JP2000113852A - Atmospheric pressure ionization mass spectrograph - Google Patents
Atmospheric pressure ionization mass spectrographInfo
- Publication number
- JP2000113852A JP2000113852A JP10285124A JP28512498A JP2000113852A JP 2000113852 A JP2000113852 A JP 2000113852A JP 10285124 A JP10285124 A JP 10285124A JP 28512498 A JP28512498 A JP 28512498A JP 2000113852 A JP2000113852 A JP 2000113852A
- Authority
- JP
- Japan
- Prior art keywords
- atmospheric pressure
- ions
- ion
- mass spectrometer
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、大気圧又はその近
傍の圧力雰囲気中で試料をイオン化し、真空中に配置さ
れた質量分析部へ導入口を介して導入し質量分析する大
気圧イオン化質量分析装置に関し、特に、導入口を介し
て導入されたイオンを前記質量分析部へ導くイオンガイ
ドに関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an atmospheric pressure ionization mass spectrometer which ionizes a sample in an atmosphere at or near atmospheric pressure and introduces the mass into a mass spectrometer arranged in a vacuum through an inlet. The present invention relates to an analyzer and, more particularly, to an ion guide for guiding ions introduced through an inlet to the mass spectrometer.
【0002】[0002]
【従来の技術】大気圧イオン化法は、取り扱いが容易で
あること、ソフトなイオン化であることなどから広く普
及してきている。大気圧イオン化法の代表的なものに
は、APCI( 大気圧化学イオン化) 法やESI( エレ
クトロスプレイイオン化) 法などがある。これらのイオ
ン化法で生成されたイオンを、高真空に維持される質量
分析部へ導入するために、差動排気系が用いられる。2. Description of the Related Art Atmospheric pressure ionization has been widely used because of its easy handling and soft ionization. Representative examples of the atmospheric pressure ionization method include an APCI (atmospheric pressure chemical ionization) method and an ESI (electrospray ionization) method. A differential pumping system is used to introduce ions generated by these ionization methods into a mass spectrometer maintained in a high vacuum.
【0003】図1は、このような差動排気系を備えた質
量分析装置のイオン導入部を示す図である。図1におい
て、大気圧イオン源1で生成されたイオン2は、スキマ
ー3を介して第1中間排気室4へ導入され、更にスキマ
ー5を介して第2中間排気室6へ導入される。第2中間
排気室6には、イオンの収束性を改善するためのマルチ
ポールレンズ7及び収束レンズ8が配置されており、こ
れらのレンズにより収束性の改善されたイオンは、導入
口9を介して高真空( 10-6Torr程度の圧力)に維持さ
れた質量分析部10へ導入されて質量分析される。FIG. 1 is a diagram showing an ion introducing section of a mass spectrometer provided with such a differential pumping system. In FIG. 1, ions 2 generated by an atmospheric pressure ion source 1 are introduced into a first intermediate exhaust chamber 4 via a skimmer 3 and further introduced into a second intermediate exhaust chamber 6 via a skimmer 5. A multipole lens 7 and a converging lens 8 for improving the convergence of ions are arranged in the second intermediate exhaust chamber 6, and the ions having improved convergence by these lenses pass through the inlet 9. And introduced into the mass spectrometer 10 maintained in a high vacuum (a pressure of about 10 −6 Torr) and subjected to mass analysis.
【0004】前記第1中間排気室4は、ロータリーポン
プRPにより1〜数Torr程度の圧力に排気され、第2中
間排気室6は、ターボ分子ポンプTMPにより1×10
-3Torr程度の圧力に排気され、大気圧のイオン源1と高
真空の質量分析部10との間の圧力差が維持されるよう
な差動排気系を構成している。The first intermediate exhaust chamber 4 is evacuated to a pressure of about 1 to several Torr by a rotary pump RP, and the second intermediate exhaust chamber 6 is exhausted by a turbo molecular pump TMP to a pressure of 1 × 10 Torr.
A differential evacuation system is constructed such that the gas is exhausted to a pressure of about -3 Torr and the pressure difference between the ion source 1 at atmospheric pressure and the mass spectrometer 10 at high vacuum is maintained.
