JP2000178712A - Film forming device and method of cathode maintenance - Google Patents
Film forming device and method of cathode maintenanceInfo
- Publication number
- JP2000178712A JP2000178712A JP10356826A JP35682698A JP2000178712A JP 2000178712 A JP2000178712 A JP 2000178712A JP 10356826 A JP10356826 A JP 10356826A JP 35682698 A JP35682698 A JP 35682698A JP 2000178712 A JP2000178712 A JP 2000178712A
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- maintenance
- opening
- closing
- reaction chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は真空槽内にターゲッ
トと基板を対向して配置し、ターゲットから放出させた
スパッタ粒子によって基板の表面に薄膜を生成する成膜
装置およびカソードメンテナンス方法に関するものであ
る。[0001] 1. Field of the Invention [0002] The present invention relates to a film forming apparatus and a cathode maintenance method in which a target and a substrate are arranged in a vacuum chamber so as to face each other, and a thin film is formed on the surface of the substrate by sputter particles emitted from the target. is there.
【0002】[0002]
【従来の技術】図4に従来の成膜装置の構造を示してい
る。図4において、1はカソード、2は反応室真空槽、
3は反応室真空槽2に膜が付着するのを防止する防着
板、4は前記カソード1の下側でバッキングプレート5
に固着されているターゲット、6は成膜時の異常放電を
防止するアースシールド、7はターゲット4に対向する
ように反応室真空槽2の下端内部に配置される被成膜物
である基板、8は基板7を受ける基板支持台、9は前記
カソード1が取り付けられているカソード出入用開閉
蓋、10は反応室真空槽2に形成されているガス供給
口、11は同反応室真空槽2に形成されている真空排気
口である。2. Description of the Related Art FIG. 4 shows the structure of a conventional film forming apparatus. In FIG. 4, 1 is a cathode, 2 is a vacuum chamber of a reaction chamber,
Reference numeral 3 denotes an adhesion-preventing plate for preventing a film from adhering to the vacuum chamber 2 of the reaction chamber, and reference numeral 4 denotes a backing plate 5 below the cathode 1.
A ground shield for preventing abnormal discharge during film formation; 7 a substrate as a film-forming object disposed inside the lower end of the reaction chamber vacuum tank 2 so as to face the target 4; Reference numeral 8 denotes a substrate support for receiving the substrate 7, reference numeral 9 denotes a cathode access opening / closing lid to which the cathode 1 is attached, reference numeral 10 denotes a gas supply port formed in the reaction chamber vacuum tank 2, and reference numeral 11 denotes the reaction chamber vacuum tank 2. It is a vacuum exhaust port formed at the bottom.
【0003】上記構成において、ガス供給口10よりガ
ス、例えばアルゴンガスを供給しながら真空排気口11
より排気し、反応室真空槽2の内部を所定の圧力に調整
してターゲット4にカソード1、バッキングプレート5
を介して電源(図示せず)より電流を印加し基板7を成
膜処理する。ターゲット4をある期間使用すると、ター
ゲット4の交換が必要になってくる。ターゲット4を交
換するためにカソード1が取り付けられているカソード
出入用開閉蓋9を上昇、退避させると反応室真空槽2内
に大気が進入し、メンテナンスを行なっている間、反応
室真空槽2内は大気にさらされている。また、防着板3
および、アースシールド6もある期間使用すると掃除な
どのメンテナンスが必要になり、そのメンテナンス中も
反応室真空槽2内は大気にさらされることになる。[0003] In the above configuration, the vacuum exhaust port 11 is supplied while a gas, for example, argon gas is supplied from the gas supply port 10.
Then, the inside of the reaction chamber vacuum chamber 2 is adjusted to a predetermined pressure, and the cathode 4 and the backing plate 5 are
A current is applied from a power supply (not shown) through the substrate 7, and the substrate 7 is formed into a film. If the target 4 is used for a certain period, the target 4 needs to be replaced. When the cathode access opening / closing lid 9 on which the cathode 1 is attached is lifted and retracted to replace the target 4, the atmosphere enters the reaction chamber vacuum chamber 2 and during maintenance, the reaction chamber vacuum chamber 2 Inside is exposed to the atmosphere. In addition, the deposition plate 3
In addition, if the earth shield 6 is used for a certain period of time, maintenance such as cleaning is required, and during the maintenance, the inside of the reaction chamber vacuum tank 2 is exposed to the atmosphere.
