JP1578944S - - Google Patents

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Publication number
JP1578944S
JP1578944S JPD2016-20567F JP2016020567F JP1578944S JP 1578944 S JP1578944 S JP 1578944S JP 2016020567 F JP2016020567 F JP 2016020567F JP 1578944 S JP1578944 S JP 1578944S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2016-20567F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2016-20567F priority Critical patent/JP1578944S/ja
Priority to US29/593,538 priority patent/USD827459S1/en
Application granted granted Critical
Publication of JP1578944S publication Critical patent/JP1578944S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2016-20567F 2016-09-26 2016-09-26 Active JP1578944S (enExample)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2016-20567F JP1578944S (enExample) 2016-09-26 2016-09-26
US29/593,538 USD827459S1 (en) 2016-09-26 2017-02-09 Probe for remote coordinate measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2016-20567F JP1578944S (enExample) 2016-09-26 2016-09-26

Publications (1)

Publication Number Publication Date
JP1578944S true JP1578944S (enExample) 2017-06-12

Family

ID=59011610

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2016-20567F Active JP1578944S (enExample) 2016-09-26 2016-09-26

Country Status (2)

Country Link
US (1) USD827459S1 (enExample)
JP (1) JP1578944S (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6631984B1 (ja) * 2019-06-25 2020-01-15 株式会社浅沼技研 検査マスタ
JP1716912S (ja) 2021-11-15 2022-06-08 電気的特性測定用プローブ

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
DE3417991A1 (de) * 1984-05-15 1985-11-21 Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf Tastkopf einer messmaschine
USD327854S (en) * 1989-04-22 1992-07-14 Renishaw Plc Coordinate positioning probe head
DE4243284C2 (de) * 1992-12-21 1996-09-12 Zeiss Carl Jena Gmbh Tastelement für Koordinatenmeßsysteme
US5446971A (en) * 1993-01-14 1995-09-05 Leitz Messtechnik Gmbh Method for the dimensional measurement of workpieces
GB2336433B (en) * 1998-04-14 2002-02-06 Mitutoyo Corp Touch signal probe
JP3352055B2 (ja) * 1999-06-16 2002-12-03 株式会社ミツトヨ タッチ信号プローブの着座機構
US8122610B2 (en) * 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
USD666513S1 (en) * 2010-10-21 2012-09-04 Mitutoyo Corporation Remote probe for a coordinate measuring machine
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
JP6321441B2 (ja) * 2014-05-07 2018-05-09 株式会社ミツトヨ 三次元測定システム、三次元測定方法、および、被測定体
US9759540B2 (en) * 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
JP6039718B2 (ja) * 2015-03-05 2016-12-07 株式会社ミツトヨ 測定プローブ
JP6049785B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6049786B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ

Also Published As

Publication number Publication date
USD827459S1 (en) 2018-09-04

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