JP2000187053A - Substrate inspecting system - Google Patents

Substrate inspecting system

Info

Publication number
JP2000187053A
JP2000187053A JP10364203A JP36420398A JP2000187053A JP 2000187053 A JP2000187053 A JP 2000187053A JP 10364203 A JP10364203 A JP 10364203A JP 36420398 A JP36420398 A JP 36420398A JP 2000187053 A JP2000187053 A JP 2000187053A
Authority
JP
Japan
Prior art keywords
board
substrate
inspection
inspecting
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP10364203A
Other languages
Japanese (ja)
Inventor
Ikumi Fujimori
郁美 藤森
Koji Mantani
耕二 萬谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Microelectronics Co Ltd
Original Assignee
Ricoh Microelectronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Microelectronics Co Ltd filed Critical Ricoh Microelectronics Co Ltd
Priority to JP10364203A priority Critical patent/JP2000187053A/en
Publication of JP2000187053A publication Critical patent/JP2000187053A/en
Withdrawn legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a substrate inspecting system which can judge whether or not a substrate is supplied to a substrate inspecting part in correct orientation, thereby avoiding wasteful inspection to the substrate. SOLUTION: The system is provided with a board inspecting part 6 with an inspecting terminal 12 which comes in touch with an electrode terminal of an engine board 50 to be inspected, a transfer rail 31 for transferring the board 50 to supply to an inspection position in the vicinity of the board inspecting part 6 and discharge from the inspection position, and a drive means (step motor) for driving the transfer rail 31 for the board 50 to bring the board inspecting part 6 and the board 50 at the inspection position close to each other to make the electrode terminal and the inspecting terminal 12 touch each other. In this case, a through hole 50a and a guide pin 14 are formed respectively to the board 50 and the board inspecting part 6 to be engaged with each other when the board 50 and the board-inspecting part 6 approach to have the electrode terminal and inspecting terminal 12 touch with each other. A reflecting light sensor 34 is set for detecting whether the through hole 50a of the board 50 and the guide pin 14 of the board inspecting part 6 are engaged with each other or not.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、検査対象の基板の
電極端子と基板検査部の検査端子とを接触させた状態で
該基板を検査する基板検査システムに関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a board inspection system for inspecting a board to be inspected while the electrode terminals of the board are in contact with the inspection terminals of a board inspection section.

【0002】[0002]

【従来の技術】従来、この種の基板検査システムでは、
搬送ベルトやガイドレール等からなる基板搬送手段によ
り検査対象の基板を基板検査部の近傍の検査位置に搬送
し、該基板の電極端子と該基板検査部の検査端子とを接
触させるように該基板と該基板検査部とを接近させた
後、該基板の検査を開始していた。
2. Description of the Related Art Conventionally, in this type of board inspection system,
The substrate to be inspected is transported to an inspection position near the substrate inspection unit by a substrate transportation unit including a transport belt and a guide rail, and the substrate is so contacted that the electrode terminals of the substrate and the inspection terminals of the substrate inspection unit are brought into contact with each other. After approaching the substrate inspection section with the substrate inspection section, the inspection of the substrate was started.

【0003】[0003]

【発明が解決しようとする課題】ところが、上記従来の
基板検査システムでは、基板の前後の向きを間違えて該
基板を上記検査位置に搬送するおそれがあった。一般
に、検査対象の基板の電極端子の配置は、該基板の部品
装着面に垂直で該部品装着面の中心を通る軸に関して1
80度回転対称になっていない場合がほとんどである。
したがって、基板の搬送の向きを間違えると該基板の電
極端子と該基板検査部の検査端子とが接触しないので、
この状態で基板の検査動作を開始したとしても所定の検
査結果を得ることができず、検査動作が無駄になってし
まう。
However, in the above-mentioned conventional board inspection system, there is a risk that the board is transported to the above-described inspection position with the front and rear directions of the board wrong. In general, the arrangement of the electrode terminals on the board to be inspected is one with respect to an axis perpendicular to the component mounting surface of the board and passing through the center of the component mounting surface.
In most cases, it is not 80 degrees rotationally symmetric.
Therefore, if the direction of conveyance of the substrate is wrong, the electrode terminals of the substrate and the inspection terminals of the substrate inspection section do not come into contact with each other,
Even if the inspection operation of the substrate is started in this state, a predetermined inspection result cannot be obtained, and the inspection operation is wasted.

