JP1529613S - - Google Patents

Info

Publication number
JP1529613S
JP1529613S JPD2014-28581F JP2014028581F JP1529613S JP 1529613 S JP1529613 S JP 1529613S JP 2014028581 F JP2014028581 F JP 2014028581F JP 1529613 S JP1529613 S JP 1529613S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2014-28581F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2014-28581F priority Critical patent/JP1529613S/ja
Priority to US29/530,396 priority patent/USD769753S1/en
Priority to TW104303280F priority patent/TWD175553S/en
Application granted granted Critical
Publication of JP1529613S publication Critical patent/JP1529613S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2014-28581F 2014-12-19 2014-12-19 Active JP1529613S (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JPD2014-28581F JP1529613S (en) 2014-12-19 2014-12-19
US29/530,396 USD769753S1 (en) 2014-12-19 2015-06-16 Probe pin
TW104303280F TWD175553S (en) 2014-12-19 2015-06-17 A part of probe pin for ic socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-28581F JP1529613S (en) 2014-12-19 2014-12-19

Publications (1)

Publication Number Publication Date
JP1529613S true JP1529613S (en) 2015-07-27

Family

ID=53764640

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2014-28581F Active JP1529613S (en) 2014-12-19 2014-12-19

Country Status (3)

Country Link
US (1) USD769753S1 (en)
JP (1) JP1529613S (en)
TW (1) TWD175553S (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD983681S1 (en) * 2020-12-03 2023-04-18 Mpi Corporation Probe for testing device under test
TWD226028S (en) * 2022-04-29 2023-06-21 南韓商普因特工程有限公司 Semiconductor probe pin

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD400811S (en) * 1997-11-21 1998-11-10 Delaware Capital Formation, Inc. Test probe plunger tip
USD445350S1 (en) * 2000-11-14 2001-07-24 Sagab Electronic Ab Voltage detection stick
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
JP4823617B2 (en) * 2005-09-09 2011-11-24 日本発條株式会社 Conductive contact and method for manufacturing conductive contact
WO2011036800A1 (en) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
KR101058146B1 (en) * 2009-11-11 2011-08-24 하이콘 주식회사 Spring contacts and sockets with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
JP5352525B2 (en) 2010-04-28 2013-11-27 日本航空電子工業株式会社 Probe pin contact, probe pin, and connection jig for electronic devices
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
USD699607S1 (en) * 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
TWD157152S (en) 2012-05-08 2013-11-11 日本麥克隆尼股份有限公司 Electric contact
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Also Published As

Publication number Publication date
USD769753S1 (en) 2016-10-25
TWD175553S (en) 2016-05-11

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