JP3002824B1 - Test piece cleaning equipment - Google Patents

Abstract

Abstract: PROBLEM TO BE SOLVED: To eliminate the need for power-mechanical equipment, to improve maintainability, to make handling easier, and to reduce the size of the entire apparatus. SOLUTION: When a test piece immersed in a sample is transported from a test piece introducing section 10 to a test piece photometry section 30, a test piece washing apparatus for removing an excess sample attached to the test piece. In the first stopping portion 20A on the way from the test piece introducing section 10 to the test piece photometric section 30, the length of the test piece is set in a state where the moisture absorbing member 21 made of a non-woven fabric having a high hygroscopic property is accommodated in the cassette case 21a. It is arranged so that it can contact the side.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test piece cleaning apparatus for removing an excess sample from a test piece immersed in a sample such as urine or blood and conveyed in a wet state.

[0002]

2. Description of the Related Art Conventionally, test strips used in urine tests, blood tests, and the like are, as is well known, elongated strips having a large number of different types of reagent pads bonded to the surface thereof.

[0003] In such an apparatus for continuously testing using test pieces, each test piece is immersed one by one in each sample collected from a large number of people, and after a predetermined reaction time, each test piece is immersed. The test result is obtained by measuring the reagent pad at the same time, and this type of continuous inspection device has a surplus part attached to the test piece when a large number of test pieces are successively and continuously transported to the test section. A test strip cleaning device is provided for removing the specimen.

For example, a conventional test strip cleaning apparatus is provided with a suction pump, a waste liquid bottle, and the like, and the excess sample attached to the test strip is sucked by the negative pressure effect of the suction pump. The sample sucked in this way is stored in a waste liquid bottle through a tube or the like, and when a certain amount of liquid is accumulated in the waste liquid bottle, the user discards the waste liquid from the waste liquid bottle each time and cleans the waste liquid bottle with water or the like. It is supposed to be attached to the original place again later.

[0005]

However, the above-described conventional test piece cleaning apparatus requires power for operating the suction pump, and has a power-mechanical problem that noise is generated when the pump is operated. Was. In addition, since a sample such as urine adheres to a waste liquid bottle, a tube, or the like and becomes contaminated, there is an inconvenience in terms of maintainability in that the sample must be washed off each time. In addition, since an internal space for installing a pump and a bottle must be secured, there is also a structural problem that the entire apparatus becomes large accordingly.

The present invention has been conceived in view of the above circumstances, and eliminates power mechanical equipment.
It is an object of the present invention to provide a test strip cleaning apparatus which can improve the maintainability, make the handling more convenient, and reduce the size of the entire apparatus.

[0007]

DISCLOSURE OF THE INVENTION In order to solve the above problems, the present invention employs the following technical means.

[0008] That is, the test piece cleaning apparatus provided by the present invention removes an excess sample attached to the test piece when the test piece immersed in the sample is transported from the introduction section to the inspection section. A test piece washing apparatus, characterized in that a member having high hygroscopicity is arranged in a part of the way from the introduction section to the inspection section so as to be in contact with the test piece.

[0009] According to the test piece cleaning apparatus provided by the present invention in which the above technical means are taken, the excess sample adhering to the test piece absorbs moisture by the member having high hygroscopicity which comes into contact with the test piece. Since it is absorbed by the action, the excess sample is statically removed from the test piece without any need for power, and it is not necessary to wash the highly hygroscopic member itself in terms of maintenance,
Handling can be convenient. In addition, since it is only necessary to arrange a member having high hygroscopicity in the middle of the test piece conveyance, it is possible to reduce the size of the entire apparatus without securing an extra installation space or the like.

In a preferred embodiment, the member having high hygroscopicity may be arranged so as to be able to contact the test piece pushed out by sliding movement.

According to such a configuration, the test piece that slides and slides against the highly hygroscopic member comes into contact with the pressed member, so that the hygroscopic action of the highly hygroscopic member due to the contact of the test piece is effective. Thus, the excess sample attached to the test piece can be sufficiently removed.

As another preferred embodiment, the member having high hygroscopicity is made of hygroscopic fiber, porous resin, polymer absorbent, or sponge.

[0013] According to this configuration, since the highly hygroscopic member is made of hygroscopic fiber, porous resin, polymer absorbent, or sponge, the excess sample adhering to the test piece is absorbed by the hygroscopic material. The high-performance member itself can be effectively absorbed. For example, if a nonwoven fabric, which is a kind of hygroscopic fiber, is adopted as a specific material of the highly hygroscopic member, a sufficient amount of the sample can be absorbed in the fiber gap woven by the nonwoven fabric.

