JP2000216174A - Die bonder - Google Patents

Die bonder

Info

Publication number
JP2000216174A
JP2000216174A JP1518599A JP1518599A JP2000216174A JP 2000216174 A JP2000216174 A JP 2000216174A JP 1518599 A JP1518599 A JP 1518599A JP 1518599 A JP1518599 A JP 1518599A JP 2000216174 A JP2000216174 A JP 2000216174A
Authority
JP
Japan
Prior art keywords
solder
lead frame
stirring rod
stirring
die bonder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1518599A
Other languages
Japanese (ja)
Inventor
Shinichi Ozawa
真一 小沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP1518599A priority Critical patent/JP2000216174A/en
Publication of JP2000216174A publication Critical patent/JP2000216174A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319Arrangement of the layer connectors prior to mounting
    • H01L2224/83192Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Die Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To cause less detachment of fine particles from parts of a sealed container, when an air flow takes place in a casing at the time of replacing an atmosphere within the casing, or even when the parts of container are brought into contact with each other, or even when the container and an atmosphere replacer are brought into contact with each other at the time of transporting an object into or from the container. SOLUTION: The die bonder includes a solder supply section 5 for supplying a predetermined amount of solder 7 to a lead frame 1 intermittently moving as heated along a guide rail 2 covered with a cover 3, a solder stirring section 8 for stirring the melted solder 7 on the lead frame 1 with use of a stirring rod 9, and a semiconductor pellet supply section 10 for supplying a semiconductor pellet 12 onto the stirred and melted solder 7, which sections are sequentially positioned. In this case, a heating means 13 for heating at least its contact surface with the melted solder 7 is attached to the stirring rod 9 of the die bonder.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はリードフレームに半
田を介して半導体ペレットをマウントするダイボンダに
関する。
[0001] 1. Field of the Invention [0002] The present invention relates to a die bonder for mounting a semiconductor pellet on a lead frame via solder.

【0002】[0002]

