JP2000097835A - Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method - Google Patents

Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method

Info

Publication number
JP2000097835A
JP2000097835A JP10272097A JP27209798A JP2000097835A JP 2000097835 A JP2000097835 A JP 2000097835A JP 10272097 A JP10272097 A JP 10272097A JP 27209798 A JP27209798 A JP 27209798A JP 2000097835 A JP2000097835 A JP 2000097835A
Authority
JP
Japan
Prior art keywords
substrate
wettability
liquid
reagent
adhesion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP10272097A
Other languages
Japanese (ja)
Inventor
Koichi Kamijo
光一 上條
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP10272097A priority Critical patent/JP2000097835A/en
Publication of JP2000097835A publication Critical patent/JP2000097835A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enable simple and short-time wettability determination of a substrate on a manufacture line site by measuring an adhesion degree of a coating film, for each liquid reagent having different adhesive tensions applied on a part of the substrate. SOLUTION: Liquid reagents 2a-2d are applied on the peripheral parts 1a-1d on the four sides of a glass substrate 1 conveyed to a manufacture line. Monohydric to polyhydric alcohols having different molecular weights are used as the liquid reagents. In a case that, for example, a contamination degree on the glass substrate 1 surface is high, the liquid reagents have low wettability and take the form of small balls in the repelled state. In a case that the contamination is clear line this, the glass substrate 1 is returned to a cleaning process. In case the surface is sufficiently clean and has a high activity degree, the liquid reagents show high wettability and take the form of comparatively wide lines, and if the surface is contaminated in some degree, the liquid reagents take the form of somewhat narrow lines. When visual determination is delicate, the line widths are measured precisely by using a measuring equipment, such as a vernier caliper or the like, and the quality of wettability on the glass substrate 1 is determined by whether the measured result is in a prescribed range or not.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリコン基板や液
晶パネル用ガラス基板等の濡れ性を判定する方法および
その判定方法に用いられる試薬塗布具に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for determining wettability of a silicon substrate, a glass substrate for a liquid crystal panel, and the like, and a reagent applicator used in the method.

【0002】[0002]

【従来の技術】シリコン基板や液晶パネル等の液晶装置
に用いられるガラス基板は、その表面に設けられる配線
やスイッチング素子等の形成工程における各種膜の密着
性に起因するパターニング精度や、ガラス基板を接着す
るシール材の密着性を高めるために高度の清浄性あるい
は活性度が求められる。
2. Description of the Related Art A glass substrate used for a liquid crystal device such as a silicon substrate or a liquid crystal panel is required to have a patterning accuracy due to the adhesion of various films in a process of forming wirings and switching elements provided on the surface, and a glass substrate. A high degree of cleanliness or activity is required to enhance the adhesion of the sealing material to be bonded.

【0003】ところで、ガラス基板等の清浄性や活性度
を定量的に確かめることは一般的に困難であるため、そ
の表面の濡れ性(湿潤性)を測定することにより基板の
清浄性等を間接的に判定する方法が従来から用いられて
いる。
Since it is generally difficult to quantitatively confirm the cleanliness and activity of a glass substrate or the like, the wettability (wetability) of the surface of the substrate is measured to indirectly control the cleanliness of the substrate. Conventionally, a method for making a determination is used.

【0004】ここで、図5を参照して簡単に説明する
と、ガラス基板1上に所定の試薬を滴下して液滴Aを形
成した場合に、基板上の汚れ具合に応じて液滴Aと基板
1の接触角θが変化する。なお、図中γAは液滴Aの表
面張力を示している。
Here, a brief description will be given with reference to FIG. 5. When a predetermined reagent is dropped on a glass substrate 1 to form a droplet A, the droplet A is formed depending on the degree of contamination on the substrate. The contact angle θ of the substrate 1 changes. In the drawing, γA indicates the surface tension of the droplet A.

【0005】即ち、理論的にはガラス基板が完全な清浄
状態にあるとした場合には接触角θ=0となって液滴A
が基板1の表面をどこまでも広がることのできる理想的
な濡れ性を示し、基板上に油膜や埃等の不純物が付着し
ている場合にはその汚染の程度が高い程、接触角θは大
きくなる傾向を示すことが知られている。
That is, theoretically, when the glass substrate is in a completely clean state, the contact angle θ = 0 and the droplet A
Shows an ideal wettability that can spread the surface of the substrate 1 as far as possible, and when impurities such as an oil film and dust adhere to the substrate, the higher the degree of the contamination, the larger the contact angle θ. It is known to show a tendency.

【0006】したがって、接触角θの許容範囲を予め定
めることにより、液滴Aが許容範囲を越える接触角θを
示す場合には、汚染の程度が高いと判定することがで
き、また、許容範囲以下である場合には基板の汚染の程
度は使用上問題のない範囲であり十分な活性度があると
判定することができる。
Accordingly, by setting the allowable range of the contact angle θ in advance, when the droplet A has a contact angle θ exceeding the allowable range, it can be determined that the degree of contamination is high, and the allowable range can be determined. In the following cases, the degree of contamination of the substrate is within a range where there is no problem in use, and it can be determined that there is sufficient activity.

【0007】[0007]

【発明が解決しようとする課題】ところが、従来におい
て、例えば液晶パネル等の製造ラインの現場でガラス基
板の濡れ性を簡易的に判定する場合には、例えばスポイ
ト等でヨウ化メチレン等を滴下し、その液滴Aを光学系
で拡大して分度器により上記接触角θを計測していた。
However, conventionally, when the wettability of a glass substrate is simply determined at the site of a production line for a liquid crystal panel or the like, for example, methylene iodide or the like is dropped with a dropper or the like. Then, the droplet A was enlarged by an optical system, and the contact angle θ was measured by a protractor.

