JP2000258397A - Nondestructive inspection device of pipe - Google Patents
Nondestructive inspection device of pipeInfo
- Publication number
- JP2000258397A JP2000258397A JP6284399A JP6284399A JP2000258397A JP 2000258397 A JP2000258397 A JP 2000258397A JP 6284399 A JP6284399 A JP 6284399A JP 6284399 A JP6284399 A JP 6284399A JP 2000258397 A JP2000258397 A JP 2000258397A
- Authority
- JP
- Japan
- Prior art keywords
- pipe
- probes
- pitch
- pipe axis
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、管の非破壊検査装
置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-destructive pipe inspection apparatus.
【0002】[0002]
【従来の技術】シームレス鋼管等の欠陥を非破壊検査す
る装置は、管の外周に0.3mm程度の隙間をあけて外
嵌する回転リング状体に、管軸方向に多数本連設した細
径のプローブをプローブの長手方向が管軸に直角になる
ように配設して取付けている。この回転リング状体を毎
分1000回転程度の回転数で回転させ、その中を管を
軸方向に通過させて管の表面の傷の有無を検査する。こ
の細径のプローブは直径2mmφ程度のフェライトコア
に高周波巻線を巻いたプローブであって、被覆を含めて
直径約4mmφとなり、4mmのピッチで管軸に平行に
密に並べられている。従来このようなプローブはピッチ
が約10mmであったが、小さい傷を検出することがで
きるように、プローブのピッチをできるだけ小さくする
ために、細径のプローブの開発と改善が続けられてき
た。しかしこのプローブの配設ピッチをさらに小さくす
ることは困難な限界に達している。そして直径4mmφ
のプローブでは、軸方向長さ約8mmまでの傷を検出す
ることが限度であり、これより短い傷を確実に検出する
ことはできなかった。2. Description of the Related Art An apparatus for non-destructively inspecting a defect of a seamless steel pipe or the like is provided with a plurality of thin ring-shaped bodies continuously fitted in a pipe axis direction on a rotating ring-shaped body which is externally fitted with a gap of about 0.3 mm on the outer circumference of the pipe. A probe having a diameter is arranged and attached such that the longitudinal direction of the probe is perpendicular to the tube axis. The rotating ring-shaped body is rotated at a rotation speed of about 1000 rotations per minute, and the tube is passed through the tube in the axial direction to inspect the surface of the tube for flaws. This small-diameter probe is a probe in which a high-frequency winding is wound around a ferrite core having a diameter of about 2 mmφ, and has a diameter of about 4 mmφ including the coating, and is densely arranged parallel to the tube axis at a pitch of 4 mm. Conventionally, such a probe has a pitch of about 10 mm. However, in order to detect a small flaw, a probe with a small diameter has been developed and improved in order to make the pitch of the probe as small as possible. However, it has reached a difficult limit to further reduce the arrangement pitch of the probes. And diameter 4mmφ
With the probe of the above, the limit of detecting a flaw up to an axial length of about 8 mm was a limit, and a flaw shorter than this could not be reliably detected.
【0003】[0003]
【発明が解決しようとする課題】しかし、近年さらに小
さい傷が問題となるケースが生じ、非破壊検査装置でさ
らに小さい表面傷を精度よく検出することが要請されて
いる。However, in recent years, there have been cases where even smaller flaws become a problem, and there is a demand for non-destructive inspection equipment to detect smaller surface flaws with higher accuracy.
【0004】本発明は上記問題点を解決し、軸方向長さ
3mm以下の傷を確実に検出することができる管の非破
壊検査装置を開発し、これを提供することを目的とする
ものである。An object of the present invention is to solve the above-mentioned problems and to develop and provide a non-destructive pipe inspection apparatus capable of reliably detecting a flaw having an axial length of 3 mm or less. is there.
【0005】[0005]
【課題を解決するための手段】本発明は、上記問題点を
解決するためになされたもので、その技術手段は、管の
非破壊検査装置において、管軸方向に連設したプローブ
を円周方向にN列設け、該N列のそれぞれの連設プロー
ブの管軸方向位置をプローブの連設ピッチのN分の1ず
つ相互に管軸方向にずらして配設したことを特徴とする
管の非破壊検査装置である。但し、Nは2以上の整数と
する。SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and its technical means is to provide a non-destructive inspection apparatus for a pipe in which a probe connected in the axial direction of the pipe is provided. N rows are provided in the direction, and the positions in the pipe axis direction of the respective consecutively arranged probes in the N rows are displaced from each other in the pipe axis direction by 1 / N of the continuous pitch of the probes. It is a non-destructive inspection device. Here, N is an integer of 2 or more.
【0006】[0006]
【発明の実施の形態】以下図面を参照して本発明の実施
の形態を説明する。Embodiments of the present invention will be described below with reference to the drawings.
