IT8248308A0 - Dispositivo per rilevare la posizione di una sonda rispetto ad un pezzo in lavorazione - Google Patents

Dispositivo per rilevare la posizione di una sonda rispetto ad un pezzo in lavorazione

Info

Publication number
IT8248308A0
IT8248308A0 IT8248308A IT4830882A IT8248308A0 IT 8248308 A0 IT8248308 A0 IT 8248308A0 IT 8248308 A IT8248308 A IT 8248308A IT 4830882 A IT4830882 A IT 4830882A IT 8248308 A0 IT8248308 A0 IT 8248308A0
Authority
IT
Italy
Prior art keywords
workpiece
probe
detect
respect
Prior art date
Application number
IT8248308A
Other languages
English (en)
Other versions
IT1147865B (it
Inventor
Richard Owen Juengel
Original Assignee
Valeron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valeron Corp filed Critical Valeron Corp
Publication of IT8248308A0 publication Critical patent/IT8248308A0/it
Application granted granted Critical
Publication of IT1147865B publication Critical patent/IT1147865B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/58—Wireless transmission of information between a sensor or probe and a control or evaluation unit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Electronic Switches (AREA)
IT48308/82A 1981-04-30 1982-04-29 Dispositivo per rilevare la posisione di una sonda rispetto ad un pezzo in lavorazione IT1147865B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/259,257 US4401945A (en) 1981-04-30 1981-04-30 Apparatus for detecting the position of a probe relative to a workpiece

Publications (2)

Publication Number Publication Date
IT8248308A0 true IT8248308A0 (it) 1982-04-29
IT1147865B IT1147865B (it) 1986-11-26

Family

ID=22984216

Family Applications (1)

Application Number Title Priority Date Filing Date
IT48308/82A IT1147865B (it) 1981-04-30 1982-04-29 Dispositivo per rilevare la posisione di una sonda rispetto ad un pezzo in lavorazione

Country Status (12)

Country Link
US (2) US4401945A (it)
JP (1) JPS57182602A (it)
AU (1) AU559784B2 (it)
BE (1) BE892971A (it)
BR (1) BR8202477A (it)
CA (1) CA1172334A (it)
DE (1) DE3213313A1 (it)
FR (1) FR2505040B1 (it)
GB (1) GB2097930B (it)
IT (1) IT1147865B (it)
MX (1) MX151356A (it)
SE (1) SE8202683L (it)

Families Citing this family (71)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57113116A (en) * 1980-12-30 1982-07-14 Fanuc Ltd Robot control system
JPS57113115A (en) * 1980-12-30 1982-07-14 Fanuc Ltd Robot control system
US5065035A (en) * 1981-04-30 1991-11-12 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4670989A (en) * 1981-04-30 1987-06-09 Gte Valeron Corporation Touch probe using microwave transmission
US4779319A (en) * 1981-04-30 1988-10-25 Gte Valeron Corporation Method and apparatus for performing workpiece inspection with a probe
US4401945A (en) * 1981-04-30 1983-08-30 The Valeron Corporation Apparatus for detecting the position of a probe relative to a workpiece
US4978857A (en) * 1981-04-30 1990-12-18 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4509266A (en) * 1982-06-14 1985-04-09 Gte Valeron Corporation Touch probe
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
US4454762A (en) * 1982-06-21 1984-06-19 Federal Products Corporation Measurement system with remote display
US4608763A (en) * 1983-06-14 1986-09-02 Gte Valeron Corporation Probe
US4543859A (en) * 1983-06-14 1985-10-01 Gte Valeron Corporation Probe adjustment tool and method of using same
AU555481B2 (en) * 1983-06-14 1986-09-25 Gte Valeron Corp. Remote measuring apparatus
US4523063A (en) * 1983-12-05 1985-06-11 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4553001A (en) * 1983-12-05 1985-11-12 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4627292A (en) * 1984-07-03 1986-12-09 Randek Inc. AC transducers, methods and systems
US4651074A (en) * 1984-12-04 1987-03-17 Wise James A Robotic sensor
JPS61214953A (ja) * 1985-03-15 1986-09-24 Dai Showa Seiki Kk 工具とワ−クの接触検知装置
US4683361A (en) * 1985-04-04 1987-07-28 Westinghouse Electric Corp. Brazing apparatus having a dual function heating and eddy current probe coil
US4693110A (en) * 1985-06-06 1987-09-15 Gte Valeron Corporation Method and apparatus for testing the operability of a probe
US4843640A (en) * 1986-04-24 1989-06-27 Gte Valeron Corporation Industrial identification transponder
JPH0765883B2 (ja) * 1986-06-05 1995-07-19 宣夫 福久 無線送受信器を有する位置検出装置
US4804896A (en) * 1987-09-30 1989-02-14 University Of Lowell Vibratory interference sensor
US4972155A (en) * 1988-11-29 1990-11-20 Dickey-John Corporation Weight responsive moisture tester
AU664722B2 (en) * 1991-11-29 1995-11-30 H.P.M. Industries Pty Limited Apparatus for determining the relative positions of power outlets within an electrical circuit
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
DE19547977A1 (de) 1995-12-21 1997-06-26 Zeiss Carl Fa Tastsystem für Koordinatenmeßgeräte
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
GB9826093D0 (en) * 1998-11-28 1999-01-20 Limited Locating arm for a probe on a coordinate positioning machine
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
US6970634B2 (en) * 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
TW567333B (en) * 2002-09-20 2003-12-21 Benq Corp Method for phase matching by detecting magnetic flux
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
DE10312884B4 (de) * 2003-03-22 2014-02-27 Dr. Johannes Heidenhain Gmbh Tastsystem
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
WO2006017078A2 (en) 2004-07-07 2006-02-16 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
WO2005065258A2 (en) 2003-12-24 2005-07-21 Cascade Microtech, Inc. Active wafer probe
ITBO20040182A1 (it) * 2004-04-01 2004-07-01 Marposs Spa Sistema e metodo per il controllo di pezzi meccanici, con trasmissioni di segnali via etere
JP4324012B2 (ja) * 2004-05-20 2009-09-02 日立オムロンターミナルソリューションズ株式会社 変位検知装置および変位検知方法
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7316313B1 (en) * 2004-10-15 2008-01-08 Juchau Jason R Heated equipment bag
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
DE102005037101A1 (de) * 2005-08-03 2007-02-08 Krones Ag Verfahren und Vorrichtung zur Wandstärkenkontrolle
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN112431299A (zh) * 2020-11-11 2021-03-02 刘战军 一种水管爆裂应急排水装置

