JP2000055923A - Specimen-carrying device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To efficiently carry a number of specimens by coping with troubles caused by wetting the specimens, and by furthermore improving treatment capability. SOLUTION: In a specimen-carrying device, a number of specimens being dipped into a sample are successively and continuously carried from a first stop part 20A to a second stop part 20B. At a carrying section part 20C between the first and second stop parts 20A and 20B, recessed and projecting rails 22 and 22 where a recessed part 22a is alternately arranged is provided to arrange each of specimens A1-A8 in parallel at intervals with a specific pitch. Also, the device is provided with a pinching mechanism with a pinching part 23a that can simultaneously pinch and release the specimens A1-A8, a mechanism such as a rotary cam 25 and a rise and fall cam 26 being operated by alternately repeating pitching and releasing operation with the pinching mechanism, and a mechanism such as a swing arm that is connected with the rotary cam 25 or the like and allows the entire pinching mechanism to be subjected to reciprocation by one pitch along a carrier direction F.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test strip transporting apparatus for transporting a large number of wet test strips in a urine test, blood test, or the like to a test section or the like sequentially and continuously.

[0002]

2. Description of the Related Art Conventionally, test strips used in urine tests, blood tests, and the like are, as is well known, elongated strips having a large number of different types of reagent pads bonded to the surface thereof.

[0003] In such an apparatus for continuously testing using test pieces, each test piece is immersed one by one in each sample collected from a large number of people, and after a predetermined reaction time, each test piece is immersed. Inspection results are obtained by photometrically measuring the reagent pad. This type of continuous inspection apparatus is provided with a test strip transport device that sequentially transports a large number of test strips to the inspection unit sequentially. .

For example, there is a conventional test piece transport apparatus in which test pieces which are immersed in a sample and are wet are moved one by one in a lateral direction. In the apparatus, the wet test piece is transported while sliding on the transport member.

[0005] In addition, there is another type of test piece transporting apparatus in which one test piece is conveyed while being lifted while one end thereof is sandwiched. In such a holding type test piece transporting apparatus, The test pieces are sequentially transferred to the inspection section one by one, and the next test piece is in a standby state at a predetermined position until the operation of transporting one test piece is completed.

[0006]

However, according to the above-described conventional moving apparatus for transporting test pieces, a large number of wet test pieces are transported while sliding on the transport member. Samples such as urine dripped from a piece contaminate and contaminate the transport member, and samples from the already transported test piece adhere to the transport member, and the sample is then absorbed by the transported test piece. Could carry over and cause contamination. Further, if such a contamination situation becomes more severe, the operation of the transport member that transports the test piece is hindered, and a transport error may occur.

[0007] On the other hand, according to the above-described conventional gripping type test piece transporting apparatus, since the test piece is transported in a lifted state, various problems caused by the wetness of the test piece as described above are caused. However, since the transport operation for the next test piece cannot be started until the transport operation for one test piece is completed, a large number of test pieces are continuously transported within a given time. The processing capacity of the apparatus itself was limited, and the test piece could not be efficiently transported.

The present invention has been conceived in view of the above circumstances, and addresses various problems caused by wetness of a test piece, and further improves the processing capacity by increasing the number of sheets. It is an object of the present invention to provide a test piece transport device capable of efficiently transporting a test piece.

[0009]

DISCLOSURE OF THE INVENTION In order to solve the above problems, the present invention employs the following technical means.

[0010] That is, the test piece transport apparatus provided by the present invention transfers a large number of test pieces immersed in a sample to the first.
A test piece transporting device for transporting the test piece from the first stopping portion to the second stopping portion sequentially and continuously from the first stopping portion to the second stopping portion.
Over a transport section extending over the stop portion, a transport section secured to arrange a predetermined number of the test pieces at a predetermined pitch interval, and a plurality of test pieces arranged in parallel at a predetermined pitch interval in the transport section. Lift it across one end,
And a transport mechanism that repeatedly performs an operation of moving down and releasing after moving forward by one pitch.

In the test piece transporting apparatus provided by the present invention in which the above technical means are taken, a predetermined number of test pieces arranged in parallel at a predetermined pitch interval in a transport section portion are simultaneously lifted and lifted by one pitch. The test pieces are conveyed every minute, and the test piece is sequentially and continuously conveyed continuously by repeating such a conveying operation.

Therefore, according to the test piece transport apparatus provided by the present invention, a predetermined number of test pieces are transported one pitch at a time while being pinched and lifted, so that the transport mechanism for directly transporting the test pieces is itself a test piece. Thus, various problems caused by the wetness of the test piece can be dealt with without being stained by the sample adhered to the sample, and problems such as carry-over contamination and transport error can be solved. In addition, since a plurality of test pieces are continuously and continuously transported continuously, the processing capability of the apparatus itself, which continuously transports a large number of test pieces within a given time, is maximized. Thus, a large number of test pieces can be efficiently transported.

In a preferred embodiment, the transport mechanism includes a pinch mechanism capable of pinching one end of a plurality of test pieces, lifting and lowering and releasing the pinched state, and a pinch mechanism of the pinch mechanism. A reciprocating mechanism that repeats the operation, and a reciprocating mechanism that moves the pinching mechanism forward by one pitch in a test piece lifting state and retreats by one pitch in a test piece releasing state while interlocking with the repeating operation mechanism. It can be provided with a configuration.

According to such a configuration, a repetitive operation of simultaneously pinching or releasing a plurality of test pieces by the pinching mechanism is realized by the repetitive operation mechanism, and the test piece is lifted and released by the pinching mechanism. Since the corresponding forward and backward operations are realized by the reciprocating mechanism, it is possible to more specifically realize the operation of the transport mechanism that requires a complicated movement to simultaneously transport a plurality of test pieces.

