JP2000111593A - Measuring device - Google Patents

Measuring device

Info

Publication number
JP2000111593A
JP2000111593A JP10285329A JP28532998A JP2000111593A JP 2000111593 A JP2000111593 A JP 2000111593A JP 10285329 A JP10285329 A JP 10285329A JP 28532998 A JP28532998 A JP 28532998A JP 2000111593 A JP2000111593 A JP 2000111593A
Authority
JP
Japan
Prior art keywords
constant current
wiring
switch
resistance
current source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10285329A
Other languages
Japanese (ja)
Other versions
JP3562623B2 (en
Inventor
Takashi Kuwabara
孝 桑原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP28532998A priority Critical patent/JP3562623B2/en
Publication of JP2000111593A publication Critical patent/JP2000111593A/en
Application granted granted Critical
Publication of JP3562623B2 publication Critical patent/JP3562623B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To realize a measuring device capable of performing contact check without caring the contact on-resistance of a switch. SOLUTION: In a measuring device for measuring an object to be measured 1 by contacting, arranged are a constant current source 26 sending a constant current for contact check from a power source 23 for measurement and another system power source and switch parts 21 and 22 connecting to the wire for measuring the object to be measured and to the constant current source 26 and turning on when checking the wire. Contact check is done by resistors R1 to R4 in the wiring.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、被測定対象、例え
ば、抵抗を測定する計測装置に関し、特に、測定用の配
線の結線状態の診断機能を持つ計測装置に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring device for measuring an object to be measured, for example, a resistance, and more particularly to a measuring device having a function of diagnosing a connection state of a measurement wiring.

【0002】[0002]

【従来の技術】従来、抵抗を測定する計測装置を図3に
示し説明する。なお、図はリセット状態を示す。
2. Description of the Related Art A conventional measuring device for measuring resistance is shown in FIG. The figure shows a reset state.

【0003】図において、1は被測定抵抗、配線部2,
3は、被測定抵抗1と接続する。配線部2は、配線抵抗
R1,R2からなり、配線部3は、配線抵抗R3,R4
からなる。配線抵抗R1,R2は、一端を被測定抵抗1
の一端に接続し、被測定抵抗1との接触抵抗も含まれ
る。配線抵抗R3,R4は、一端を被測定抵抗1の他端
に接続し、被測定抵抗1との接触抵抗も含まれる。計測
装置100は、配線部2,3に接続し、被測定抵抗1を
測定する。
In the drawing, reference numeral 1 denotes a resistance to be measured, a wiring portion 2,
3 is connected to the resistance 1 to be measured. The wiring section 2 includes wiring resistances R1 and R2, and the wiring section 3 includes wiring resistances R3 and R4.
Consists of One end of each of the wiring resistances R1 and R2 is the resistance 1 to be measured.
And the contact resistance with the resistance under test 1 is also included. One end of each of the wiring resistors R3 and R4 is connected to the other end of the measured resistor 1, and the contact resistance with the measured resistor 1 is also included. The measuring device 100 is connected to the wiring units 2 and 3 and measures the resistance 1 to be measured.

【0004】以下、計測装置100の構成を説明する。
スイッチ部4は、スイッチSW1〜SW4からなり、配
線部2,3と接続し、切り替える。スイッチSW1は、
配線抵抗R1の他端に接続し、スイッチSW2は、配線
抵抗R2の他端に接続し、スイッチSW3は、配線抵抗
R3の他端に接続し、スイッチSW4は、配線抵抗R4
の他端に接続する。
Hereinafter, the configuration of the measuring apparatus 100 will be described.
The switch unit 4 includes switches SW1 to SW4, and is connected to the wiring units 2 and 3 for switching. The switch SW1 is
The switch SW2 is connected to the other end of the wiring resistance R2, the switch SW3 is connected to the other end of the wiring resistance R3, and the switch SW4 is connected to the other end of the wiring resistance R4.
To the other end.

【0005】スイッチ部5,6は、スイッチ部4と接続
し、オン/オフを行う。スイッチ部5は、スイッチSW
5,SW6からなり、スイッチ部6は、スイッチSW
7,SW8からなる。スイッチSW5は、スイッチSW
1で切り替えられ、スイッチSW6は、スイッチSW2
で切り替えられ、スイッチSW7は、スイッチSW3で
切り替えられ、スイッチSW8は、スイッチSW4で切
り替えられる。
[0005] The switch units 5 and 6 are connected to the switch unit 4 and are turned on / off. The switch unit 5 includes a switch SW
5, SW6, and the switch unit 6 includes a switch SW.
7, SW8. The switch SW5 is a switch SW5.
1, and the switch SW6 is switched to the switch SW2.
The switch SW7 is switched by the switch SW3, and the switch SW8 is switched by the switch SW4.