【従来の技術】リードフレームを用いた半導体装置は、
一般的にリードフレームのアイランドや放熱板に半導体
ペレットをマウントし、半導体ペレット上の電極とリー
ドとを電気的に接続し、半導体ペレットを含む主要部分
を外装して外装材から露呈したリードフレームの連結部
分を切断除去し個々に分離されて製造される。ここで、
高電流、高電力用の半導体装置では、内部抵抗を小さく
し、半導体ペレットで発生した熱をアイランドへ伝達し
さらに外部へ効率よく放出するために、半導体ペレット
をリードフレームに接着する接着材として半田を用いて
いる。この種ダイボンダの一例を図7から説明する。図
において、1は詳細は省略するが放熱板と複数本一組の
リードとを基本単位としてこれを多数組み連結一体化し
たリードフレーム、2はリードフレーム1をガイドし、
図示省略するが移送機構によりリードフレーム1を間欠
的に移動させるガイドレール、3はガイドレール2を覆
い外気から遮断するカバーで、その上面にはリードフレ
ーム1の移動方向に沿って3つの開口窓3a、3b、3
cが穿設されている。4はガイドレール2上のリードフ
レーム1を加熱する加熱手段で、図示例ではガイドレー
ル2に埋設されたヒータユニットを示す。このカバー3
内には非酸化性ガスが供給され加熱されたリードフレー
ム1の酸化を防止している。5はカバー3上の開口窓3
a位置に配置された半田供給部で、図示例では上下動す
る半田吸着コレット6の下端に定量の半田7を吸着して
開口窓3aからカバー3内に挿入されリードフレーム1
上に半田7を供給する。8は開口窓3b位置に配置され
て上下動及び軸周りに回転する攪拌棒9により、リード
フレーム1上で溶融した半田7を攪拌する半田攪拌部
で、攪拌棒9は耐熱性、耐食性、耐摩耗性が良好な超硬
合金や人工ルビーなどが用いられる。10は半導体ペレ
ット供給部で、ペレット吸着コレット11によりカバー
3の外部で半導体ペレット12を吸着し水平動して開口
窓3c位置で上下動してリードフレーム1上の溶融半田
7に半導体ペレット12を供給する。この装置ではリー
ドフレーム1上に供給された半田片7が溶融する際に表
面張力で面積が縮小したり位置ずれし、リードフレーム
1や半田片7の表面が酸化していると電気的、機械的、
熱的な接続が不完全となり半導体ペレット12とリード
フレーム1の接続が不完全になるため、リードフレーム
1上で溶融した半田7を攪拌棒9で攪拌して半田7を拡
げるとともに酸化膜を破壊してリードフレーム1と半田
7とを完全に接続している。カバー3内の雰囲気温度は
リードフレーム1上の半田が溶融する温度に保たれてお
り、攪拌棒9もカバー3内に出入りして溶融半田7と接
触し伝導熱と輻射熱により高温に加熱されている。
2. Description of the Related Art Semiconductor devices using a lead frame are:
In general, the semiconductor pellet is mounted on the island or heat sink of the lead frame, the electrodes on the semiconductor pellet are electrically connected to the leads, the main part including the semiconductor pellet is packaged, and the lead frame is exposed from the package. It is manufactured by cutting and removing the connecting portions and separating them individually. here,
In semiconductor devices for high current and high power, solder is used as an adhesive to bond the semiconductor pellets to the lead frame in order to reduce the internal resistance, transfer the heat generated by the semiconductor pellets to the islands, and release the heat to the outside efficiently. Is used. An example of this type of die bonder will be described with reference to FIG. In the drawing, 1 is a detailed description, but a lead frame in which a large number of heat sinks and a set of leads are connected and integrated as a basic unit, 2 is a lead frame,
Although not shown, a guide rail 3 for intermittently moving the lead frame 1 by a transfer mechanism is a cover for covering the guide rail 2 and shielding it from the outside air, and has three opening windows on its upper surface along the moving direction of the lead frame 1. 3a, 3b, 3
c is drilled. Reference numeral 4 denotes a heating unit for heating the lead frame 1 on the guide rail 2, and in the illustrated example, a heater unit embedded in the guide rail 2 is shown. This cover 3
A non-oxidizing gas is supplied into the inside to prevent oxidation of the heated lead frame 1. 5 is an opening window 3 on the cover 3
In the example shown in the drawing, the solder supply unit disposed at the position "a" adsorbs a fixed amount of solder 7 at the lower end of the vertically moving solder suction collet 6 and is inserted into the cover 3 through the opening window 3a.
Supply solder 7 on top. Reference numeral 8 denotes a solder stirrer which is arranged at the position of the opening window 3b and stirs the solder 7 melted on the lead frame 1 by a stirrer 9 which moves up and down and rotates around an axis. The stirrer 9 is used for heat resistance, corrosion resistance, and heat resistance. Cemented carbide and artificial ruby with good wear properties are used. Reference numeral 10 denotes a semiconductor pellet supply unit, which sucks the semiconductor pellet 12 outside the cover 3 by the pellet suction collet 11 and moves horizontally to move the semiconductor pellet 12 up and down at the position of the opening window 3c, thereby applying the semiconductor pellet 12 to the molten solder 7 on the lead frame 1. Supply. In this apparatus, when the solder pieces 7 supplied on the lead frame 1 are melted, the area is reduced or displaced due to surface tension, and if the surfaces of the lead frame 1 and the solder pieces 7 are oxidized, electrical and mechanical Target,
Since the thermal connection is incomplete and the connection between the semiconductor pellet 12 and the lead frame 1 is incomplete, the molten solder 7 on the lead frame 1 is stirred by the stirring rod 9 to spread the solder 7 and destroy the oxide film. Thus, the lead frame 1 and the solder 7 are completely connected. The ambient temperature in the cover 3 is maintained at a temperature at which the solder on the lead frame 1 melts, and the stirring rod 9 also enters and exits the cover 3 and contacts the molten solder 7 to be heated to a high temperature by conduction heat and radiation heat. I have.