【0005】[0005]
【発明が解決しようとする課題】上記マルチポールレン
ズ7は、第2中間排気室6におけるイオンの拡散を防ぐ
ために設けられており、例えば4本の棒状電極をイオン
通路の周りに90°の等間隔に配置したQポールレンズ
に高周波電圧のみが印加される。6本あるいは8本の棒
状電極を用いる場合もある。The above-mentioned multipole lens 7 is provided to prevent the diffusion of ions in the second intermediate exhaust chamber 6, and for example, four rod-like electrodes are formed at 90 ° around the ion passage. Only the high frequency voltage is applied to the Q pole lenses arranged at intervals. In some cases, six or eight rod-shaped electrodes are used.
【0006】しかしながら、マルチポールレンズはフィ
ルタ作用があり、質量電荷比の異なるイオンを広い範囲
にわたって一度に通過させることができない。広い範囲
に対応するためには、高周波電圧の振幅あるいは周波数
を掃引することが必要で、これは構造が複雑となって不
利となるし、感度の面でも不利である。However, the multipole lens has a filter function, and cannot pass ions having different mass-to-charge ratios over a wide range at once. In order to cover a wide range, it is necessary to sweep the amplitude or frequency of a high-frequency voltage, which is disadvantageous due to its complicated structure and sensitivity.
【0007】本発明は、上述した点に鑑みてなされたも
のであり、大気圧イオン源で生成され導入口を介して中
間排気室に導入されたイオンを、広い質量範囲にわた
り、高い通過効率で質量分析部へ導くことのできる大気
圧イオン化質量分析装置を提供することを目的とするも
のである。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned point, and has a high passing efficiency over a wide mass range over ions generated by an atmospheric pressure ion source and introduced into an intermediate exhaust chamber through an inlet. It is an object of the present invention to provide an atmospheric pressure ionization mass spectrometer that can be led to a mass spectrometer.
【0008】[0008]
【課題を解決するための手段】この目的を達成するた
め、本発明の大気圧イオン化質量分析装置は、大気圧又
はその近傍の圧力雰囲気中で試料をイオン化し、真空中
に配置された質量分析部へ導入口を介して導入し質量分
析する大気圧イオン化質量分析装置において、導入口を
介して導入されたイオンを前記質量分析部へ導くイオン
ガイドであって、イオン通過口を有する板状電極を多数
通過口を合わせて一列に配置し各電極に交互に極性の異
なる電圧を印加したイオンガイドを設け、該イオンガイ
ドの途中の電極と電極の間に質量分析部が配置される部
屋と導入口を介してイオンが導入される部屋とを仕切る
隔壁を設けたことを特徴としている。In order to achieve this object, an atmospheric pressure ionization mass spectrometer according to the present invention ionizes a sample in an atmosphere at or near atmospheric pressure, and a mass spectrometer placed in a vacuum. Atmospheric pressure ionization mass spectrometer for mass spectrometry which is introduced through an inlet to a part, and which is an ion guide for guiding ions introduced via an inlet to the mass spectrometer, and a plate-like electrode having an ion passage port A large number of passage openings are aligned and arranged in a row, and an ion guide is provided in which voltages having different polarities are alternately applied to the respective electrodes. It is characterized in that a partition is provided for partitioning a room into which ions are introduced through a mouth.
【0009】[0009]
【発明の実施の形態】以下、図面を参照して本発明の実
施の形態を詳説する。図2は本発明の一実施例の構造を
示す図である。図2において、大気圧イオン源1で生成
されたイオン2は、スキマー3を介して第1中間排気室
4へ導入され、更にスキマー5を介して第2中間排気室
6へ、更に第3中間排気室11へと導入される。この第
2中間排気室6及び第3中間排気室11には、両者にま
たがる形でリングレンズ21から構成されるイオンガイ
ドが配置されており、このイオンガイドにより導かれた
イオンは、収束レンズ8により導入口9へ向けて収束さ
れて導入口9を通過し、高真空( 10-6Torr程度の圧
力) に維持された質量分析部10へ導入されて質量分析
される。Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 2 is a diagram showing the structure of one embodiment of the present invention. In FIG. 2, ions 2 generated by an atmospheric pressure ion source 1 are introduced into a first intermediate exhaust chamber 4 via a skimmer 3, further to a second intermediate exhaust chamber 6 via a skimmer 5, and further to a third intermediate exhaust chamber 6. It is introduced into the exhaust chamber 11. In the second intermediate exhaust chamber 6 and the third intermediate exhaust chamber 11, an ion guide composed of a ring lens 21 is disposed so as to extend over both of them. Thus, the light is converged toward the inlet 9, passes through the inlet 9, is introduced into the mass spectrometer 10 maintained in a high vacuum (pressure of about 10 −6 Torr), and is subjected to mass analysis.