【0004】[0004]
【発明が解決しようとする課題】一般に成膜装置におい
てはターゲットの交換などのメンテナンス作業後の再生
産までの時間の短縮が要求されている。しかし、ターゲ
ット交換時には反応室真空槽内が大気にさらされ、大気
成分、例えば、水が反応室真空槽内を汚染する。そのた
め、メンテナンス作業後に反応室真空槽内の汚染を除去
し、再生産までの時間の長期化という問題を引き起こし
ていた。Generally, in a film forming apparatus, it is required to reduce the time required for reproduction after maintenance work such as replacement of a target. However, when the target is replaced, the inside of the reaction chamber vacuum tank is exposed to the atmosphere, and atmospheric components such as water contaminate the inside of the reaction chamber vacuum tank. Therefore, the contamination in the vacuum chamber of the reaction chamber is removed after the maintenance work, which causes a problem of prolonging the time until the reproduction.
【0005】本発明は、カソードや防着板などのメンテ
ナンス時に反応室真空槽内が大気にさらされる時間を短
くし、カソードや防着板などのメンテナンス後の再生産
までの時間を短縮することができる成膜装置およびカソ
ードメンテナンス方法を提供することを目的とする。An object of the present invention is to shorten the time during which the inside of the vacuum chamber of the reaction chamber is exposed to the atmosphere during maintenance of the cathode and the protection plate, and to shorten the time until re-production after maintenance of the cathode and the protection plate. It is an object of the present invention to provide a film forming apparatus and a cathode maintenance method capable of performing the above.
【0006】[0006]
【課題を解決するための手段】本発明の成膜装置および
カソードメンテナンス方法は、カソードメンテナンス時
にカソード出入用開閉部を閉じるメンテナンス用蓋を備
え、カソードメンテナンス中は反応室真空槽内を真空排
気し、カソードメンテナンス終了時にメンテナンス用蓋
を取り、カソード出入用開閉蓋にてカソード出入用開閉
部を閉じることを特徴とするものである。A film forming apparatus and a cathode maintenance method according to the present invention include a maintenance lid for closing a cathode access opening / closing unit during cathode maintenance, and evacuate the reaction chamber vacuum chamber during cathode maintenance. At the end of the cathode maintenance, a maintenance lid is taken off, and the cathode access opening / closing section is closed by the cathode access opening / closing lid.
【0007】この発明によると、カソードや防着板など
のメンテナンス時に反応室真空槽内が大気にさらされる
時間を短くし、カソードや防着板などのメンテナンス後
の再生産までの時間を短縮することができる。According to the present invention, the time during which the inside of the vacuum chamber of the reaction chamber is exposed to the atmosphere during maintenance of the cathode and the deposition plate is shortened, and the time until the reproduction of the cathode and the deposition plate after the maintenance is shortened. be able to.
【0008】[0008]
【発明の実施の形態】請求項1記載の成膜装置は、ガス
供給および排気機能を有する反応室真空槽内に、基板支
持台に設置された基板と、この基板に対抗しかつカソー
ド側に設置されたターゲットとを有し、基板をターゲッ
トに対して静止した状態で成膜する成膜装置において、
カソード出入用開閉蓋と、このカソード出入用開閉蓋に
設置されたカソードおよび防着板と、カソード出入用開
閉蓋を開閉、退避するカソード出入用開閉蓋開閉手段
と、カソードメンテナンス時にカソード出入用開閉部を
閉じるメンテナンス用蓋を備えたことを特徴とする。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A film forming apparatus according to a first aspect of the present invention includes a substrate installed on a substrate support in a vacuum chamber of a reaction chamber having gas supply and exhaust functions. In a film forming apparatus having an installed target and forming a film while the substrate is stationary with respect to the target,
A cathode access opening / closing lid, a cathode and a protection plate installed on the cathode access opening / closing lid, a cathode access opening / closing lid opening / closing means for opening / closing and retracting the cathode access opening / closing lid, and a cathode access opening / closing during cathode maintenance A maintenance lid for closing the part is provided.