Further, as another preferred embodiment,
The member having high hygroscopicity may be configured to be exchangeably disposed at an intermediate position from the introduction section to the inspection section.

According to such a configuration, when the hygroscopic effect of the member having high hygroscopicity is weakened, the member can be replaced with another new member, so that the user only needs to perform a simple replacement operation. Can be maintained, and in terms of maintainability, it can be made more convenient with simple handling.

Further, as another preferred embodiment, the member having high hygroscopicity can be exchanged with the case in a state of being housed in a cassette case.

According to such a configuration, since the member having a high hygroscopic property can be replaced together with the cassette case without touching the member itself that has absorbed the sample such as urine, the sanitary condition can be achieved without soiling the hands with the sample. Can be handled.

[0018] Other features and advantages of the present invention will become more apparent from the detailed description given below with reference to the accompanying drawings.

[0019]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be specifically described below with reference to the drawings.

FIG. 1 is a schematic perspective view showing one embodiment of a test piece cleaning apparatus according to the present invention from the front side, and FIG.
It is the schematic perspective view which showed the test piece cleaning apparatus shown in FIG. 1 from the back side, The test piece cleaning apparatus shown in these figures is:
It is incorporated in a continuous inspection apparatus that sequentially and sequentially inspects a large number of test pieces immersed in a specimen such as urine.

As schematically shown in FIGS. 1 and 2, the continuous inspection apparatus has a test piece introduction section 10, a test piece transport section 20, and a test piece photometry section 30 in each section.
The test piece cleaning device according to the present invention is incorporated exclusively as a device that constitutes the vicinity of the boundary between the test piece introduction section 10 and the test piece transport section 20. In describing the test strip cleaning apparatus according to the present invention, the configuration and operation of the entire continuous inspection apparatus will be described below in order to make the configuration and operation clearer. Further, the operation of the entire continuous inspection apparatus is controlled by a microcomputer, but since the microcomputer itself is generally known to be generally applied to this type of apparatus, its configuration and control operation are as follows. Description is omitted.

The test piece introducing section 10 is a section for guiding the test pieces immersed in the sample and being wet to the test piece transport section 20 one by one. The slide rail 11 to be placed and placed, and the test piece transport unit 2 in contact with the long side of the test piece on the slide rail 11
It is schematically configured to include a slide member 12 that slides to the 0 side, a slide operation mechanism 13 that slides the slide member 12 along the slide rail 11, and the like.

The test piece transport section 20 is a section for sequentially transporting a predetermined number of test pieces to the test piece photometric section 30 in a state where the test pieces are simultaneously sandwiched and separated from each other. A first stopping portion 20A for temporarily stopping the test piece, a second stopping portion 20B for holding one test piece to be inspected by the test piece photometric unit 30,
From the first stop 20A to the transfer section including the second stop 20B, a transfer direction of the transfer section 20C and the second stop 20B secured to arrange a predetermined number of test pieces at equal intervals in parallel. It has a detailed configuration of a disposal unit 20D for discarding a test piece that has been inspected at the front. Test piece transporting section 20 having such details
As a specific configuration, a moisture absorbing member 21 exhibiting a moisture absorbing action in a state of being in contact with the long side of one test piece at the first stopping portion 20A, and a predetermined number of test pieces are transported at the transport section 20C. In order to arrange the test pieces at regular intervals, a pair of concave and convex rails 22 and 22 provided in the transport section 20C having concave portions alternately and a predetermined number of test pieces arranged in parallel at the transport section 20C at the same time. Numerous pinching portions 23a that can be pinched and separated ...
Although not shown in FIGS. 1 and 2, the pinching mechanism 23 has a repetitive operation mechanism that alternately repeats the pinching and separating operation of the pinching mechanism 23, and the entire pinching mechanism 23 in conjunction with the repetitive operation mechanism. And a reciprocating operation mechanism for reciprocating a predetermined distance along the transport direction.

The test piece photometry section 30 is a section for performing optical treatment on the test piece stopped at the second stop section 20B of the test piece transport section 20, and this test piece photometry section 30 Carriage 3 holding substrate 31 incorporating a light receiving element and a light emitting element slidably on second stop 20B
And a belt drive mechanism 33 for intermittently moving the carriage 32 stepwise by belt drive.