In another preferred embodiment, the sandwiching mechanism includes a casing member adjacent to the transport section and variably provided in the transport direction, and both ends supported by the casing member. A rod provided in a long axis shape along the direction, and cantilevered by the rod, and arranged in a comb-tooth shape at the same pitch interval relative to one end of a predetermined number of test pieces in the transport section. The surface pinch that can be opened and closed on the surface of one end of each test piece by opening and closing the rod with the fulcrum, and A back-side sandwiching portion that is cantilevered by the rod and that can open and close with the rod as a fulcrum and that can be brought into contact with and separated from the one-side back surface of each test piece.

According to such a configuration, the front and rear sandwiching portions, which are arranged in a comb-tooth shape in accordance with each other, are in close contact with one end of each test piece in a closed state, and in an open state. Both pinches, which are disengaged from one end of each test piece and perform such an operation, are reciprocated along the transport direction integrally with the casing member. In other words, the operation of pinching and separating the test pieces of the pinching mechanism and the operation of reciprocating in the transport direction can be performed while correlating with each other. The operation of the pinch mechanism requiring movement can be more specifically realized.

Further, as another preferred embodiment,
The front-side holding portion is urged by a downward gentle elastic force in a predetermined steady state in a natural state, and the rear-side holding portion is separated from the front-side holding portion in a natural state by a predetermined distance. It can be configured to be urged by a gentle downward elastic force in a steady posture.

According to such a configuration, the sandwiching portions for the front surface and the back surface are separated from each other while being biased by a gentle downward elastic force in a predetermined steady state in a natural state. By simply pushing the two clamps upward against the gentle elasticity from the natural state, one end of the test piece is sandwiched between the two clamps so that the two clamps are in close contact, and the plurality of test specimens can be securely held. Can be lifted.

Further, as another preferred embodiment, the repetitive operation mechanism includes a rotating shaft that rotates in a fixed direction by a torque from a power unit, a rotating shaft fixed to the rotating shaft, and the rotating shaft. A rotating cam having a contour shape in which the distance from the rotating cam is not constant, and is driven in contact with the contour of the rotating cam, and is moved up and down in contact with a lower portion of the pinching portion in the pinching mechanism, and the pinching portion is alternately repeated. And a lifting / lowering cam that operates in a vertical direction.

According to such a configuration, the rotating cam rotates integrally with the rotating shaft that rotates in a fixed direction, and the lifting cam moves up and down following the rotating cam. Is operated in the up and down direction, so that the rotary movement can be skillfully converted into a linear movement along the up and down direction, and the operation of the repetitive operation mechanism that requires a complicated movement to operate the pinching portion of the pinching mechanism. It can be realized more specifically.

In still another preferred embodiment, the rotating cam has a substantially quarter-circular contour,
The elevating cam may be configured to complete an elevating movement for one cycle every time the rotating cam makes one rotation.

According to such a configuration, each time the rotating cam integrated with the rotating shaft makes one rotation, the elevating cam completes the elevating movement of one cycle by the rotating cam. Since the pinching / separating operation by the pinching portion of the mechanism makes a round, intermittent movement of the pinching mechanism of repeatedly pinching / separating can be systematically realized based on the rotational motion.

Further, as another preferred embodiment, the reciprocating mechanism is interlocked with the rotating shaft of the repetitive operating mechanism and rotates around the rotating axis;
A swing arm that guides the orbiting pin into the elongated hole, swings in a metronome shape in conjunction with the orbiting pin, and reciprocates in the transport direction in a state where the entire pinching mechanism is pushed out. be able to.

According to such a configuration, the swing arm swings along the transport direction in a state in which the orbiting pin is guided around the rotation axis while the orbiting pin is guided to the elongated hole, and the movement of the swing arm is controlled. Since the entire pinching mechanism is reciprocated in response, the rotary motion can be skillfully converted into a reciprocating motion along the transport direction, and a complicated movement is required to reciprocate the entire pinching mechanism with a constant moving amount. The operation of the reciprocating mechanism can be more specifically realized.

Further, as another preferred embodiment, the swing arm can complete the swing motion for one cycle every time the orbiting pin makes one rotation.

According to such a configuration, each time the orbiting pin that orbits around the rotation axis makes one revolution, the swing motion for one cycle by the swing arm is completed, that is, the rotation axis of the repetitive operation mechanism makes one revolution. Since the entire pinching mechanism makes one reciprocation each time, the constant movement of the pinching mechanism, which repeatedly reciprocates, can be systematically realized based on the rotational motion, and the movements of the reciprocating mechanism and the repetitive operation mechanism are mutually correlated. Can be linked with good coordination.

In still another preferred embodiment, the transport section has a rail-like recess along the transport direction for recessing the test pieces at predetermined pitch intervals. can do.

According to such a configuration, when the test pieces are simultaneously released by the transport mechanism, the test pieces are aligned in the concave portions in the transport section and are arranged in parallel at a predetermined pitch interval. A plurality of test pieces can be juxtaposed in a state of being accurately arranged before and after.

In still another preferred embodiment, the second stopping portion is an inspection portion for inspecting the test piece, and the inspection is provided in front of the second stopping portion in the transport direction. A configuration may be adopted in which a disposal port for discarding the finished test piece downward is opened.

According to such a configuration, the first and the second
When a predetermined number of test pieces are arranged side by side in the transfer section including the stop portion, a plurality of test pieces are simultaneously transferred one pitch forward in the transfer direction by the transfer mechanism.
Since one test piece that has been inspected at the stop part is discarded through the waste port, a large number of test pieces are sequentially
The test pieces that have been inspected can be sequentially and automatically discarded at the same time as they are transported to the inspection section, which is the stop section.

Other features and advantages of the present invention will become more apparent from the detailed description given below with reference to the accompanying drawings.

[0032]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be specifically described below with reference to the drawings.

FIG. 1 is a schematic perspective view showing one embodiment of a test piece transport device according to the present invention from the front side, and FIG.
FIG. 2 is a schematic perspective view showing the test piece transport device shown in FIG. 1 from the rear side, and the test piece transport device shown in these drawings is:
It is incorporated in a continuous inspection apparatus that sequentially and sequentially inspects a large number of test pieces immersed in a specimen such as urine.

