JP2000139899A5 - - Google Patents

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Publication number
JP2000139899A5
JP2000139899A5 JP1999236349A JP23634999A JP2000139899A5 JP 2000139899 A5 JP2000139899 A5 JP 2000139899A5 JP 1999236349 A JP1999236349 A JP 1999236349A JP 23634999 A JP23634999 A JP 23634999A JP 2000139899 A5 JP2000139899 A5 JP 2000139899A5
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JP
Japan
Prior art keywords
view
detector
detector array
views
sfov
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1999236349A
Other languages
English (en)
Japanese (ja)
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JP2000139899A (ja
Filing date
Publication date
Priority claimed from US09/140,291 external-priority patent/US6091797A/en
Application filed filed Critical
Publication of JP2000139899A publication Critical patent/JP2000139899A/ja
Publication of JP2000139899A5 publication Critical patent/JP2000139899A5/ja
Withdrawn legal-status Critical Current

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JP11236349A 1998-08-25 1999-08-24 偵察画像を作成するための方法及び装置 Withdrawn JP2000139899A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/140,291 US6091797A (en) 1997-10-29 1998-08-25 Methods and apparatus for generating a scout image
US09/140291 1998-08-25

Publications (2)

Publication Number Publication Date
JP2000139899A JP2000139899A (ja) 2000-05-23
JP2000139899A5 true JP2000139899A5 (enExample) 2006-10-05

Family

ID=22490597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11236349A Withdrawn JP2000139899A (ja) 1998-08-25 1999-08-24 偵察画像を作成するための方法及び装置

Country Status (3)

Country Link
EP (1) EP0990419A1 (enExample)
JP (1) JP2000139899A (enExample)
IL (1) IL131568A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9610057B2 (en) 2014-06-16 2017-04-04 General Electric Company System and method for determining X-ray exposure parameters
US9615803B2 (en) * 2014-06-16 2017-04-11 General Electric Company System and method for determining X-ray exposure parameters
CN118986383B (zh) * 2024-08-09 2025-10-17 上海联影医疗科技股份有限公司 医学数据采集方法、装置和ct心脏扫描控制方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4383327A (en) * 1980-12-01 1983-05-10 University Of Utah Radiographic systems employing multi-linear arrays of electronic radiation detectors
US4928283A (en) * 1988-02-26 1990-05-22 Analogic Corporation X-ray tomography apparatus
FR2668829B1 (fr) * 1990-11-05 1993-10-22 Commissariat Energie Atomique Dispositif et procede de controle non destructif a acquisition simultanee de donnees radiographiques et de donnees tomographiques.
US5457724A (en) * 1994-06-02 1995-10-10 General Electric Company Automatic field of view and patient centering determination from prescan scout data
US5459769A (en) * 1994-11-09 1995-10-17 General Electric Company Procedure for monitoring contrast agent application in a CT imaging system
US6370218B1 (en) * 1995-12-21 2002-04-09 General Electric Company Methods and systems for determining x-ray beam position in multi-slice computed tomography scanners

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