【0003】[0003]

【発明が解決しようとする課題】ところで、リードフレ
ーム1の移動速度、カバー内の雰囲気温度、各開口窓3
a、3b、3cの間隔などはリードフレーム1上に供給
した半田7が半田攪拌部8位置で十分溶けるように設定
されるが、生産性を向上させるために、半田供給部5、
半田攪拌部9、半導体ペレット供給部10の動作速度を
高速化して約1秒あるいはそれよりも短い時間で各作業
ポジションでの作業が完了するように各動作条件が設定
されている。ここで攪拌棒9は下端が溶融半田7と接触
した状態で軸周りに回転させる必要があり、高速動作さ
せるためには上昇位置から回転させつつ降下させなけれ
ばならない。そのため攪拌棒9と接触した溶融半田7は
押し拡げられると同時に回転力が与えられ攪拌される
が、図8及び図9に示すように溶融半田7が攪拌棒9の
中心軸から外れて偏り局部的に突出していると、この突
出部7aが回転力により図示矢印方向に飛散り、半田の
量が減少するだけでなく、リードフレーム1やガイドレ
ール2上の不所望部分に付着することがあった。このよ
うにしてマウント位置の半田の量が減少すると、パワー
サイクル試験を実施し半導体装置をオン・オフ動作させ
半導体ペレットを発熱、冷却させると半田7とリードフ
レーム1、半導体ペレット12の各接着界面で各熱膨張
係数の違いによる応力が集中して亀裂を生じやすくなり
寿命が短縮されるという問題もあった。さらには飛散っ
た半田がガイドレール2の不所望部分に付着するとこれ
がさらに後続のリードフレームに付着し支障を生じる虞
があるため、設備の動作を停止しカバー3を開いてガイ
ドレール2を清掃しなければならず、生産性が低下する
という問題もあった。このような問題を解決し得るもの
として攪拌棒を筒体と同軸配置し、筒体内で攪拌棒を回
転させるようにしたものがある。(例えば実開昭58−
127644号公報参照) これによれば、攪拌棒は筒体に囲まれているため溶融半
田が飛散ったとしても筒体によってリードフレーム外へ
の飛散を防止することかできる。ところが動作速度を速
くすると筒体と攪拌棒の同期が取りにくくなり高速動作
に限界があった。
By the way, the moving speed of the lead frame 1, the ambient temperature in the cover,
The intervals a, 3b and 3c are set so that the solder 7 supplied onto the lead frame 1 is sufficiently melted at the position of the solder agitating section 8, but in order to improve the productivity, the solder supplying section 5,
The operating conditions are set so that the operation speed of the solder stirring section 9 and the semiconductor pellet supply section 10 is increased to complete the work at each work position in about 1 second or less. Here, it is necessary to rotate the stirring rod 9 around its axis with its lower end in contact with the molten solder 7. In order to operate at high speed, the stirring rod 9 must be lowered while rotating from the ascending position. Therefore, the molten solder 7 in contact with the stirring rod 9 is pushed and spread, and at the same time, a rotational force is applied and the molten solder 7 is stirred. However, as shown in FIGS. If the protrusions 7a protrude, the protrusions 7a may be scattered in the direction of the arrow shown by the rotational force, not only reducing the amount of solder but also adhering to undesired portions on the lead frame 1 and the guide rails 2. Was. When the amount of solder at the mounting position is reduced in this way, a power cycle test is performed, the semiconductor device is turned on and off, and the semiconductor pellet is heated and cooled, and the bonding interface between the solder 7 and the lead frame 1 and the semiconductor pellet 12 is reduced. Thus, there is also a problem that stress due to a difference in each coefficient of thermal expansion is concentrated and cracks are easily generated, and the life is shortened. Further, if the scattered solder adheres to an undesired portion of the guide rail 2, it may adhere to a subsequent lead frame and cause trouble, so that the operation of the equipment is stopped and the cover 3 is opened to clean the guide rail 2. And there is a problem that productivity is reduced. As a device that can solve such a problem, there is a device in which a stirring rod is arranged coaxially with a cylinder, and the stirring rod is rotated in the cylinder. (For example, 58-
According to this, since the stirring rod is surrounded by the cylindrical body, even if the molten solder is scattered, the molten metal can be prevented from scattering outside the lead frame. However, when the operating speed is increased, it is difficult to synchronize the cylinder and the stirring rod, and there is a limit to the high-speed operation.