【0007】図1に示すように、管の非破壊検査装置1
は、管10の外周にハードメタル又はセラミックシュー
2を介して、管外周との間に0.3mm程度の隙間をあ
けて外嵌する回転リング状体に、管軸方向に連設した細
径の多数のプローブ3を配設したものである。As shown in FIG. 1, a non-destructive pipe inspection apparatus 1
Is a small diameter continuously provided in the pipe axis direction on a rotating ring-shaped body which is fitted around the outer circumference of the pipe 10 with a gap of about 0.3 mm between the outer circumference of the pipe and a hard metal or ceramic shoe 2. Are provided with a large number of probes 3.
【0008】この細径のプローブ3は直径2mmφ程度
のフェライトコアに8kHzの高周波電流を流す高周波
巻線を巻いたプローブであって、被覆を含めて管軸方向
に約4mmのピッチで連設されている。従来このプロー
ブ3は回転リング状体の円周方向1ヶ所に設けられてい
たが、本発明の管の非破壊検査装置1では、図2に示す
ように円周方向にN列(図2の例では4列のプローブ3
a,3b,3c,3d)を配設している。そしてこの各
プローブ3a,3b,3c,3dはN分の1ピッチず
つ、すなわち図2では4分の1ピッチずつ管軸方向にず
らして取付ける。この結果全体ではプローブ3をピッチ
1mmで連設したのと同様になり、この装置で検出でき
る傷の長さは従来8mm程度であったが、長さ1.5m
m程度まで検出可能となった。The small-diameter probe 3 is a probe in which a high-frequency winding for passing a high-frequency current of 8 kHz is wound around a ferrite core having a diameter of about 2 mmφ, and is continuously provided at a pitch of about 4 mm in the tube axis direction including the coating. ing. Conventionally, this probe 3 is provided at one location in the circumferential direction of the rotating ring-shaped body. However, in the pipe nondestructive inspection apparatus 1 of the present invention, as shown in FIG. In the example, four rows of probes 3
a, 3b, 3c, 3d). The probes 3a, 3b, 3c, 3d are mounted at a pitch of 1 / N, that is, shifted by a quarter pitch in FIG. 2 in the tube axis direction. As a result, it is the same as when the probes 3 are continuously connected at a pitch of 1 mm. The length of a flaw that can be detected by this device was about 8 mm in the past, but was 1.5 m in length.
m can be detected.
【0009】[0009]
【実施例】図4は従来のプローブ3の配列を示すもので
プローブのピッチ4mmである。図3は、これを2列と
し、2分の1ピッチずつ管軸方向にずらして配設したも
のである。その結果プローブ3の管軸方向配設ピッチは
2mmとなった。図3の例では2列のプローブ3a,3
bは近接して設けられているが図2に示すように円周上
の離れた位置に設けてもよい。FIG. 4 shows an arrangement of a conventional probe 3 having a probe pitch of 4 mm. FIG. 3 shows two rows of these, which are arranged so as to be shifted in the tube axis direction by a half pitch. As a result, the arrangement pitch of the probe 3 in the tube axis direction was 2 mm. In the example of FIG. 3, two rows of probes 3a, 3
Although b is provided in the vicinity, it may be provided at a distant position on the circumference as shown in FIG.
【0010】図3のプローブ配置とした非破壊検査装置
は図4に示すプローブ配置の装置に対して探傷速度は2
分の1となるが傷検出長さは8mm(100%)から3
mm(100%/−3dB)となった。The nondestructive inspection apparatus having the probe arrangement shown in FIG. 3 has a flaw detection speed of 2 compared to the apparatus having the probe arrangement shown in FIG.
The length of flaw detection is reduced from 8 mm (100%) to 3
mm (100% /-3 dB).
【0011】図5は図3、図4に示すプローブ配列の差
異をテストした直径25.4mmφの試験パイプ11で
ある。深さ0.15mm、長さがそれぞれL=3,5,
8,10,25mmの傷を人工的に表面に設けた。これ
を図3、図4に示すプローブ配列の非破壊検査装置1で
測定した。10回のテストの結果、傷検出の度数を調べ
図6に示した。検出回数は図4に示す従来型ではL=3
mmのとき5回(50%)、L=5mmのとき6回(6
0%)、L=8mmのとき9回(90%)、L=10m
m、L=25mmのとき10回(100%)であった。
これに比し図3のプローブ配列とした短傷用の非破壊検
査装置では、L=3mmの傷で10回(100%)、こ
れより長い傷は問題なく100%検出した。FIG. 5 shows a test pipe 11 having a diameter of 25.4 mmφ for testing the difference between the probe arrangements shown in FIGS. 0.15mm depth and L = 3,5 respectively
8, 10, 25 mm flaws were artificially provided on the surface. This was measured by the probe array nondestructive inspection device 1 shown in FIGS. As a result of the ten tests, the frequency of flaw detection was determined and shown in FIG. The number of detections is L = 3 in the conventional type shown in FIG.
5 times (50%) at 6 mm, and 6 times (6%) at L = 5 mm
0%), 9 times (90%) when L = 8 mm, L = 10 m
It was 10 times (100%) when m and L = 25 mm.
On the other hand, in the non-destructive inspection device for short scratches having the probe array shown in FIG. 3, a scratch of L = 3 mm was detected 10 times (100%), and a scratch longer than this was detected 100% without any problem.
