JP1592871S - - Google Patents

Info

Publication number
JP1592871S
JP1592871S JPD2017-2475F JP2017002475F JP1592871S JP 1592871 S JP1592871 S JP 1592871S JP 2017002475 F JP2017002475 F JP 2017002475F JP 1592871 S JP1592871 S JP 1592871S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2017-2475F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2017-2475F priority Critical patent/JP1592871S/ja
Priority to US29/612,176 priority patent/USD867183S1/en
Priority to TW106304545F priority patent/TWD190540S/zh
Application granted granted Critical
Publication of JP1592871S publication Critical patent/JP1592871S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2017-2475F 2017-02-10 2017-02-10 Active JP1592871S (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2017-2475F JP1592871S (ko) 2017-02-10 2017-02-10
US29/612,176 USD867183S1 (en) 2017-02-10 2017-07-28 Probe pin
TW106304545F TWD190540S (zh) 2017-02-10 2017-08-09 探針之部分

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2017-2475F JP1592871S (ko) 2017-02-10 2017-02-10

Publications (1)

Publication Number Publication Date
JP1592871S true JP1592871S (ko) 2017-12-11

Family

ID=60570635

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2017-2475F Active JP1592871S (ko) 2017-02-10 2017-02-10

Country Status (3)

Country Link
US (1) USD867183S1 (ko)
JP (1) JP1592871S (ko)
TW (1) TWD190540S (ko)

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
US8912803B2 (en) * 2011-09-19 2014-12-16 Honeywell International, Inc. Electrostatic shielding technique on high voltage diodes
WO2013154738A1 (en) * 2012-04-13 2013-10-17 Delaware Capital Formation, Inc. Test probe assembly and related methods
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
JP6269337B2 (ja) * 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6484137B2 (ja) 2014-11-26 2019-03-13 株式会社日本マイクロニクス プローブ及び接触検査装置
JP1529608S (ko) * 2014-12-15 2015-07-27
JP1529607S (ko) * 2014-12-15 2015-07-27
JP1529605S (ko) * 2014-12-15 2015-07-27
JP1529612S (ko) * 2014-12-19 2015-07-27

Also Published As

Publication number Publication date
TWD190540S (zh) 2018-05-21
USD867183S1 (en) 2019-11-19

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