【0008】しかしながら、上記従来の方法は、特殊な
光学装置を必要とするためコストが嵩むという問題があ
ると共に、試薬を滴下する際のスポイト等の操作具合な
どの測定条件の変化によって液滴Aの大きさが変化して
しまい、その度毎に光学系の焦点を合わせ直すなどの精
密で面倒な操作が必要となり、また分度器による接触角
θの測定にも時間がかかるなどの難点があった。
[0008] However, the above-mentioned conventional method has a problem that the cost is increased due to the necessity of a special optical device, and the droplet A is changed due to a change in the measurement conditions such as the operating condition of a dropper or the like when the reagent is dropped. The size of the lens changed, requiring precise and cumbersome operations such as refocusing the optical system each time, and the measurement of the contact angle θ with a protractor took time. .

【0009】したがって、従来の濡れ性判定方法は、生
産性向上のために簡便性や高速性が求められる液晶パネ
ルや半導体デバイスの製造ラインの現場への適用には不
向きであるという問題があった。
Therefore, the conventional wettability determination method has a problem that it is not suitable for application to the site of a liquid crystal panel or semiconductor device production line where simplicity and high speed are required to improve productivity. .

【0010】本発明は、上述の課題に鑑みて案出された
ものであり、液晶パネルや半導体デバイスの製造ライン
の現場において簡便かつ短時間で基板の濡れ性を判定す
ることのできる基板の濡れ性判定方法および該判定方法
に用いられる試薬塗布具を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and has been made in consideration of the above-described problems. An object of the present invention is to provide a sex determination method and a reagent applicator used for the determination method.

【0011】[0011]

【課題を解決するための手段】上記目的を達成するため
に、本発明に係る基板の濡れ性判定方法は、基板の一部
に付着張力の異なるn種類(nは1以上の整数)の液状
試薬を塗布する塗布過程と、上記基板上における各液状
試薬の付着程度を測定する測定過程と、上記測定過程に
おいて測定された液状試薬の付着程度に基づいて基板の
濡れ性の良否を判定する判定過程とを少なくとも有する
ようにしたものである。
In order to achieve the above object, a method for judging the wettability of a substrate according to the present invention comprises the steps of providing n (n is an integer of 1 or more) liquids having different adhesion tensions on a part of the substrate. A coating step of applying a reagent, a measuring step of measuring the degree of adhesion of each liquid reagent on the substrate, and a determination of judging the wettability of the substrate based on the degree of adhesion of the liquid reagent measured in the measuring step And at least a process.

【0012】これにより、n種類の液状試薬の付着程度
を対比観察することにより基板の濡れ性を正確且つ短時
間で判定することが可能となる。
This makes it possible to accurately and quickly determine the wettability of the substrate by observing the degree of adhesion of the n kinds of liquid reagents.

【0013】即ち、基板の種類や用途に応じて、例えば
2番目の試薬としてのエタノールの付着程度が良好であ
る場合には基板の濡れ性(清浄性)は許容範囲であると
判定したり、例えば3番目の試薬としてのプロパノール
の付着程度が不良ではじかれる場合には濡れ性(清浄
性)が不十分であるとして再度の基板洗浄や焼成処理を
行うといった判定を製造ラインの現場で簡便に行うこと
が可能となる。
That is, depending on the type and use of the substrate, for example, when the degree of adhesion of ethanol as the second reagent is good, the wettability (cleanability) of the substrate is determined to be within an allowable range, For example, if the adhesion of propanol as the third reagent is rejected if the degree of adhesion is poor, the wettability (cleanliness) is determined to be insufficient and the determination that the substrate is to be washed again or baked is simply performed at the production line site. It is possible to do.

【0014】なお、上記液状試薬は、分子量の異なる一
価または多価のアルコールで構成するようにするとよ
い。
The above liquid reagent is preferably composed of monohydric or polyhydric alcohols having different molecular weights.

【0015】このような液状試薬を用いる場合には、塗
布後にシリコン基板やガラス基板に不純物が残ることを
回避することができ、製品の信頼性等に影響を及ぼすこ
とがないという利点がある。なお、分子量の異なる一価
または多価のアルコールは、分子量が小さい程濡れ易
く、分子量が大きい程濡れ難くはじかれ易いという性質
を有している。
When such a liquid reagent is used, there is an advantage that impurities can be prevented from remaining on the silicon substrate or the glass substrate after coating, and the reliability of the product is not affected. In addition, monohydric or polyhydric alcohols having different molecular weights have a property that the smaller the molecular weight, the more easily it gets wet, and the larger the molecular weight, the more difficult it is to get wet and repelled.

【0016】さらに、上記測定過程は、光学系を介して
得られる上記各液状試薬の塗布膜の塗布状況を示す画像
データを解析して各液状試薬の付着領域の幅あるいは付
着面積を測定し、上記判定過程は、上記各液状試薬の付
着領域の幅あるいは付着面積を予め設定した所定値と比
較して基板の濡れ性の良否を判定するようにでき、この
場合には生産性を一層向上させることが期待できる。
Further, in the measuring step, the width or the adhering area of the adhering area of each liquid reagent is measured by analyzing image data indicating the coating state of the liquid reagent applied through the optical system. In the above-mentioned determination step, the quality or wettability of the substrate can be determined by comparing the width or the area of the adhesion area of each of the liquid reagents with a predetermined value set in advance. In this case, the productivity is further improved. I can expect that.