【0004】[0004]

【課題を解決するための手段】本発明は上記課題の解決
を目的として提案されたもので、カバーで覆われたガイ
ドレール上を間欠移動するリードフレームの移動経路に
沿って、リードフレーム上に半田を供給する半田供給部
と、リードフレーム上で溶融した半田を攪拌棒で攪拌す
る半田攪拌部と、攪拌された溶融半田上に半導体ペレッ
トを供給する半導体ペレット供給部とを順次配置したダ
イボンダの攪拌棒に、少なくとも溶融半田と接触する面
を加熱する加熱手段を付設したことを特徴とするダイボ
ンダを提供する。
SUMMARY OF THE INVENTION The present invention has been proposed for the purpose of solving the above-mentioned problems, and is provided on a lead frame which moves intermittently on a guide rail covered with a cover. A die bonder in which a solder supply unit for supplying solder, a solder stirring unit for stirring the solder melted on the lead frame with a stirring bar, and a semiconductor pellet supply unit for supplying semiconductor pellets on the stirred molten solder are sequentially arranged. There is provided a die bonder characterized in that a heating means for heating at least a surface in contact with molten solder is provided on a stirring rod.

【0005】[0005]

【発明の実施の形態】本発明によるダイボンダは、加熱
されたリードフレーム上に供給した半田を攪拌する攪拌
棒に加熱手段を付設したものであるが、加熱手段として
例えば電気ヒータを採用し、攪拌棒内に空洞を形成しこ
の空洞内にヒータを配置することができる。また攪拌棒
の少なくとも下端部外周面を電気的絶縁部材により構成
し、この下端部外周面にヒータを配置るすこともでき
る。この場合、ヒータは導電パターンで形成することが
できる。このヒータによって加熱される攪拌棒の下端の
温度は、リードフレーム上の溶融半田の温度とほぼ同じ
に設定すればよい。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A die bonder according to the present invention is provided with a heating means attached to a stirring rod for stirring solder supplied on a heated lead frame. A cavity can be formed in the rod and the heater can be located within the cavity. In addition, at least the outer peripheral surface of the lower end of the stirring rod may be formed of an electrically insulating member, and a heater may be disposed on the outer peripheral surface of the lower end. In this case, the heater can be formed of a conductive pattern. The temperature of the lower end of the stirring rod heated by the heater may be set to be substantially the same as the temperature of the molten solder on the lead frame.

【0006】[0006]

