JP2000046523A - Measuring equipment - Google Patents

Measuring equipment

Info

Publication number
JP2000046523A
JP2000046523A JP10216032A JP21603298A JP2000046523A JP 2000046523 A JP2000046523 A JP 2000046523A JP 10216032 A JP10216032 A JP 10216032A JP 21603298 A JP21603298 A JP 21603298A JP 2000046523 A JP2000046523 A JP 2000046523A
Authority
JP
Japan
Prior art keywords
undulation
measuring table
measuring
ceramic
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10216032A
Other languages
Japanese (ja)
Inventor
Katsumi Kono
克巳 河野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sokkia Co Ltd
Original Assignee
Sokkia Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sokkia Co Ltd filed Critical Sokkia Co Ltd
Priority to JP10216032A priority Critical patent/JP2000046523A/en
Publication of JP2000046523A publication Critical patent/JP2000046523A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enhance accuracy of measurement by making a planar measuring table for mounting a thin article to be measured of ceramic thereby suppressing undulation of the measuring table. SOLUTION: The measuring equipment 1 comprises a planar ceramic measuring table 2. Fine ceramic having rigidity high enough not to cause deformation through aging, e.g. ceramic for stretch, is preferably employed. A pair of sliding rails 11 are arranged in back forth direction on the left and right of the measuring table 2. A gate type movable bridge 3 sliding on the sliding rails 11 is fixed with CCD camera 4 reciprocal in the left/right direction in order to pick up the image of an article to be measured vertically from above. Since the ceramic measuring table 2 has smaller undulation as compared with an aluminum or glass measuring table and reduce aging, undulation is not required to be regulated by moving a supporting member up and down.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、剛性の小さな薄板
等の被測定物の各所の寸法をCCDカメラ等の光学的手
段を用いて測定する測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring device for measuring the size of various parts of an object to be measured such as a thin rigid plate using optical means such as a CCD camera.

【0002】[0002]

【従来の技術】従来より、露光を繰り返し製作する液晶
基板の場合に一回一回の露光により設計通りにマスクや
基板のパターン寸法が形成されているかを測定するた
め、該マスクや基板のパターンを平板状の測定テーブル
上に載置し、該パターンを上方からCCDカメラで撮像
しながらCCDカメラをX−Y方向に移動させ、CCD
カメラの移動距離からマスクや基板のパターンの各所の
寸法を正確に測定する測定装置が知られている。
2. Description of the Related Art Conventionally, in the case of a liquid crystal substrate which is repeatedly manufactured by exposure, in order to measure whether a pattern size of a mask or a substrate is formed as designed by each exposure, the pattern of the mask or the substrate is measured. Is placed on a flat measurement table, and the CCD camera is moved in the X-Y direction while capturing the pattern with the CCD camera from above.
2. Description of the Related Art Measuring apparatuses for accurately measuring the dimensions of various portions of a mask or substrate pattern from a moving distance of a camera are known.

【0003】[0003]

【発明が解決しようとする課題】上記測定テーブルは略
1メートル四方の大きさであり、可能な限り平面である
ことが望ましい。従来の測定装置の測定テーブルはアル
ミニウムやガラスで形成されており、面粗度は容易に1
μm以下にすることはできるが、うねりが大きくなると
いう不具合がある。被測定物は上記基板のように薄厚で
あるため剛性が小さく、測定テーブル上に載置すると被
測定物はベッドのうねりに合わせて部分的に撓む。例え
ば測定テーブルのうねりの曲率半径が略666.7mで
うねりが30μmであり、該測定テーブルに厚さ1.1
mmの被測定物を載置したとすると、被測定物上の40
0mmの距離に対して被測定物の撓みにより0.33μ
mの誤差が生じる。そのため測定テーブルの下方に所定
間隔を存して複数の上下動自在の補正ピンを設け、測定
テーブルの凹んでいる部分を補正ピンで押し上げて測定
テーブルの上面のうねりを小さくするようにしている。
但し、このように補正ピンにより測定テーブルのうねり
を矯正してもうねりを数10μm以下にすることはでき
ない。また、測定時の雰囲気温度が変化すると特にアル
ミニウムは熱膨張または熱収縮しうねりが変化する。更
に、測定テーブル内の残留応力が十分に除去されていな
いと、経時的に残留応力が開放されうねりが変化する。
更に、測定テーブルのうねりは測定テーブルの場所によ
って不規則に生じ且つ経時変化するので被測定物の撓み
に起因する誤差の再現性がきわめて低い。
The measuring table is approximately one meter square and preferably as flat as possible. The measuring table of the conventional measuring device is made of aluminum or glass, and the surface roughness is easily 1
Although it can be reduced to μm or less, there is a problem that undulation is increased. The object to be measured has a small rigidity because it is thin like the above-mentioned substrate, and when the object to be measured is placed on the measurement table, the object to be measured is partially bent according to the undulation of the bed. For example, the curvature radius of the undulation of the measurement table is approximately 666.7 m, the undulation is 30 μm, and the thickness of the measurement table is 1.1 μm.
Assuming that the object to be measured is placed on the
0.33μ due to bending of the object to be measured for a distance of 0mm
An error of m occurs. Therefore, a plurality of vertically movable correction pins are provided below the measurement table at predetermined intervals, and the concave portion of the measurement table is pushed up by the correction pins to reduce the undulation on the upper surface of the measurement table.
However, the undulation of the measurement table cannot be corrected to several tens μm or less by correcting the undulation of the measurement table with the correction pin. Also, when the ambient temperature at the time of measurement changes, aluminum, in particular, thermally expands or contracts, and the undulation changes. Further, if the residual stress in the measurement table is not sufficiently removed, the undulation that the residual stress is released with time changes.
Further, the undulation of the measurement table is irregularly generated depending on the location of the measurement table and changes with time, so that the reproducibility of the error due to the bending of the measured object is extremely low.