【0017】また、上記基板の濡れ性判定方法に用いら
れる試薬塗布具を、付着張力の異なるn種類(nは1以
上の整数)の液状試薬の一つをそれぞれ封入したn種類
(例えば1番目からn番目まで)のフェルトペンで構成
することができる。
The reagent applicator used in the above-described method for determining the wettability of a substrate is composed of n kinds of liquid reagents (n is an integer of 1 or more) having different adhesion tensions. To the n-th) felt-tip pen.

【0018】この場合に、上記液状試薬は、分子量の異
なる一価または多価のアルコールで構成するとよい。
In this case, the liquid reagent may be composed of a monohydric or polyhydric alcohol having a different molecular weight.

【0019】このような試薬塗布具によれば、例えば基
板の種類や用途に応じて、液晶パネル用ガラス基板であ
ればエタノール系の試薬を封入した例えば2番のフェル
トペンと、プロパノール系の試薬を封入した例えば3番
のフェルトペンとを用いてガラス基板上に各試薬を簡単
に塗布することが可能となり、上記基板の濡れ性判定方
法によって、2番目のフェルトペンにより試薬としての
エタノールを塗布し、その付着程度が良好である場合に
は基板の濡れ性(清浄性)は許容範囲であると判定した
り、3番目のフェルトペンにより試薬としてのプロパノ
ールを塗布し、その付着程度が不良ではじかれる場合に
は濡れ性(清浄性)が不十分であるとして再度の基板洗
浄や焼成処理を行うといった判定を製造ラインの現場で
簡便に行うことができるようになる。
According to such a reagent applicator, for example, in the case of a glass substrate for a liquid crystal panel, for example, a No. 2 felt-tip pen in which an ethanol-based reagent is sealed, and a propanol-based reagent It is possible to easily apply each reagent on a glass substrate using, for example, a No. 3 felt-tip pen enclosing the same, and apply ethanol as a reagent using a second felt-tip pen according to the method for determining wettability of the substrate. However, if the degree of adhesion is good, the wettability (cleanability) of the substrate is determined to be within an acceptable range, or propanol as a reagent is applied using a third felt pen, and if the degree of adhesion is poor, In the case of being repelled, it is easy to judge on the site of the production line that the wettability (cleanliness) is insufficient and that the substrate is washed again and fired. Kill as to become.

【0020】また、本発明の液晶装置の製造方法は、基
板上に薄膜をパターニングしてなる液晶装置の製造方法
において、上記基板の一部に付着張力の異なるn種類
(nは1以上の整数)の液状試薬を塗布する塗布過程
と、上記基板上における各液状試薬の塗布膜の付着程度
を測定する測定過程と、上記測定過程において測定され
た液状試薬の付着程度に基づいて基板の濡れ性の良否を
判定する判定過程と、を少なくとも有することを特徴と
する。
Further, according to the method for manufacturing a liquid crystal device of the present invention, in a method for manufacturing a liquid crystal device in which a thin film is patterned on a substrate, n types (n is an integer of 1 or more) having different adhesion tensions on a part of the substrate. A) a coating step of applying a liquid reagent, a measuring step of measuring the degree of adhesion of a coating film of each liquid reagent on the substrate, and a wettability of the substrate based on the degree of adhesion of the liquid reagent measured in the measuring step. And a determining step of determining the quality of the product.

【0021】この製造法によれば、簡便な方法で基板の
濡れ性が判定できるため、基板上の薄膜の形成の精度を
きわめて高く維持することができ、液晶装置の品質をよ
り高めることができるものである。
According to this manufacturing method, since the wettability of the substrate can be determined by a simple method, the precision of forming a thin film on the substrate can be maintained extremely high, and the quality of the liquid crystal device can be further improved. Things.

【0022】[0022]

【発明の実施の形態】以下、本発明の好適な実施形態を
図面を用いて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below with reference to the drawings.

【0023】ここに、図1は基板への液体試薬の塗布状
態を示す概略図、図2は基板に塗布された液体試薬の塗
布状態を示す説明図、図3は本実施形態に用いられる試
薬塗布具の一構成例を示す概略図である。
FIG. 1 is a schematic view showing a state of applying a liquid reagent to a substrate, FIG. 2 is an explanatory view showing an application state of a liquid reagent applied to a substrate, and FIG. 3 is a reagent used in the present embodiment. It is a schematic diagram showing an example of 1 composition of an applicator.

【0024】図1において、符号1は基板の一種として
の液晶装置用のガラス基板を示す。
In FIG. 1, reference numeral 1 denotes a glass substrate for a liquid crystal device as one type of substrate.

【0025】ガラス基板としては例えば無アルカリガラ
スや石英の基板などが用いられ、その表面には、例えば
アクティブマトリクス型の液晶パネルであればスイッチ
ング素子として設けられるTFD(Thin Film Diode:
薄膜ダイオード)やTFT(Thin Film Transistor:薄
膜トランジスタ)を形成するための金属、半導体、ある
いはそれらのパターニングのためのレジスト等の薄膜が
形成されるようになっている。
As the glass substrate, for example, a non-alkali glass or quartz substrate or the like is used, and on the surface thereof, for example, a TFD (Thin Film Diode) provided as a switching element in the case of an active matrix type liquid crystal panel.
A thin film such as a metal or a semiconductor for forming a thin film diode (TFT) or a thin film transistor (TFT) or a resist for patterning the metal or the semiconductor is formed.