【0006】定電流源7は、スイッチ部4に接続し、被
測定抵抗1に流す定電流を出力する。定電流源7は、一
端がスイッチSW1で切り替えられ、他端がスイッチS
W4で切り替えられると共に、接地する。
The constant current source 7 is connected to the switch section 4 and outputs a constant current flowing through the resistance 1 to be measured. One end of the constant current source 7 is switched by the switch SW1, and the other end is the switch S1.
It is switched by W4 and grounded.

【0007】差動アンプ8は、スイッチ部4に接続し、
A/D変換器(図示せず)に出力する。差動アンプ8
は、一方の入力端がスイッチSW2で切り替えられ、他
方の入力端がスイッチSW3で切り替えられる。
The differential amplifier 8 is connected to the switch unit 4,
Output to an A / D converter (not shown). Differential amplifier 8
One input terminal is switched by a switch SW2, and the other input terminal is switched by a switch SW3.

【0008】定電流源9は、スイッチ部5,6に接続
し、コンタクトチェック用の定電流を出力する。定電流
源9は、一端がスイッチSW5,SW7の他端に接続
し、他端がスイッチSW6,SW8に接続すると共に、
接地する。
[0008] The constant current source 9 is connected to the switches 5 and 6, and outputs a constant current for contact check. The constant current source 9 has one end connected to the other ends of the switches SW5 and SW7, the other end connected to the switches SW6 and SW8,
Ground.

【0009】コンパレータ10は、一方の入力端を定電
流源9の一端と接続し、他方の入力端を基準電圧11と
接続し、比較結果を出力する。
The comparator 10 has one input terminal connected to one end of the constant current source 9 and the other input terminal connected to the reference voltage 11, and outputs a comparison result.

【0010】CPU12は、コンパレータ10の出力を
入力し、良/不良の判定を行い、信号出力13,ディス
プレイ14に出力する。
The CPU 12 receives the output of the comparator 10, determines good / bad, and outputs it to the signal output 13 and the display 14.

【0011】このような装置の動作を説明する。まず始
めに被測定抵抗1の測定動作を説明する。スイッチSW
1,SW4を定電流源7に切り替え、スイッチSW2,
SW3を差動アンプ8に切り替える。そして、定電流源
7が被測定抵抗1に電流を流す。差動アンプ8が、被測
定抵抗1の両端に発生する電圧を増幅し、A/D変換器
に出力する。
The operation of such an apparatus will be described. First, the measuring operation of the measured resistance 1 will be described. Switch SW
1 and SW4 are switched to the constant current source 7, and switches SW2 and SW2 are switched.
SW3 is switched to the differential amplifier 8. Then, the constant current source 7 allows a current to flow through the resistance 1 to be measured. The differential amplifier 8 amplifies the voltage generated at both ends of the resistance under test 1 and outputs the amplified voltage to the A / D converter.

【0012】次に、コンタクトチェック動作を説明す
る。スイッチSW1をスイッチSW5に切り替え、スイ
ッチSW2をスイッチSW6に切り替え、スイッチSW
3をスイッチSW7に切り替え、スイッチSW4をスイ
ッチSW8に切り替える。
Next, a contact check operation will be described. Switch SW1 to switch SW5, switch SW2 to switch SW6, switch SW
3 is switched to a switch SW7, and the switch SW4 is switched to a switch SW8.

【0013】スイッチSW5,SW6をオンにし、スイ
ッチSW7,SW8をオフのままにする。そして、定電
流源9が、配線抵抗R1,R2に電流を流す。コンパレ
ータ10が、配線抵抗R1,R2により発生する電圧と
基準電圧11とを比較し、比較結果をCPU12に出力
する。CPU12は、配線抵抗R1,R2、つまり、配
線の良/不良を判定し、信号出力13とディスプレイ1
4とに判定結果を出力する。
The switches SW5 and SW6 are turned on, and the switches SW7 and SW8 are kept off. Then, the constant current source 9 causes a current to flow through the wiring resistors R1 and R2. The comparator 10 compares the voltage generated by the wiring resistances R1 and R2 with the reference voltage 11, and outputs the comparison result to the CPU 12. The CPU 12 determines the wiring resistances R1 and R2, that is, whether the wiring is good or bad, and outputs the signal output 13 and the display 1
4 and the judgment result is output.

