JP1719190S - 粒子測定機構 - Google Patents

粒子測定機構

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Publication number
JP1719190S
JP1719190S JP2022008101F JP2022008101F JP1719190S JP 1719190 S JP1719190 S JP 1719190S JP 2022008101 F JP2022008101 F JP 2022008101F JP 2022008101 F JP2022008101 F JP 2022008101F JP 1719190 S JP1719190 S JP 1719190S
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sample
mount
sample tube
laser beam
article
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Abstract

本物品は、試料チューブが装着されるマウントと、マウントに結合された共鳴ユニットとで構成される。具体的に、本物品は、試料チューブ内の試料にレーザービームを照射して、試料に含まれるナノ粒子から発生する音波を共鳴ユニットにより増幅させ、ナノ粒子を測定するための粒子測定機構である。試料チューブは、内部を説明するための参考正面斜視図および参考背面斜視図に示されるＡ部分に挿入されて取り付けられる。マウントを貫通するように、Ｂ部分からレーザービームを試料チューブに照射する。このとき、レーザービームは、試料チューブ内の試料に含まれるナノ粒子によって異なる衝撃波を発生する。この衝撃波は、マウントの内部の貫通孔を通って共鳴ユニットに伝達され、共鳴現象によって増幅されながら、共鳴ユニットのＣ部分から外に伝播する。そして、この衝撃波を測定することで、試料に含まれるナノ粒子を測定できる。本物品の材質は、金属または合成樹脂である。
JP2022008101F 2021-11-24 2022-04-13 粒子測定機構 Active JP1719190S (ja)

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KR20210056224 2021-11-24

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JP1719190S true JP1719190S (ja) 2022-07-06

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JP2022008101F Active JP1719190S (ja) 2021-11-24 2022-04-13 粒子測定機構

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TW (1) TWD224210S (ja)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6549747B2 (ja) 2017-04-14 2019-07-24 リオン株式会社 粒子測定装置および粒子測定方法

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TWD224210S (zh) 2023-03-11

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