【0026】さらに、このガラス基板1上には、上記ス
イッチング素子に信号を供給するための端子部が形成さ
れ、例えばCOG(Chip On Glass:チップオングラ
ス)方式や、TAB(Tape Automated Bonding:テープ
オートメーテッドボンディング)方式等により、駆動用
ICや、FPC(Flexible Printed Circuit:可撓性基
板)が実装されるようになっており、それらとガラス基
板を接着するためのACF(Anisotropy Conductive Fi
lm:異方性導電膜)が配置されるようになっている。
Further, a terminal portion for supplying a signal to the switching element is formed on the glass substrate 1. For example, a COG (Chip On Glass) method or a TAB (Tape Automated Bonding: Tape) is used. Driving ICs and FPCs (Flexible Printed Circuits) are mounted by an automated bonding method, etc., and an ACF (Anisotropy Conductive Fi
lm: anisotropic conductive film).

【0027】このガラス基板1は、例えば所定の洗浄液
に浸漬されて脱脂処理や不純物除去が行われ純水によっ
て洗浄液の除去が行われた後に乾燥される。
The glass substrate 1 is immersed in, for example, a predetermined cleaning liquid, subjected to a degreasing treatment and removal of impurities, and is then dried after removing the cleaning liquid with pure water.

【0028】そして、このガラス基板1を用いて例えば
アクティブマトリクス型の液晶パネルを製造する場合に
は、ガラス基板1は上記スイッチング素子を形成する製
造ラインや、基板同士をシール材によって接着する工程
や、駆動用ICを実装する工程等に搬送される。
When an active matrix type liquid crystal panel is manufactured by using the glass substrate 1, for example, the glass substrate 1 may be manufactured by a manufacturing line for forming the above-mentioned switching element, a process of bonding the substrates to each other with a sealing material, or the like. Is transported to the step of mounting the driving IC.

【0029】ここで、ガラス基板1は上述のような洗浄
が行われてはいるが、洗浄が不十分な場合や乾燥時の水
垢等の付着により、スイッチング素子や端子部のパター
ニング精度や、シール部における基板同士の密着性や、
駆動用ICの導通の信頼性等の製品品質に影響を与える
程度に表面が汚染されている場合がある。
Here, although the glass substrate 1 has been cleaned as described above, when the cleaning is insufficient or when scale is attached during drying, the patterning accuracy of the switching element and the terminal portion and the sealing accuracy are reduced. Between the substrates in the area,
The surface may be contaminated to such an extent that the product quality such as the reliability of conduction of the driving IC is affected.

【0030】そこで、ガラス基板1の表面の清浄性を確
認して製品の歩留まりを向上させるために、製造ライン
に搬送されるガラス基板1について所定枚数毎に基板表
面の濡れ性の判定を行うこととなる。
Therefore, in order to confirm the cleanliness of the surface of the glass substrate 1 and to improve the product yield, the wettability of the substrate surface is determined every predetermined number of the glass substrates 1 conveyed to the production line. Becomes

【0031】具体的には、例えば100枚毎にサンプル
としてのガラス基板1を抽出し、そのガラス基板1の4
辺の周縁部1a,1b,1c,1dに液状試薬2a,2
b,2c,2dを塗布する。試薬の塗布を周縁部に行っ
たのは液晶パネルの表示部となる部分を避けて検査を行
うためである。
Specifically, for example, a glass substrate 1 as a sample is extracted every 100 sheets,
The liquid reagents 2a, 2a are placed on the peripheral edges 1a, 1b, 1c, 1d of the sides.
b, 2c and 2d are applied. The reason why the reagent was applied to the peripheral portion was to avoid the portion serving as the display portion of the liquid crystal panel to perform the inspection.

【0032】上記液状試薬2a,2b,2c,2dとし
ては、分子量の異なる一価または多価のアルコールが用
いられる。
As the liquid reagents 2a, 2b, 2c and 2d, monohydric or polyhydric alcohols having different molecular weights are used.

【0033】このように分子量の異なるアルコールを液
状試薬として用いるのは、分子量が小さい程濡れ易く、
分子量が大きい程濡れ難くはじかれ易いという性質を有
している(即ち、濡れ易さについて、メタノール>エタ
ノール>プロパノール・・・である。)ため、各試薬を
これら分子量の異なるアルコールとすることにより接触
角の対比が明確となり濡れ性の判定が容易となるためで
ある。
The use of alcohols having different molecular weights as the liquid reagent is easier as the molecular weight is smaller.
The higher the molecular weight, the more difficult it is to get wet and the more easily it is repelled (that is, the ease of wetting is methanol>ethanol> propanol ...). This is because the contrast of the contact angles becomes clear and the determination of wettability becomes easy.

【0034】なお、上記液状試薬2a,2b,2c,2
dを基板上に滴下した場合には図5に示すような液滴A
となるが、この際のγAcosθは付着の尺度を表す付着張
力を示し、上記の濡れ易さ或いははじかれ易さはこの付
着張力を反映しているものと考えられる。したがって、
本実施例では、液状試薬を分子量の異なるアルコールで
構成したが、これに限らず付着張力の異なる所定の液体
であれば同様の試薬として適用することが可能である。
The liquid reagents 2a, 2b, 2c, 2
When d is dropped on the substrate, a droplet A as shown in FIG.
However, γAcosθ at this time indicates an adhesion tension indicating a measure of adhesion, and the above-mentioned easiness of wetting or repelling is considered to reflect this adhesion tension. Therefore,
In the present embodiment, the liquid reagents are composed of alcohols having different molecular weights. However, the present invention is not limited to this, and it is possible to apply the same reagent as long as it is a predetermined liquid having a different adhesion tension.