【0004】本発明は以上の問題点に鑑みなされたもの
であり、その目的は、検査対象の基板が正しい向きで基
板検査部に供給されたか否かを判定可能にすることによ
り、基板の無駄な検査動作を回避することができる基板
検査システムを提供することである。
The present invention has been made in view of the above problems, and an object of the present invention is to make it possible to determine whether or not a board to be inspected has been supplied to a board inspection section in a correct direction, thereby reducing waste of the board. It is an object of the present invention to provide a board inspection system capable of avoiding a complicated inspection operation.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に、請求項1の発明は、検査対象の基板の電極端子に接
触する検査端子を有する基板検査部と、該基板検査部の
近傍の検査位置への供給及び該検査位置からの排出を行
うように該基板を搬送する基板搬送手段と、該基板検査
部と該検査位置にある該基板とを接近させて該電極端子
と該検査端子とを接触させるように該基板及び該基板検
査部の少なくとも一方を駆動する駆動手段とを備えた基
板検査システムであって、該基板及び該基板検査部のそ
れぞれに、該基板と該基板検査部とが接近して該電極端
子と該検査端子が接触したときに互いに係合する係合部
を形成し、該基板側の係合部と該基板検査部側の係合部
とが係合したか否かを検知する検知手段を設けたことを
特徴とするものである。
To achieve the above object, according to the present invention, there is provided a substrate inspection section having an inspection terminal for contacting an electrode terminal of a substrate to be inspected, and a substrate inspection section near the substrate inspection section. A substrate transporting unit that transports the substrate so as to supply the substrate to the inspection position and discharge the substrate from the inspection position; bringing the substrate inspection unit and the substrate located at the inspection position closer to each other so that the electrode terminal and the inspection terminal A driving unit for driving at least one of the substrate and the substrate inspection unit so that the substrate and the substrate inspection unit are brought into contact with each other. Form an engaging portion that engages with each other when the electrode terminal and the inspection terminal come into contact with each other, and the engagement portion on the substrate side and the engagement portion on the substrate inspection unit side are engaged. Detection means for detecting whether or not That.

【0006】請求項1の基板検査システムでは、基板搬
送手段で基板を搬送して基板検査部の近傍の検査位置に
供給し、該基板及び該基板検査部の少なくとも一方を駆
動手段で駆動することにより該基板と該基板検査部とを
接近させる。ここで、該検査位置に供給された基板が検
査対象の基板であって該基板の向きが正しいときは、該
基板検査部側の係合部と該基板側の係合部とが係合し、
該基板と該基板検査部とが所定距離まで接近し、該基板
の電極端子と該基板検査部の検査端子とが接触する。一
方、該検査位置に供給された基板が検査対象以外の基板
であったり、該基板の向きが間違っていたりしたとき
は、該基板検査部側の係合部と該基板側の係合部とが係
合しないので、該基板と該基板検査部とが所定距離まで
接近せず、該基板の電極端子と該基板検査部の検査端子
とが接触しない。この基板側の係合部と基板検査部側の
係合部とが係合したか否かを検知手段で検知することに
より、基板検査部に検査対象の基板が正しい向きで供給
されたか否かを判定することができる。
According to the first aspect of the present invention, the substrate is transported by the substrate transport unit and supplied to an inspection position near the substrate inspection unit, and at least one of the substrate and the substrate inspection unit is driven by the driving unit. To bring the substrate and the substrate inspection unit closer. Here, when the substrate supplied to the inspection position is the substrate to be inspected and the orientation of the substrate is correct, the engagement portion on the substrate inspection portion and the engagement portion on the substrate side are engaged. ,
The substrate and the board inspection unit approach each other to a predetermined distance, and the electrode terminals of the board and the inspection terminals of the board inspection unit come into contact with each other. On the other hand, when the substrate supplied to the inspection position is a substrate other than the inspection target, or when the orientation of the substrate is wrong, the engagement portion on the substrate inspection portion and the engagement portion on the substrate side Are not engaged, the board and the board inspection unit do not approach each other to a predetermined distance, and the electrode terminals of the board do not contact the inspection terminals of the board inspection unit. By detecting whether or not the engaging portion on the substrate side and the engaging portion on the substrate inspecting portion are engaged with each other by the detecting means, it is determined whether the substrate to be inspected is supplied to the substrate inspecting portion in a correct direction. Can be determined.