As schematically shown in FIG. 1 and FIG. 2, the continuous inspection apparatus has a test piece introduction section 10, a test piece transport section 20, and a test piece photometry section 30 in each section.
The test piece transport device according to the present invention is incorporated exclusively as a device configuring the test piece transport unit 20. In describing the test piece transport device according to the present invention,
In order to make the configuration and operation clearer, the configuration and operation of the entire continuous inspection apparatus will be described below.
Further, the operation of the entire continuous inspection apparatus is controlled by a microcomputer, but since the microcomputer itself is generally known to be generally applied to this type of apparatus, its configuration and control operation are as follows. Description is omitted.

The test piece introducing section 10 is a section where the test pieces immersed in the sample and wetted are guided one by one to the test piece transporting section 20. The slide rail 11 to be placed and placed, and the test piece transport unit 2 in contact with the long side of the test piece on the slide rail 11
It is schematically configured to include a slide member 12 that slides to the 0 side, a slide operation mechanism 13 that slides the slide member 12 along the slide rail 11, and the like.

The test piece transporting section 20 is a section for sequentially transporting a predetermined number of test pieces to the test piece photometric section 30 in a state where the test pieces are simultaneously held apart from each other. A first stopping portion 20A for temporarily stopping the test piece, a second stopping portion 20B for holding one test piece to be inspected by the test piece photometric unit 30,
From the first stop 20A to the transfer section including the second stop 20B, the transfer of the transfer section 20C and the transfer of the second stop 20B ensured to arrange a predetermined number of test pieces at predetermined pitch intervals. It is schematically configured to have a disposal unit 20D for discarding a test piece that has been inspected in the front of the direction in detail. The test piece transporting section 20 having such details has a first stopping section 20 as a specific configuration.
At A, concave portions are alternately provided in order to place a predetermined number of test pieces at a predetermined pitch interval in the transport section 20C in the state of being in contact with the long side of one test piece and exhibiting a hygroscopic action. A pair of concave and convex rails 22, 22 provided in the transport section 20C, and a number of pinches 23a, which can simultaneously pinch and separate a predetermined number of test pieces arranged in parallel at a predetermined pitch interval in the transport section 20C. Although not shown in FIGS. 1 and 2, the pinching mechanism 23
And a reciprocating mechanism for reciprocating the entire pinching mechanism 23 by a fixed amount along the transport direction while interlocking with the repetitive operating mechanism. It is configured.

The test piece photometry section 30 is a section for performing an optical treatment on the test piece stopped at the second stop section 20B of the test piece transport section 20, and this test piece photometry section 30 Carriage 3 holding substrate 31 incorporating a light receiving element and a light emitting element slidably on second stop 20B
And a belt drive mechanism 33 for intermittently moving the carriage 32 stepwise by belt drive.

FIG. 3 is a perspective view showing a main part of the test piece introducing section 10 shown in FIGS. 1 and 2 from a front side, and FIG. 4 is a view showing a peripheral part of the test piece introducing section 10 from a rear side. FIG. 2 is a perspective view of a main part, and as is well shown in these figures, from the test piece introduction section 10 to the test piece transport section 20, a test piece A
Saucer member 4 for receiving samples such as urine dripping from
0 is provided. Test piece introduction part 1 of saucer member 40
A pair of slide rails 11, 11 are provided in the inside corresponding to 0 along the transport direction F. Saucer member 4
Both end portions corresponding to the test piece transport unit 20 of 0 are formed as a pair of uneven rails 22 and 22 parallel to each other. A moisture absorbing member 21 is provided at an intermediate portion of the tray member 40 that transitions from the test piece introduction section 10 to the test piece transport section 20 and is in a posture orthogonal to the transport direction F and in contact with the long side of the test piece A. . In such a saucer member 40, the test piece A
Is in contact with the moisture absorbing member 21 is the first stopping portion 20A,
The topmost portion of the uneven rails 22 is the second stopping portion 20.
B, a portion where the uneven rails 22 and 22 are provided as a whole is a transport section 20C, and a portion which is greatly opened adjacent to the foremost portion of the uneven rails 22 and 22 is a disposal portion 20D. .

The slide member 12 slides from the state shown in FIGS. 3 and 4 along the slide rails 11 and 11 toward the moisture absorbing member 21. In other words, the slide member 12 slides along the transport direction F while one test piece A is placed on the slide rails 11, so that one test piece A While being pushed out and sliding on the slide rails 11, 11, the slide rails 11 are finally stopped while being pressed against the moisture absorbing member 21.

As shown in FIG. 4, the slide operation mechanism 13 converts a rotary motion into a reciprocating motion, and is similar to a crank lever mechanism. That is, the slide member 12 is slidable along the slide rod 12a in a state of being cantilevered by the slide rod 12a along the transport direction F. Then, the slide operation mechanism 13 transmits the rotational motion of the rotary shaft 13a, which rotates in a certain direction by a torque from a motor (not shown), to the lever 13d as a reciprocating rotary motion at a certain angle via the crank 13b and the connecting rod 13c. The lever 13d reciprocates around its base end as a fulcrum, and is connected to the guide hole 12b of the slide member 12 so that its front end is guided vertically.
That is, each time the rotation shaft 13a makes one rotation, the lever 13
d completes one cycle of reciprocating rotation,
The operation in which the slide member 12 reciprocates while sliding on the slide rails 11, 11 is also completed for each rotation of the rotating shaft 13a.

The hygroscopic member 21 is made of a material having high hygroscopicity with respect to an aqueous substance such as a specimen, for example, a ceramic porous resin obtained by sintering polyethylene, a polymer absorber, or a sponge-like or brush-like material. It is formed using a synthetic resin. The moisture absorbing member 21 is formed in an elongated rectangular shape having substantially the same length as the long side of the test piece A. One test piece slid on the slide rails 11, 11 It is in a state of being temporarily stopped by abutting on one side surface along the longitudinal direction. An extra sample such as urine is sucked from the test piece into the moisture absorbing member 21 itself, but when the moisture absorbing action of the moisture absorbing member 21 is weakened, the whole unit can be replaced with another new moisture absorbing member. I have.

