JP2000157493A5 - - Google Patents

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Publication number
JP2000157493A5
JP2000157493A5 JP1998336687A JP33668798A JP2000157493A5 JP 2000157493 A5 JP2000157493 A5 JP 2000157493A5 JP 1998336687 A JP1998336687 A JP 1998336687A JP 33668798 A JP33668798 A JP 33668798A JP 2000157493 A5 JP2000157493 A5 JP 2000157493A5
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JP
Japan
Prior art keywords
eye
eyelid
inspected
inspection
unit
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JP1998336687A
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Japanese (ja)
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JP2000157493A (en
JP3660145B2 (en
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Priority to JP33668798A priority Critical patent/JP3660145B2/en
Priority claimed from JP33668798A external-priority patent/JP3660145B2/en
Publication of JP2000157493A publication Critical patent/JP2000157493A/en
Publication of JP2000157493A5 publication Critical patent/JP2000157493A5/ja
Application granted granted Critical
Publication of JP3660145B2 publication Critical patent/JP3660145B2/en
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Description

【0010】
(3) (1)の眼科装置において、前記判定手段は前記瞼位置検出手段により検出された瞼位置の経時変化に基づいて瞼が最上位置に移動したことを検知する最上位置検知手段を備え、瞼が最上位置に移動したことが検知された場合に前記検査手段による検査実行を可能と判定することを特徴とする。
0010
(3) In the ophthalmic apparatus of (1), the determination means includes the uppermost position detecting means for detecting that the eyelid has moved to the uppermost position based on the time course of the eyelid position detected by the eyelid position detecting means. When it is detected that the eyelid has moved to the uppermost position, it is determined that the inspection can be performed by the inspection means.

【0011】
(4) 被検眼を撮影又は被検眼の特性を測定する検査手段を具備する眼科装置において、被検眼前眼部に検出光を投光する検出光投光手段と、前記検出光による前眼部からの反射光を受光する受光手段であって、被検眼角膜と略共役な位置で被検眼の上下方向に検出面を持つように配置された位置検出素子を有する受光手段と、前記位置検出素子からの出力信号に基づいて被検眼の瞼の移動位置を経時的に検出する瞼位置検出手段と、検出された瞼位置の経時変化に基づいて瞼が最上位置に移動したことを検知する最上位置検知手段と、瞼が最上位置に移動したことが検知された場合に前記検査手段の検査実行を制御する制御手段と、を備えることを特徴とする。
0011
(4) In an ophthalmic apparatus provided with an inspection means for photographing the eye to be inspected or measuring the characteristics of the eye to be inspected, the detection light projection means for projecting the detection light to the anterior eyelid to be inspected and the anterior eye portion by the detection light. A light receiving means that receives light reflected from the eye and has a position detecting element arranged so as to have a detection surface in the vertical direction of the eye to be inspected at a position substantially conjugate with the cornea of the eye to be inspected, and the position detecting element. The eyelid position detecting means for detecting the movement position of the eyelid of the eye to be inspected over time based on the output signal from, and the uppermost position for detecting that the eyelid has moved to the uppermost position based on the detected change in the eyelid position with time. It is characterized by including a detecting means and a control means for controlling the inspection execution of the inspection means when it is detected that the eyelid has moved to the uppermost position.

Claims (4)