【0007】請求項2の発明は、請求項1の基板検査シ
ステムにおいて、上記係合部として、上記基板及び上記
基板検査部のいずれか一方に貫通孔を形成するととも
に、他方に該貫通孔に貫通して係合する突起部を形成し
たことを特徴とするものである。
According to a second aspect of the present invention, in the board inspection system of the first aspect, a through hole is formed in one of the substrate and the board inspection section as the engagement portion, and the through hole is formed in the other. It is characterized in that a projection portion that penetrates and engages is formed.

【0008】この請求項2の基板検査システムでは、上
記検査位置に供給された基板が検査対象の基板であって
該基板の向きが正しいときは、該基板及び基板検査部の
いずれか一方に形成した貫通孔に、他方に形成した突起
部が貫通して係合し、該基板と該基板検査部とが所定距
離まで接近し、該基板の電極端子と該基板検査部の検査
端子とが接触する。一方、該検査位置に供給された基板
が検査対象以外の基板であったり、該基板の向きが間違
っていたりしたときは、該貫通孔に該突起部が貫通して
係合しないので、該基板と該基板検査部とが所定距離ま
で接近せず、該基板の電極端子と該基板検査部の検査端
子とが接触しない。
In the substrate inspection system according to the second aspect, when the substrate supplied to the inspection position is a substrate to be inspected and the orientation of the substrate is correct, the substrate is formed on one of the substrate and the substrate inspection section. The protrusion formed on the other side penetrates and engages with the through hole, and the board and the board inspection section approach each other to a predetermined distance, and the electrode terminal of the board and the inspection terminal of the board inspection section come into contact with each other. I do. On the other hand, when the substrate supplied to the inspection position is a substrate other than the inspection target, or when the orientation of the substrate is wrong, the projection does not penetrate into the through hole and does not engage with the substrate. And the substrate inspection unit do not approach to a predetermined distance, and the electrode terminals of the substrate do not contact the inspection terminals of the substrate inspection unit.

【0009】請求項3の発明は、請求項1又は2の基板
検査システムにおいて、上記係合部を、上記基板が上記
基板検査部とが接近するときに該基板の電極端子が該基
板検査部の検査端子に接触するように該基板及び該基板
検査部の少なくとも一方をガイドするガイド機構に兼用
したことを特徴とするものである。
According to a third aspect of the present invention, in the substrate inspection system according to the first or second aspect, the engagement portion is connected to the substrate inspection portion when the substrate approaches the substrate inspection portion. And a guide mechanism for guiding at least one of the substrate and the substrate inspection section so as to contact the inspection terminal.

【0010】この請求項3の基板検査システムでは、上
記基板と上記基板検査部との接近に伴って該基板検査部
側の係合部と該基板側の係合部とが係合するときに、該
基板の位置が多少ずれていても該基板がガイドされ、該
基板の電極端子と該基板検査部の検査端子とが確実に接
触する。
In the substrate inspection system according to the third aspect, when the engagement portion on the substrate inspection portion and the engagement portion on the substrate side engage with each other as the substrate approaches the substrate inspection portion. Even if the position of the substrate is slightly shifted, the substrate is guided, and the electrode terminals of the substrate and the inspection terminals of the substrate inspection section surely come into contact with each other.

【0011】なお、上記基板及び上記基板検査部に形成
する係合部が1組の場合は、該基板の中央部からずらし
た位置に該係合部を形成すれば、該基板の前後の向きが
正しいか否かを判定できる。また、上記係合部が偶数組
の場合は、該基板の部品装着面に垂直で該部品装着面の
中央を通る軸を回転軸とした180度回転対称な配置か
らずらして該係合部を形成すれば、該基板の前後の向き
が正しいか否かを判定できる。
In the case where the board and the board inspection section are formed of one set of engagement sections, if the engagement section is formed at a position shifted from the center of the board, the front and rear directions of the board can be changed. Is correct or not. In the case where the engagement portion is an even-numbered pair, the engagement portion is shifted from a 180-degree rotationally symmetric arrangement with an axis perpendicular to the component mounting surface of the substrate and passing through the center of the component mounting surface as a rotation axis. If formed, it is possible to determine whether the front and rear directions of the substrate are correct.