【実施例】以下に本発明の実施例を図1から説明する。
図において、図7と同一物には同一符号を付し、重複す
る説明を省略する。本発明装置は、攪拌棒9にその下端
の溶融半田7と接触する面の温度を溶融半田の温度とほ
ぼ同じ温度に設定する攪拌棒加熱手段13を付設したこ
とを特徴とする。この攪拌棒加熱手段13はロッド状の
電気ヒータで、攪拌棒9内に形成した空洞9aに収容さ
れている。より具体的には図2に示すように、上下動す
るアーム14の一端部に支持されたモータ15の回転軸
15aを下方に延ばし、この回転軸15aに硬質材料か
らなる攪拌棒9を接続し、回転軸15aの外周に電気
的、熱的に絶縁性して2つの環状電極16a、16bを
配置し、ヒータ13のリード13a、13bをこの環状
電極16a、16bに接続する。一方、アーム14から
下方に延長した脚片17に前記環状電極16a、16b
と電気接続する端子18a、18bを固定し、この端子
18a、18bからヒータ13に通電している。これに
より、上下動並びに軸周りに回転する攪拌棒9内のヒー
タ13に連続して通電でき温度調整も可能である。本発
明装置では攪拌棒9が上昇時にリードフレーム1から離
れ、さらに外気に触れてもヒータ13により少なくとも
溶融半田と接する下端面の温度を半田の溶融温度とほぼ
同じに保つことができるため、リードフレーム上の溶融
半田が偏って局部的に盛り上がっても、攪拌棒9と接し
た溶融半田の温度低下がなく、溶融半田7と攪拌棒9の
接触面の滑りが良好で、半田の温度低下による粘度上昇
や固化が防止でき、半田の飛散を防止して短時間でも半
田を良好に攪拌できる。特に必要により設備の動作を一
時停止させ、攪拌棒9の下端を長時間カバー3から出し
た状態で設備の動作を開始した直後でも半田の飛散りが
なく良好な攪拌ができる。また攪拌された溶融半田の量
も一定に保たれるため、長期間のパワーサイクル試験に
耐え、長寿命で信頼性の高い半導体装置を実現できる。
さらには、半田の飛散りによる設備の一時停止、清掃が
不要で生産性を向上できる。図3は本発明の他の実施例
を示す。図において、図7、図1、図2と同一物には同
一符号を付し重複する説明を省略する。図2装置と相異
するのは、攪拌棒9とこれを加熱するヒータ19で、攪
拌棒9はその周面が電気的に絶縁性で耐熱性を有すもの
であれば、超硬合金に絶縁層を形成したものやセラミッ
ク、人工宝石などを用いることが出来る。ヒータ19は
電気的に絶縁された攪拌棒9の周面に形成された抵抗膜
パターンで構成されている。この抵抗膜パターンの両端
は環状電極16a、16bに接続され、図1、図2装置
と同様に動作する。この装置も図1装置同様に攪拌棒9
の下端温度を適正に保つことが出来、図1装置と同様の
硬化を奏することが出来る上、カバー3内の輻射熱を受
け、外気に曝されて放熱される面を直接加熱するため小
電力で済む。図4は本発明の他の実施例を示す。図にお
いて、図2と同一物には同一符号を付し重複する説明を
省略する。この装置では、攪拌棒9は直接的にアーム1
4に軸支され、平行配置されたモータ15によって回転
駆動される。そして、攪拌棒9の上方には回転する攪拌
棒9を加熱する赤外線ランプなどの熱源20が配置され
ている。この攪拌棒9は図5に示すように有底筒状と
し、底部を肉薄にすることにより、熱源20から供給さ
れる熱を攪拌棒9の下端表面に効率よく伝達することが
出来る。またこの攪拌棒9は図6に示すように、透明で
耐熱性、耐食性、耐摩耗性を有する人工宝石などで構成
することが出来る。この場合、熱源20から供給される
熱は攪拌棒9を通り過ぎるため、その下端面を黒化処理
したり、下端に近い内部に吸熱部材21を配置しても良
い。尚、攪拌棒9はマウントする半導体ペレット12に
応じて、最適な材質や直径が設定され、図2乃至図6の
実施例を選択し適用することができる。
FIG. 1 shows an embodiment of the present invention.
In the figure, the same components as those in FIG. 7 are denoted by the same reference numerals, and redundant description will be omitted. The apparatus according to the present invention is characterized in that the stirring rod 9 is provided with a stirring rod heating means 13 for setting the temperature of the surface of the lower end in contact with the molten solder 7 to be substantially the same as the temperature of the molten solder. The stirring rod heating means 13 is a rod-shaped electric heater and is housed in a cavity 9 a formed in the stirring rod 9. More specifically, as shown in FIG. 2, a rotating shaft 15a of a motor 15 supported at one end of an arm 14 that moves up and down is extended downward, and a stirring rod 9 made of a hard material is connected to the rotating shaft 15a. The two annular electrodes 16a and 16b are electrically and thermally insulated on the outer periphery of the rotating shaft 15a, and the leads 13a and 13b of the heater 13 are connected to the annular electrodes 16a and 16b. On the other hand, the leg pieces 17 extending downward from the arm 14 are attached to the annular electrodes 16a, 16b.
Terminals 18a and 18b electrically connected to the heater are fixed, and the heater 13 is energized from the terminals 18a and 18b. Thereby, the heater 13 in the stirring rod 9 rotating up and down and rotating around the axis can be continuously energized, and the temperature can be adjusted. In the apparatus of the present invention, the stirrer rod 9 separates from the lead frame 1 when ascending, and even if the stirring rod 9 comes into contact with the outside air, the heater 13 can maintain at least the temperature of the lower end surface in contact