被検眼を撮影又は被検眼の特性を測定する検査手段を具備する眼科装置において、被検眼前眼部に検出光を投光する検出光投光手段と、前記検出光による前眼部からの反射光を受光する受光手段であって、被検眼角膜と略共役な位置で被検眼の上下方向に検出面を持つように配置された位置検出素子を有する受光手段と、前記位置検出素子からの出力信号に基づいて被検眼の瞼の位置を経時的に検出する瞼位置検出手段と、検出される瞼位置に基づいて前記検査手段による検査実行の可否を判定する判定手段と、を備えることを特徴とする眼科装置。In an ophthalmologic apparatus including an inspection unit that photographs an eye to be inspected or measures characteristics of the eye to be inspected, a detection light projection unit that emits detection light to an anterior eye of the eye to be inspected, and a reflection from the anterior eye by the detection light A light receiving means for receiving light, the light receiving means having a position detecting element arranged to have a detecting surface in a vertical direction of the eye to be examined at a position substantially conjugate with the cornea of the eye to be inspected, and an output from the position detecting element Eyelid position detecting means for detecting the position of the eyelid of the subject's eye over time based on a signal; and determining means for determining whether or not to execute the inspection by the inspection means based on the detected eyelid position. Ophthalmic device. 請求項1の眼科装置において、前記検出光投光手段は被検眼前眼部を照明するための照明光を投光する前眼部照明手段、又は被検眼の上下方向に距離が異なる多数個の指標を投影する指標投影手段であることを特徴とする眼科装置。2. The ophthalmologic apparatus according to claim 1, wherein the detection light projecting unit emits illumination light for illuminating an anterior eye of the subject's eye, or a plurality of detection light projecting units having different distances in the vertical direction of the subject's eye. An ophthalmologic apparatus, which is an index projection unit that projects an index. 請求項1の眼科装置において、前記判定手段は前記瞼位置検出手段により検出された瞼位置の経時変化に基づいて瞼が最上位置に移動したことを検知する最上位置検知手段を備え、瞼が最上位置に移動したことが検知された場合に前記検査手段による検査実行を可能と判定することを特徴とする眼科装置。2. The ophthalmologic apparatus according to claim 1, wherein the determination unit includes an uppermost position detection unit that detects that the eyelid has moved to an uppermost position based on a temporal change in the eyelid position detected by the eyelid position detection unit. An ophthalmologic apparatus, wherein it is determined that an inspection can be executed by the inspection unit when it is detected that the inspection apparatus has moved to a position. 被検眼を撮影又は被検眼の特性を測定する検査手段を具備する眼科装置において、被検眼前眼部に検出光を投光する検出光投光手段と、前記検出光による前眼部からの反射光を受光する受光手段であって、被検眼角膜と略共役な位置で被検眼の上下方向に検出面を持つように配置された位置検出素子を有する受光手段と、前記位置検出素子からの出力信号に基づいて被検眼の瞼の移動位置を経時的に検出する瞼位置検出手段と、検出された瞼位置の経時変化に基づいて瞼が最上位置に移動したことを検知する最上位置検知手段と、瞼が最上位置に移動したことが検知された場合に前記検査手段の検査実行を制御する制御手段と、を備えることを特徴とする眼科装置。In an ophthalmologic apparatus including an inspection unit that photographs an eye to be inspected or measures characteristics of the eye to be inspected, a detection light projection unit that emits detection light to an anterior eye of the eye to be inspected, and a reflection from the anterior eye by the detection light A light receiving means for receiving light, the light receiving means having a position detecting element arranged to have a detecting surface in a vertical direction of the eye to be examined at a position substantially conjugate with the cornea of the eye to be inspected, and an output from the position detecting element Eyelid position detecting means for detecting the eyelid movement position of the eye to be examined based on the signal over time, and uppermost position detecting means for detecting that the eyelid has moved to the uppermost position based on a temporal change in the detected eyelid position; And a control unit for controlling the execution of the inspection by the inspection unit when it is detected that the eyelid has moved to the uppermost position.
JP33668798A 1998-11-27 1998-11-27 Ophthalmic equipment Expired - Lifetime JP3660145B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33668798A JP3660145B2 (en) 1998-11-27 1998-11-27 Ophthalmic equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33668798A JP3660145B2 (en) 1998-11-27 1998-11-27 Ophthalmic equipment

Publications (3)

Publication Number Publication Date
JP2000157493A JP2000157493A (en) 2000-06-13
JP2000157493A5 true JP2000157493A5 (en) 2004-07-22
JP3660145B2 JP3660145B2 (en) 2005-06-15

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JP33668798A Expired - Lifetime JP3660145B2 (en) 1998-11-27 1998-11-27 Ophthalmic equipment

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JP (1) JP3660145B2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006054774A1 (en) * 2006-11-17 2008-05-21 Carl Zeiss Meditec Ag Ophthalmological examination device
JP5427494B2 (en) 2009-07-03 2014-02-26 株式会社ニデック Fundus photographing device
JP5649997B2 (en) 2011-02-04 2015-01-07 株式会社トーメーコーポレーション Ophthalmic equipment
JP2013027615A (en) * 2011-07-29 2013-02-07 Topcon Corp Microscope for ophthalmologic surgery
JP6462209B2 (en) * 2013-12-03 2019-01-30 浜松ホトニクス株式会社 Measuring device and measuring method
JP6227996B2 (en) * 2013-12-18 2017-11-08 浜松ホトニクス株式会社 Measuring device and measuring method
JP2018166650A (en) * 2017-03-29 2018-11-01 株式会社トプコン Ophthalmologic apparatus
JP2018166649A (en) * 2017-03-29 2018-11-01 株式会社トプコン Ophthalmologic apparatus
JP7183617B2 (en) * 2018-08-02 2022-12-06 株式会社ニデック Fundus camera
JP2020146469A (en) * 2020-04-20 2020-09-17 株式会社トプコン Ophthalmologic examination system and ophthalmologic examination device

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