As described above, the uneven rails 22, 22 are formed by processing both ends of the saucer member 40 parallel to each other into an uneven shape.
The recesses 22a for alternately placing a predetermined number of test pieces A at predetermined pitch intervals are formed in each of the test pieces A. In the present embodiment, as an example, a maximum of seven test pieces can be set in each recess 22a of the uneven rails 22 and 22, and if the first stopping part 20A is included, a total of eight test pieces are provided as a predetermined number. Of test pieces can be arranged in parallel at a predetermined pitch. In other words, the transport section 20C extending from the first stopping section 20A to the second stopping section 20B is secured with a sufficient section distance so that about several test pieces are arranged at predetermined pitch intervals. Further, the discarding portion 20D adjacent to the uneven rails 22 and 22 is provided as a discarding opening larger than the vertical dimension of the test piece A, and the second stopping portion 20D is provided.
The test pieces that have been inspected in B are collected as used test pieces in an apparatus (not shown) through the waste port.

FIG. 5 shows the clamping mechanism 2 shown in FIG. 1 and FIG.
FIG. 6 is a perspective view of a main part of the peripheral part 3 shown from the front side, and FIG. 6 is a perspective view of a main part of the peripheral part showing the peripheral part from the back side. Pinching mechanism 23
Are generally configured to include a casing member 23b, a rod 23c, and front and back side sandwiching portions 23d, 23e, etc. incorporated as sandwiching portions 23a, etc. The casing member 23b is provided adjacent to one of the above-mentioned uneven rails 22 (not shown) so as to be movable along the transport direction F. The rod 23c is arranged in a long axis shape along the transport direction F with both ends supported inside the casing member 23b. Surface sandwiching part 2
3d are cantilevered by a rod 23c, as shown in FIG.
2a are arranged in a comb shape at a predetermined pitch interval with respect to one end of a test piece (not shown) fixed to the rod 23a.
The opening / closing operation is performed with c as a fulcrum, so that it can be brought into contact with and separated from one end surface of each test piece. The rear sandwiching portions 23e are cantilevered by a rod 23c in a state of being arranged in a comb shape in conformity with the front sandwiching portions 23d.
The opening / closing operation is performed with the 3c as a fulcrum. As shown in FIG. 6, each surface sandwiching portion 23 d is formed in a protruding end shape whose tip is suitable for holding one end surface of the test piece. On the other hand, each of the sandwiching portions 23e for the back surface is formed in a V-shaped cross section suitable for holding one back surface of one end of the test piece. It is integrated while being joined to the member 23f.

More specifically, the surface sandwiching portion 23d
Is maintained in a substantially horizontal steady state in a natural state, and is urged by an elastic body such as a leaf spring (not shown) with a downward gentle elastic force. On the other hand, the sandwiching portion 23e for the back surface
Is maintained in a steady state in an inclined state separated from the surface sandwiching portion 23d in a natural state, and is in a state of being urged by an elastic body such as a coil spring (not shown) with a downward gentle elastic force. That is, when the front-side and rear-side sandwiching portions 23d and 23e are separated from one end of the test piece, an upward load is not applied as an external force, and the holding portions 23d and 23e are in a vertically open state separated from each other. On the other hand, in the case where the front and rear sandwich portions 23d and 23e sandwich one end of the test piece, an upward load is applied to the rear sandwich portion 23e from below by a repetitive operation mechanism described later, and the rear sandwich portion is formed. 23e comes into close contact with the front sandwiching portion 23d against the gentle elasticity, and when an upward load is further applied, the front and rear sandwiching portions 23d, 23d are provided.
In a state where e is closely integrated, it is lifted further above its close position. In this manner, the entire pinching mechanism 23 that performs the pinching / separating operation is reciprocated by a fixed amount along the transport direction F by a reciprocating mechanism described below.

The repetitive operation mechanism is shared with the slide operation mechanism 13 as shown in FIGS.
A rotating shaft 13a that rotates in a fixed direction by the torque from the motor 24, a rotating cam 25 that rotates while being fixed to the rotating shaft 13a, and has a contour shape in which the distance from the rotating shaft 13a is not constant; It is provided with an elevating cam 26 which is driven in contact with the contour, moves up and down in contact with a lower portion of the backside sandwiching portion 23e, and alternately repeats the entire backside sandwiching portion 23e in the up and down direction. It is schematically configured. The torque of the motor 24 is transmitted to the rotating shaft 13a via the reduction gear box 24a and the gear trains 24b and 24c.
A crank 13b of the slide operation mechanism 13 (not shown) is fixed to one end of the rotating shaft 13a, and a rotating cam 25 is fixed to the other end of the rotating shaft 13a. The rotating cam 25 is formed into a smooth fan shape having a substantially quarter-circular outline shape, and is connected to the lifting cam 26 through an opening 26a whose entire outline can be easily accommodated. The extending portion 26b extending above the elevating cam 26 is connected to the lower surface of the base member 23f integrated with the holding portion 23e for the back surface. In other words, each time the rotating shaft 13a makes one rotation, the rotating cam 25 makes one rotation, and the extension portion 26b of the elevating cam 26 moves up and down following the rotating cam 25, and accordingly the pinching mechanism 2
The pinching and separating operation by the pinching portion 23a is activated.

As shown in FIG. 5, the reciprocating mechanism is fixed to a predetermined position of a rotary cam 25 that rotates integrally with the rotary shaft 13a, and a revolving pin 27 that rotates around the rotary shaft 13a. And a swing arm 28 that swings in a metronome shape in conjunction with the orbiting pin 27 and that reciprocates in the transport direction F so as to push out the entire holding mechanism 23. The orbiting pin 27 has a long hole 2 formed in the swing arm 28.
8a. On the other hand, a base end portion 28b of the swing arm 28 is rotatably supported at a predetermined position in the apparatus, so that a distal end portion (not shown) of the swing arm 28 swings largely in the transport direction F. ing. The distal end portion of the swing arm 28 is configured to contact and press two front and rear portions along the transport direction F in the casing member 23b of the sandwiching mechanism 23. That is, each time the rotation shaft 13a makes one revolution, the orbiting pin 27 makes one revolution, and the
, The swing arm 28 also swings, and accordingly, the entire pinching mechanism 23 makes one reciprocation with a constant movement amount corresponding to the swing width of the swing arm 28.