【0012】[0012]

【発明の実施の形態】以下、本発明を画像形成装置とし
てのカラーインクジェットプリンタに用いるエンジン基
板の機能を検査する基板検査システムに適用した実施形
態について説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment in which the present invention is applied to a board inspection system for inspecting the function of an engine board used in a color ink jet printer as an image forming apparatus will be described below.

【0013】図2(a)は本実施形態の基板検査システ
ムの外観を示す正面図であり、図2(b)は同基板検査
システムにおける検査対象のエンジン基板50が載置さ
れた基板検査部6の拡大図である。基板検査部6は、検
査対象のエンジン基板50の種類に応じて作業者が自由
に取り替えることができるようにモジュール化されてい
る。この基板検査部6を装置本体の所定位置にセットす
ると、図中奥側にある各種基板に共通に用いる汎用部の
コネクタ25が図中手前側に移動し、基板検査部6側の
コネクタ13と係合し、基板検査部6と汎用部との間が
電気的に接続される。基板検査部6には、エンジン基板
50に関する情報が記憶されているため、該基板検査部
6と汎用部20との接続により、エンジン基板50を搬
送する搬送手段としての搬送ベルト31a及びガイドレ
ール31bからなる搬送レール31(図1参照)が、図
示しないステップモータで駆動され、搬送レール31の
幅が基板50の幅に適合するように設定される。
FIG. 2A is a front view showing the appearance of the board inspection system of the present embodiment, and FIG. 2B is a board inspection unit on which the engine board 50 to be inspected is mounted in the board inspection system. FIG. 6 is an enlarged view of FIG. The board inspection unit 6 is modularized so that an operator can freely replace it according to the type of the engine board 50 to be inspected. When the board inspection section 6 is set at a predetermined position in the apparatus main body, the connector 25 of the general-purpose section commonly used for various boards on the back side in the figure moves to the front side in the figure, and the connector 13 on the board inspection section 6 side As a result, the board inspection section 6 and the general-purpose section are electrically connected. Since the board inspecting section 6 stores information about the engine board 50, the connection between the board inspecting section 6 and the general-purpose section 20 causes the transport belt 31 a and the guide rail 31 b as transport means for transporting the engine board 50. Is transported by a step motor (not shown), and the width of the transport rail 31 is set to match the width of the substrate 50.

【0014】所定の前後の向きで搬送レール30上にセ
ットされ矢印A方向に搬送されるエンジン基板50は、
該基板50上に付された識別マークとしてのバーコード
が図示しないバーコードリーダーで読み取られる。そし
て、図1(a)に示すように基板検査部6の上方に設置
された搬送レール31上の所定の検査位置で停止する。
この搬送レール31は、図示しない駆動手段で昇降可能
に構成されている。
The engine board 50 which is set on the transport rail 30 in a predetermined front and rear direction and transported in the direction of arrow A,
A bar code as an identification mark provided on the substrate 50 is read by a bar code reader (not shown). Then, as shown in FIG. 1 (a), it stops at a predetermined inspection position on the transport rail 31 installed above the substrate inspection unit 6.
The transport rail 31 is configured to be able to move up and down by a driving unit (not shown).

