CA2641940A1 - Mass spectrometry with segmented rf multiple ion guides in various pressure regions - Google Patents

Mass spectrometry with segmented rf multiple ion guides in various pressure regions Download PDF

Info

Publication number
CA2641940A1
CA2641940A1 CA002641940A CA2641940A CA2641940A1 CA 2641940 A1 CA2641940 A1 CA 2641940A1 CA 002641940 A CA002641940 A CA 002641940A CA 2641940 A CA2641940 A CA 2641940A CA 2641940 A1 CA2641940 A1 CA 2641940A1
Authority
CA
Canada
Prior art keywords
multipole ion
mass
ions
ion
multipole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002641940A
Other languages
French (fr)
Other versions
CA2641940C (en
Inventor
Craig M. Whitehouse
David G. Welkie
Gholamreza Javahery
Lisa Cousins
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Revvity Health Sciences Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2641940A1 publication Critical patent/CA2641940A1/en
Application granted granted Critical
Publication of CA2641940C publication Critical patent/CA2641940C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • H01J49/063Multipole ion guides, e.g. quadrupoles, hexapoles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/422Two-dimensional RF ion traps
    • H01J49/4225Multipole linear ion traps, e.g. quadrupoles, hexapoles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

A mass spectrometer is configured with individual multipole ion guides, configured in an assembly in alignment along a common centerline. A linear (22) of four independent quadrupole ion guides (23, 24, 25, 26) and three smaller quadrupole ion guide segments (39, 40, 41) are positioned along common axis (27) and are configured in a six vaccum pumping stage hybrid API source-multiple quadrupole TOF mass analyzer.

Claims (24)

1. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) a vacuum system with at least two vacuum pumping stages;
(c) a detector configured in at least one of said vacuum pumping stages;
(d) configuring at least two multipole ion guides in at least one of said vacuum pumping stages wherein at least a portion of one said multipole ion guide is positioned in at least one of said vacuum pumping stages wherein the background pressure in said vacuum stage is maintained sufficiently high so that collisions between said ions and neutral gas molecules occur with ions in said two multipole ion guides; while at least a portion of the other ion guide is positioned in at least one of said vacuum stage is maintained sufficiently low so that few or no collisions occur, and, (e) means for conducting mass to charge selection in at least one of said multipole ion guides.
2. An apparatus according to claim 1, wherein said ion source is an Electrospray ion source.
3. An apparatus according to claim 1, wherein said ion source is an Atmospheric Pressure Chemical Ionization ion source.
4. An apparatus according to claim 1, wherein said ion source is an Inductively Coupled Plasma ion source.
5. An apparatus according to claim 1, wherein said ion source is an Glow Discharge ion source.
6. An apparatus according to claim 1, wherein said multipole ion guide is a quadrupole.
7. An apparatus according to claim 1, wherein said multipole ion guide is a hexapole.
8. An apparatus according to claim 1, wherein said multipole ion guide is a octapole.
9. An apparatus according to claim 1, wherein said multipole ion guide has more than eight poles.
10. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) a vacuum system with at least two vacuum pumping stages;
(c) a detector configured in at least one of said vacuum pumping stages;
(d) a mass analyzer for conducting mass to charge analysis;
(e) configuring at least two multipole ion guides in at least one of said vacuum pumping stages wherein at least a portion of one said multipole ion guide is positioned in at least one of said vacuum pumping stages wherein the background pressure in said vacuum stage is maintained sufficiently high so that collisions between said ions and neutral gas molecules occur with ions in said two multipole ion guides; while at least a portion of the other ion guide is positioned in at least one of said vacuum stage is maintained sufficiently low so that few or no collisions occur, and, (f) means for conducting mass to charge selection in at least one of said multipole ion guides; and, (g) conducting mass to charge analysis in said mass analyzer.
11. An apparatus according to claim 10 wherein said at least two multipole ion guides are configured in series along a common centerline wherein said ions can be transferred from one multipole ion guide to the next.
12. An apparatus according to claim 10, wherein said mass analyzer is a quadrupole mass spectrometer.
13. An apparatus according to claim 10, wherein said mass analyzer is a quadrupole mass analyzer.
14. An apparatus according to claim 10, wherein said at least two multipole ion guides are configured with said mass analyze to form a triple quadrupole mass analyzer.
15. An apparatus according to claim 10, wherein said mass analyzer is a magnetic sector mass spectrometer.
16. An apparatus according to claim 10, wherein said mass analyzer is a Fourier Transform mass spectrometer.
17. An apparatus according to claim 10, wherein said mass analyzer is a ion trap mass spectrometer.
18. An apparatus according to claim 10, wherein said mass analyzer is a Time-Of-Flight mass spectrometer.
19. An apparatus according to claim 10, wherein said mass analyzer is a Time-Of-Flight mass spectrometer configured with orthogonal pulsing.
20. An apparatus according to claim 10, wherein said mass analyzer is a Time-Of-Flight mass spectrometer configure with linear pulsing.
21. An apparatus according to claim 10, wherein said mass analyzer is a Time-Of-Flight mass spectrometer comprising an ion reflector.
22. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) a vacuum system with at least two vacuum pumping stages;
(c) a detector configured in at least one of said vacuum pumping stages;