【0009】請求項2記載のカソードメンテナンス方法
は、カソードメンテナンス時にカソード出入用開閉蓋を
開口し、ついでメンテナンス用蓋でカソード出入用開閉
部を閉じ、カソードメンテナンス中は反応室真空槽内を
真空排気し、カソードメンテナンス終了時にメンテナン
ス用蓋を取り、カソード出入用開閉蓋にてカソード出入
用開閉部を閉じることを特徴とする。According to a second aspect of the present invention, a cathode access opening / closing cover is opened at the time of cathode maintenance, the cathode access opening / closing portion is closed with the maintenance cover, and the inside of the reaction chamber vacuum chamber is evacuated during the cathode maintenance. Then, at the end of the cathode maintenance, the maintenance lid is removed, and the cathode entrance opening / closing section is closed by the cathode entrance opening / closing lid.
【0010】以下、本発明の一実施の形態を図1〜図3
を参照しながら説明する。なお、前記従来例と同一符号
は同一部材を示す。反応室真空槽2は、内部に被成膜物
である基板7を基板支持台8に設置して収容すると共
に、反応ガスを反応室真空槽2内に導入するガス供給口
10、反応室真空槽2内を真空状態に排気するための真
空排気口11が接続され、その上部の開口部(カソード
出入用開閉部)12は、カソード1を下面保持し蓋体を
兼ねるカソード出入用開閉蓋9により開閉可能となって
いる。前記カソード1の周囲には前記反応室真空槽2の
内面が成膜されないようにするための防着板3が、カソ
ード出入用開閉蓋9に固定されて設置されている。5は
ターゲット4を固着しているバッキングプレートであ
る。6はアースシールドであり、成膜時の異常放電を防
止する。Hereinafter, an embodiment of the present invention will be described with reference to FIGS.
This will be described with reference to FIG. Note that the same reference numerals as those in the conventional example denote the same members. The reaction chamber vacuum chamber 2 has a gas supply port 10 for introducing a reaction gas into the reaction chamber vacuum chamber 2 while accommodating a substrate 7 which is a film formation object on a substrate support 8. A vacuum exhaust port 11 for exhausting the inside of the tank 2 to a vacuum state is connected, and an upper opening (cathode access opening / closing section) 12 has a cathode access opening / closing cover 9 that holds the cathode 1 underneath and also serves as a lid. Can be opened and closed. Attached to the cathode 1 is a deposition-preventing plate 3 for preventing the inner surface of the reaction chamber vacuum chamber 2 from being formed into a film. Reference numeral 5 denotes a backing plate to which the target 4 is fixed. Reference numeral 6 denotes an earth shield which prevents abnormal discharge during film formation.
【0011】前記カソード出入用開閉蓋9はカソードメ
ンテナンス時に前記防着板3、バッキングプレート5、
ターゲット4、アースシールド6とともに図2に図示し
たカソード出入用開閉蓋開閉手段13により上昇、退避
可能となっている。また、ターゲット4には電源(図示
せず)からの電流が前記カソード1およびバッキングプ
レート5を通じて印加される。14はカソードメンテナ
ンス時にカソード出入用開閉部を閉じるメンテナンス用
蓋であり、カソードメンテナンス時に前記カソード出入
用開閉蓋9に代わって、前記開口部12を閉じるように
設置されている。なお、図2はカソード出入用開閉蓋9
を閉じた状態を示し、図3はカソード出入用開閉蓋9を
開き、前記メンテナンス用蓋14を閉じた状態を示して
いる。図2および図3において、15は反応室真空槽2
の底板、16は本体架台である。The cathode access opening / closing lid 9 is used to hold the attachment-preventing plate 3, backing plate 5,
The target 4 and the earth shield 6 can be raised and retracted by the cathode opening / closing lid opening / closing means 13 shown in FIG. A current from a power supply (not shown) is applied to the target 4 through the cathode 1 and the backing plate 5. Reference numeral 14 denotes a maintenance lid for closing the cathode access opening / closing section during cathode maintenance, and is provided so as to close the opening 12 instead of the cathode access opening / closing lid 9 during cathode maintenance. FIG. 2 shows the cathode opening / closing lid 9.
3 shows a state where the cathode access opening / closing lid 9 is opened and the maintenance lid 14 is closed. 2 and 3, reference numeral 15 denotes a reaction chamber vacuum tank 2.
Reference numeral 16 denotes a main body stand.