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US30975A (en) * 1860-12-18 Wrench
US2508051A (en) * 1944-05-26 1950-05-16 Charles W Warren Tolerance-limit comparator gauge
DE1031976B (de) * 1955-12-27 1958-06-12 Dr Felix Ernest Planer Vorrichtung zur elektrischen Bestimmung der geometrischen Ausgestaltung von isolierten Leitern
US3488586A (en) * 1965-06-02 1970-01-06 Gen Electric Frequency modulated light coupled data link
US3670243A (en) * 1970-02-27 1972-06-13 Federal Prod Corp Physical displacement measuring system utilizing impedance changing the frequency of an oscillatory circuit
US3795054A (en) * 1970-08-13 1974-03-05 American Welding Mfg Co Method and apparatus for calibrating the position of a tool and for gauging the dimension of a workpiece
US3783340A (en) * 1972-09-07 1974-01-01 Biotek Instr Inc Ground safe system
US4153998A (en) * 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
US3855708A (en) * 1972-10-16 1974-12-24 Candid Logic Inc Self-actuated digital location sensor
DE2403402B1 (de) * 1974-01-22 1975-03-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zum Überwachen von Meßwertgebern und deren Zuleitungen auf Leitungsbrüche
US3962911A (en) * 1974-11-21 1976-06-15 Beloit Corporation Method and apparatus for coupling signals from a rotating device with end shafts exposed
US4130941A (en) * 1975-03-20 1978-12-26 Rolls-Royce Limited Displacement gauge
US4119948A (en) * 1976-04-29 1978-10-10 Ernest Michael Ward Remote meter reading system
JPS5628984Y2 (it) * 1976-05-29 1981-07-10
US4197530A (en) * 1977-02-09 1980-04-08 Laue Eric G Passive intrusion detection system
US4150284A (en) * 1977-04-28 1979-04-17 Texas Instruments Incorporated Medical patient condition monitoring system
JPS53141717A (en) * 1977-05-13 1978-12-09 Suwa Seikosha Kk Dot printer head structure
DE2742899C3 (de) * 1977-09-23 1980-06-12 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zur optischen Übertragung von Nachrichten
CH628137A5 (fr) * 1977-09-27 1982-02-15 Meseltron Sa Procede de mesure a l'aide d'une tete de mesure d'une machine a mesurer et tete de mesure pour la mise en oeuvre de ce procede.
GB2007355B (en) * 1977-10-29 1982-08-18 Lucas Industries Ltd Apparatus for transmitting electrical signals
US4145816A (en) * 1977-11-21 1979-03-27 Kearney & Trecker Corporation Spindle probe with orbital transformer
USRE30975E (en) 1977-11-21 1982-06-22 Kearney & Trecker Corporation Spindle probe with orbital transformer
US4118871A (en) * 1978-06-13 1978-10-10 Kearney & Trecker Corporation Binary inspection probe for numerically controlled machine tools
US4339714A (en) * 1978-07-07 1982-07-13 Rolls Royce Limited Probe having passive means transmitting an output signal by reactive coupling
SE413808B (sv) * 1978-09-22 1980-06-23 Asea Ab Metdon for overforing av metsignaler via en optisk lenk
US4259746A (en) * 1979-10-26 1981-03-31 Sandstedt Gary O Electrical communications system
US4443946A (en) * 1980-07-01 1984-04-24 Renishaw Electrical Limited Probe for measuring workpieces
US4328623A (en) * 1980-08-28 1982-05-11 The Valeron Corporation Telemetry gage system
US4330870A (en) * 1980-09-05 1982-05-18 Datapoint Corporation Optical data link
US4401945A (en) * 1981-04-30 1983-08-30 The Valeron Corporation Apparatus for detecting the position of a probe relative to a workpiece
US4451987A (en) * 1982-06-14 1984-06-05 The Valeron Corporation Touch probe

Also Published As

Publication number Publication date
BR8202477A (pt) 1983-04-12
FR2505040B1 (fr) 1986-04-18
US4401945A (en) 1983-08-30
FR2505040A1 (fr) 1982-11-05
US4578874A (en) 1986-04-01
GB2097930A (en) 1982-11-10
SE8202683L (sv) 1982-10-31
DE3213313C2 (it) 1993-01-21
JPH0432321B2 (it) 1992-05-29
AU559784B2 (en) 1987-03-19
IT1147865B (it) 1986-11-26
DE3213313A1 (de) 1982-11-18
CA1172334A (en) 1984-08-07
BE892971A (fr) 1982-08-16
GB2097930B (en) 1985-01-23
AU8282282A (en) 1982-11-04
JPS57182602A (en) 1982-11-10
MX151356A (es) 1984-11-12

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Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19940428