FIG. 3 is a perspective view showing a main part of the test piece introducing section 10 shown in FIGS. 1 and 2 from a front side, and FIG. 4 is a rear view showing a main part of the periphery thereof. FIG. 2 is a perspective view of a main part, and as is well shown in these figures, from the test piece introduction section 10 to the test piece transport section 20, a test piece A
Saucer member 4 for receiving samples such as urine dripping from
0 is provided. Test piece introduction part 1 of saucer member 40
A pair of slide rails 11, 11 are provided in the inside corresponding to 0 along the transport direction F. Saucer member 4
Both end portions corresponding to the test piece transport unit 20 of 0 are formed as a pair of uneven rails 22 and 22 parallel to each other. A moisture absorbing member 21 is provided at an intermediate portion of the tray member 40 that transitions from the test piece introduction section 10 to the test piece transport section 20 and is in a posture orthogonal to the transport direction F and in contact with the long side of the test piece A. . In such a saucer member 40, the test piece A
Is in contact with the moisture absorbing member 21 is the first stopping portion 20A,
The topmost portion of the uneven rails 22 is the second stopping portion 20.
B, a portion where the uneven rails 22 and 22 are provided as a whole is a transport section 20C, and a portion which is greatly opened adjacent to the foremost portion of the uneven rails 22 and 22 is a disposal portion 20D. .

The slide member 12 slides from the state shown in FIGS. 3 and 4 along the slide rails 11 and 11 toward the moisture absorbing member 21. In other words, the slide member 12 slides along the transport direction F while one test piece A is placed on the slide rails 11, so that one test piece A While being pushed out and sliding on the slide rails 11, 11, the slide rails 11 are finally stopped while being pressed against the moisture absorbing member 21.

As shown particularly in FIG. 4, the slide operation mechanism 13 converts a rotary motion into a reciprocating motion, and is similar to a crank lever mechanism. That is, the slide member 12 is slidable along the slide rod 12a in a state of being cantilevered by the slide rod 12a along the transport direction F. Then, the slide operation mechanism 13 transmits the rotational motion of the rotary shaft 13a, which rotates in a certain direction by a torque from a motor (not shown), to the lever 13d as a reciprocating rotary motion at a certain angle via the crank 13b and the connecting rod 13c. The lever 13d reciprocates around its base end as a fulcrum, and is connected to the guide hole 12b of the slide member 12 so that its front end is guided vertically.
That is, each time the rotation shaft 13a makes one rotation, the lever 13
d completes one cycle of reciprocating rotation,
The operation in which the slide member 12 reciprocates while sliding on the slide rails 11, 11 is also completed for each rotation of the rotating shaft 13a.

The hygroscopic member 21 is made of a material having a high hygroscopicity with respect to an aqueous substance such as a specimen, for example, a hygroscopic fiber, a porous resin, a polymer absorbent, or a sponge. Specifically, the non-woven fabric, paper,
Examples thereof include filter paper, glass fiber, and cloth. Examples of the porous resin include a sintered body such as polyethylene and polyolefin, and a foamed material such as sponge. In particular, the moisture absorbing member 21
It has been confirmed that, when a nonwoven fabric in which an acrylate-based fiber is mixed with a main material is used, the hygroscopicity becomes extremely high. Such a moisture absorbing member 21 is formed in an elongated rectangular shape having a length substantially equal to the long side of the test piece A, and slides on the slide rails 11.
The test pieces are brought into contact with one side surface of the moisture absorbing member 21 along the longitudinal direction and temporarily stopped.

FIG. 5 is a sectional view of the moisture absorbing member 21 shown in FIG.
FIG. 9 is a cross-sectional view of a main part showing a cross section taken along line XX of FIG.
The intermediate portion 40a of 0 is formed in a groove shape in cross section, and the cassette case 21a is fitted into the intermediate portion 40a. The moisture absorbing member 21 is housed in the cassette case 21a and is exposed to the test piece introduction unit 10 on which the slide rail 11 is formed. When the test piece A comes into contact with such an exposed portion of the moisture absorbing member 21, a surplus sample such as urine is sucked from the test piece by the moisture absorbing member 21 itself, but the moisture absorbing action of the moisture absorbing member 21 is weakened. In this case, the cassette case 21a can be replaced with another new moisture absorbing member. That is, when the moisture absorbing member 21 is replaced, the trough-shaped receiving member 4
It is only necessary to remove the cassette case 21a from the intermediate portion 40a and mount another cassette case 21a already accommodating the moisture absorbing member 21 in the intermediate portion 40a.