【0012】次に、上記構成の成膜装置におけるカソー
ドメンテナンス方法について説明する。反応室用真空槽
2内のターゲット4の交換および、防着板3の掃除など
のメンテナンスが必要になったとき、まずカソード出入
用開閉蓋9を上昇させて退避させる(図3参照)。これ
によりカソード出入用開閉蓋9に固定されているカソー
ド1、防着板3、カソード1に固定されているパッキン
グプレート5、アースシールド6、バッキングプレート
5に固着されているターゲット4がすべて同時に反応室
真空層2より取り出される。次に、メンテナンス用蓋1
4により開口部12を閉じ、真空排気口11を通じて反
応室真空槽2内を真空排気する。反応室真空槽2の真空
排気を行なっている間、反応室真空槽2外でターゲット
4の交換、カソード1、アースシールド6、防着板3の
掃除などのメンテナンスを行なう。前記メンテナンス作
業が終了次第、開口部12からメンテナンス用蓋14を
取り外し、カソード出入用開閉蓋9により開口部12を
閉じる(図2参照)。これによりメンテナンス作業を終
了した、カソード1、防着板3、カソード1に固定され
ているパッキングプレート5、アースシールド6、バッ
キングプレート5に固着されているターゲット4がすべ
て同時に反応室真空層2内の所定に位置に設置される。Next, a cathode maintenance method in the film forming apparatus having the above configuration will be described. When maintenance such as replacement of the target 4 in the reaction chamber vacuum tank 2 and cleaning of the deposition-preventing plate 3 becomes necessary, first, the cathode access opening / closing lid 9 is raised and retracted (see FIG. 3). As a result, the cathode 1 fixed to the cathode opening / closing lid 9, the deposition-preventing plate 3, the packing plate 5 fixed to the cathode 1, the earth shield 6, and the target 4 fixed to the backing plate 5 all react simultaneously. It is taken out from the chamber vacuum layer 2. Next, the maintenance lid 1
The opening 12 is closed by 4 and the inside of the reaction chamber vacuum tank 2 is evacuated through the evacuation port 11. While the evacuation of the reaction chamber vacuum chamber 2 is being performed, maintenance such as replacement of the target 4 and cleaning of the cathode 1, the earth shield 6, and the deposition preventing plate 3 are performed outside the reaction chamber vacuum chamber 2. As soon as the maintenance work is completed, the maintenance lid 14 is removed from the opening 12, and the opening 12 is closed by the cathode access opening / closing lid 9 (see FIG. 2). As a result, the cathode 1, the deposition-preventing plate 3, the packing plate 5 fixed to the cathode 1, the earth shield 6, and the target 4 fixed to the backing plate 5, all of which have undergone the maintenance work, are all in the reaction chamber vacuum layer 2 at the same time. At a predetermined position.
【0013】このような方法を採用することにより、成
膜装置においてターゲット4の交換および、防着板3の
掃除などのメンテナンス作業時に反応室真空槽2を大気
成分にさらしている時間を短くできる。メンテナンス作
業時の反応室真空槽2の大気開放時間と再生産までの時
間の関係を表1に示しており、この表1からわかるよう
に、反応室真空槽2の大気開放時間を短縮することでタ
ーゲット4の交換および、防着板3の掃除などのメンテ
ナンス作業後の再生産までの時間を短縮できるという効
果が得られる。By employing such a method, the time during which the reaction chamber vacuum tank 2 is exposed to atmospheric components during maintenance work such as replacement of the target 4 and cleaning of the deposition-preventing plate 3 in the film forming apparatus can be shortened. . Table 1 shows the relationship between the time for opening the reaction chamber vacuum tank 2 to the atmosphere and the time until reproduction during maintenance work. As can be seen from Table 1, the time for opening the reaction chamber vacuum tank 2 to the atmosphere can be shortened. Thus, the effect of shortening the time until the reproduction after the maintenance work such as the replacement of the target 4 and the cleaning of the protection plate 3 can be obtained.
【0014】[0014]
【表1】 [Table 1]
【0015】[0015]
【発明の効果】以上のように本発明によれば、カソード
や防着板などのメンテナンス時に反応室真空槽内が大気
にさらされる時間を短くし、カソードや防着板などのメ
ンテナンス後の再生産までの時間を短縮することができ
る。As described above, according to the present invention, the time during which the inside of the vacuum chamber of the reaction chamber is exposed to the atmosphere during maintenance of the cathode and the attachment plate is shortened, and the maintenance time of the cathode and the attachment plate is reduced. The time to production can be reduced.
【図1】本発明の一実施の形態による成膜装置の断面図FIG. 1 is a cross-sectional view of a film forming apparatus according to an embodiment of the present invention.
【図2】同カソード出入用開閉蓋を閉じた状態を示す斜
視図FIG. 2 is a perspective view showing a state in which the cathode access opening / closing lid is closed.