【0004】そこで本発明は、上記の問題点に鑑み、測
定テーブルのうねりが小さい測定装置を提供することを
課題とする。
[0004] In view of the above problems, an object of the present invention is to provide a measuring apparatus in which the swell of a measuring table is small.

【0005】[0005]

【課題を解決するための手段】上記課題を解決するため
に本発明は、薄厚の被測定物が載置される平板状の測定
テーブルを備え、該測定テーブル上に載置された被測定
物の寸法を光学的に測定する測定装置において、上記測
定テーブルをセラミックスで作成したことを特徴とす
る。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention comprises a flat measuring table on which a thin measuring object is placed, and the measuring object mounted on the measuring table. In the measuring device for optically measuring the dimensions of the above, the measuring table is made of ceramics.

【0006】セラミックスは従来のアルミニウムやガラ
ス等の材料に比べてうねりを小さく加工することがで
き、且つ温度変化によって形状が変化しにくく、経時変
化が少ない。
[0006] Ceramics can be processed with less undulation than conventional materials such as aluminum and glass, and are hardly changed in shape due to temperature change, and have little change over time.

【0007】[0007]

【発明の実施の形態】図1を参照して、1は測定装置で
あり、セラミックス製の平板状の測定テーブル2を備え
ている。該測定テーブル2を形成するためのセラミック
スはいわゆるファインセラミックスと呼ばれる高機能セ
ラミックスのうち、特に剛性が高く経時的に形状が変化
しないものであればいずれのものを用いてもよいが、例
えばストレッチ(ストレートエッジ)に使用させるセラ
ミックスを用いることが望ましい。該測定テーブル2の
左右には該測定テーブル2を挟んで1対の摺動レール1
1が前後方向に長手になるように相互に平行に設けられ
ている。該摺動レール11上を摺動する門形の可動橋3
が設けられており、該可動橋3には左右方向に往復動自
在なCCDカメラ4が取り付けられている。該CCDカ
メラ4は測定テーブル2上に載置される被測定物を垂直
上方から撮像する。該CCDカメラ4は外部のコンピュ
ータから成る測定装置5によってX−Y方向に自在に移
動させることができ、該移動量は図示しないロータリー
エンコーダやポテンショメータから制御装置5に入力さ
れる。例えば被測定物上の2点間の距離を測定する際に
は、一方の測定点の垂直上方位置までCCDカメラ4を
移動させ、該測定点の座標を記憶する。続いて他方の測
定点の垂直上方位置までCCDカメラ4を移動させて該
他方の測定点の座標を求める。そして両側定点の座標か
ら両測定点間の距離を求める。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Referring to FIG. 1, reference numeral 1 denotes a measuring device having a flat plate-shaped measuring table 2 made of ceramics. Ceramics for forming the measurement table 2 may be any of high-performance ceramics, so-called fine ceramics, that have high rigidity and do not change shape over time. It is desirable to use ceramics used for the straight edge). A pair of sliding rails 1 is provided on the left and right sides of the measurement table 2 with the measurement table 2 interposed therebetween.
1 are provided in parallel with each other so as to be long in the front-rear direction. A gate-shaped movable bridge 3 sliding on the sliding rail 11
The movable bridge 3 is provided with a CCD camera 4 that can reciprocate in the left-right direction. The CCD camera 4 captures an image of an object to be measured placed on the measurement table 2 from vertically above. The CCD camera 4 can be freely moved in the X and Y directions by a measuring device 5 composed of an external computer, and the moving amount is input to the control device 5 from a rotary encoder or a potentiometer (not shown). For example, when measuring the distance between two points on an object to be measured, the CCD camera 4 is moved to a position vertically above one of the measurement points, and the coordinates of the measurement point are stored. Subsequently, the CCD camera 4 is moved to a position vertically above the other measurement point to obtain the coordinates of the other measurement point. Then, the distance between the two measurement points is obtained from the coordinates of the fixed points on both sides.

