USD827459S1 - Probe for remote coordinate measuring machine - Google Patents

Probe for remote coordinate measuring machine Download PDF

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Publication number
USD827459S1
USD827459S1 US29/593,538 US201729593538F USD827459S US D827459 S1 USD827459 S1 US D827459S1 US 201729593538 F US201729593538 F US 201729593538F US D827459 S USD827459 S US D827459S
Authority
US
United States
Prior art keywords
probe
measuring machine
coordinate measuring
remote coordinate
remote
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/593,538
Inventor
Sadayuki Matsumiya
Takeshi Kawabata
Hidekazu Sano
Yu Sugai
Shigeru Ohtani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAWABATA, TAKESHI, MATSUMIYA, SADAYUKI, OHTANI, SHIGERU, SANO, HIDEKAZU, SUGAI, YU
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Description

FIG. 1 is a top, front, right-side perspective view of the probe for remote coordinate measuring machine;
FIG. 2 is a top, rear, left-side perspective view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a right-side elevational view thereof;
FIG. 6 is a left-side elevational view thereof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a bottom plan view thereof.
The broken lines depict unclaimed parts of the probe, and thus form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a probe for remote coordinate measuring machine, as shown and described.
US29/593,538 2016-09-26 2017-02-09 Probe for remote coordinate measuring machine Active USD827459S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-020567 2016-09-26
JPD2016-20567F JP1578944S (en) 2016-09-26 2016-09-26

Publications (1)

Publication Number Publication Date
USD827459S1 true USD827459S1 (en) 2018-09-04

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ID=59011610

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US29/593,538 Active USD827459S1 (en) 2016-09-26 2017-02-09 Probe for remote coordinate measuring machine

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US (1) USD827459S1 (en)
JP (1) JP1578944S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220221261A1 (en) * 2019-06-25 2022-07-14 Asanuma Giken Co., Ltd. Inspection master
TWD222756S (en) 2021-11-15 2022-12-21 南韓商ＯＫｉｎｓ電子股份有限公司 Probe for measuring electrical characteristics

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
US4578873A (en) * 1984-05-15 1986-04-01 Mauser-Werke Oberndorf Gmbh Sensor head with stop elements for establishing stable rest position
USD327854S (en) * 1989-04-22 1992-07-14 Renishaw Plc Coordinate positioning probe head
US5446971A (en) * 1993-01-14 1995-09-05 Leitz Messtechnik Gmbh Method for the dimensional measurement of workpieces
US5524354A (en) * 1992-12-21 1996-06-11 Carl Zeiss Jena Gmbh Probe element for coordinate measurement systems
US6360176B1 (en) * 1998-04-14 2002-03-19 Mitutoyo Corporation Touch signal probe
US6678966B1 (en) * 1999-06-16 2004-01-20 Mitutoyo Corporation Reseat system of touch signal probe
US8122610B2 (en) * 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
USD666513S1 (en) * 2010-10-21 2012-09-04 Mitutoyo Corporation Remote probe for a coordinate measuring machine
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US9354042B2 (en) * 2014-05-07 2016-05-31 Mitutoyo Corporation Coordinate measuring system, coordinate measuring method, and probe
US20160258738A1 (en) * 2015-03-05 2016-09-08 Mitutoyo Corporation Measuring probe
US9618312B2 (en) * 2015-03-05 2017-04-11 Mitutoyo Corporation Measuring probe
US9759540B2 (en) * 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
US9810529B2 (en) * 2015-03-05 2017-11-07 Mitotoyo Corporation Measuring probe for measuring a three-dimensional shape of an object to be measured

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
US4578873A (en) * 1984-05-15 1986-04-01 Mauser-Werke Oberndorf Gmbh Sensor head with stop elements for establishing stable rest position
USD327854S (en) * 1989-04-22 1992-07-14 Renishaw Plc Coordinate positioning probe head
US5524354A (en) * 1992-12-21 1996-06-11 Carl Zeiss Jena Gmbh Probe element for coordinate measurement systems
US5446971A (en) * 1993-01-14 1995-09-05 Leitz Messtechnik Gmbh Method for the dimensional measurement of workpieces
US6360176B1 (en) * 1998-04-14 2002-03-19 Mitutoyo Corporation Touch signal probe
US6678966B1 (en) * 1999-06-16 2004-01-20 Mitutoyo Corporation Reseat system of touch signal probe
US8122610B2 (en) * 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
USD666513S1 (en) * 2010-10-21 2012-09-04 Mitutoyo Corporation Remote probe for a coordinate measuring machine
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US9354042B2 (en) * 2014-05-07 2016-05-31 Mitutoyo Corporation Coordinate measuring system, coordinate measuring method, and probe
US9759540B2 (en) * 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
US20160258738A1 (en) * 2015-03-05 2016-09-08 Mitutoyo Corporation Measuring probe
US9618312B2 (en) * 2015-03-05 2017-04-11 Mitutoyo Corporation Measuring probe
US9810529B2 (en) * 2015-03-05 2017-11-07 Mitotoyo Corporation Measuring probe for measuring a three-dimensional shape of an object to be measured

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
http://www.ndigital.com/msci/products/procmm/.
Multi-Sided Probe. NDI (Northern Digital Inc.). Jul. 2008. NDI P/N 8300220.

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220221261A1 (en) * 2019-06-25 2022-07-14 Asanuma Giken Co., Ltd. Inspection master
US11781849B2 (en) * 2019-06-25 2023-10-10 Asanuma Giken Co., Ltd. Inspection master
TWD222756S (en) 2021-11-15 2022-12-21 南韓商ＯＫｉｎｓ電子股份有限公司 Probe for measuring electrical characteristics
USD1024815S1 (en) 2021-11-15 2024-04-30 Okins Electronics Co., Ltd. Probe for measuring electrical characteristics

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Publication number Publication date
JP1578944S (en) 2017-06-12

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