(d) configuring at least two multipole ion guides in at least one of said vacuum pumping stages wherein at least a portion of one said multipole ion guide is positioned in at least one of said vacuum pumping stages wherein the background pressure in said vacuum stage is maintained sufficiently high so that collisions between said ions and neutral gas molecules occur with ions in said two multipole ion guides; while at least a portion of the other ion guide is positioned in at least one of said vacuum stage is maintained sufficiently low so that few or no collisions occur, and, (e) means for conducting mass to charge selection in at least one of said multipole ion guides; and, (f) means for conducting collisional induced dissociation ion fragmentation in at least one said multipole ion guides.
23. An apparatus for analyzing chemical species, comprising:
(a) an ion source for operation at substantially atmospheric pressure to produce ions from a sample substance;
(b) a vacuum system with at least two vacuum pumping stages;
(c) a detector configured in at least one of said vacuum pumping stages;
(d) a mass analyzer for conducting mass to charge analysis;
(e) configuring at least two multipole ion guides in at least one of said vacuum pumping stages wherein at least a portion of one said multipole ion guide is positioned in at least one of said vacuum pumping stages wherein the background pressure in said vacuum stage is maintained sufficiently high so that collisions,between said ions and neutral gas molecules occur with ions in said two multipole ion guides; while at least a portion of the other ion guide is positioned in at least one of said vacuum stage is maintained sufficiently low so that few or no collisions occur, and, (f) means for conducting mass to charge selection in at least one of said multipole ion guides;
(g) means for conducting collisional induced dissociation ion fragmentation in at least one said multipole ion guides; and, (h) conducting mass to charge analysis in said mass analyzer.
24. A method for analyzing chemical species utilizing an ion source, a vacuum system with at least one vacuum pumping stage, a mass analyzer, at least two multipole ion guides configured in a adjacent alignment along a common centerline in at least one said vacuum stage and a detector, said method comprising;
(a) producing ions in said ion source;
(b) delivering said ions into said at least one said multipole ion guide;
(c) operating at least a portion of said at least two multipole ion guides in a background pressure in at least one said vacuum stage wherein collisions occur between said ions and the neutral background molecules for said ions traversing said at least one said multipole ion guide;
(d) conducting mass to charge selection of said ions in at least one said multipole ion guide;
(e) conducting collisional Induced dissociation in at least one said multipole ion guide;
(f) transferring said ions from the first said multipole ion guide into the second said multipole ion guide; and, (g) conducting mass analysis of the ion population resulting from said mass to charge selection and said ion fragmentation steps performed in said first and second multipole ion guides.
CA2641940A 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions Expired - Lifetime CA2641940C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US38510002P 2002-05-31 2002-05-31
US60/385,100 2002-05-31
CA002487136A CA2487136C (en) 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CA002487136A Division CA2487136C (en) 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions

Publications (2)

Publication Number Publication Date
CA2641940A1 true CA2641940A1 (en) 2003-12-11
CA2641940C CA2641940C (en) 2011-11-15

Family

ID=29712134

Family Applications (2)

Application Number Title Priority Date Filing Date
CA2641940A Expired - Lifetime CA2641940C (en) 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions
CA002487136A Expired - Lifetime CA2487136C (en) 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions

Family Applications After (1)

Application Number Title Priority Date Filing Date
CA002487136A Expired - Lifetime CA2487136C (en) 2002-05-31 2003-05-30 Mass spectrometry with segmented rf multiple ion guides in various pressure regions

Country Status (4)

Country Link
EP (2) EP2421023A1 (en)
AU (1) AU2003249685A1 (en)
CA (2) CA2641940C (en)
WO (1) WO2003102508A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10325579B4 (en) 2003-06-05 2007-10-11 Bruker Daltonik Gmbh Ion fragmentation by electron capture in linear ion traps
GB0514964D0 (en) * 2005-07-21 2005-08-24 Ms Horizons Ltd Mass spectrometer devices & methods of performing mass spectrometry
DE102004051785B4 (en) 2004-10-25 2008-04-24 Bruker Daltonik Gmbh Protein profiles with air MALDI
US20060208187A1 (en) * 2005-03-18 2006-09-21 Alex Mordehai Apparatus and method for improved sensitivity and duty cycle
CA2641561A1 (en) * 2006-02-08 2007-08-16 Applera Corporation Radio frequency ion guide
GB0900973D0 (en) * 2009-01-21 2009-03-04 Micromass Ltd Method and apparatus for performing MS^N
WO2014197348A2 (en) * 2013-06-03 2014-12-11 Perkinelmer Health Sciences, Inc. Ion guide or filters with selected gas conductance
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
US20240087870A1 (en) * 2021-01-25 2024-03-14 Dh Technologies Development Pte. Ltd. Pressure Control in Vacuum Chamber of Mass Spectrometer
GB2624012A (en) * 2022-11-04 2024-05-08 Thermo Fisher Scient Bremen Gmbh Enhancing mass spectrometer signals