with the molten solder at substantially the same as the melting temperature of the solder. Even if the molten solder on the frame is locally eccentrically raised, the temperature of the molten solder in contact with the stirring rod 9 does not decrease, and the contact surface between the molten solder 7 and the stirring rod 9 slides well. Viscosity rise and solidification can be prevented, and solder scattering can be prevented, so that the solder can be well stirred even for a short time. Particularly, if necessary, the operation of the equipment is temporarily stopped, and even after the operation of the equipment is started with the lower end of the stirring rod 9 being out of the cover 3 for a long time, the solder can be scattered and good stirring can be performed. In addition, since the amount of the molten solder that is agitated is kept constant, a semiconductor device that can withstand a long-term power cycle test and has a long life and high reliability can be realized.
Furthermore, it is not necessary to temporarily stop and clean the equipment due to the scattering of the solder, thereby improving the productivity. FIG. 3 shows another embodiment of the present invention. In the figure, the same components as those in FIGS. 7, 1 and 2 are denoted by the same reference numerals, and redundant description will be omitted. 2 is different from the apparatus shown in FIG. 2 in that a stirring rod 9 and a heater 19 for heating the stirring rod 9 are made of cemented carbide if the peripheral surface thereof is electrically insulating and has heat resistance. Materials having an insulating layer, ceramics, artificial jewels, and the like can be used. The heater 19 is constituted by a resistive film pattern formed on the peripheral surface of the stirring rod 9 which is electrically insulated. Both ends of this resistive film pattern are connected to the annular electrodes 16a and 16b, and operate in the same manner as the device shown in FIGS. This device also has a stirring rod 9 like the device of FIG.
The temperature at the lower end of the cover 3 can be appropriately maintained, and the same curing as that of the apparatus shown in FIG. 1 can be achieved. I'm done. FIG. 4 shows another embodiment of the present invention. In the figure, the same components as those in FIG. 2 are denoted by the same reference numerals, and duplicate description will be omitted. In this device, the stirring rod 9 is directly connected to the arm 1.
4 and is rotationally driven by a motor 15 arranged in parallel. A heat source 20 such as an infrared lamp for heating the rotating stirring rod 9 is disposed above the stirring rod 9. As shown in FIG. 5, the stirring rod 9 is formed in a cylindrical shape having a bottom, and by making the bottom thinner, heat supplied from the heat source 20 can be efficiently transmitted to the lower end surface of the stirring rod 9. Further, as shown in FIG. 6, the stirring bar 9 can be made of a transparent artificial gem having heat resistance, corrosion resistance and wear resistance. In this case, since the heat supplied from the heat source 20 passes through the stirring rod 9, the lower end surface may be blackened, or the heat absorbing member 21 may be disposed inside the lower end. The stirring bar 9 has an optimum material and diameter set according to the semiconductor pellet 12 to be mounted, and the embodiment shown in FIGS. 2 to 6 can be selected and applied.