As described above, the uneven rails 22, 22 are formed by processing both ends of the saucer member 40 parallel to each other into an uneven shape.
The recesses 22a for alternately placing the plurality of test pieces A at equal intervals are formed in each of the test pieces A. In addition,
In the present embodiment, as an example, the uneven rails 22 and 2 are used.
A maximum of seven test pieces can be set in each of the two concave portions 22a, and a total of eight test pieces as a predetermined number can be arranged at equal intervals by including the first stopping portion 20A. In other words, the transport section 20C extending from the first stopping section 20A to the second stopping section 20B is secured with a sufficient section distance so that about several test pieces are arranged in parallel at equal intervals. Further, the discarded portion 20D adjacent to the uneven rails 22 and 22 is provided as a discard port larger than the vertical dimension of the test piece A, and the test piece which has been inspected at the second stopping portion 20B is The test pieces are collected as used test pieces in a device (not shown) through the waste port.

FIG. 6 shows the pinching mechanism 2 shown in FIGS.
FIG. 7 is a perspective view of a main part of the peripheral part 3 shown from the front side, and FIG. 7 is a perspective view of a main part of the peripheral part shown from the rear side. Pinching mechanism 23
Are generally configured to include a casing member 23b, a rod 23c, and front and back side sandwiching portions 23d, 23e, etc. incorporated as sandwiching portions 23a, etc. The casing member 23b is provided adjacent to one of the above-mentioned uneven rails 22 (not shown) so as to be movable along the transport direction F. The rod 23c is arranged in a long axis shape along the transport direction F with both ends supported inside the casing member 23b. Surface sandwiching part 2
3d are cantilevered by a rod 23c, as shown in FIG.
The test pieces (not shown) are arranged in a comb shape at equal intervals relative to one end of a test piece (not shown) fixed at 2a, and can be opened and closed with the rod 23c as a fulcrum so as to be able to come into contact with and separate from one end surface of each test piece. . The sandwiching portions 23e for the back side are the sandwiching portions 2 for the front surface.
The rods 23 are arranged in a comb-tooth shape in conformity with 3d.
The test piece is cantilevered and supported by the rod 23c, and can be opened and closed with the rod 23c as a fulcrum so as to be able to come in contact with and separate from the back of one end of each test piece (not shown). As shown in FIG. 6, each of the sandwiching portions 23 d for each surface is formed in a protruding end shape suitable for holding one end surface of the test piece. On the other hand, each of the sandwiching portions 23e for the back surface is formed in a V-shaped cross section suitable for holding one end back surface of the test piece. It is integrated while being joined to the member 23f.

More specifically, the sandwiching portion 23d for the front surface
Is maintained in a substantially horizontal steady state in a natural state, and is urged by an elastic body such as a leaf spring (not shown) with a downward gentle elastic force. On the other hand, the sandwiching portion 23e for the back surface
Is maintained in a steady state in an inclined state separated from the surface sandwiching portion 23d in a natural state, and is in a state of being urged by an elastic body such as a coil spring (not shown) with a downward gentle elastic force. That is, when the front-side and rear-side sandwiching portions 23d and 23e are separated from one end of the test piece, an upward load is not applied as an external force, and the holding portions 23d and 23e are in a vertically opened state in which they are separated from each other in a steady posture. On the other hand, in the case where the front and rear sandwiching portions 23d and 23e sandwich one end of the test piece, an upward load is applied to the rear sandwiching portion 23e from below by a repetitive operation mechanism described later, and the rear sandwiching portion 23e. 23e comes into close contact with the front sandwiching portion 23d against the gentle elasticity, and when an upward load is further applied, the front and rear sandwiching portions 23d, 23d are provided.
In a state where e is closely integrated, it is lifted further above its close position. In this manner, the entire pinching mechanism 23 that performs the pinching / separating operation is reciprocated by a fixed amount along the transport direction F by a reciprocating mechanism described below.

As shown in FIGS. 6 and 7, the repetitive operation mechanism is shared with the slide operation mechanism 13,
A rotating shaft 13a that rotates in a fixed direction by the torque from the motor 24, a rotating cam 25 that rotates while being fixed to the rotating shaft 13a, and has a contour shape in which the distance from the rotating shaft 13a is not constant; It is provided with an elevating cam 26 which is driven in contact with the contour, moves up and down in contact with a lower portion of the backside sandwiching portion 23e, and alternately repeats the entire backside sandwiching portion 23e in the up and down direction. It is schematically configured. The torque of the motor 24 is transmitted to the rotating shaft 13a via the reduction gear box 24a and the gear trains 24b and 24c.
A crank 13b of the slide operation mechanism 13 (not shown) is fixed to one end of the rotating shaft 13a, and a rotating cam 25 is fixed to the other end of the rotating shaft 13a. The rotating cam 25 is formed into a smooth fan shape having a substantially quarter-circular outline shape, and is connected to the lifting cam 26 through an opening 26a whose entire outline can be easily accommodated. The extending portion 26b extending above the elevating cam 26 is connected to the lower surface of the base member 23f integrated with the holding portion 23e for the back surface. In other words, each time the rotating shaft 13a makes one rotation, the rotating cam 25 makes one rotation, and the extension portion 26b of the elevating cam 26 moves up and down following the rotating cam 25, and accordingly the pinching mechanism 2
The pinching and separating operation by the pinching portion 23a is activated.

