IT8522397A0 - Procedimento e dispositivo per controllare oggetto monocristallini. - Google Patents

Procedimento e dispositivo per controllare oggetto monocristallini.

Info

Publication number
IT8522397A0
IT8522397A0 IT8522397A IT2239785A IT8522397A0 IT 8522397 A0 IT8522397 A0 IT 8522397A0 IT 8522397 A IT8522397 A IT 8522397A IT 2239785 A IT2239785 A IT 2239785A IT 8522397 A0 IT8522397 A0 IT 8522397A0
Authority
IT
Italy
Prior art keywords
monocrystalline
checking
objects
procedure
monocrystalline objects
Prior art date
Application number
IT8522397A
Other languages
English (en)
Other versions
IT1200500B (it
Inventor
Wilfried Pesch
Original Assignee
Mtu Muenchen Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mtu Muenchen Gmbh filed Critical Mtu Muenchen Gmbh
Publication of IT8522397A0 publication Critical patent/IT8522397A0/it
Application granted granted Critical
Publication of IT1200500B publication Critical patent/IT1200500B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
IT22397/85A 1984-10-27 1985-10-09 Procedimento e dispositivo per controllare oggetto monocristallini IT1200500B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843439471 DE3439471A1 (de) 1984-10-27 1984-10-27 Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende

Publications (2)

Publication Number Publication Date
IT8522397A0 true IT8522397A0 (it) 1985-10-09
IT1200500B IT1200500B (it) 1989-01-18

Family

ID=6248965

Family Applications (1)

Application Number Title Priority Date Filing Date
IT22397/85A IT1200500B (it) 1984-10-27 1985-10-09 Procedimento e dispositivo per controllare oggetto monocristallini

Country Status (5)

Country Link
US (1) US4696024A (it)
DE (1) DE3439471A1 (it)
FR (1) FR2572529A1 (it)
GB (1) GB2166630B (it)
IT (1) IT1200500B (it)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3740614C1 (de) * 1987-12-01 1988-12-29 Deutsches Elektronen Synchr Verfahren und Vorrichtung zur beruehrungsfreien Messung mechanischer Spannungen an schnell bewegten Objekten mit kristalliner Struktur
US5008909A (en) * 1990-02-07 1991-04-16 The United States Of America As Represented By The Department Of Energy Diffractometer data collecting method and apparatus
US4961210A (en) * 1990-02-28 1990-10-02 The United States Of America As Represented By The Secretary Of The Navy High resolution technique and instrument for measuring lattice parameters in single crystals
US5589690A (en) * 1995-03-21 1996-12-31 National Institute Of Standards And Technology Apparatus and method for monitoring casting process
US6005913A (en) * 1996-04-01 1999-12-21 Siemens Westinghouse Power Corporation System and method for using X-ray diffraction to detect subsurface crystallographic structure
KR20020011369A (ko) 1999-03-16 2002-02-08 키네티큐 리미티드 재료 조성의 분석을 위한 방법 및 장치
US7120228B2 (en) * 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
DE102008008829B4 (de) * 2007-02-14 2008-11-20 Technische Universität Dresden Verfahren und Vorrichtung zur Registrierung von Realstruktur-Informationen in massiven Kristallkörpern mittels Röntgenstrahlung
US8243878B2 (en) * 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8605858B2 (en) 2011-06-27 2013-12-10 Honeywell International Inc. Methods and systems for inspecting structures for crystallographic imperfections
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
US9939393B2 (en) 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
FR3059424B1 (fr) * 2016-11-28 2018-11-09 Safran Procede de controle non destructif d'une piece de turbomachine
US11341629B2 (en) * 2020-07-02 2022-05-24 Pratt & Whitney Canada Corp. Systems and methods for generating an inspection image of an object from radiographic imaging

Family Cites Families (25)

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Publication number Priority date Publication date Assignee Title
BE546685A (it) * 1955-04-04
GB936910A (en) * 1959-12-22 1963-09-18 Rigaku Denki Company Ltd A system for measuring the lattice spacing of a crystal by means of x-rays
GB1150243A (en) * 1967-02-15 1969-04-30 Aiken Ind Inc Automatic X-Ray Apparatus for Crystal Z-Axis Orientation Determination and Sorting.
US3609356A (en) * 1968-12-16 1971-09-28 Ibm Feedback controlled scanning microscopy apparatus for x-ray diffraction topography
GB1308948A (en) * 1969-05-30 1973-03-07 Abrahamsson S Monitoring occurence of respective events at a plurality of predetermied positions
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
DE2051511B2 (de) * 1970-10-20 1973-05-03 Siemens AG, 1000 Berlin u. 8000 München Roentgentopographiegeraet
FR2123855A5 (it) * 1971-02-03 1972-09-15 Commissariat Energie Atomique
DE2133972C3 (de) * 1971-07-08 1975-01-09 Philips Patentverwaltung Gmbh, 2000 Hamburg Röntgenuntersuchungsanlage mit verstellbarer Primär- und Sekundärblende
US3716712A (en) * 1971-09-27 1973-02-13 Northern Electric Co Apparatus for and method of orienting crystal wafers
AT346629B (de) * 1972-01-28 1978-11-27 Efanov Valery P Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben
US3736426A (en) * 1972-03-01 1973-05-29 Western Electric Co Methods of and apparatus for inspecting crystals
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus
JPS5847659B2 (ja) * 1975-08-12 1983-10-24 日新製鋼株式会社 ゴウキンカアエンテツバンノ ゴウキンカドノ ソクテイホウホウ
US4053748A (en) * 1975-12-01 1977-10-11 Horst William Kueppers Techniques for determining the peak angle of response of piezoelectric crystals and other radiation-sensitive resonant devices
JPS5687849A (en) * 1979-12-19 1981-07-16 Hitachi Ltd Foreknowing method for remaining life by x-rays
US4380820A (en) * 1980-06-19 1983-04-19 The Machlett Laboratories, Incorporated Compact X-ray collimator
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
SU920481A1 (ru) * 1980-09-18 1982-04-15 Институт Механики Ан Усср Способ определени качества материалов
FI64999C (fi) * 1980-09-22 1984-02-10 Instrumentarium Oy Spaltkollimator foer panoramaroentgenavbildningsanordning
US4429411A (en) * 1981-04-20 1984-01-31 The United States Of America As Represented By The United States Department Of Energy Instrument and method for focusing X-rays, gamma rays and neutrons
US4412345A (en) * 1981-08-03 1983-10-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for precise determinations of crystallographic orientation in crystalline substances
GB2107560A (en) * 1981-10-07 1983-04-27 Rolls Royce A method for determining the orientation of a crystal
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
US4592083A (en) * 1984-03-27 1986-05-27 Tokyo Shibaura Denki Kabushiki Kaisha High speed x-ray shutter

Also Published As

Publication number Publication date
GB2166630A (en) 1986-05-08
GB8525473D0 (en) 1985-11-20
FR2572529A1 (fr) 1986-05-02
DE3439471A1 (de) 1986-04-30
US4696024A (en) 1987-09-22
IT1200500B (it) 1989-01-18
GB2166630B (en) 1988-06-22

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