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US694542A (en) 1901-10-31 1902-03-04 John Peter Gorton Telegraphy.
US2118496A (en) 1936-03-09 1938-05-24 Corley Mfg Company Feeding mechanism for sawmills
US3410997A (en) 1964-09-08 1968-11-12 Bell & Howell Co Multipole mass filter
US4542293A (en) 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
CA1307859C (en) 1988-12-12 1992-09-22 Donald James Douglas Mass spectrometer and method with improved ion transmission
US5179278A (en) 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5521380A (en) 1992-05-29 1996-05-28 Wells; Gregory J. Frequency modulated selected ion species isolation in a quadrupole ion trap
US5689111A (en) 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US6011259A (en) 1995-08-10 2000-01-04 Analytica Of Branford, Inc. Multipole ion guide ion trap mass spectrometry with MS/MSN analysis
WO1995023018A1 (en) 1994-02-28 1995-08-31 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
AU6653296A (en) 1995-08-11 1997-03-12 Mds Health Group Limited Spectrometer with axial field
US6177668B1 (en) 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
US6093929A (en) * 1997-05-16 2000-07-25 Mds Inc. High pressure MS/MS system
GB9717926D0 (en) * 1997-08-22 1997-10-29 Micromass Ltd Methods and apparatus for tandem mass spectrometry
US6331702B1 (en) * 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
AU4326599A (en) * 1998-05-29 1999-12-13 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US6177688B1 (en) 1998-11-24 2001-01-23 North Carolina State University Pendeoepitaxial gallium nitride semiconductor layers on silcon carbide substrates
US6194717B1 (en) * 1999-01-28 2001-02-27 Mds Inc. Quadrupole mass analyzer and method of operation in RF only mode to reduce background signal
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
US6340814B1 (en) 1999-07-15 2002-01-22 Sciex, A Division Of Mds Inc. Mass spectrometer with multiple capacitively coupled mass analysis stages

Also Published As

Publication number Publication date
EP1549914A4 (en) 2009-03-25
CA2487136C (en) 2008-12-30
AU2003249685A1 (en) 2003-12-19
CA2641940C (en) 2011-11-15
EP1549914B1 (en) 2012-12-26
EP1549914A1 (en) 2005-07-06
EP2421023A1 (en) 2012-02-22
CA2487136A1 (en) 2003-12-11
WO2003102508A1 (en) 2003-12-11

Similar Documents

Publication Publication Date Title
CA2626383A1 (en) Mass spectrometry with multipole ion guides
US11017990B2 (en) Compact mass spectrometer
US6872939B2 (en) Mass spectrometer
CA2670286C (en) Differential-pressure dual ion trap mass analyzer and methods of use thereof
US7932487B2 (en) Mass spectrometer with looped ion path
US10978288B2 (en) Compact mass spectrometer
EP2113128B1 (en) Mass spectrometer
US9190251B2 (en) Pre-scan for mass to charge ratio range
US9123517B2 (en) Ion guide with different order multipolar field order distributions across like segments
CA2656956A1 (en) Multipole ion guide for mass spectrometry
US6781117B1 (en) Efficient direct current collision and reaction cell
US6707036B2 (en) Ionization apparatus and method for mass spectrometer system
US10090138B2 (en) Compact mass spectrometer
US10128092B2 (en) Compact mass spectrometer
GB2399939A (en) A method of operating a mass spectrometer in which ions are sent an even number of times though the same mass filter/analyser
GB2355108A (en) Mass spectrometer with interchangeable ion sources and ion guides
GB2520788A (en) Compact mass spectrometer
CA2641940A1 (en) Mass spectrometry with segmented rf multiple ion guides in various pressure regions
EP2715774B1 (en) Ion inlet for a mass spectrometer
GB2520786A (en) Compact mass spectrometer
CN118016511A (en) Ion transmission system with double photoionization sources connected in series
CA2733436A1 (en) Mass spectrometer

Legal Events

Date Code Title Description
EEER Examination request
MKEX Expiry

Effective date: 20230530