【0035】また、本実施形態では液状試薬2a,2
b,2c,2dとして、2aに例えばメタノール,2b
に例えばエタノール,2cにプロパノール,2dにブタ
ノールを用いた。なお、液状試薬はこれら限定されるも
のではなく、上記アルコールを適宜混合してもよいし、
その他二価アルコールとしてのジオールや三価アルコー
ルとしてのトリオール等を用いることも考えられる。
In this embodiment, the liquid reagents 2a, 2a
b, 2c, 2d, for example, methanol, 2b
For example, ethanol, 2c was propanol, and 2d was butanol. The liquid reagent is not limited to these, and the alcohol may be appropriately mixed,
It is also conceivable to use a diol as a dihydric alcohol or a triol as a trihydric alcohol.

【0036】また、本実施形態では、液状試薬2a,2
b,2c,2dを塗布するために図3および図4に示す
ようなフェルトペン状の試薬塗布具3を用いた。
In this embodiment, the liquid reagents 2a, 2a
In order to apply b, 2c and 2d, a felt pen-shaped reagent applicator 3 as shown in FIGS. 3 and 4 was used.

【0037】図3において、4は各種アルコールに対し
て耐溶性を有する樹脂や金属等で形成されるケースであ
り、このケース4の絞り込まれた一端にはフェルト等の
浸透性のある材料で形成される芯材5が挿通され、芯材
5の先端部5aは一定幅(例えば、5mm)の直線が引
き易いように所定形状にカットされている。
In FIG. 3, reference numeral 4 denotes a case made of a resin, metal, or the like having resistance to various alcohols. The narrowed end of the case 4 is made of a permeable material such as felt. The core material 5 to be inserted is inserted, and the tip 5a of the core material 5 is cut into a predetermined shape so that a straight line having a constant width (for example, 5 mm) can be easily drawn.

【0038】そして複数本の試薬塗布具3,3・・・
は、例えば1番ペン,2番ペン,3番ペン,4番ペンな
ど区別され、各試薬塗布具3のケース4内にはそれぞれ
上記液状試薬2a,2b,2c,2dの一つが所定量ず
つ充填されている。
The plurality of reagent applicators 3, 3,...
Are classified into, for example, a first pen, a second pen, a third pen, and a fourth pen, and one of the liquid reagents 2a, 2b, 2c, and 2d is provided in the case 4 of each reagent applicator 3 by a predetermined amount. Is filled.

【0039】また、図4に示すように、各試薬塗布具3
には未使用時に試薬の蒸発や漏れを防ぐ気密性のキャッ
プ6が取り付けられるようになっている。なお、図4に
おいては、ケース4は筒状の軸部4aと蓋部4bとから
構成されている。
Further, as shown in FIG.
An airtight cap 6 for preventing evaporation and leakage of the reagent when not in use is provided. In FIG. 4, the case 4 includes a cylindrical shaft portion 4a and a lid portion 4b.

【0040】このようにして構成された例えば1番ペン
〜4番ペンの試薬塗布具3を用いて、図3に示すように
芯材の先端部5aを基板1の周縁部に当接させて、図1
に示すように基板1の4辺に沿って各液状試薬2a,2
b,2c,2dをそれぞれ直線的に塗布する。
Using the reagent applicator 3 of the first to fourth pens, for example, thus configured, the tip 5a of the core material is brought into contact with the peripheral edge of the substrate 1 as shown in FIG. , FIG.
As shown in FIG. 3, each liquid reagent 2a, 2
Each of b, 2c, and 2d is applied linearly.

【0041】図2は、液状試薬の塗布状態を例示するも
のであり、例えばガラス基板1の表面が十分に清浄であ
り活性度が高い場合には(a)に示すように液状試薬は
高い濡れ性を示し比較的幅の広い線状となる。また、ガ
ラス基板1の表面が不純物の付着等によりある程度汚染
されている場合には(b)に示すように若干幅の狭い線
状となり、表面の汚染の程度が大きい場合には、(c)
に示すように試薬は濡れ性が極端に悪くなり水玉状には
じかれる状態となる。
FIG. 2 exemplifies the state of application of the liquid reagent. For example, when the surface of the glass substrate 1 is sufficiently clean and has high activity, the liquid reagent has a high wettability as shown in FIG. It has a relatively wide linear shape. Further, when the surface of the glass substrate 1 is contaminated to some extent due to the adhesion of impurities or the like, it becomes a line having a slightly narrow width as shown in (b), and when the degree of contamination on the surface is large, (c)
As shown in (2), the reagent becomes extremely poor in wettability and repels in a polka dot form.

【0042】このように(c)の如く視覚的に見て明ら
かに濡れ性が悪く、ガラス基板1の表面が不純物等によ
って汚染されていることが明確な場合には、即、ガラス
基板1およびそのガラス基板1を抽出したロットのガラ
ス基板全数を再度洗浄する工程にまわすこととなる。
When the wettability is clearly poor visually as shown in FIG. 4C and it is clear that the surface of the glass substrate 1 is contaminated by impurities or the like, the glass substrate 1 The process is transferred to the step of cleaning again all the glass substrates of the lot from which the glass substrate 1 has been extracted.

【0043】一方、上記(a),(b)のように視覚に
よる判定が微妙な場合にはノギスやマイクロメータ等の
測定器具を用いて、各液状試薬2a,2b,2c,2d
について線幅を精密に測定する。
On the other hand, when the visual judgment is delicate as in (a) and (b) above, each liquid reagent 2a, 2b, 2c, 2d is measured using a measuring instrument such as a caliper or a micrometer.
The line width is precisely measured for.

