IT9047883A0 - Dispositivo per la determinazione di bassisime concentrazioni di elementi mediante spettrometria in rimissione atomica. - Google Patents
Dispositivo per la determinazione di bassisime concentrazioni di elementi mediante spettrometria in rimissione atomica.Info
- Publication number
- IT9047883A0 IT9047883A0 IT9047883A IT4788390A IT9047883A0 IT 9047883 A0 IT9047883 A0 IT 9047883A0 IT 9047883 A IT9047883 A IT 9047883A IT 4788390 A IT4788390 A IT 4788390A IT 9047883 A0 IT9047883 A0 IT 9047883A0
- Authority
- IT
- Italy
- Prior art keywords
- remission
- spectrometry
- atomic
- determination
- elements
- Prior art date
Links
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT47883A IT1241166B (it) | 1990-04-24 | 1990-04-24 | Dispositivo per la determinazione di bassissime concentrazioni di elementi mediante spettrometria in emissione atomica |
EP91830157A EP0455606A1 (en) | 1990-04-24 | 1991-04-22 | Device for determination of very low concentrations of elements by atomic emission spectrometry |
US07/690,508 US5235401A (en) | 1990-04-24 | 1991-04-24 | Device for determination of very low concentrations of elements by atomic emission spectrometry |
JP3119119A JPH0789101B2 (ja) | 1990-04-24 | 1991-04-24 | 原子放出分光測定により非常に低濃度の元素を検出する装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT47883A IT1241166B (it) | 1990-04-24 | 1990-04-24 | Dispositivo per la determinazione di bassissime concentrazioni di elementi mediante spettrometria in emissione atomica |
Publications (3)
Publication Number | Publication Date |
---|---|
IT9047883A0 true IT9047883A0 (it) | 1990-04-24 |
IT9047883A1 IT9047883A1 (it) | 1991-10-24 |
IT1241166B IT1241166B (it) | 1993-12-29 |
Family
ID=11263111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT47883A IT1241166B (it) | 1990-04-24 | 1990-04-24 | Dispositivo per la determinazione di bassissime concentrazioni di elementi mediante spettrometria in emissione atomica |
Country Status (4)
Country | Link |
---|---|
US (1) | US5235401A (it) |
EP (1) | EP0455606A1 (it) |
JP (1) | JPH0789101B2 (it) |
IT (1) | IT1241166B (it) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5821502A (en) * | 1996-07-01 | 1998-10-13 | Boeing North American, Inc. | System for providing in-situ temperature monitoring and temperature control of a specimen being exposed to plasma environments |
AUPS044202A0 (en) * | 2002-02-11 | 2002-03-07 | Varian Australia Pty Ltd | Microwave plasma source |
JP5352895B2 (ja) * | 2008-07-23 | 2013-11-27 | イマジニアリング株式会社 | 物質分析装置 |
-
1990
- 1990-04-24 IT IT47883A patent/IT1241166B/it active IP Right Grant
-
1991
- 1991-04-22 EP EP91830157A patent/EP0455606A1/en not_active Withdrawn
- 1991-04-24 JP JP3119119A patent/JPH0789101B2/ja not_active Expired - Lifetime
- 1991-04-24 US US07/690,508 patent/US5235401A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
IT1241166B (it) | 1993-12-29 |
JPH0789101B2 (ja) | 1995-09-27 |
US5235401A (en) | 1993-08-10 |
IT9047883A1 (it) | 1991-10-24 |
EP0455606A1 (en) | 1991-11-06 |
JPH06337244A (ja) | 1994-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
0001 | Granted | ||
TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19950428 |