【0007】[0007]

【発明の効果】以上のように本発明によれば、設備を高
速動作させても溶融半田の飛散を防止でき、生産効率の
向上を図ることが出来、長寿命で信頼性の高い半導体装
置を実現することが出来る。
As described above, according to the present invention, even when the equipment is operated at high speed, the scattering of the molten solder can be prevented, the production efficiency can be improved, and a semiconductor device having a long life and high reliability can be obtained. Can be realized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明によるダイボンダを示す一部断面側面
FIG. 1 is a partial cross-sectional side view showing a die bonder according to the present invention.

【図2】 図1装置の要部拡大側面図FIG. 2 is an enlarged side view of a main part of the apparatus in FIG. 1;

【図3】 本発明の他の実施例を示す要部拡大側面図FIG. 3 is an enlarged side view of a main part showing another embodiment of the present invention.

【図4】 本発明の他の実施例を示す要部拡大側面図FIG. 4 is an enlarged side view of a main part showing another embodiment of the present invention.

【図5】 本発明の他の実施例を示す要部拡大側面図FIG. 5 is an enlarged side view of a main part showing another embodiment of the present invention.

【図6】 本発明の他の実施例を示す要部拡大側面図FIG. 6 is an enlarged side view of a main part showing another embodiment of the present invention.

【図7】 ダイボンタの従来例を示す一部断面側面図FIG. 7 is a partially sectional side view showing a conventional example of a die bonder.

【図8】 図7装置による溶融半田の攪拌状態を示す平
断面図
FIG. 8 is a cross-sectional plan view showing a stirring state of molten solder by the apparatus in FIG. 7;

【図9】 図8のA−A断面図9 is a sectional view taken along line AA of FIG. 8;

【符号の説明】[Explanation of symbols]

1 リードフレーム 2 ガイドレール 3 カバ 4 フレーム加熱手段 5 半田供給部 7 半田 8 半田攪拌部 9 攪拌棒 10 半導体ペレット供給部 12 半導体ペレット 13 攪拌棒加熱手段(ヒータ) DESCRIPTION OF SYMBOLS 1 Lead frame 2 Guide rail 3 Cover 4 Frame heating means 5 Solder supply part 7 Solder 8 Solder stirring part 9 Stirring rod 10 Semiconductor pellet supply part 12 Semiconductor pellet 13 Stirring rod heating means (heater)

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】リードフレームをガイドし間欠移動させる
ガイドレールと、ガイドレールを覆いリードフレームの
移動方向に沿う上面の所定位置に開口窓を開口したカバ
ーと、ガイドレール上のリードフレームを加熱するフレ
ーム加熱手段と、カバーの開口窓位置に配置されてカバ
ー内に挿入され、リードフレーム上に半田を供給する半
田供給部と、リードフレーム上で溶融した半田を攪拌棒
で攪拌する半田攪拌部と、攪拌された溶融半田上に半導
体ペレットを供給する半導体ペレット供給部とを備えた
ダイボンダにおいて、 上記半田攪拌部の攪拌棒に、少なくとも溶融半田と接触
する面を加熱する加熱手段を付設したことを特徴とする
ダイボンダ。
1. A guide rail for guiding and intermittently moving a lead frame, a cover covering the guide rail and opening an opening at a predetermined position on an upper surface along a moving direction of the lead frame, and heating the lead frame on the guide rail. A frame heating means, a solder supply unit which is disposed at the opening window position of the cover and is inserted into the cover, and supplies the solder on the lead frame, and a solder stirring unit for stirring the molten solder on the lead frame with a stirring rod. In a die bonder having a semiconductor pellet supply unit for supplying semiconductor pellets onto the stirred molten solder, a heating means for heating at least a surface in contact with the molten solder is provided on the stirring rod of the solder stirring unit. Die bonder characterized.
【請求項2】攪拌棒内に空洞を形成しこの空洞内にヒー
タを配置したことを特徴とする請求項1に記載のダイボ
ンダ。
2. The die bonder according to claim 1, wherein a cavity is formed in the stirring rod, and a heater is disposed in the cavity.
【請求項3】攪拌棒の少なくとも下端部外周面を電気的
絶縁部材により構成し、この下端部外周面にヒータを配
置したことを特徴とする請求項1に記載のダイボンダ。
3. The die bonder according to claim 1, wherein at least the outer peripheral surface of the lower end portion of the stirring rod is formed of an electrically insulating member, and a heater is disposed on the outer peripheral surface of the lower end portion.
【請求項4】ヒータを導電パターンで形成したことを特
徴とする請求項3に記載のダイボンダ。
4. The die bonder according to claim 3, wherein the heater is formed by a conductive pattern.
【請求項5】攪拌棒の下端の温度をリードフレーム上の
溶融半田の温度とほぼ同じに設定したことを特徴とする
請求項1に記載のダイボンダ。
5. The die bonder according to claim 1, wherein the temperature of the lower end of the stirring rod is set substantially equal to the temperature of the molten solder on the lead frame.
JP1518599A 1999-01-25 1999-01-25 Die bonder Pending JP2000216174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1518599A JP2000216174A (en) 1999-01-25 1999-01-25 Die bonder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1518599A JP2000216174A (en) 1999-01-25 1999-01-25 Die bonder