【0044】そして、その測定結果に基づいて、例えば
液状試薬2a(メタノール)の線幅が4.8〜5mmの
範囲内、液状試薬2b(エタノール)の線幅が4.5〜
5mmの範囲内、液状試薬2c(プロパノール)の線幅
が4.2〜5mmの範囲内、液状試薬2d(ブタノー
ル)の線幅が4〜5mmの範囲内である場合等にはガラ
ス基板1は十分に清浄で活性度が高いと判定してガラス
基板を次の工程に送ることができる。
Based on the measurement results, for example, the line width of the liquid reagent 2a (methanol) is in the range of 4.8 to 5 mm, and the line width of the liquid reagent 2b (ethanol) is 4.5 to 5 mm.
When the line width of the liquid reagent 2c (propanol) is in the range of 4.2 to 5 mm, and the line width of the liquid reagent 2d (butanol) is in the range of 4 to 5 mm, the glass substrate 1 The glass substrate can be sent to the next step after judging that the activity is sufficiently clean and high.

【0045】また、例えば液状試薬2a(メタノール)
の線幅が4.8mm未満、液状試薬2b(エタノール)
の線幅が4.5mm未満、液状試薬2c(プロパノー
ル)の線幅が4.2mm未満、液状試薬2d(ブタノー
ル)の線幅が4mm未満である場合等には、ガラス基板
1の表面が不純物等によって汚染されていると判定して
そのガラス基板1を抽出したロットのガラス基板全数を
再度洗浄する工程にまわすこととなる。
Further, for example, the liquid reagent 2a (methanol)
Is less than 4.8 mm, liquid reagent 2b (ethanol)
Is less than 4.5 mm, the liquid reagent 2c (propanol) has a line width of less than 4.2 mm, and the liquid reagent 2d (butanol) has a line width of less than 4 mm. It is determined that the glass substrate 1 has been contaminated, and the process returns to the step of cleaning all the glass substrates of the lot from which the glass substrate 1 has been extracted.

【0046】なお、上記例では、測定器具により手動的
に液状試薬の塗布領域の幅を測定する場合について述べ
たが、これに代えて、例えば各液状試薬2a,2b,2
c,2dの塗布状態をCCDカメラ等で撮影し、その撮
影により得られる画像データについてマイクロコンピュ
ータ等の演算装置により所定の演算処理を施して所定領
域に対応する画像データを二値データ化するなどの加工
をして、画像の明暗等から各液状試薬の塗布領域の線幅
や面積を算出し、その線幅値あるいは面積値を予め設定
した値と比較し、その設定値を上回っている場合にはガ
ラス基板1は濡れ性が高く清浄であると判定し、下回っ
ている場合には濡れ性が低く汚染されていると判定する
ようにすることも可能である。
In the above example, the case where the width of the liquid reagent application area is manually measured by the measuring instrument has been described. However, instead of this, for example, each of the liquid reagents 2a, 2b, 2
The application state of c and 2d is photographed by a CCD camera or the like, and image data obtained by the photographing is subjected to a predetermined arithmetic processing by an arithmetic device such as a microcomputer to convert image data corresponding to a predetermined area into binary data. Calculate the line width and area of the application area of each liquid reagent from the brightness of the image, etc., compare the line width value or area value with a preset value, and exceed the set value It is also possible to judge that the glass substrate 1 has high wettability and is clean, and to judge that the glass substrate 1 is low and has low wettability and is contaminated.

【0047】このような場合には、ガラス基板1の搬送
ラインに上記CCDカメラ等を配置することにより、本
発明に係る基板の濡れ性判定方法を製造工程の一環とし
て自動的に行うシステムを構築することができ、液晶パ
ネル等の生産性や歩留りを一層向上させることが期待で
きる。
In such a case, by arranging the CCD camera or the like on the transfer line of the glass substrate 1, a system for automatically performing the substrate wettability determination method according to the present invention as part of the manufacturing process is constructed. It is expected that the productivity and yield of liquid crystal panels and the like can be further improved.

【0048】また、本実施形態ではガラス基板の濡れ性
を判定する場合について述べたがこれに限定されるもの
ではなくシリコン基板やGaAs基板等の半導体基板の
濡れ性を判定する場合にも同様にして適用することがで
きる。
In this embodiment, the case where the wettability of the glass substrate is determined has been described. However, the present invention is not limited to this, and the same applies to the case where the wettability of a semiconductor substrate such as a silicon substrate or a GaAs substrate is determined. Can be applied.

【0049】また、液状試薬に所定色の染料を添加して
着色することにより、塗布領域の線幅や面積の測定を行
い易くすることもできる。
Further, by adding a dye of a predetermined color to the liquid reagent and coloring the liquid reagent, the line width and area of the application area can be easily measured.

【0050】また、本実施形態ではガラス基板の周縁部
に試薬を塗布する場合について説明したがこれに限定さ
れるものではなく、基板の所定部位に例えば複数種類の
試薬塗布具3(例えば2番ペンと3番ペンなど)を並べ
て一度に塗布するようにして、濡れ性の判定に要する時
間を短縮することも可能である。
In this embodiment, the case where the reagent is applied to the peripheral portion of the glass substrate has been described. However, the present invention is not limited to this. For example, a plurality of types of reagent application tools 3 (for example, the second It is also possible to shorten the time required for determining wettability by arranging and applying the pens and the third pen at the same time.