【0014】同様に、スイッチSW5,SW6をオフに
し、スイッチSW7,SW8をオンにする。そして、定
電流源9が、配線抵抗R3,R4に電流を流す。コンパ
レータ10が、配線抵抗R3,R4により発生する電圧
と基準電圧11とを比較し、比較結果をCPU12に出
力する。CPU12は、配線抵抗R3,R4、つまり、
配線の良/不良を判定し、信号出力13とディスプレイ
14とに判定結果を出力する。
Similarly, the switches SW5 and SW6 are turned off, and the switches SW7 and SW8 are turned on. Then, the constant current source 9 causes a current to flow through the wiring resistors R3 and R4. The comparator 10 compares the voltage generated by the wiring resistances R3 and R4 with the reference voltage 11, and outputs the comparison result to the CPU 12. The CPU 12 sets the wiring resistances R3 and R4,
The pass / fail of the wiring is determined, and the determination result is output to the signal output 13 and the display 14.

【0015】[0015]

【発明が解決しようとする課題】このような装置では、
定電流源7,9のコンプライアンス電圧を小さくする
(消費電力を抑える)ために、スイッチ部4のオン抵抗
を小さくする必要がある。また、被測定抵抗1が低抵抗
のとき、定電流源7から200mA程度の電流を流すの
で、スイッチ部4で消費される電力が機器内部の熱とな
り、温度上昇をもたらす。その影響は測定値のドリフト
となって現れる。そのため、スイッチ部4はオン抵抗が
小さいメカニカルリレーが使用されている。
In such a device,
In order to reduce the compliance voltage of the constant current sources 7 and 9 (suppress the power consumption), it is necessary to reduce the on-resistance of the switch unit 4. When the resistance 1 to be measured has a low resistance, a current of about 200 mA flows from the constant current source 7, so that the power consumed by the switch unit 4 becomes heat inside the device, thereby increasing the temperature. The effect appears as a drift of the measured value. Therefore, a mechanical relay having a small on-resistance is used for the switch unit 4.

【0016】例えば、チップ抵抗の検査ラインのように
高速で多量にハンドリングされる場合、測定プローブ接
触面の疲労や断線による誤測定が問題になる。そのた
め、コンタクトチェックを測定ごとに行い結線状態を診
断して測定の信頼性を維持している。
For example, when a large amount is handled at a high speed as in a test line for chip resistance, erroneous measurement due to fatigue or disconnection of the contact surface of the measurement probe becomes a problem. Therefore, a contact check is performed for each measurement to diagnose the connection state, thereby maintaining the reliability of the measurement.

【0017】しかし、測定状態とコンタクトチェック状
態とを切り替えるときに、スイッチ部4が安定するまで
待たなければならない。メカニカルリレーの場合、安定
時間は数msと長く、高速で多量に測定する際に妨げと
なってしまう。
However, when switching between the measurement state and the contact check state, it is necessary to wait until the switch section 4 is stabilized. In the case of a mechanical relay, the stabilization time is as long as several milliseconds, which hinders a large amount of measurement at high speed.

【0018】また、メカニカルリレーの場合、寿命が問
題となり、定期的なメンテナンスを必要としてしまう。
In the case of a mechanical relay, the service life becomes a problem, and periodic maintenance is required.

【0019】そこで、本発明の目的は、スイッチのオン
抵抗を気にすることなく、コンタクトチェックを行うこ
とができる計測装置を実現することにある。
An object of the present invention is to realize a measuring device capable of performing a contact check without regard to the on-resistance of a switch.

【0020】[0020]

【課題を解決するための手段】本発明は、被測定対象に
接続し測定を行う計測装置において、測定用の電源と別
系統の電源により、コンタクトチェック用の定電流を流
す定電流源と、前記被測定対象の測定用の配線に接続す
ると共に、前記定電流源に接続し、配線のチェック時に
オンするスイッチ部とを有し、前記配線の抵抗によりコ
ンタクトチェックを行うことを特徴とするものである。
SUMMARY OF THE INVENTION The present invention relates to a measuring apparatus connected to an object to be measured for performing a measurement, comprising: a constant current source for supplying a constant current for contact check by a power supply for measurement and a power supply of another system; A switch section connected to the measurement wiring of the object to be measured, connected to the constant current source, and turned on when checking the wiring, and performing a contact check by the resistance of the wiring. It is.