FIG. 7 is a perspective view of a main part of the test piece photometer 30 shown in FIGS. 1 and 2 from the front side, and FIG. FIGS. 4A and 4B are main part side views showing the state, and as is well shown in these figures, a test piece photometric unit 30 includes a second stop unit 2 (not shown).
An optical system 30A that performs an optical treatment on the test piece stopped at 0B, and a drive system 30 that slides the entire optical system 30A along the long side direction of the test piece (not shown).
B. In this optical system 30A, a substrate 31 incorporating a light-receiving element and a light-emitting element described later is provided.
Are integrated with the carriage 32. On the other hand, drive system 3
In 0B, the carriage 32 itself is slidable along the parallel rod 34 by the driving force of the belt driving mechanism 33.

FIG. 9 is a perspective view showing the entirety of the optical system 30A shown in FIGS. 7 and 8, and FIG. 10 is a perspective view showing the optical system 30A shown in FIG. 30A is an exploded perspective view showing each component of 30A in an exploded manner,
As shown in these figures, the optical system 30A includes a substrate 31,
A carriage body 32a and its accessory parts 32b, 32c;
A plurality of light emitting elements 35 for reflection used as irradiation means for reflection, a light receiving element 36 mainly used as light receiving means for reflection, and transparent protection for protecting the light emitting element 35 for reflection and the light receiving element 36, respectively. Covers 37, 38,
Further, a back-side illuminating component 39 having a built-in transmission light emitting element (not shown) used as a transmitting irradiation unit is provided.

The board 31 and the carriage main body 32a are connected to a belt drive mechanism 33 shown in FIGS. 7 and 8 via an accessory 32b in an integrated state.
It is slidably supported by the parallel rods 34, 34 shown in FIGS. 7 and 8 via the attachment part 32c and the insertion hole 32d. The light-emitting elements for reflection 35 shown in FIG.
For example, LEDs that emit light of different specific wavelengths
And is used to irradiate the test piece with light from above the surface of the test piece to which a pad exhibiting a color reaction is attached. In the present embodiment, as an example, nine reflective light emitting elements 35... Having different wavelengths are arranged in a circumferential shape, and three of them are respectively RGB.
It is supposed to emit light having a wavelength corresponding to the color. The reflection light-emitting elements 35 are approximately 120 for each same wavelength.
They are arranged with a central angle of degrees and irradiate light with different phases for the same wavelength. That is, for example, the light emitting elements for reflection 35 are RGB
In this order.

Further, the light receiving element 36 is, for example, a photodiode, and is mainly used for receiving light emitted from the reflecting light emitting elements 35 and reflected by the pads on the surface of the test piece. The light receiving element 36 is arranged at the center of the light emitting element group 35 for reflection arranged in a circumferential shape. Note that a shielding member 36a for blocking light is provided between the light emitting element 35 for reflection and the light receiving element 36 so that the light emitted from the light emitting element 35 for reflection 35 does not directly reach the light receiving element 36. I have. Based on the light receiving level of the reflected light received by such a light receiving element 36,
A microcomputer detects a reaction level based on the color of the pad on the surface of the test piece, and the microcomputer outputs the reaction level to a printer or monitor as digital information expressed numerically.

On the other hand, the transmission light-emitting element (not shown) built in the back-side irradiation component 39 is, for example, the reflection light-emitting element 3.
5 is an LED of the same type as that used to irradiate light from the back side of the test piece to guide transmitted light from the back side of the test piece to the light receiving element 36. The light emitted from the light-emitting element for transmission of the back-side illuminating component 39 passes through the back surface of the test piece and is received by the light-receiving element 36. Based on the light receiving level of the transmitted light obtained by the light receiving element 36, the microcomputer specifies the position where the pad is attached on the surface of the test piece and vertically attaches the pad on the surface of the test piece. Recognize the sticking pattern of the worn pad. The light emitting element for reflection 35 as described above ...
The lighting of the transmission light-emitting element is controlled by the microcomputer when the entire optical system 30A is scanned and moved relative to the test piece by sliding.

Next, the operation of the continuous inspection apparatus having the above configuration will be described in detail with reference to the drawings. In starting the apparatus, a user picks up wet test pieces immersed in a sample such as urine, and places the test pieces one by one on a side of the slide member 12 at a predetermined timing. To be placed on the slide rails 11 to be moved.

First, as shown in FIGS. 1 to 4, in the test piece introducing section 10, one test piece placed on the slide rails 11, 11 is pushed out by the slide member 12 in the transport direction. Slide along F.

When the slide member 12 is moved to the maximum position, the test pieces on the slide rails 11, 11 are brought into contact with the moisture absorbing member 21 at their long sides at the first stopping portion 20A. The state is temporarily stopped.

At this time, since the test piece is brought into contact with the hygroscopic member 21, a sample such as urine extraly attached to the test piece is effectively sucked by the hygroscopic member 21,
While such contact is maintained, the excess sample is sufficiently removed from the test strip.

After the test piece comes into contact with the moisture absorbing member 21, the slide member 12 is returned to the original position by the slide operation mechanism 13, and the reciprocating motion of the slide member 12 is as shown in FIG. It is performed each time the rotating shaft 13a of the illustrated slide operation mechanism 13 makes one rotation.

Subsequently, the test piece stopped in the first stopping portion 20A is moved by the pinching mechanism 23 to the uneven rails 22, 22.
The test piece photometric unit 30 is sequentially placed on the concave portion 22a of the
It is sent to.