【図3】同カソード出入用開閉蓋を開いた状態を示す斜
視図FIG. 3 is a perspective view showing a state where the cathode access opening / closing lid is opened.
【図4】従来の成膜装置の断面図FIG. 4 is a cross-sectional view of a conventional film forming apparatus.
1 カソード 2 反応室真空槽 3 防着板 4 ターゲット 5 バッキングプレート 6 アースシールド 7 基板 8 基板支持台 9 カソード出入用開閉蓋 10 ガス供給口 11 真空排気口 12 開口部 13 カソード出入用開閉蓋開閉手段 14 メンテナンス用蓋 15 反応室真空槽底板 16 本体架台 DESCRIPTION OF SYMBOLS 1 Cathode 2 Vacuum tank of reaction chamber 3 Prevention plate 4 Target 5 Backing plate 6 Earth shield 7 Substrate 8 Substrate support 9 Cathode opening / closing lid 10 Gas supply port 11 Vacuum exhaust port 12 Opening 13 Cathode entering / closing lid opening / closing means 14 Lid for maintenance 15 Bottom plate of vacuum chamber of reaction chamber 16 Main frame
───────────────────────────────────────────────────── フロントページの続き (72)発明者 柴崎 初彦 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 Fターム(参考) 4K029 CA05 DA02 DA04 DA10 DC00 DC20 DC22 JA01 ──────────────────────────────────────────────────続 き Continuation of the front page (72) Inventor Hatsuhiko Shibasaki 1006 Kazuma Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. F-term (reference) 4K029 CA05 DA02 DA04 DA10 DC00 DC20 DC22 DC01 JA01
Claims (2)
室真空槽内に、基板支持台に設置された基板と、この基
板に対抗しかつカソード側に設置されたターゲットとを
有し、基板をターゲットに対して静止した状態で成膜す
る成膜装置において、カソード出入用開閉蓋と、このカ
ソード出入用開閉蓋に設置されたカソードおよび防着板
と、カソード出入用開閉蓋を開閉、退避するカソード出
入用開閉蓋開閉手段と、カソードメンテナンス時にカソ
ード出入用開閉部を閉じるメンテナンス用蓋を備えたこ
とを特徴とする成膜装置。1. A reaction chamber having a gas supply and exhaust function, a reaction chamber having a substrate, a substrate provided on a substrate support, and a target provided on the cathode side opposite to the substrate. A cathode opening / closing lid, a cathode and an attachment plate installed on the cathode entrance / exit lid, and a cathode for opening / closing the cathode entrance / exit lid A film forming apparatus comprising: an access opening / closing lid opening / closing means; and a maintenance lid for closing a cathode access opening / closing section during cathode maintenance.
入用開閉蓋を開口し、ついでメンテナンス用蓋でカソー
ド出入用開閉部を閉じ、カソードメンテナンス中は反応
室真空槽内を真空排気し、カソードメンテナンス終了時
にメンテナンス用蓋を取り、カソード出入用開閉蓋にて
カソード出入用開閉部を閉じることを特徴とするカソー
ドメンテナンス方法。2. A cathode access opening / closing cover is opened at the time of cathode maintenance, the cathode access opening / closing section is closed with the maintenance cover, and the inside of the reaction chamber vacuum chamber is evacuated during the cathode maintenance. A cathode maintenance method comprising removing a lid and closing the cathode access opening / closing section with the cathode access opening / closing cover.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10356826A JP2000178712A (en) | 1998-12-16 | 1998-12-16 | Film forming device and method of cathode maintenance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10356826A JP2000178712A (en) | 1998-12-16 | 1998-12-16 | Film forming device and method of cathode maintenance |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000178712A true JP2000178712A (en) | 2000-06-27 |
JP2000178712A5 JP2000178712A5 (en) | 2006-02-09 |
Family
ID=18450972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10356826A Pending JP2000178712A (en) | 1998-12-16 | 1998-12-16 | Film forming device and method of cathode maintenance |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000178712A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016108577A (en) * | 2014-12-02 | 2016-06-20 | 国立研究開発法人産業技術総合研究所 | Small-sized device maintenance mechanism |
-
1998
- 1998-12-16 JP JP10356826A patent/JP2000178712A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016108577A (en) * | 2014-12-02 | 2016-06-20 | 国立研究開発法人産業技術総合研究所 | Small-sized device maintenance mechanism |
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