【0015】上記エンジン基板50の搬送方向と直交す
る方向の2つの端部の一方(図2の手前側、図1の右
側)には、基板向き検知用の2つの係合部としての貫通
孔50aが形成されている。基板検査部6の上面端部に
は、該貫通孔50aに貫通し得る2つの係合部としての
ガイドピン14が設けられている。このエンジン基板5
0が載置された搬送レール31を図示しない駆動手段に
より図中矢印Bの下方向に移動させると、図1(b)に
示すように基板検査部6のガイドピン14が、エンジン
基板50の貫通孔50aを貫通して係合する。この係合
により、エンジン基板50と基板検査部6とが接近して
エンジン基板50側の図示しない電極端子と該基板検査
部6側の検査端子12とが接触し、検査可能な状態にな
る。このとき、基板検査部6の上面端部に設けられた検
知手段としての反射型光センサ34により、エンジン基
板50の下面で反射される反射光が受光され、これによ
り、ガイドピン14がエンジン基板50の貫通孔50a
に貫通して係合し、エンジン基板50が基板検査部6に
対して所定の距離まで接近したか否かが検知される。こ
の検知結果は、図示しない制御部に送られる。
One of two ends of the engine board 50 in a direction perpendicular to the transport direction (a front side in FIG. 2 and a right side in FIG. 1) has two through holes as two engaging portions for detecting board orientation. 50a are formed. A guide pin 14 is provided at an end of the upper surface of the board inspection unit 6 as two engagement portions that can penetrate the through hole 50a. This engine board 5
When the transport rail 31 on which the “0” is placed is moved in the downward direction of the arrow B in the figure by a driving unit (not shown), the guide pins 14 of the board inspection unit 6 move the engine board 50 as shown in FIG. It engages through the through hole 50a. Due to this engagement, the engine board 50 and the board inspection section 6 approach each other, and the electrode terminals (not shown) on the engine board 50 side and the inspection terminals 12 on the board inspection section 6 side come into contact with each other, so that the board can be tested. At this time, the reflection light reflected on the lower surface of the engine substrate 50 is received by the reflection type optical sensor 34 as a detecting means provided at the end of the upper surface of the substrate inspection unit 6, whereby the guide pins 14 50 through holes 50a
To detect whether or not the engine board 50 has approached the board inspection unit 6 to a predetermined distance. This detection result is sent to a control unit (not shown).

【0016】また、上記ガイドピン14及び貫通孔50
aは、エンジン基板50のガイド機構に兼用されてい
る。このガイド機構を構成するため、ガイドピン14は
先端が細くなった円錐形状になっており、このガイドピ
ン14の底部の直径が貫通孔50aの直径とほぼ同じに
なっている。これにより、エンジン基板50の位置が多
少ずれていても、該基板50と基板検査部6とが接近す
るときに該ガイドピンの14の中心軸上に該貫通孔50
aの中心が来るように該基板50がガイドされ、該基板
50aの電極端子が基板検査部6の検査端子12に確実
に接触するようになる。
The guide pin 14 and the through hole 50
“a” is also used as a guide mechanism of the engine board 50. In order to configure the guide mechanism, the guide pin 14 has a conical shape with a thin tip, and the diameter of the bottom of the guide pin 14 is substantially the same as the diameter of the through hole 50a. Thereby, even if the position of the engine board 50 is slightly shifted, when the board 50 and the board inspection unit 6 approach each other, the through hole 50 is formed on the central axis of the guide pin 14.
The substrate 50 is guided so that the center of a is located, and the electrode terminals of the substrate 50a surely come into contact with the inspection terminals 12 of the substrate inspection section 6.

【0017】上記基板検査部6に接近したエンジン基板
50は、押圧部材33で矢印C方向に押圧される。この
押圧により、基板検査部6の上面から突出している検査
端子12とエンジン基板50の電極端子とを確実に接触
させる。エンジン基板50の機能検査が終了すると、押
圧部材33及び搬送レール31が上昇し、該搬送レール
31上のエンジン基板50が図中矢印Dで示すように下
流側の搬送レール32上に送り出され、次の工程に運ば
れる。
The engine board 50 approaching the board inspection section 6 is pressed by a pressing member 33 in the direction of arrow C. By this pressing, the inspection terminals 12 protruding from the upper surface of the substrate inspection section 6 and the electrode terminals of the engine substrate 50 are reliably brought into contact. When the function inspection of the engine board 50 is completed, the pressing member 33 and the transport rail 31 are raised, and the engine board 50 on the transport rail 31 is sent out onto the downstream transport rail 32 as shown by an arrow D in the drawing. It is carried to the next step.