FIGS. 11 to 15 are explanatory views for explaining the operation of the pinching mechanism 23 shown in FIGS. 1 and 2. First, as shown in FIG. In the first and second stops 20A, 2
As an example, eight test pieces A1 to A8 are arranged in parallel at a predetermined pitch interval over the entire transport section 20C including 0B. At this time, the slide rail 1 of the first stop 20A
Except for the test piece A1 stopped on the test pieces 1 and 11, the other test pieces A2 to A8 are in a state where they are fixed in the concave portions 22a (not shown in FIG. 11) of the uneven rails 22 and 22 in the transport section 20C. ing. Further, each of the holding portions 23a of the holding mechanism 23 is located opposite to one end of each of the test pieces A1 to A8, and the holding portions 23d and 23e for the front surface and the back surface are separated from each other and open.

In the first stage shown in FIG. 12, the rotating shaft 13a makes a substantially 1/4 turn clockwise from the state shown in FIG. The elevating cam 26 is displaced upward accordingly. Then, the sandwiching portion 23a of the sandwiching mechanism 23 is pushed up as a whole with the rod 23c as a fulcrum, and the sandwiching portions 23d and 23e for the front surface and the back surface are in close contact with each other and closed. That is, the sandwiching portion 23a of the sandwiching mechanism 23 is in a state where one end of each of the test pieces A1 to A8 is simultaneously sandwiched and lifted. Thereby, all of the test pieces A1 stopped on the slide rails 11 and 11 of the first stopping portion 20A and the test pieces A2 to A8 placed in the concave portions 22a of the uneven rails 22 and 22 are moved from that position. It is in a state of being temporarily lifted upward. On the other hand, the swing arm 28 is in an intermediate position from a position in which the swing arm 28 is tilted toward the first stopping portion 20A to a position in which the swing arm 28 is tilted toward the second stopping portion 20B. The entire pinching mechanism 23 shown in FIG. It is maintained at the same position as in FIG. 11 without being pushed out.

Subsequently, as shown in FIG. 13, when the rotating shaft 13a further rotates approximately ４ clockwise, the rotating cam 2 is rotated.
5 also makes approximately 1/4 turn, but at this time, the elevating cam 26 is maintained at the same position as in FIG. Therefore, the test pieces A1 to A8 are:
It is still in a state of being lifted upward. On the other hand, the swing arm 28 changes from the posture in which it falls to the first stopping portion 20A side to a position in which it is almost completely inclined to the second stopping portion 20B side, whereby the whole pinching mechanism 23 becomes parallel test pieces A1 to A8. Is moved in the forward direction by one pitch. In other words, each of the test pieces A1 to A8 is moved to a position advanced by one pitch while being lifted by the holding portion 23a of the holding mechanism 23.

Subsequently, as shown in FIG. 14, when the rotating shaft 13a rotates approximately １ ／ clockwise, the rotating cam 2 is rotated.
5 rotates approximately 1/4, and the elevating cam 26 is displaced downward accordingly. In other words, the pinching portion 23a of the pinching mechanism 23 is entirely pulled down with the rod 23c as a fulcrum, and the pinching portions 23 for the front surface and the back surface are set.
As in the state shown in FIG. 11, d and 23e are separated from each other and open. That is, the pinching portion 23a of the pinching mechanism 23
Is the test piece A transferred to the position advanced by one pitch
Release one end of 1 to A8. At this time, the test specimens indicated by reference numerals A1 to A7 are moved from the holding portion 23a of the holding mechanism 23 to the concave portions 22a of the uneven rails 22, 22 at that position, but the test piece A8 located in the front row is When the pinch mechanism 23 is released from the pinch portion 23a of the pinch mechanism 23 at that position, the pinch unit 23 falls down and is discarded through the discard unit 20D that is a discard port. On the other hand, the swing arm 28
As in the state shown in FIG. 7, the posture is almost completely tilted down to the second stopping portion 20B side.
The whole 3 is maintained at the same position as in FIG. 13 without being pushed out by the swing arm 28.

Finally, as shown in FIG. 15, when the rotating shaft 13a further rotates approximately 1/4 clockwise, the rotating cam 25 also rotates approximately 1/4.
This is a state where the rotary cam 25 is maintained at the same position as in FIG. 14 according to the contour shape. Therefore, the remaining test pieces A1 to A7 in which the front row is discarded continue to have the uneven rails 22,
22 is set in the recess 22a. On the other hand, the swing arm 28 is moved from the state shown in FIG.
, And the pinch mechanism 23 slides by one pitch in the retreating direction in reverse to the preceding advancing operation. As a result, the whole operation of the pinching mechanism 23 has completed one cycle, and all the operating mechanisms are returned to the original initial state again. By repeating such a series of operations, a large number of test pieces are successively and continuously conveyed from the first stopping part 20A to the disposal part 20 through the second stopping part 20B. You.

At some point during the above-described transport operation, one test piece parked in the second parking section 20B is subjected to optical treatment.

Referring to FIG. 7 to FIG.
When the test piece A is stopped at the second stopping portion 20B, the entire optical system 30A is slid along the long side direction of the test piece A via the drive system 30B.

At this time, the light-emitting elements 35 for reflection, which are the main components of the optical system 30A, are alternately turned on and off at the same wavelength, whereby the light reflected on the surface of the test piece A is received by the light-receiving element 36. Is done.

The microcomputer detects a reaction level for each pad on the surface of the test piece A based on the light reception level of the reflected light obtained in this manner. Optical system 30 for detection
When A slides, light is emitted from the back side of the test piece A by controlling the lighting of a transmission light emitting element (not shown) built in the back irradiation component 39.

The light emitted from the light emitting element for transmission passes through the test piece and is received by the light receiving element 36. The microcomputer changes the light receiving level from the light receiving element 36 to the reflected light or the light at a timing according to the lighting control. It is taken in as a received light signal while distinguishing each transmitted light.

When the signal indicating the light receiving level is taken into the microcomputer, the microcomputer sets the test piece A based on the light receiving level based on the transmitted light.
The position of the pad on the surface of the test piece A is specified, and the sticking pattern of the pad vertically arranged on the surface of the test piece A is recognized.

