature firing glass ceramics | |
CN1267376C (en) | Composite material of glass ceramics cosintered by low temp | |
JP2000272960A5 (en) | ||
JP3624405B2 (en) | Glass ceramic dielectric material | |
JP2526701B2 (en) | Dielectric porcelain composition | |
JP2515611B2 (en) | Dielectric porcelain composition | |
JP2526702B2 (en) | Dielectric porcelain composition | |
JP4052032B2 (en) | Dielectric composition and multilayer ceramic component using the same | |
KR100343523B1 (en) | Method for Manufacturing Ceramic Electronic Device | |
JPH06211564A (en) | Ceramic substrate | |
JP3375450B2 (en) | Dielectric porcelain composition | |
JP4409165B2 (en) | Microwave dielectric ceramic composition and microwave dielectric ceramic composition for substrate | |
JP4146152B2 (en) | Dielectric ceramic composition and ceramic electronic component | |
JPH0717444B2 (en) | Dielectric porcelain composition | |
JP3624406B2 (en) | Glass ceramic dielectric material | |
JP3978689B2 (en) | Low-temperature fired porcelain composition and microwave component using the same | |
KR100478127B1 (en) | Dielectric Ceramic Composition |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060830 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060830 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090123 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090918 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20091001 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4392633 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121023 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121023 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131023 Year of fee payment: 4 |
|
EXPY | Cancellation because of completion of term |