【0021】このような本発明では、測定用の配線のチ
ェック時に、スイッチ部をオンにし、定電流源により配
線に定電流を流し、配線の抵抗による電圧により、コン
タクトチェックを行う。
In the present invention, when checking the wiring for measurement, the switch section is turned on, a constant current is supplied to the wiring by a constant current source, and a contact check is performed based on a voltage due to the resistance of the wiring.

【0022】[0022]

【発明の実施の形態】以下図面を用いて本発明を説明す
る。図1は本発明の一実施例を示した構成図である。こ
こで、図3と同一のものは、同一符号を付し説明を省略
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram showing one embodiment of the present invention. Here, the same components as those in FIG. 3 are denoted by the same reference numerals, and description thereof is omitted.

【0023】図において、スイッチ部21,22は、そ
れぞれ配線部2,3に接続し、オン/オフを行う。スイ
ッチ部21は、MOSFETであるスイッチSW9,S
W10からなり、スイッチ部22は、MOSFETであ
るスイッチSW11,SW12からなる。スイッチSW
9は、一端を配線抵抗R1の他端に接続し、スイッチS
W10は、一端を配線抵抗R2の他端に接続する。スイ
ッチSW11は、一端を配線抵抗R3の他端に接続し、
スイッチSW12は、一端を配線抵抗R4の他端に接続
する。
In the figure, switch sections 21 and 22 are connected to wiring sections 2 and 3, respectively, and are turned on / off. The switch unit 21 includes switches SW9 and S
The switch unit 22 includes switches SW11 and SW12 that are MOSFETs. Switch SW
The switch 9 has one end connected to the other end of the wiring resistor R1 and the switch S
W10 has one end connected to the other end of the wiring resistor R2. The switch SW11 has one end connected to the other end of the wiring resistor R3,
The switch SW12 has one end connected to the other end of the wiring resistor R4.

【0024】定電流源23は、配線部2,3と接続し、
被測定抵抗1に流す定電流を出力する。定電流源23
は、一端を配線抵抗R1の他端に接続し、他端を配線抵
抗R4の他端に接続すると共に、グランド24に接地す
る。
The constant current source 23 is connected to the wiring parts 2 and 3,
A constant current flowing through the resistance to be measured 1 is output. Constant current source 23
Has one end connected to the other end of the wiring resistance R1, the other end connected to the other end of the wiring resistance R4, and grounded to the ground 24.

【0025】差動アンプ25は、配線部2,3と接続
し、A/D変換器(図示せず)に出力する。差動アンプ
25は、一方の入力端を配線抵抗R2の他端に接続し、
他方の入力端を配線抵抗R3の他端に接続する。
The differential amplifier 25 is connected to the wiring sections 2 and 3 and outputs the result to an A / D converter (not shown). The differential amplifier 25 has one input terminal connected to the other end of the wiring resistor R2,
The other input terminal is connected to the other end of the wiring resistor R3.

【0026】定電流源26は、スイッチ部21,22に
接続し、定電流源23と別系統の電源により、コンタク
トチェック用の定電流”50mA”を出力する。定電流
源26は、一端をスイッチSW9,SW11の他端に接
続し、他端をスイッチSW10,SW12の他端に接続
すると共に、グランド24と別系統のグランド27に接
地する。
The constant current source 26 is connected to the switch units 21 and 22 and outputs a constant current of “50 mA” for contact check by a power supply of a different system from the constant current source 23. The constant current source 26 has one end connected to the other ends of the switches SW9 and SW11, the other end connected to the other ends of the switches SW10 and SW12, and grounded to a ground 27 different from the ground 24.

【0027】コンパレータ28は、一方の入力端を定電
流源26の一端と接続し、他方の入力端を基準電圧29
と接続し、比較結果を出力する。基準電圧29は、グラ
ンド27に接地する。
The comparator 28 has one input terminal connected to one end of the constant current source 26 and the other input terminal connected to the reference voltage 29.
And output the comparison result. The reference voltage 29 is grounded to the ground 27.