【0010】上記リングレンズ21は、図3に示すよう
に、円形のイオン通過口を有するリング電極L1,L2,
L3,・・・を、通過口を合わせて一定間隔で一列に並
べた構造を有している。各電極には、1枚おきに正電圧
(+V)及び負電圧(−V)が交互に印加されている。前記
第2中間排気室6と第3中間排気室7を仕切る仕切板3
1(アース電位)は、リング電極と同心のイオン通過口を
有し、かつ隣り合うリング電極の中間の電位ゼロの等電
位面に沿うように配置される。As shown in FIG. 3, the ring lens 21 has ring electrodes L1, L2,
Have a structure in which L3,... Positive voltage on every other electrode
(+ V) and the negative voltage (−V) are applied alternately. Partition plate 3 for partitioning the second intermediate exhaust chamber 6 and the third intermediate exhaust chamber 7
1 (earth potential) has an ion passage port concentric with the ring electrode, and is arranged along an equipotential surface of zero potential intermediate between adjacent ring electrodes.
【0011】図4は、仕切板31とその付近のリング電
極の周囲に形成される電位分布を示しており、仕切板3
1が隣り合うリング電極の中間の電位ゼロの等電位面に
沿うように配置されていることが分かる。リングレンズ
21に入射したイオンは、リング電極内に形成される電
界により中心軌道に沿って単振動を行い、リングレンズ
にガイドされる形でリングレンズを通過する。FIG. 4 shows a potential distribution formed around the partition plate 31 and the ring electrode in the vicinity thereof.
It can be seen that 1 is arranged along the equipotential surface at zero potential intermediate between adjacent ring electrodes. The ions that have entered the ring lens 21 make a simple oscillation along the central trajectory by the electric field formed in the ring electrode, and pass through the ring lens in a form guided by the ring lens.
【0012】前記仕切板31に設けられるイオン通過口
の径は、第2中間排気室6と第3中間排気室7の間の圧
力差を維持するために必要な大きさに選定されるが、リ
ング電極のイオン通過口よりも小さい。そこで、仕切板
31は、図2に示されているように、スキマー5を介し
て第2中間排気室6へ導かれたイオン軌道の振幅が最小
又はそれに近い位置に配置されている。The diameter of the ion passage port provided in the partition plate 31 is selected to be a size necessary to maintain a pressure difference between the second intermediate exhaust chamber 6 and the third intermediate exhaust chamber 7. It is smaller than the ion passage of the ring electrode. Therefore, as shown in FIG. 2, the partition plate 31 is disposed at a position where the amplitude of the ion trajectory guided to the second intermediate exhaust chamber 6 via the skimmer 5 is at or near a minimum.
【0013】そのため、イオンは、差動排気のための仕
切板31が設けられていても、仕切板31のイオン通過
口をロス少なく通過できる。Therefore, even if the partition plate 31 for differential exhaust is provided, the ions can pass through the ion passage opening of the partition plate 31 with little loss.
【0014】仕切板31は、軌道計算結果に従い、流入
するイオンの平均自由行程とイオン通過効率(イオン軌
道の振幅が最小又はそれに近い位置が高い)を考慮した
最適位置に設定することが望ましい。なお、収束レンズ
8としては、アインツェルレンズをはじめ、各種静電レ
ンズを使用することができる。The partition plate 31 is desirably set at an optimum position in consideration of the mean free path of the inflowing ions and the ion passage efficiency (the position where the amplitude of the ion orbit is minimum or close to it is high) in accordance with the result of the orbit calculation. As the converging lens 8, various electrostatic lenses including an Einzel lens can be used.