【0018】上記搬送レール31上に搬送されてきたエ
ンジン基板50の前後の向きが所定の向きと反対の場合
は、上記ガイドピン14がエンジン基板50の貫通孔5
0aを貫通しないので、図1(c)に示すようにエンジ
ン基板50の端部がガイドピン14で突き上げられて傾
く。この基板50の傾きは、前述の光センサ34で検知
される。この検知結果に基づいて、エンジン基板50の
前後の向きが逆向きであると判定される。この逆向きと
判定されたエンジン基板50に対しては上記機能検査が
実行されず、該基板50は搬送レール32で搬送され、
図示しない再検査用ストッカーに収納される。
When the front and rear directions of the engine board 50 conveyed on the conveyance rail 31 are opposite to the predetermined directions, the guide pins 14 are connected to the through holes 5 of the engine board 50.
1a, the end of the engine board 50 is pushed up by the guide pins 14 and tilted, as shown in FIG. 1C. The inclination of the substrate 50 is detected by the optical sensor 34 described above. Based on this detection result, it is determined that the front and rear directions of the engine board 50 are opposite. The engine board 50 determined to be in the opposite direction is not subjected to the function test, and the board 50 is transported by the transport rail 32,
It is stored in a re-inspection stocker not shown.

【0019】以上、本実施形態によれば、基板検査部6
に搬送されてきたエンジン基板50の向きが正しいか否
かを判定することができるので、エンジン基板50の無
駄な検査動作を回避することができる。
As described above, according to the present embodiment, the board inspection unit 6
It can be determined whether or not the direction of the engine board 50 conveyed to the engine board is correct, so that useless inspection operation of the engine board 50 can be avoided.

【0020】また、本実施形態によれば、上記ガイドピ
ン14及び上記貫通孔50aを、該エンジン基板50の
ガイドに兼用することができるので、基板をガイドする
ガイド機構を個別に設けた場合に比して装置構成をより
簡略化することができる。
Further, according to the present embodiment, the guide pins 14 and the through holes 50a can also be used as guides for the engine board 50. Therefore, when a guide mechanism for guiding the boards is provided separately. As a result, the device configuration can be further simplified.

【0021】なお、上記実施形態では、カラーインクジ
ェットプリンタに用いるエンジン基板の機能を検査する
基板検査システムについて説明したが、本発明は、他の
基板を検査する場合にも適用できるものである。
In the above embodiment, the board inspection system for inspecting the function of the engine board used in the color ink jet printer has been described. However, the present invention can be applied to the case of inspecting other boards.

【0022】また、上記実施形態では、図3(a)に示
すようにエンジン基板50の搬送方向(矢印A方向)と
直交する幅方向における一方の端部に2つの貫通孔50
aを形成しているが、本発明は、貫通孔50a及びガイ
ドピン14の組数に限定されることなく適用することが
できるものである。ここで、上記貫通孔50aの個数が
奇数個の場合は基板の端部の任意の位置に貫通孔50a
を形成することが可能であり、例えば図3(b)及び
(c)に示すように貫通孔50aを形成することができ
る。一方、上記貫通孔50aの個数が偶数個の場合は、
本実施形態や図3(d)の変形例のように、該基板50
の部品装着面に垂直で該部品装着面の中心を通る軸に関
して180度回転対称な配置からずらして貫通孔50a
を形成する。
In the above embodiment, as shown in FIG. 3A, two through holes 50 are formed at one end in the width direction orthogonal to the transport direction of the engine substrate 50 (the direction of arrow A).
Although a is formed, the present invention can be applied without being limited to the number of sets of the through hole 50a and the guide pin 14. Here, when the number of the through holes 50a is an odd number, the through holes 50a
Can be formed. For example, as shown in FIGS. 3B and 3C, a through hole 50a can be formed. On the other hand, when the number of the through holes 50a is an even number,
As in the present embodiment and the modification of FIG.
The through-hole 50a is displaced from the 180-degree rotationally symmetric arrangement with respect to an axis perpendicular to the component mounting surface and passing through the center of the component mounting surface.
To form

【0023】また、上記実施形態では、エンジン基板5
0を載置した搬送レール31を下降させるように構成し
た場合について説明したが、本発明は、基板検査部6を
上昇させるように構成した場合や上記搬送レール31及
び基板検査部6の両方を駆動するように構成した場合に
も適用できるものである。
In the above embodiment, the engine board 5
Although the case where the transport rail 31 on which the “0” is placed is described as being lowered has been described, the present invention relates to the case where the substrate inspecting unit 6 is configured to be lifted, or both the transport rail 31 and the substrate inspecting unit 6 are used. The present invention can also be applied to a case in which driving is performed.