Finally, the microcomputer responds to each pad attachment position specified based on the transmitted light,
The light receiving level of the reflected light obtained from the light receiving element 36 is extracted, and the light receiving level based on the reflected light is detected as a reaction level at the pad. The detected reaction level is output to a printer or monitor as digital information expressed numerically.

That is, when the position where the pad is attached is specified by using the transmitted light, the light receiving level of the transmitted light is emphasized by the thickness of the pad. The light intensity is not averaged due to the influence, and the sticking position of the pad is clearly specified according to the light receiving level of such transmitted light.

The microcomputer also recognizes the pad attachment pattern from the result of specifying the position of the pad. Based on the recognition result of the attachment pattern, the microcomputer prepares various types according to the inspection items. While determining the type of the test piece A, the response level of the pad according to the type is output.

Therefore, according to the apparatus having the above configuration and operation, a predetermined number of test pieces are transported in the transport section 20C while being lifted while being sandwiched by the sandwiching mechanism 23, so that the test piece is directly transported. The mechanism 23 itself is not contaminated by a sample such as urine attached to the test piece, and various problems caused by wetness of the test piece are dealt with, and problems such as carry-over contamination and transport error can be solved. .

Further, by repeatedly and alternately repeating the operation of sandwiching and moving the predetermined number of test pieces and the operation of moving the test pieces, a large number of test pieces are successively and continuously conveyed without interruption. The processing capability of the apparatus itself for continuously transporting a large number of test pieces into the inside of the apparatus is maximized, so that a large number of test pieces can be transported efficiently.

The rotating cam 25 rotates integrally with the rotating shaft 13a which rotates in a certain direction.
The vertical movement of the elevating cam 26 causes the pinching portion 23a of the pinching mechanism 23 to move in the vertical direction, so that the rotary motion can be skillfully converted into a linear motion along the vertical direction. The operation of the repetitive operation mechanism that requires a complicated movement to operate the pinching portion 23a of the 23 can be more specifically realized.

Furthermore, since the pinching operation by the pinching portion 23a of the pinching mechanism 23 makes one round each time the rotating shaft 13a makes one rotation, the intermittent movement of the pinching mechanism 23, which is repeatedly pinched and separated, is planned based on the rotational motion. Can be realized. In addition, the rotating shaft 13a is
Is used also as a drive shaft for swinging the shaft, and further, as a drive shaft for sliding the slide member 12, so that each mechanism can be interlocked with good coordination for each rotation of the rotation shaft 13a. .

[Brief description of the drawings]

FIG. 1 is a schematic perspective view showing one embodiment of a test piece transport device according to the present invention from the front side.

FIG. 2 is a schematic perspective view showing the test piece transport device shown in FIG. 1 from the back side.

FIG. 3 is a perspective view of a main part showing a main part around a test piece introduction part shown in FIGS. 1 and 2 from the front side.

FIG. 4 is a perspective view of a principal part showing a principal part around a test piece introduction part shown in FIGS. 1 and 2 from the back side.

FIG. 5 is a perspective view of a main part of the pinch mechanism shown in FIG. 1 and FIG.

FIG. 6 is a perspective view of a main part of the pinch mechanism shown in FIG. 1 and FIG.

FIG. 7 is a perspective view of a main part of a peripheral portion of a test piece photometer shown in FIGS. 1 and 2 viewed from the front side.

FIG. 8 is a side view of a main part of the test piece photometer shown in FIGS. 1 and 2 when viewed from the X direction.

FIG. 9 is a perspective view of a main part showing the entire optical system shown in FIGS. 7 and 8;

FIG. 10 is an exploded perspective view showing components of the optical system shown in FIG. 9 in an exploded manner.

FIG. 11 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 12 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 13 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 14 is an explanatory diagram for explaining the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 15 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 10 Test piece introduction part 11 Slide rail 12 Slide member 13 Slide operation mechanism 13a Rotating shaft 20 Test piece conveyance part 20A 1st stop part 20B 2nd stop part 20C Conveyance section part 20D Discard part 21 Hygroscopic member 22 Uneven rail 22a Concave part Reference Signs List 23 pinching mechanism 23a pinching section 23b casing member 23c rod 23d pinching section for front surface 23e pinching section for back surface 25 rotating cam 26 elevating cam 27 circling pin 28 swing arm 30 test piece photometering section 31 substrate 32 carriage 33 belt drive mechanism 34 parallel Rod 35 Light-emitting element for reflection 36 Light-receiving element 39 Back-side illuminated part A, A1-A8 Test piece

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[Procedure amendment]

[Submission date] July 26, 1999 (1999.7.2)
6)

[Procedure amendment 1]

[Document name to be amended] Statement

[Correction target item name] 0047

[Correction method] Change

[Correction contents]

FIG. 7 is a perspective view of a main part of the test piece photometer 30 shown in FIGS. 1 and 2 from the front side, and FIG. It is a principal part side view showing the state seen from the direction, and, as is often shown in these figures, the test piece photometry unit 30 is configured so that the test piece stopped at the second stop part 20B (not shown). An optical system 30A for performing an optical treatment and a drive system 30B for sliding the entire optical system 30A along a long side direction of a test piece (not shown) are roughly divided. In the optical system 30A, a substrate 31 incorporating a light receiving element and a light emitting element described later is integrated with a carriage 32. On the other hand, in the drive system 30B, the carriage 32 itself can be slid along the parallel rod 34 by the driving force of the belt drive mechanism 33.

[Procedure amendment 2]

[Document name to be amended] Statement

[Correction target item name] 0050

[Correction method] Change

[Correction contents]

Further, the light receiving element 36 is, for example, a photodiode, and is mainly used for receiving light emitted from the reflecting light emitting elements 35 and reflected by the pads on the surface of the test piece. The light receiving element 36 is arranged at the center of the reflective light emitting elements 35 arranged circumferentially. Note that a shielding member 36a for blocking light is provided between the light emitting element 35 for reflection and the light receiving element 36 so that the light emitted from the light emitting element 35 for reflection 35 does not directly reach the light receiving element 36. I have. Based on the light receiving level of the reflected light received by the light receiving element 36, a microcomputer detects a reaction level based on the color of the pad on the surface of the test piece, and the microcomputer calculates the reaction level as a numerical value. The digital information is output to a printer or monitor as digital information expressed in a typical manner.