As shown in FIG. 6, the reciprocating mechanism is fixed to a predetermined position of a rotary cam 25 that rotates integrally with the rotary shaft 13a, and a revolving pin 27 that rotates around the rotary shaft 13a. And a swing arm 28 that swings in a metronome shape in conjunction with the orbiting pin 27 and that reciprocates in the transport direction F so as to push out the entire holding mechanism 23. The orbiting pin 27 has a long hole 2 formed in the swing arm 28.
8a. On the other hand, a base end portion 28b of the swing arm 28 is rotatably supported at a predetermined position in the apparatus, so that a distal end portion (not shown) of the swing arm 28 swings largely in the transport direction F. ing. The distal end portion of the swing arm 28 is configured to contact and press two front and rear portions along the transport direction F in the casing member 23b of the sandwiching mechanism 23. That is, each time the rotation shaft 13a makes one revolution, the orbiting pin 27 makes one revolution, and the
, The swing arm 28 also swings, and accordingly, the entire pinching mechanism 23 makes one reciprocation with a constant movement amount corresponding to the swing width of the swing arm 28.

FIG. 8 is a perspective view of the main part of the test piece photometer 30 shown in FIGS. 1 and 2 from the front side, and FIG. It is a principal part side view showing the state seen from the direction, and, as is often shown in these figures, the test piece photometry unit 30 is configured so that the test piece stopped at the second stop part 20B (not shown). An optical system 30A for performing an optical treatment and a drive system 30B for sliding the entire optical system 30A along the long side direction of a test piece (not shown) are roughly divided. In the optical system 30A, a substrate 31 incorporating a light receiving element and a light emitting element described later is integrated with a carriage 32. On the other hand, in the drive system 30B, the carriage 32 itself can be slid along the parallel rod 34 by the driving force of the belt drive mechanism 33.

FIG. 10 shows the optical system 30A shown in FIGS. 8 and 9 in order to describe the optical system 30A in more detail.
11 is an exploded perspective view showing the components of the optical system 30A shown in FIG. 10 in an exploded manner. As shown in these drawings, the optical system 30A Substrate 3
1. Carriage body 32a and its accessory parts 32b, 32
c, a plurality of light-emitting elements 35 for reflection used as irradiation means for reflection, a light-receiving element 36 mainly used as light-receiving means for reflection, a light-emitting element 35 for reflection, and a light-receiving element 3
6, transparent protective covers 37, 3 for protecting each
8 and a back-side illuminating component 39 incorporating a light-emitting element for transmission (not shown) used as an irradiating means for transmission.

The board 31 and the carriage main body 32a are connected to a belt drive mechanism 33 shown in FIGS. 8 and 9 via an accessory 32b in an integrated state.
It is slidably supported by the parallel rods 34 shown in FIGS. 8 and 9 via the accessory 32c and the insertion hole 32d. The light emitting elements for reflection 35 shown in FIG.
For example, LEDs that emit light of different specific wavelengths
And is used to irradiate the test piece with light from above the surface of the test piece to which a pad exhibiting a color reaction is attached. In the present embodiment, as an example, nine reflective light emitting elements 35... Having different wavelengths are arranged in a circumferential shape, and three of them are respectively RGB.
It is supposed to emit light having a wavelength corresponding to the color. The reflection light-emitting elements 35 are approximately 120 for each same wavelength.
They are arranged with a central angle of degrees and irradiate light with different phases for the same wavelength. That is, for example, the light emitting elements for reflection 35 are RGB
In this order.

Further, the light receiving element 36 is, for example, a photodiode, and is mainly used for receiving light emitted from the reflecting light emitting elements 35 and reflected by pads on the surface of the test piece. The light receiving element 36 is arranged at the center of the reflective light emitting elements 35 arranged circumferentially. Note that a shielding member 36a for blocking light is provided between the light emitting element 35 for reflection and the light receiving element 36 so that the light emitted from the light emitting element 35 for reflection 35 does not directly reach the light receiving element 36. I have. Based on the light receiving level of the reflected light received by the light receiving element 36, a microcomputer detects a reaction level based on the color of the pad on the surface of the test piece, and the microcomputer numerically calculates the reaction level. The digital information is output to a printer or monitor as digital information.