【0024】また、上記実施形態では、係合部として、
エンジン基板50側に貫通孔50aを形成し、基板検査
部6にガイドピン6を形成しているが、この貫通孔50
aとガイドピン6との組み合わせに限定されることな
く、本発明は、例えば互いに係合可能な凸部と凹部との
組み合わせのような他の種類の係合部を採用した場合に
も適用できるものである。
Further, in the above embodiment, the engaging portion is
A through hole 50a is formed on the engine board 50 side, and a guide pin 6 is formed on the board inspection section 6.
The present invention is not limited to the combination of the a and the guide pin 6, and the present invention can be applied to a case where another type of engagement portion such as a combination of a protrusion and a recess engageable with each other is employed. Things.

【0025】また、上記本実施形態では、エンジン基板
50の前後の向きが正しいか否かを判定できるように貫
通孔50a及びガイドピン6からなる係合部を形成して
いるが、所定の検査対象の基板が検査位置に間違いなく
供給されたか否かを判定できるように係合部を形成して
もよい。この場合は、基板検査部6に所定の検査対象以
外の間違った基板が供給されたときに基板の無駄な検査
動作を回避することができる。この場合は、上記係合部
として、例えば、種類の異なる基板のそれぞれに直径や
形状の異なる貫通孔を形成し、基板検査部6側には、該
基板検査部で検査可能な所定種類の基板の貫通孔のみに
係合するような直径や形状を有するガイドピンを形成す
る。
In the present embodiment, the engaging portion including the through hole 50a and the guide pin 6 is formed so as to determine whether the front and rear directions of the engine board 50 are correct. An engagement portion may be formed so that it can be determined whether or not the target substrate has been correctly supplied to the inspection position. In this case, when a wrong board other than a predetermined inspection target is supplied to the board inspection unit 6, useless inspection operation of the board can be avoided. In this case, for example, through holes having different diameters and shapes are formed in the different types of substrates as the engaging portions, and a predetermined type of substrate that can be inspected by the substrate inspecting portion is provided on the substrate inspecting portion 6 side. A guide pin having a diameter and a shape that engages only with the through hole is formed.

【0026】[0026]

【発明の効果】請求項1乃至3の発明によれば、基板検
査部に検査対象の基板が正しい向きで供給されたか否か
を判定することができるので、基板の無駄な検査動作を
回避することができるという効果がある。
According to the first to third aspects of the present invention, it is possible to determine whether or not the substrate to be inspected has been supplied to the substrate inspecting section in a correct direction, thereby avoiding unnecessary inspection operations of the substrate. There is an effect that can be.

【0027】特に、請求項3の発明によれば、上記判定
に用いる基板検査部側の係合部及び基板側の係合部を、
該基板のガイド機構に兼用することができるので、該ガ
イド機構を個別に設けた場合に比して装置構成をより簡
略化することができるという効果がある。
In particular, according to the third aspect of the present invention, the engaging portion on the board inspection section side and the engaging section on the board side used for the determination are
Since it can be used also as a guide mechanism for the substrate, there is an effect that the device configuration can be further simplified as compared with a case where the guide mechanism is separately provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)は、本発明の一実施形態に係る基板検査
システムの基板検査部の上方に所定の向きで搬送されて
きたエンジン基板の側面図。(b)は、同エンジン基板
の下降の様子を示す側面図。(c)は、所定の向きとは
逆向きに搬送されてきたエンジン基板の下降の様子を示
す側面図。
FIG. 1A is a side view of an engine board conveyed in a predetermined direction above a board inspection unit of a board inspection system according to an embodiment of the present invention. (B) is a side view showing a state where the engine board is lowered. (C) is a side view showing a state in which the engine board that has been transported in a direction opposite to the predetermined direction is lowered.

【図2】(a)は、同基板検査システムの外観を示す正
面図。(b)は、同基板検査システムにおけるエンジン
基板が載置された基板検査部の拡大図。
FIG. 2A is a front view showing the appearance of the board inspection system. (B) is an enlarged view of the board inspection part in which the engine board is mounted in the board inspection system.