【0028】CPU30は、コンパレータ28の出力を
入力し、良/不良の判定を行い、信号出力31,ディス
プレイ32に出力する。
The CPU 30 receives the output of the comparator 28, determines good / bad, and outputs it to the signal output 31 and the display 32.

【0029】さらに詳細に定電流源23の構成を図2に
示し説明する。図において、抵抗R5は、抵抗値”5
Ω”で、一端を”5V”に接続する。FET231は、
ドレインを抵抗R5の他端に接続し、ソースから定電流
を出力する。アンプ232は、−端子に抵抗R5の他端
を接続し、出力端子にFET231のゲートを接続す
る。スイッチ233は、”4.999V”と”4V”と
を切り替えて、アンプ232の+端子に出力する。
The structure of the constant current source 23 will be described in more detail with reference to FIG. In the figure, a resistor R5 has a resistance value "5".
Ω ”, and one end is connected to“ 5 V. ”
The drain is connected to the other end of the resistor R5, and a constant current is output from the source. The amplifier 232 has the − terminal connected to the other end of the resistor R5, and the output terminal connected to the gate of the FET 231. The switch 233 switches between “4.999 V” and “4 V” and outputs the same to the + terminal of the amplifier 232.

【0030】このような装置の動作を以下で説明する。
始めに被測定抵抗1の測定動作を説明する。スイッチS
W9〜SW12はオフのままにする。そして、スイッチ
233は”4V”を選択し、定電流源23から”200
mA”の定電流を被測定抵抗1に流す。差動アンプ25
が、被測定抵抗1の両端に発生する電圧を増幅し、A/
D変換器に出力する。
The operation of such a device will be described below.
First, the measuring operation of the measured resistance 1 will be described. Switch S
W9 to SW12 are kept off. Then, the switch 233 selects “4 V” and outputs “200 V” from the constant current source 23.
mA "constant current flows through the resistance 1 to be measured.
Amplifies the voltage generated across the resistance 1 to be measured, and A /
Output to D converter.

【0031】次に、コンタクトチェック動作を説明す
る。スイッチSW9,SW10をオンにし、スイッチS
W11,SW12をオフのままにする。スイッチ233
は”4.999V”を選択し、定電流源23は”0.2
mA”の定電流を出力する。定電流源23の”0.2m
A”の定電流は、配線抵抗R1と被測定抵抗1と配線抵
抗R4とを流れ、グランド24に流れる。定電流源26
の”50mA”の定電流は、スイッチSW9と配線抵抗
R1と配線抵抗R2とスイッチSW10とを流れ、グラ
ンド27に流れる。
Next, the contact check operation will be described. The switches SW9 and SW10 are turned on, and the switch S
W11 and SW12 are kept off. Switch 233
Selects “4.999V”, and the constant current source 23 selects “0.299V”.
A constant current of 0.2 mA is output.
The constant current of A ″ flows through the wiring resistance R1, the measured resistance 1, and the wiring resistance R4, and flows to the ground 24. The constant current source 26.
The constant current of “50 mA” flows through the switch SW9, the wiring resistance R1, the wiring resistance R2, and the switch SW10, and flows to the ground 27.

【0032】通常、コンタクトチェックレベルの精度は
それほど必要でなく、1%もあればよい。従って、コン
タクトチェック用の定電流が”50mA”の場合、測定
用の定電流を”0.5mA”程度にすれば十分である。
Usually, the accuracy of the contact check level is not so required, and may be 1%. Therefore, when the constant current for contact check is “50 mA”, it is sufficient to set the constant current for measurement to about “0.5 mA”.

【0033】そして、コンパレータ28は、配線抵抗R
1,R2により発生する電圧と基準電圧29とを比較
し、比較結果をCPU30に出力する。CPU30は、
配線抵抗R1,R2、つまり、配線の良/不良を判定
し、信号出力31とディスプレイ32とに判定結果を出
力する。
The comparator 28 has a wiring resistance R
1 and R2 are compared with the reference voltage 29, and the comparison result is output to the CPU 30. The CPU 30
The wiring resistances R1 and R2, that is, whether the wiring is good or bad, are determined, and the determination result is output to the signal output 31 and the display 32.