On the other hand, a light emitting element for transmission (not shown) built in the backside illumination component 39 is, for example, a light emitting element for reflection 3.
5 is an LED of the same type as that used to irradiate light from the back side of the test piece to guide transmitted light from the back side of the test piece to the light receiving element 36. The light emitted from the light-emitting element for transmission of the back-side illuminating component 39 passes through the back surface of the test piece and is received by the light-receiving element 36. Based on the light receiving level of the transmitted light obtained by the light receiving element 36, the microcomputer specifies the position where the pad is attached on the surface of the test piece and vertically attaches the pad on the surface of the test piece. Recognize the sticking pattern of the worn pad. The light emitting element for reflection 35 as described above ...
The lighting of the transmission light-emitting element is controlled by the microcomputer when the entire optical system 30A is scanned and moved relative to the test piece by sliding.

Next, the operation of the continuous inspection apparatus having the above configuration will be described in detail with reference to the drawings. In starting the apparatus, a user picks up wet test pieces immersed in a sample such as urine, and places the test pieces one by one on a side of the slide member 12 at a predetermined timing. To be placed on the slide rails 11 to be moved.

First, as shown in FIGS. 1 to 4, in the test piece introducing section 10, one test piece placed on the slide rails 11, 11 is pushed out by the slide member 12 in the transport direction. Slide along F.

When the slide member 12 reaches the maximum position, as shown in FIG. 5, the test piece A on the slide rails 11, 11 has its long side at the moisture absorbing member 2 as shown in FIG.
In a state in which the first stop portion 20A is in contact with the first stop portion 20A, the first stop portion 20A temporarily stops.

At this time, since the test piece A is in a state of contact with the moisture absorbing member 21, a sample such as urine extraly attached to the test piece is effectively sucked by the moisture absorbing member 21, and the contact state is not changed. During this time, the excess sample is sufficiently removed from the test piece.

After the test piece comes into contact with the moisture absorbing member 21, the slide member 12 is pulled back to the original position by the slide operation mechanism 13, and the reciprocating motion of the slide member 12 is as shown in FIG. It is performed each time the rotating shaft 13a of the illustrated slide operation mechanism 13 makes one rotation.

Subsequently, the test piece stopped in the first stopping portion 20A is moved by the pinching mechanism 23 to the uneven rails 22, 22.
The test piece photometric unit 30 is sequentially placed on the concave portion 22a of the
It is sent to.

FIGS. 12 to 16 are explanatory views for explaining the operation of the pinching mechanism 23 shown in FIGS. 1 and 2. First, as shown in FIG. In the first and second stops 20A, 2
As an example, eight test pieces A1 to A8 are arranged in parallel at equal intervals over the entire transport section 20C including 0B. At this time, the slide rails 11, 11 of the first stopping portion 20A
Except for the test piece A1 stopped above, each of the other test pieces A2 to A8 is the uneven rail 2 in the transport section 20C.
2 and 22 are set in recesses 22a not shown in FIG. Further, each of the pinching portions 23 of the pinching mechanism 23
“a” is located opposite to one end of each of the test pieces A1 to A8, and the front and rear sandwiching portions 23d and 23e are separated from each other and opened.

In the first stage shown in FIG. 13, the rotating shaft 13a makes approximately 1/4 of a clockwise rotation from the state shown in FIG. The elevating cam 26 is displaced upward accordingly. Then, the sandwiching portion 23a of the sandwiching mechanism 23 is pushed up as a whole with the rod 23c as a fulcrum, and the sandwiching portions 23d and 23e for the front surface and the back surface are in close contact with each other and closed. That is, the sandwiching portion 23a of the sandwiching mechanism 23 is in a state where one end of each of the test pieces A1 to A8 is simultaneously sandwiched and lifted. Thereby, all of the test pieces A1 stopped on the slide rails 11 and 11 of the first stopping portion 20A and the test pieces A2 to A8 placed in the concave portions 22a of the uneven rails 22 and 22 are moved from that position. It is in a state of being temporarily lifted upward. On the other hand, the swing arm 28 is in an intermediate position from a position in which the swing arm 28 is tilted toward the first stopping portion 20A to a position in which the swing arm 28 is tilted toward the second stopping portion 20B, and the entire pinching mechanism 23 shown in FIG. It is maintained at the same position as in FIG. 12 without being pushed out.