【図3】(a)は、本実施形態の基板検査システムで検
査するエンジン基板の平面図。(b)乃至(d)は、変
形例に係るエンジン基板の平面図。
FIG. 3A is a plan view of an engine board inspected by the board inspection system of the embodiment. (B) thru | or (d) are top views of the engine board | substrate which concerns on a modification.

【符号の説明】[Explanation of symbols]

6 基板検査部 12 検査端子 14 ガイドピン 30〜32 搬送レール 34 反射型光センサ 50 エンジン基板 50a 貫通孔 6 Board Inspection Unit 12 Inspection Terminal 14 Guide Pin 30-32 Transport Rail 34 Reflective Optical Sensor 50 Engine Board 50a Through Hole

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】検査対象の基板の電極端子に接触する検査
端子を有する基板検査部と、該基板検査部の近傍の検査
位置への供給及び該検査位置からの排出を行うように該
基板を搬送する基板搬送手段と、該基板検査部と該検査
位置にある該基板とを接近させて該電極端子と該検査端
子とを接触させるように該基板及び該基板検査部の少な
くとも一方を駆動する駆動手段とを備えた基板検査シス
テムであって、 該基板及び該基板検査部のそれぞれに、該基板と該基板
検査部とが接近して該電極端子と該検査端子が接触した
ときに互いに係合する係合部を形成し、 該基板側の係合部と該基板検査部側の係合部とが係合し
たか否かを検知する検知手段を設けたことを特徴とする
基板検査システム。
A substrate inspection section having an inspection terminal in contact with an electrode terminal of a substrate to be inspected, and the substrate is supplied to an inspection position near the substrate inspection section and discharged from the inspection position. A substrate transporting unit for transporting, and driving at least one of the substrate and the substrate inspection unit such that the substrate inspection unit and the substrate at the inspection position are brought close to each other to bring the electrode terminals into contact with the inspection terminals. A board inspection system comprising a driving unit, wherein the substrate and the board inspection unit approach each other when the electrode terminal and the inspection terminal come into contact with each other. A board inspecting system, comprising: an engaging portion that engages; and a detecting unit that detects whether the board-side engaging portion and the board inspecting portion-side engaging portion are engaged. .
【請求項2】請求項1の基板検査システムにおいて、 上記係合部として、上記基板及び上記基板検査部のいず
れか一方に貫通孔を形成するとともに、他方に該貫通孔
に貫通して係合する突起部を形成したことを特徴とする
基板検査システム。
2. The board inspection system according to claim 1, wherein a through hole is formed in one of the substrate and the board inspection section as the engagement section, and the other is inserted through the through hole and engaged. A substrate inspection system characterized by forming a projecting portion.
【請求項3】請求項1又は2の基板検査システムにおい
て、 上記係合部を、上記基板が上記基板検査部とが接近する
ときに該基板の電極端子が該基板検査部の検査端子に接
触するように該基板及び該基板検査部の少なくとも一方
をガイドするガイド機構に兼用したことを特徴とする基
板検査システム。
3. The board inspection system according to claim 1 or 2, wherein said engagement portion is connected to an electrode terminal of said board when said board comes close to said board inspection portion. And a guide mechanism for guiding at least one of the substrate and the substrate inspection unit.
JP10364203A 1998-12-22 1998-12-22 Substrate inspecting system Withdrawn JP2000187053A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10364203A JP2000187053A (en) 1998-12-22 1998-12-22 Substrate inspecting system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10364203A JP2000187053A (en) 1998-12-22 1998-12-22 Substrate inspecting system

Publications (1)

Publication Number Publication Date
JP2000187053A true JP2000187053A (en) 2000-07-04

Family

ID=18481234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10364203A Withdrawn JP2000187053A (en) 1998-12-22 1998-12-22 Substrate inspecting system

Country Status (1)

Country Link
JP (1) JP2000187053A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200109236A (en) 2019-03-12 2020-09-22 가부시키가이샤 스크린 홀딩스 Inspection apparatus and inspection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200109236A (en) 2019-03-12 2020-09-22 가부시키가이샤 스크린 홀딩스 Inspection apparatus and inspection method

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