【0012】図7、図8は計算モデルによる欠陥検出確
率を示すもので漏洩磁束が正規分布すると仮定し検出確
率を計算した結果を示すもので、欠陥長さmmと検出レ
ベル%と確率%を示した図である。図8に示すように、
図4のプローブ配置では欠陥長さ8mm以上は100%
検出するが8mm未満では確率が小さい。図3に示すプ
ローブ配列の例では図7に示すように長さL=1mmで
検出確率約50%、L=3mm以上では確率100%で
あることを示している。FIGS. 7 and 8 show the defect detection probability by the calculation model, and show the result of calculation of the detection probability assuming that the leakage magnetic flux has a normal distribution. The defect length mm, the detection level% and the probability% are shown in FIG. FIG. As shown in FIG.
In the probe arrangement shown in FIG. 4, 100% is used when the defect length is 8 mm or more.
Although it is detected, if it is less than 8 mm, the probability is small. In the example of the probe array shown in FIG. 3, as shown in FIG. 7, the detection probability is about 50% when the length L is 1 mm, and the probability is 100% when the length L is 3 mm or more.
【0013】[0013]
【発明の効果】本発明の管の非破壊検査装置は以上のよ
うに構成されているので、管の表面傷が従来より小さい
ものを確実に検出することが可能となるという優れた効
果を奏する。The pipe non-destructive inspection apparatus of the present invention is configured as described above, and has an excellent effect that it is possible to reliably detect a pipe having a smaller surface flaw than the conventional one. .
【図1】実施例の管の非破壊検査装置を示す模式断面図
である。FIG. 1 is a schematic sectional view showing a non-destructive pipe inspection apparatus according to an embodiment.
【図2】実施例の管の非破壊検査装置を示す模式正面図
である。FIG. 2 is a schematic front view showing a non-destructive pipe inspection apparatus according to an embodiment.
【図3】実施例のプローブ配列を示す説明図である。FIG. 3 is an explanatory diagram showing a probe sequence of an example.
【図4】従来例のプローブ配列を示す説明図である。FIG. 4 is an explanatory view showing a conventional probe arrangement.
【図5】試験パイプの側面図である。FIG. 5 is a side view of a test pipe.
【図6】試験結果を示す比較グラフである。FIG. 6 is a comparative graph showing test results.
【図7】実施例の検出レベルと確率を示す図である。FIG. 7 is a diagram showing detection levels and probabilities in the embodiment.
【図8】従来例の検出レベルと確率を示す図である。FIG. 8 is a diagram showing a detection level and a probability in a conventional example.
1 非破壊検査装置 2 シュー 3 プローブ 10 管 11 テストパイプ DESCRIPTION OF SYMBOLS 1 Non-destructive inspection apparatus 2 Shoe 3 Probe 10 Tube 11 Test pipe
Claims (1)
連設したプローブを円周方向にN列設け、該N列のそれ
ぞれの連設プローブの管軸方向位置をプローブの連設ピ
ッチのN分の1ずつ相互に管軸方向にずらして配設した
ことを特徴とする管の非破壊検査装置。但し、Nは2以
上の整数とする。In a non-destructive inspection apparatus for a pipe, N rows of probes connected in the pipe axis direction are provided in the circumferential direction, and the position of each of the N rows of connected probes in the pipe axis direction is determined by the pitch of the connected probes. A non-destructive inspection apparatus for pipes, wherein the pipes are mutually displaced in the pipe axis direction by 1 / N. Here, N is an integer of 2 or more.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6284399A JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6284399A JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000258397A true JP2000258397A (en) | 2000-09-22 |
Family
ID=13212005
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6284399A Pending JP2000258397A (en) | 1999-03-10 | 1999-03-10 | Nondestructive inspection device of pipe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000258397A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007205826A (en) * | 2006-02-01 | 2007-08-16 | Hitachi Building Systems Co Ltd | Wire rope flaw detector |
JP2013064668A (en) * | 2011-09-20 | 2013-04-11 | Ihi Inspection & Instrumentation Co Ltd | Method for analyzing defect detection probability by ultrasonic test |
JP2016500812A (en) * | 2012-10-15 | 2016-01-14 | マグカム ナムローゼ フェンノートシャップMagCam NV | Apparatus and method for determining magnetic field distribution of magnet along main surface of magnet |
-
1999
- 1999-03-10 JP JP6284399A patent/JP2000258397A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007205826A (en) * | 2006-02-01 | 2007-08-16 | Hitachi Building Systems Co Ltd | Wire rope flaw detector |
JP2013064668A (en) * | 2011-09-20 | 2013-04-11 | Ihi Inspection & Instrumentation Co Ltd | Method for analyzing defect detection probability by ultrasonic test |
JP2016500812A (en) * | 2012-10-15 | 2016-01-14 | マグカム ナムローゼ フェンノートシャップMagCam NV | Apparatus and method for determining magnetic field distribution of magnet along main surface of magnet |
US9797964B2 (en) | 2012-10-15 | 2017-10-24 | Magcam Nv | Devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A02 | Decision of refusal |
Effective date: 20031224 Free format text: JAPANESE INTERMEDIATE CODE: A02 |