【0034】同様に、スイッチSW9,SW10をオフ
にし、スイッチSW11,SW12をオンにする。定電
流源23の”0.2mA”の定電流は、配線抵抗R1と
被測定抵抗1と配線抵抗R4とを流れ、グランド24に
流れる。定電流源26の”50mA”の定電流は、スイ
ッチSW11と配線抵抗R3と配線抵抗R4とスイッチ
SW12とを流れ、グランド27に流れる。
Similarly, the switches SW9 and SW10 are turned off, and the switches SW11 and SW12 are turned on. The constant current of “0.2 mA” from the constant current source 23 flows through the wiring resistance R1, the measured resistance 1, and the wiring resistance R4, and flows to the ground 24. The constant current of “50 mA” of the constant current source 26 flows through the switch SW11, the wiring resistance R3, the wiring resistance R4, and the switch SW12, and flows to the ground 27.

【0035】そして、コンパレータ28は、配線抵抗R
3,R4により発生する電圧と基準電圧29とを比較
し、比較結果をCPU30に出力する。CPU30は、
配線抵抗R3,R4、つまり、配線の良/不良を判定
し、信号出力31とディスプレイ32とに判定結果を出
力する。
The comparator 28 determines the wiring resistance R
3, the voltage generated by R4 is compared with the reference voltage 29, and the comparison result is output to the CPU 30. The CPU 30
The wiring resistances R3 and R4, that is, whether the wiring is good or bad, are determined, and the determination result is output to the signal output 31 and the display 32.

【0036】このように、定電流源23と定電流源26
との電源系統を別にしたので、測定用の定電流源23を
スイッチで切り替えることなく、測定毎にコンタクトチ
ェックを行うことができる。つまり、スイッチのオン抵
抗を気にする必要がなくなる。
As described above, the constant current source 23 and the constant current source 26
Therefore, the contact check can be performed for each measurement without switching the constant current source 23 for measurement with a switch. That is, there is no need to worry about the on-resistance of the switch.

【0037】また、メカニカルリレーを使う必要がなく
なり、切り替え時のスイッチの安定時間を必要とせず、
高速測定が可能となる。そして、寿命部品を使用しない
ため、メンテナンスフリーにすることができる。
In addition, there is no need to use a mechanical relay, and there is no need for a switch stabilization time at the time of switching.
High-speed measurement becomes possible. In addition, maintenance-free can be achieved because no life component is used.

【0038】なお、本発明はこれに限定されるものでは
なく、以下のようなものでもよい。基準電圧29で、配
線抵抗により発生する電圧と比較する構成を示したが、
D/A変換器により、基準電圧を出力する構成でもよ
い。この場合、コンタクトチェックレベルを可変にで
き、配線抵抗が異なる測定装置にも簡単に対応すること
ができる。
The present invention is not limited to this, but may be as follows. Although the configuration for comparing the reference voltage 29 with the voltage generated by the wiring resistance has been described,
The reference voltage may be output by a D / A converter. In this case, the contact check level can be changed, and it is possible to easily cope with a measuring device having a different wiring resistance.

【0039】また、コンパレータ28で比較する構成を
示したが、A/D変換器に配線抵抗により発生する電圧
を入力し、A/D変換器の出力によりCPUで配線の良
/不要を判断する構成にしてもよい。
Although the configuration for comparison by the comparator 28 has been described, the voltage generated by the wiring resistance is input to the A / D converter, and the CPU determines whether the wiring is good or not based on the output of the A / D converter. It may be configured.

【0040】そして、計測装置として、被測定対象とし
て抵抗の抵抗値を測定する装置を示したが、他の計測装
置でもよい。例えば、コンデンサの静電容量等を求める
ものでもよい。
As the measuring device, the device for measuring the resistance value of the resistor as the object to be measured has been described, but another measuring device may be used. For example, the capacitance of the capacitor may be determined.

【0041】コンデンサの場合は、抵抗を測定する場合
と同じ構成で行うことができる。つまり、コンデンサの
静電容量は、容量がCのコンデンサに定電流Iを充電し
て、そのコンデンサの両端の電圧が所定の電圧値Vにな
るまでに時間Tがかかったとすると、C=T・I/Vで
求めることができる。
In the case of a capacitor, the measurement can be performed with the same configuration as that for measuring the resistance. That is, assuming that it takes time T for a capacitor having a capacitance of C to be charged with a constant current I and for the voltage across the capacitor to reach a predetermined voltage value V, C = T · It can be determined by I / V.