【0051】[0051]

【発明の効果】以上説明したように、本発明に係る基板
の濡れ性判定方法は、基板の一部に付着張力の異なるn
種類(nは1以上の整数)の液状試薬を塗布する塗布過
程と、上記基板上における各液状試薬の付着程度を測定
する測定過程と、上記測定過程において測定された液状
試薬の付着程度に基づいて基板の濡れ性の良否を判定す
る判定過程とを少なくとも有するようにしたので、n種
類の液状試薬の付着程度を対比観察することにより基板
の濡れ性を正確且つ短時間で判定することが可能とな
る。
As described above, the method for judging the wettability of a substrate according to the present invention provides a method for judging the wettability of n on a part of the substrate.
A coating step of applying a liquid reagent of a kind (n is an integer of 1 or more), a measuring step of measuring the degree of adhesion of each liquid reagent on the substrate, and a measuring step of measuring the degree of adhesion of the liquid reagent measured in the measuring step. The wetness of the substrate can be determined accurately and in a short time by comparing and observing the degree of adhesion of the n kinds of liquid reagents. Becomes

【0052】また、上記液状試薬は、分子量の異なる一
価または多価のアルコールで構成することができ、この
ような液状試薬を用いる場合には、塗布後にシリコン基
板やガラス基板に不純物が残ることを回避することがで
き、製品の信頼性等に影響を及ぼすことがないという効
果がある。
The liquid reagent can be composed of a monohydric or polyhydric alcohol having a different molecular weight. When such a liquid reagent is used, impurities remain on a silicon substrate or a glass substrate after coating. Can be avoided, and there is an effect that the reliability and the like of the product are not affected.

【0053】さらに、上記測定過程は、光学系を介して
得られる上記各液状試薬の塗布膜の塗布状況を示す画像
データを解析して各液状試薬の付着領域の幅あるいは付
着面積を測定し、上記判定過程は、上記各液状試薬の付
着領域の幅あるいは付着面積を予め設定した所定値と比
較して基板の濡れ性の良否を判定するようにでき、この
場合には生産性を一層向上させることができるという効
果がある。
Further, in the measuring step, the width or the area of the adhering region of each liquid reagent is measured by analyzing image data indicating the coating state of the liquid reagent obtained through the optical system. In the above-mentioned determination step, the quality or wettability of the substrate can be determined by comparing the width or the area of the adhesion area of each of the liquid reagents with a predetermined value set in advance. In this case, the productivity is further improved. There is an effect that can be.

【0054】また、上記基板の濡れ性判定方法に用いら
れる試薬塗布具を、付着張力の異なるn種類(nは1以
上の整数)の液状試薬の一つをそれぞれ封入したn種類
(例えば1番目からn番目まで)のフェルトペンで構成
することができ、このような試薬塗布具によれば、再度
の基板洗浄や焼成処理の要否の判定を製造ラインの現場
で簡便に行うことができるという効果がある。
The reagent applicator used in the above-described method for determining the wettability of a substrate is composed of n kinds of liquid reagents (n is an integer of 1 or more) having different adhesion tensions. To n-th) felt pen, and with such a reagent applicator, it is possible to easily determine the necessity of another substrate cleaning or baking treatment at the site of the production line. effective.

【図面の簡単な説明】[Brief description of the drawings]

【図1】基板への液体試薬の塗布状態を示す概略図であ
る。
FIG. 1 is a schematic view showing a state in which a liquid reagent is applied to a substrate.

【図2】基板に塗布された液体試薬の塗布状態を示す説
明図である。
FIG. 2 is an explanatory diagram showing an application state of a liquid reagent applied to a substrate.

【図3】本実施形態に用いられる試薬塗布具の構成例お
よび使用状態を示す概略図である。
FIG. 3 is a schematic diagram illustrating a configuration example and a use state of a reagent applicator used in the present embodiment.

【図4】本実施形態に用いられる試薬塗布具の構成例を
示す概略図である。
FIG. 4 is a schematic diagram illustrating a configuration example of a reagent applicator used in the present embodiment.

【図5】液体試薬の塗布後の断面状態の例を示す説明図
である。
FIG. 5 is an explanatory diagram showing an example of a cross-sectional state after application of a liquid reagent.

【符号の説明】[Explanation of symbols]

1 ガラス基板 2a〜2b 液状試薬 3 試薬塗布具 4 ケース 5 芯材 6 キャップ DESCRIPTION OF SYMBOLS 1 Glass substrate 2a-2b Liquid reagent 3 Reagent applicator 4 Case 5 Core material 6 Cap