【0008】上記測定テーブル2はセラミックスで形成
されているため図2に示すうねりの高さεは従来のアル
ミニウムやガラス製の測定テーブルのうねりの高さより
小さい。本実施の形態では、測定テーブル2に生じるう
ねりの曲率半径は略4000mでεは5μmであった。
該測定テーブル2に厚さ1.1mmの被測定物Dを載置
すると、該うねりに沿って撓んだ被測定物上の400m
mの距離に対して撓みによる誤差は0.055μmとな
り、上記従来の測定テーブルの場合より、誤差が1/6
になる。尚、図2において21は測定テーブル2を所定
間隔毎に下方から支持し、測定テーブル2の自重による
撓みを防止する支持部材である。該測定テーブル2は経
時変化が極めて小さいので該支持部材21は上下方向に
移動してうねりを調節する必要はない。
Since the measuring table 2 is made of ceramics, the undulation height ε shown in FIG. 2 is smaller than the undulation height of a conventional aluminum or glass measuring table. In the present embodiment, the radius of curvature of the undulation generated on the measurement table 2 is approximately 4000 m and ε is 5 μm.
When an object to be measured D having a thickness of 1.1 mm is placed on the measuring table 2, 400 m above the object to be measured bent along the undulation
The error due to deflection for a distance of m is 0.055 μm, which is 1/6 that of the conventional measurement table.
become. In FIG. 2, reference numeral 21 denotes a support member that supports the measurement table 2 from below at predetermined intervals and prevents bending of the measurement table 2 due to its own weight. Since the change with time of the measurement table 2 is extremely small, there is no need to adjust the swell by moving the support member 21 in the vertical direction.

【0009】[0009]

【発明の効果】以上の説明から明らかなように、本発明
は、被測定物を載置する測定テーブルをセラミックスに
より形成したので測定テーブルのうねりを小さくするこ
とができ、該うねりを小さくすることにより測定精度を
向上させることができる。
As is apparent from the above description, according to the present invention, since the measurement table on which the object to be measured is placed is formed of ceramics, the undulation of the measurement table can be reduced, and the undulation can be reduced. Thereby, the measurement accuracy can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態の構成を示す図FIG. 1 is a diagram showing a configuration of an embodiment of the present invention.

【図2】測定テーブルの断面図FIG. 2 is a sectional view of a measurement table.

【符号の説明】[Explanation of symbols]

1 測定装置 2 測定テーブル 4 CCDカメラ 5 制御装置 1 Measuring device 2 Measuring table 4 CCD camera 5 Control device

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 薄厚の被測定物が載置される平板状の
測定テーブルを備え、該測定テーブル上に載置された被
測定物の寸法を光学的に測定する測定装置において、上
記測定テーブルをセラミックスで作成したことを特徴と
する測定装置。
1. A measuring apparatus comprising: a plate-shaped measurement table on which a thin object to be measured is mounted, and optically measuring a dimension of the object to be mounted mounted on the measurement table; A measuring device characterized by being made of ceramics.
JP10216032A 1998-07-30 1998-07-30 Measuring equipment Pending JP2000046523A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10216032A JP2000046523A (en) 1998-07-30 1998-07-30 Measuring equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10216032A JP2000046523A (en) 1998-07-30 1998-07-30 Measuring equipment

Publications (1)

Publication Number Publication Date
JP2000046523A true JP2000046523A (en) 2000-02-18

Family

ID=16682233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10216032A Pending JP2000046523A (en) 1998-07-30 1998-07-30 Measuring equipment

Country Status (1)

Country Link
JP (1) JP2000046523A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI471526B (en) * 2010-03-30 2015-02-01 Hon Hai Prec Ind Co Ltd Image measuring apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI471526B (en) * 2010-03-30 2015-02-01 Hon Hai Prec Ind Co Ltd Image measuring apparatus

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