【0042】あるいは、別の構成として、交流電源から
所定周波数の正弦波交流電圧をコンデンサの一方に加
え、他方から電流を取り込み、電流電圧変換回路、位相
検波回路を介して位相90度の電圧のみを取り出して、
交流直流変換回路で直流電圧に変換した後、デジタル値
にして、このデジタル値によりCPUで容量値を演算す
る構成でもよい。このような場合、配線抵抗R2,R3
は、コンタクトチェックのみで必要となる構成になる。
Alternatively, as another configuration, a sine wave AC voltage of a predetermined frequency is applied from an AC power supply to one of the capacitors, a current is taken in from the other, and only a voltage having a phase of 90 degrees is passed through a current-voltage conversion circuit and a phase detection circuit. Take out,
It is also possible to adopt a configuration in which a DC voltage is converted by an AC / DC conversion circuit, then converted into a digital value, and a capacitance value is calculated by the CPU based on the digital value. In such a case, the wiring resistances R2, R3
Is a configuration required only by contact check.

【0043】[0043]

【発明の効果】本発明によれば、以下のような効果があ
る。コンタクトチェック用の定電流源の電源系統を測定
用電源と別にしたので、測定系をスイッチで切り替える
ことなく、測定毎にコンタクトチェックを行うことがで
きる。つまり、スイッチのオン抵抗を気にする必要がな
くなる。
According to the present invention, the following effects can be obtained. Since the power supply system of the constant current source for contact check is separated from the power supply for measurement, the contact check can be performed for each measurement without switching the measurement system with a switch. That is, there is no need to worry about the on-resistance of the switch.

【0044】また、メカニカルリレーを使う必要がなく
なり、切り替え時のスイッチの安定時間を必要とせず、
高速測定が可能となる。そして、寿命部品を使用しない
ため、メンテナンスフリーにすることができる。
In addition, there is no need to use a mechanical relay, and there is no need for a switch stabilization time at the time of switching.
High-speed measurement becomes possible. In addition, maintenance-free can be achieved because no life component is used.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例を示した構成図である。FIG. 1 is a configuration diagram showing one embodiment of the present invention.

【図2】図1に示す装置の定電流源23の構成図であ
る。
FIG. 2 is a configuration diagram of a constant current source 23 of the device shown in FIG.

【図3】従来の計測装置の構成を示した図である。FIG. 3 is a diagram showing a configuration of a conventional measuring device.

【符号の説明】[Explanation of symbols]

1 被測定抵抗 21 スイッチ部 22 スイッチ部 23 定電流源 25 差動アンプ 26 定電流源 R1〜R4 配線抵抗 DESCRIPTION OF SYMBOLS 1 Resistance to be measured 21 Switch part 22 Switch part 23 Constant current source 25 Differential amplifier 26 Constant current source R1-R4 Wiring resistance