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】基板の一部に付着張力の異なるn種類(n
は1以上の整数)の液状試薬を塗布する塗布過程と、 上記基板上における各液状試薬の塗布膜の付着程度を測
定する測定過程と、 上記測定過程において測定された液状試薬の付着程度に
基づいて基板の濡れ性の良否を判定する判定過程と、 を少なくとも有することを特徴とする基板の濡れ性判定
方法。
1. A method according to claim 1, wherein a part of the substrate has n kinds (n) having different adhesion tensions.
Is an integer of 1 or more), a measuring step of measuring the degree of adhesion of the coating film of each liquid reagent on the substrate, and a degree of adhesion of the liquid reagent measured in the measuring step. A determining step of determining whether the wettability of the substrate is good or not, and a method of determining wettability of the substrate.
【請求項2】上記液状試薬は、分子量の異なる一価また
は多価のアルコールで構成されることを特徴とする請求
項1記載の基板の濡れ性判定方法。
2. The method according to claim 1, wherein the liquid reagent is composed of a monohydric or polyhydric alcohol having a different molecular weight.
【請求項3】上記測定過程は、光学系を介して得られる
上記各液状試薬の塗布膜の塗布状況を示す画像データを
解析して各液状試薬の付着領域の幅あるいは付着面積を
測定し、 上記判定過程は、上記各液状試薬の付着領域の幅あるい
は付着面積を予め設定した所定値と比較して基板の濡れ
性の良否を判定することを特徴とする請求項1または請
求項2に記載の基板の濡れ性判定方法。
3. The method according to claim 1, wherein the measuring step comprises: analyzing image data indicating a coating state of the coating film of each of the liquid reagents obtained via an optical system to measure a width or an adhesion area of each liquid reagent. 3. The method according to claim 1, wherein the determining step determines whether the wettability of the substrate is good or not by comparing a width or an adhering area of the adhering region of each of the liquid reagents with a predetermined value set in advance. Method for determining wettability of substrate.
【請求項4】付着張力の異なるn種類(nは1以上の整
数)の液状試薬の一つをそれぞれ封入したn種類のフェ
ルトペンで構成されることを特徴とする請求項1から請
求項3の何れかに記載の基板の濡れ性判定方法に用いら
れる試薬塗布具。
4. A method according to claim 1, wherein said felt pen comprises n kinds of felt pens each enclosing one of n kinds of liquid reagents having different adhesion tensions (n is an integer of 1 or more). A reagent applicator used in the method for determining wettability of a substrate according to any one of the above.
【請求項5】上記各フェルトペンに封入される液状試薬
は、各々分子量の異なる一価または多価のアルコールの
うちの一つで構成されることを特徴とする請求項4記載
の試薬塗布具。
5. The reagent applicator according to claim 4, wherein the liquid reagent sealed in each of the felt pens is made of one of monohydric or polyhydric alcohols having different molecular weights. .
【請求項6】基板上に薄膜をパターニングしてなる液晶
装置の製造方法において、 上記基板の一部に付着張力の異なるn種類(nは1以上
の整数)の液状試薬を塗布する塗布過程と、 上記基板上における各液状試薬の塗布膜の付着程度を測
定する測定過程と、 上記測定過程において測定された液状試薬の付着程度に
基づいて基板の濡れ性の良否を判定する判定過程と、 を少なくとも有することを特徴とする液晶装置の製造方
法。
6. A method for manufacturing a liquid crystal device, comprising patterning a thin film on a substrate, comprising: a coating step of coating n types (n is an integer of 1 or more) of liquid reagents having different adhesion tensions on a part of the substrate; A measuring step of measuring the degree of adhesion of the coating film of each liquid reagent on the substrate, and a determining step of determining whether the wettability of the substrate is good or not based on the degree of adhesion of the liquid reagent measured in the measuring step. A method for manufacturing a liquid crystal device, comprising at least:
JP10272097A 1998-09-25 1998-09-25 Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method Withdrawn JP2000097835A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10272097A JP2000097835A (en) 1998-09-25 1998-09-25 Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10272097A JP2000097835A (en) 1998-09-25 1998-09-25 Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method

Publications (1)

Publication Number Publication Date
JP2000097835A true JP2000097835A (en) 2000-04-07

Family

ID=17509047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10272097A Withdrawn JP2000097835A (en) 1998-09-25 1998-09-25 Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method

Country Status (1)

Country Link
JP (1) JP2000097835A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008021690A (en) * 2006-07-11 2008-01-31 Hitachi Ltd Patterning device, and organic thin film transistor and process for fabricating the same
JP2012208075A (en) * 2011-03-30 2012-10-25 SAW&SPR−Tech有限会社 Measuring method of contact angle on solid surface and system therefor
WO2023106737A1 (en) * 2021-12-10 2023-06-15 주식회사 엘지에너지솔루션 Surface energy measurement device for metal foil, and measurement method using same
WO2024024665A1 (en) * 2022-07-27 2024-02-01 株式会社Uacj Wettability evaluation method and wettability evaluation device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008021690A (en) * 2006-07-11 2008-01-31 Hitachi Ltd Patterning device, and organic thin film transistor and process for fabricating the same
JP2012208075A (en) * 2011-03-30 2012-10-25 SAW&SPR−Tech有限会社 Measuring method of contact angle on solid surface and system therefor
WO2023106737A1 (en) * 2021-12-10 2023-06-15 주식회사 엘지에너지솔루션 Surface energy measurement device for metal foil, and measurement method using same
WO2024024665A1 (en) * 2022-07-27 2024-02-01 株式会社Uacj Wettability evaluation method and wettability evaluation device

Similar Documents

Publication Publication Date Title
KR930000873B1 (en) Integrated semiconductor structure with incorporated alignment markings
KR100894129B1 (en) Display panel having marks for visual inspection and manufacturing method therefor
KR20020041212A (en) Manufacturing Process of Liquid Crystal Cell for a Small Size Liquid Crystal Display Device
TW586149B (en) Graytone mask producing method
EP1987367B1 (en) Sensor element, device and method for inspecting a printed conductor structure, production method for sensor element
US5756885A (en) Method for determining the cleanliness of a surface
JPH11119232A (en) Applicator for coating sealant
US9481114B2 (en) Imprint method
JP2000097835A (en) Wettability determination method of substrate and manufacture of test applicator and liquid crystal device used in determination method
CN109029309A (en) The method that a kind of pair of line width measuring machine is calibrated
CN101063817B (en) Resist for printing and patterning method using the same
CN106707392B (en) Colored filter and its thicknesses of layers measurement method
US7375789B2 (en) Liquid crystal shutter and manufacturing method thereof
JP4520224B2 (en) Method and apparatus for applying sealant to liquid crystal panel
JPH11295755A (en) Method for inspecting wiring board and manufacture of liquid crystal device
KR101375852B1 (en) Liquid crystal display device
WO2013086913A1 (en) Detection method for space imaging overlay and array substrate
KR101670678B1 (en) Flat panel display and method manufacturing the same
US6275056B1 (en) Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof
KR101539676B1 (en) Contact angle measuring method
JP2004351261A (en) Coater and coating method
KR100800323B1 (en) Align inspection apparatus for laminating apparatus of substrates
CN113091662B (en) Self-supporting multi-material coating thickness standard suite and preparation method thereof
JP2004020203A (en) Film thickness measuring method and apparatus therefor
JP2008180661A (en) Apparatus and method for inspecting electronic device

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20060110