[Procedure amendment 3]

[Document name to be amended] Statement

[Correction target item name] 0062

[Correction method] Change

[Correction contents]

Finally, as shown in FIG. 15, when the rotating shaft 13a further rotates approximately 1/4 clockwise, the rotating cam 25 also rotates approximately 1/4.
This is a state where the rotary cam 25 is maintained at the same position as in FIG. 14 according to the contour shape. Therefore, the remaining test pieces A1 to A7 in which the front row is discarded continue to have the uneven rails 22,
22 is set in the recess 22a. On the other hand, the swing arm 28 is moved from the state shown in FIG.
, And the pinch mechanism 23 slides by one pitch in the retreating direction in reverse to the preceding advancing operation. As a result, the whole operation of the pinching mechanism 23 has completed one cycle, and all the operating mechanisms are returned to the original initial state again. By repeating such a series of operations, a large number of test pieces are continuously and continuously transported from the first stopping part 20A to the disposal part 20D through the second stopping part 20B. You.

[Procedure amendment 4]

[Document name to be amended] Statement

[Correction target item name] Fig. 8

[Correction method] Change

[Correction contents]

8 is a side view of a main part of the test piece photometer shown in FIGS. 1 and 2 as viewed from the X direction in FIG. 7; FIG.

[Procedure amendment 5]

[Document name to be amended] Drawing

[Correction target item name] Fig. 1

[Correction method] Change

[Correction contents]

FIG.

[Procedure amendment 6]

[Document name to be amended] Drawing

[Correction target item name] Figure 2

[Correction method] Change

[Correction contents]

FIG. 2

[Procedure amendment 7]

[Document name to be amended] Drawing

[Correction target item name] Figure 3

[Correction method] Change

[Correction contents]

FIG. 3

[Procedure amendment 8]

[Document name to be amended] Drawing

[Correction target item name] Fig. 4

[Correction method] Change

[Correction contents]

FIG. 4

[Procedure amendment 9]

[Document name to be amended] Drawing

[Correction target item name] Fig. 9

[Correction method] Change

[Correction contents]

FIG. 9

Claims (10)

[Claims] 1. A method in which a large number of test pieces immersed in a sample
A test piece conveying apparatus for sequentially and continuously conveying the test pieces from the stop portion to the second stop portion, wherein a predetermined number of the test pieces is transferred over a transfer section extending from the first stop portion to the second stop portion. A transport section secured for parallel arrangement at a predetermined pitch interval, and one end of each of a plurality of test pieces arranged in parallel at a predetermined pitch interval in the transport section section, lifted up, and further advanced by one pitch, A transport mechanism for repeatedly performing an operation of holding down and releasing the test piece, comprising: 2. The method according to claim 1, wherein the transport mechanism is configured to repeatedly perform an operation of nipping one end of the plurality of test pieces, an operation of lifting, lowering, and releasing the nipped state, and an operation of the nipping mechanism. A reciprocating mechanism, wherein the reciprocating mechanism is configured to move forward by one pitch in a test piece lifting state and to retreat by one pitch in a test piece releasing state while being interlocked with the repetitive motion mechanism. The test piece transport device according to claim 1, wherein 3. A casing member, which is provided adjacent to the transport section and variably provided in the transport direction, is supported at both ends by the casing member, and has a long-axis shape along the transport direction. A plurality of test pieces in the transport section are arranged in a comb shape at the same pitch interval with respect to one end of a predetermined number of test pieces, and the rod is opened and closed with the rod as a fulcrum. A surface sandwiching portion that can be brought into contact with and separated from one end surface of each test piece, and is cantilevered by the rod in a state of being arranged in a comb-tooth shape in conformity with the surface sandwiching portion; The test piece transporting device according to claim 2, further comprising: a holding portion for a back surface that can be opened and closed with the rod as a fulcrum so as to be able to contact and separate from the back surface at one end of each test piece. 4. The front-side sandwiching portion is urged by a downward gentle elastic force in a predetermined steady state in a natural state, and the back-side sandwiching portion is in the natural state, the front-side sandwiching portion. The test piece transport device according to claim 3, wherein the test piece transport device is urged by a downward gentle elastic force in a predetermined steady posture separated from the main body. 5. The repetitive operation mechanism comprises: a rotating shaft that rotates in a fixed direction by a torque from a power unit; and a contour shape that rotates while being fixed to the rotating shaft and whose distance from the rotating shaft is not constant. A rotating cam having a rotating cam that follows and contacts the contour of the rotating cam, moves up and down in contact with a lower portion of the holding portion in the holding mechanism, and operates the holding portion alternately in the vertical direction. The test piece transporting device according to any one of claims 2 to 4, comprising: 6. The rotating cam has a substantially quarter-circular contour, and the lifting cam completes one period of lifting movement each time the rotating cam makes one rotation. 2. The test piece transport device according to claim 1. 7. The reciprocating mechanism is interlocked with the rotating shaft of the repetitive operating mechanism, and a revolving pin that revolves around the revolving axis, guides the revolving pin to a long hole, and interlocks with the revolving pin. 7. The test piece transport device according to claim 5, further comprising: a swing arm that swings in a metronome shape and reciprocates in a transport direction in a state where the entire sandwiching mechanism is pushed out. 8. 8. The test piece transport apparatus according to claim 7, wherein the swing arm completes one cycle of the swing motion each time the orbiting pin makes one rotation. 9. The transfer section according to claim 1, wherein a concave portion for positioning the test pieces at a predetermined pitch interval is provided in a rail shape along the transfer direction. The test piece conveying device as described in the above. 10. The second stopping part is an inspection part for inspecting the test piece, and the test part after the inspection is discarded downward in the transport direction forward of the second stopping part. The test piece transporting device according to any one of claims 1 to 9, wherein a waste port is opened.