Subsequently, as shown in FIG. 14, when the rotating shaft 13a further rotates approximately ４ clockwise, the rotating cam 2 is rotated.
5 also makes approximately 1/4 turn, but at this time, the elevating cam 26 is maintained at the same position as in FIG. Therefore, the test pieces A1 to A8 are:
It is still in a state of being lifted upward. On the other hand, the swing arm 28 changes from the posture in which it falls to the first stopping portion 20A side to a position in which it almost falls down to the second stopping portion 20B side. Slide forward in the forward direction for one interval. That is, each of the test pieces A1 to A8 is
3 while being lifted by the pinching portion 23a, it is moved to a position advanced by one interval.

Subsequently, as shown in FIG. 15, when the rotating shaft 13a rotates approximately １ ／ clockwise, the rotating cam 2 is rotated.
5 rotates approximately 1/4, and the elevating cam 26 is displaced downward accordingly. In other words, the pinching portion 23a of the pinching mechanism 23 is entirely pulled down with the rod 23c as a fulcrum, and the pinching portions 23 for the front surface and the back surface are set.
As shown in FIG. 12, d and 23e are separated from each other and open. That is, the pinching portion 23a of the pinching mechanism 23
Is the test piece A1 transferred to the position advanced by one interval.
Release one end of ~ A8. At this time, the test specimens indicated by reference numerals A1 to A7 are moved from the holding portion 23a of the holding mechanism 23 to the concave portions 22a of the uneven rails 22, 22 at that position, but the test piece A8 located in the front row is When the pinch mechanism 23 is released from the pinch portion 23a of the pinch mechanism 23 at that position, the pinch unit 23 falls down and is discarded through the discard unit 20D that is a discard port. On the other hand, as in the state shown in FIG. 14, the swing arm 28 is kept in an almost completely inclined position toward the second stopping portion 20 </ b> B, whereby the pinching mechanism 23 is held.
The whole is maintained at the same position as in FIG. 14 without being pushed out by the swing arm 28.

Finally, as shown in FIG. 16, when the rotating shaft 13a further rotates approximately 1/4 clockwise, the rotating cam 25 also rotates approximately 1/4.
This is a state where the rotary cam 25 is maintained at the same position as in FIG. 15 according to the contour shape. Therefore, the remaining test pieces A1 to A7 in which the front row is discarded continue to have the uneven rails 22,
22 is set in the recess 22a. On the other hand, the swing arm 28 is moved from the state shown in FIG.
, And the entire pinching mechanism 23 slides in the retreating direction by one interval in the reversing direction, contrary to the preceding forward movement. As a result, the whole operation of the pinching mechanism 23 has completed one cycle, and all the operating mechanisms are returned to the original initial state again. By repeating such a series of operations, a large number of test pieces are continuously and continuously transported from the first stopping part 20A to the disposal part 20D through the second stopping part 20B. You.

At some point in the above-described transport operation, an optical measure is applied to one test piece parked in the second parking section 20B.

Referring to FIG. 8 to FIG.
When the test piece A is stopped at the second stopping portion 20B, the entire optical system 30A is slid along the long side direction of the test piece A via the drive system 30B.

At this time, the light emitting elements 35 for reflection, which are the main components of the optical system 30A, are alternately turned on and off at the same wavelength, whereby the light reflected on the surface of the test piece A is received by the light receiving element 36. Is done.

The microcomputer detects the reaction level for each pad on the surface of the test piece A based on the light reception level of the reflected light obtained in this manner. Optical system 30 for detection
When A slides, light is emitted from the back side of the test piece A by controlling the lighting of a transmission light emitting element (not shown) built in the back irradiation component 39.

The light emitted from the transmitting light emitting element is transmitted through the test piece and received by the light receiving element 36, and the microcomputer changes the light receiving level from the light receiving element 36 to the reflected light or the light at a timing according to the lighting control. It is taken in as a received light signal while distinguishing each transmitted light.

When the signal indicating the light receiving level is taken into the microcomputer, the microcomputer determines the test piece A based on the light receiving level based on the transmitted light.
The position of the pad on the surface of the test piece A is specified, and the sticking pattern of the pad vertically arranged on the surface of the test piece A is recognized.

Finally, the microcomputer determines the position of the pad specified on the basis of the transmitted light,
The light receiving level of the reflected light obtained from the light receiving element 36 is extracted, and the light receiving level based on the reflected light is detected as a reaction level at the pad. The detected reaction level is output to a printer or monitor as digital information expressed numerically.