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 被測定対象に接続し測定を行う計測装置
において、 測定用の電源と別系統の電源により、コンタクトチェッ
ク用の定電流を流す定電流源と、 前記被測定対象の測定用の配線に接続すると共に、前記
定電流源に接続し、配線のチェック時にオンするスイッ
チ部とを有し、前記配線の抵抗によりコンタクトチェッ
クを行うことを特徴とする計測装置。
1. A measuring apparatus connected to an object to be measured for performing measurement, comprising: a constant current source for supplying a constant current for contact check by a power supply for measurement separately from a power supply for measurement; A measuring device, comprising: a switch unit connected to a wiring, connected to the constant current source, and turned on when checking the wiring, and performing a contact check by the resistance of the wiring.
【請求項2】 被測定対象を測定する計測装置におい
て、 前記被測定対象に接続する第1,第2の配線により、被
測定対象に定電流を流す第1の定電流源と、 前記被測定対象に接続する第3,第4の配線により、両
端の電圧差を測定する差動アンプと、 前記第1の定電流源と別系統の電源により、コンタクト
チェック用の定電流を流す第2の定電流源と、 前記被測定対象の一端に接続する前記第1,第3の配線
に接続すると共に、前記第2の定電流源に接続し、第
1,第3の配線のチェック時にオンする第1のスイッチ
部と、 前記被測定対象の他端に接続する前記第2,第4の配線
に接続すると共に、前記第2の定電流源に接続し、第
2,第4の配線のチェック時にオンする第2のスイッチ
部とを有し、コンタクトチェック時に第1の定電流源の
定電流をコンタクトチェックの誤差範囲内にし、前記第
1〜第4の配線の抵抗によりコンタクトチェックを行う
ことを特徴とする計測装置。
2. A measuring apparatus for measuring an object to be measured, wherein: a first constant current source for supplying a constant current to the object to be measured by first and second wirings connected to the object to be measured; A differential amplifier for measuring a voltage difference between both ends by third and fourth wirings connected to an object; and a second current for flowing a constant current for contact check by a power supply of a different system from the first constant current source. A constant current source, connected to the first and third wires connected to one end of the device under test, and connected to the second constant current source, and turned on when checking the first and third wires; A first switch unit, connected to the second and fourth wirings connected to the other end of the object to be measured, and connected to the second constant current source to check the second and fourth wirings; At the time of contact check. A source of constant current is within the error range of the contact check, measuring device which is characterized in that the contact check by the resistance of the first to fourth wiring.
【請求項3】 第1のスイッチ部と第2のスイッチ部と
は、FETで構成されていることを特徴とする請求項2
記載の計測装置。
3. The device according to claim 2, wherein the first switch unit and the second switch unit are configured by FETs.
The measuring device as described.
【請求項4】 被測定対象は、抵抗であることを特徴と
する請求項1〜3記載の計測装置。
4. The measuring device according to claim 1, wherein the object to be measured is a resistance.
JP28532998A 1998-10-07 1998-10-07 Measuring device Expired - Fee Related JP3562623B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28532998A JP3562623B2 (en) 1998-10-07 1998-10-07 Measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28532998A JP3562623B2 (en) 1998-10-07 1998-10-07 Measuring device

Publications (2)

Publication Number Publication Date
JP2000111593A true JP2000111593A (en) 2000-04-21
JP3562623B2 JP3562623B2 (en) 2004-09-08

Family

ID=17690148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28532998A Expired - Fee Related JP3562623B2 (en) 1998-10-07 1998-10-07 Measuring device

Country Status (1)

Country Link
JP (1) JP3562623B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1991654A (en) * 2005-12-31 2007-07-04 博奥生物有限公司 Temperature sensor needless accurate heating-up temperature control device and method
JP2007178257A (en) * 2005-12-28 2007-07-12 Yokogawa Electric Corp Measuring device
JP2008281408A (en) * 2007-05-10 2008-11-20 Hioki Ee Corp Device for inspecting circuit board
JP2012220399A (en) * 2011-04-12 2012-11-12 Hioki Ee Corp Four-terminal type measuring apparatus
JP2013104663A (en) * 2011-11-10 2013-05-30 Hioki Ee Corp Circuit board inspection device
JP2015056284A (en) * 2013-09-12 2015-03-23 日置電機株式会社 Switching control circuit and measurement device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02259581A (en) * 1989-03-31 1990-10-22 Ando Electric Co Ltd Detecting circuit for terminal connection state of circuit element measuring instrument
JP3003658U (en) * 1994-04-28 1994-10-25 アデックス株式会社 Impedance measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02259581A (en) * 1989-03-31 1990-10-22 Ando Electric Co Ltd Detecting circuit for terminal connection state of circuit element measuring instrument
JP3003658U (en) * 1994-04-28 1994-10-25 アデックス株式会社 Impedance measuring device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007178257A (en) * 2005-12-28 2007-07-12 Yokogawa Electric Corp Measuring device
JP4735250B2 (en) * 2005-12-28 2011-07-27 横河電機株式会社 Measuring device
CN1991654A (en) * 2005-12-31 2007-07-04 博奥生物有限公司 Temperature sensor needless accurate heating-up temperature control device and method
WO2007076688A1 (en) * 2005-12-31 2007-07-12 Capitalbio Corporation Methods and devices for controlling temperature without temperature sensor
JP2008281408A (en) * 2007-05-10 2008-11-20 Hioki Ee Corp Device for inspecting circuit board
JP2012220399A (en) * 2011-04-12 2012-11-12 Hioki Ee Corp Four-terminal type measuring apparatus
JP2013104663A (en) * 2011-11-10 2013-05-30 Hioki Ee Corp Circuit board inspection device
JP2015056284A (en) * 2013-09-12 2015-03-23 日置電機株式会社 Switching control circuit and measurement device

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