Publications (1)

Publication Number Publication Date
JP2000216174A true JP2000216174A (en) 2000-08-04

Family

ID=11881784

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1518599A Pending JP2000216174A (en) 1999-01-25 1999-01-25 Die bonder

Country Status (1)

Country Link
JP (1) JP2000216174A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001089753A1 (en) * 2000-05-24 2001-11-29 Casem (Asia) Pte Ltd Improved apparatus and method for dispensing solder
WO2001091175A1 (en) * 2000-05-26 2001-11-29 Casem (Asia) Pte Ltd Method and device for bleed out control in solder bonding
CN102332506A (en) * 2011-07-22 2012-01-25 东莞市万丰纳米材料有限公司 Chip attaching method
CN102332507A (en) * 2011-07-22 2012-01-25 东莞市万丰纳米材料有限公司 Chip attaching method
CN102554482A (en) * 2010-12-30 2012-07-11 苏州世鼎电子有限公司 Method for welding components in groove
CN105118910A (en) * 2015-08-06 2015-12-02 广州市鸿利光电股份有限公司 LED solid crystal method, solid crystal glue and preparation method of the solid crystal glue

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001089753A1 (en) * 2000-05-24 2001-11-29 Casem (Asia) Pte Ltd Improved apparatus and method for dispensing solder
SG91867A1 (en) * 2000-05-24 2002-10-15 Casem Asia Pte Ltd Improved apparatus and method for dispensing solder
WO2001091175A1 (en) * 2000-05-26 2001-11-29 Casem (Asia) Pte Ltd Method and device for bleed out control in solder bonding
SG91870A1 (en) * 2000-05-26 2002-10-15 Casem Asia Pte Ltd Method and device for bleed out control in solder bonding
CN102554482A (en) * 2010-12-30 2012-07-11 苏州世鼎电子有限公司 Method for welding components in groove
CN102332506A (en) * 2011-07-22 2012-01-25 东莞市万丰纳米材料有限公司 Chip attaching method
CN102332507A (en) * 2011-07-22 2012-01-25 东莞市万丰纳米材料有限公司 Chip attaching method
CN105118910A (en) * 2015-08-06 2015-12-02 广州市鸿利光电股份有限公司 LED solid crystal method, solid crystal glue and preparation method of the solid crystal glue
CN105118910B (en) * 2015-08-06 2019-02-19 鸿利智汇集团股份有限公司 The preparation method of LED die-bonding method, crystal-bonding adhesive and crystal-bonding adhesive

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