That is, when the position of the pad to be attached is specified by using the transmitted light, the light receiving level of the transmitted light is emphasized by the thickness of the pad, and the sample of urine or the like attached to the test piece A is detected. The light intensity is not averaged due to the influence, and the sticking position of the pad is clearly specified according to the light receiving level of such transmitted light.

The microcomputer also recognizes the pad attachment pattern from the result of specifying the position of the pad. Based on the recognition result of the attachment pattern, the microcomputer prepares various types according to inspection items. While determining the type of the test piece A, the response level of the pad according to the type is output.

Therefore, according to the apparatus having the above-described configuration and operation, the surplus sample adhering to the test piece is absorbed by the hygroscopic member 21 having high hygroscopicity in contact with the test piece, so that no power is applied. Since the excess sample is statically removed from the test piece without the need for cleaning, and since the moisture absorbing member 21 itself does not need to be washed one by one and only the cassette case 21a needs to be replaced in terms of maintenance, handling Can be made convenient. In addition, the moisture absorbing member 21 is connected to the first stopping portion 20A.
Since it is only necessary to dispose it in the vicinity, it is possible to reduce the size of the entire apparatus without securing an extra installation space or the like.

[Brief description of the drawings]

FIG. 1 is a schematic perspective view showing one embodiment of a test strip cleaning apparatus according to the present invention from the front side.

FIG. 2 is a schematic perspective view showing the test piece cleaning apparatus shown in FIG. 1 from the back side.

FIG. 3 is a perspective view of a main part showing a main part around a test piece introduction part shown in FIGS. 1 and 2 from the front side.

FIG. 4 is a perspective view of a principal part showing a principal part around a test piece introduction part shown in FIGS. 1 and 2 from the back side.

FIG. 5 is a cross-sectional view of a main part showing an XX cross section around the moisture absorbing member shown in FIG. 1;

FIG. 6 is a perspective view of a main part of the pinch mechanism shown in FIG. 1 and FIG.

FIG. 7 is a perspective view of a main part of the pinch mechanism shown in FIG. 1 and FIG.

FIG. 8 is a perspective view of a main part of a test piece photometer shown in FIG. 1 and FIG.

9 is a side view of a principal part showing a state where a principal part around the test piece photometer shown in FIGS. 1 and 2 is viewed from the Y direction in FIG. 8;

FIG. 10 is a perspective view of a main part showing the entire optical system shown in FIGS. 8 and 9;

11 is an exploded perspective view showing components of the optical system shown in FIG. 10 in an exploded manner.

FIG. 12 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 13 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 14 is an explanatory diagram for explaining the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 15 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

FIG. 16 is an explanatory diagram shown to explain the operation of the sandwiching mechanism shown in FIGS. 1 and 2;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 10 Test piece introduction part 11 Slide rail 12 Slide member 13 Slide operation mechanism 13a Rotating axis 20 Test piece conveyance part 20A 1st stop part 20B 2nd stop part 20C Conveyance section part 20D Discard part 21 Hygroscopic member 21a Cassette case 22 Irregularity Rail 22a Recess 23 Pinching mechanism A Test piece

────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-4-109169 (JP, A) JP-A-3-186762 (JP, A) JP-A-7-306210 (JP, A) JP-A-6-106 130067 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB name) G01N 35/00-35/10

Claims (8)

(57) [Claims] 1. A test piece washing apparatus for removing a surplus sample adhered to a test piece when the test piece immersed in the sample is transported from the introduction section to the inspection section, the test piece washing apparatus comprising: A test piece cleaning device, characterized in that a member having high hygroscopicity is arranged in a part of the way to the inspection section so as to be in contact with the test piece. 2. The test piece cleaning apparatus according to claim 1, wherein the member having a high hygroscopic property is arranged so as to be able to contact the test piece pushed out by sliding movement. 3. The test piece cleaning apparatus according to claim 1, wherein the member having a high hygroscopic property is made of a hygroscopic fiber. 4. The test piece cleaning apparatus according to claim 1, wherein the member having a high hygroscopic property is made of a porous resin. 5. The test piece cleaning apparatus according to claim 1, wherein the member having a high hygroscopic property is constituted by a polymer absorber. 6. The test strip cleaning apparatus according to claim 1, wherein the highly hygroscopic member is made of sponge. 7. The test piece cleaning device according to claim 1, wherein the member having a high hygroscopic property is exchangeably disposed at an intermediate position from the introduction section to the inspection section. apparatus. 8. The test piece cleaning apparatus according to claim 1, wherein the member having a high hygroscopicity is housed in a cassette case and is exchangeably disposed with the case. .