【0015】[0015]
【発明の効果】以上詳述したごとく、本発明では、イオ
ン通過口を有する板状電極を多数通過口を合わせて一列
に配置し各電極に交互に極性の異なる電圧を印加したイ
オンガイドを設け、該イオンガイドの途中の電極と電極
の間に質量分析部が配置される部屋と導入口を介してイ
オンが導入される部屋とを仕切る隔壁を設けたため、大
気圧イオン源で生成され導入口を介して中間排気室に導
入されたイオンを、広い質量範囲にわたり、高い通過効
率で質量分析部へ導くことのできる大気圧イオン化質量
分析装置が提供される。As described above in detail, according to the present invention, a large number of plate-like electrodes having ion passage openings are arranged in a row with their passage openings aligned, and an ion guide to which voltages having different polarities are alternately applied to each electrode is provided. Since a partition is provided between the electrode in the middle of the ion guide and a room in which the mass spectrometric unit is arranged between the electrodes and a room into which ions are introduced via the inlet, the inlet generated by the atmospheric pressure ion source is used. An atmospheric pressure ionization mass spectrometer capable of guiding ions introduced into the intermediate exhaust chamber via the mass spectrometer with high passage efficiency over a wide mass range is provided.
【図1】差動排気系を備えた質量分析装置のイオン導入
部を示す図である。FIG. 1 is a diagram showing an ion introducing unit of a mass spectrometer provided with a differential pumping system.
【図2】本発明の一実施例の構造を示す図である。FIG. 2 is a diagram showing the structure of one embodiment of the present invention.
【図3】リングレンズの構造を示す図である。FIG. 3 is a diagram showing a structure of a ring lens.
【図4】仕切板とその付近のリング電極の周囲に形成さ
れる電位分布を示す図である。FIG. 4 is a diagram showing a potential distribution formed around a partition plate and a ring electrode in the vicinity thereof.
1:大気圧イオン源 2:イオン 3,5:スキマー 4:第1中間排気室 6:第2中間排気室 11:第3中間排気室 21:リングレンズ21 31:仕切板 1: Atmospheric pressure ion source 2: Ions 3, 5: Skimmer 4: First intermediate exhaust chamber 6: Second intermediate exhaust chamber 11: Third intermediate exhaust chamber 21: Ring lens 21 31: Partition plate
Claims (2)
試料をイオン化し、真空中に配置された質量分析部へ導
入口を介して導入し質量分析する大気圧イオン化質量分
析装置において、導入口を介して導入されたイオンを前
記質量分析部へ導くイオンガイドであって、イオン通過
口を有する板状電極を多数通過口を合わせて一列に配置
し各電極に交互に極性の異なる電圧を印加したイオンガ
イドを設け、該イオンガイドの途中の電極と電極の間に
質量分析部が配置される部屋と導入口を介してイオンが
導入される部屋とを仕切る隔壁を設けたことを特徴とす
る大気圧イオン化質量分析装置。1. An atmospheric pressure ionization mass spectrometer for ionizing a sample in an atmosphere at or near atmospheric pressure, introducing the sample into a mass spectrometer arranged in a vacuum through an inlet, and performing mass analysis. An ion guide for introducing ions introduced through the mass spectrometer to the mass spectrometer, wherein a number of plate-like electrodes having ion passage openings are arranged in a row with their passage openings aligned, and a voltage having a different polarity is alternately applied to each electrode. And a partition that separates a room in which the mass spectrometric unit is arranged between the electrodes in the middle of the ion guide and a room into which ions are introduced via the inlet. Atmospheric pressure ionization mass spectrometer.
イオン軌道の振幅が最少又はそれに近い位置に配置され
ることを特徴とする請求項1記載の大気圧イオン化質量
分析装置。2. The atmospheric pressure ionization mass spectrometer according to claim 1, wherein the partition wall is arranged at a position where the amplitude of an ion trajectory in the ion guide is at or near a minimum.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28512498A JP3571546B2 (en) | 1998-10-07 | 1998-10-07 | Atmospheric pressure ionization mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28512498A JP3571546B2 (en) | 1998-10-07 | 1998-10-07 | Atmospheric pressure ionization mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000113852A true JP2000113852A (en) | 2000-04-21 |
JP3571546B2 JP3571546B2 (en) | 2004-09-29 |
Family
ID=17687434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28512498A Expired - Fee Related JP3571546B2 (en) | 1998-10-07 | 1998-10-07 | Atmospheric pressure ionization mass spectrometer |
Country Status (1)
Country | Link |
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JP (1) | JP3571546B2 (en) |
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- 1998-10-07 JP JP28512498A patent/JP3571546B2/en not_active Expired - Fee Related
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