BR8202477A - Aparelho para detectar a posicao de uma sonda em relacao a uma obra - Google Patents

Aparelho para detectar a posicao de uma sonda em relacao a uma obra

Info

Publication number
BR8202477A
BR8202477A BR8202477A BR8202477A BR8202477A BR 8202477 A BR8202477 A BR 8202477A BR 8202477 A BR8202477 A BR 8202477A BR 8202477 A BR8202477 A BR 8202477A BR 8202477 A BR8202477 A BR 8202477A
Authority
BR
Brazil
Prior art keywords
appliance
probe
relation
detect
work
Prior art date
Application number
BR8202477A
Other languages
English (en)
Inventor
Richard O Juengel
Original Assignee
Valeron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valeron Corp filed Critical Valeron Corp
Publication of BR8202477A publication Critical patent/BR8202477A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/58—Wireless transmission of information between a sensor or probe and a control or evaluation unit
BR8202477A 1981-04-30 1982-04-29 Aparelho para detectar a posicao de uma sonda em relacao a uma obra BR8202477A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/259,257 US4401945A (en) 1981-04-30 1981-04-30 Apparatus for detecting the position of a probe relative to a workpiece

Publications (1)

Publication Number Publication Date
BR8202477A true BR8202477A (pt) 1983-04-12

Family

ID=22984216

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8202477A BR8202477A (pt) 1981-04-30 1982-04-29 Aparelho para detectar a posicao de uma sonda em relacao a uma obra

Country Status (12)

Country Link
US (2) US4401945A (pt)
JP (1) JPS57182602A (pt)
AU (1) AU559784B2 (pt)
BE (1) BE892971A (pt)
BR (1) BR8202477A (pt)
CA (1) CA1172334A (pt)
DE (1) DE3213313A1 (pt)
FR (1) FR2505040B1 (pt)
GB (1) GB2097930B (pt)
IT (1) IT1147865B (pt)
MX (1) MX151356A (pt)
SE (1) SE8202683L (pt)

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JPS57113116A (en) * 1980-12-30 1982-07-14 Fanuc Ltd Robot control system
US4779319A (en) * 1981-04-30 1988-10-25 Gte Valeron Corporation Method and apparatus for performing workpiece inspection with a probe
US4401945A (en) * 1981-04-30 1983-08-30 The Valeron Corporation Apparatus for detecting the position of a probe relative to a workpiece
US5065035A (en) * 1981-04-30 1991-11-12 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4670989A (en) * 1981-04-30 1987-06-09 Gte Valeron Corporation Touch probe using microwave transmission
US4978857A (en) * 1981-04-30 1990-12-18 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
US4509266A (en) * 1982-06-14 1985-04-09 Gte Valeron Corporation Touch probe
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US4543859A (en) * 1983-06-14 1985-10-01 Gte Valeron Corporation Probe adjustment tool and method of using same
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US4553001A (en) * 1983-12-05 1985-11-12 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4523063A (en) * 1983-12-05 1985-06-11 Gte Valeron Corporation Touch probe having nonconductive contact carriers
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US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
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US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
GB9826093D0 (en) * 1998-11-28 1999-01-20 Limited Locating arm for a probe on a coordinate positioning machine
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech Inc Wafersonde
US6970634B2 (en) * 2001-05-04 2005-11-29 Cascade Microtech, Inc. Fiber optic wafer probe
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
TW567333B (en) * 2002-09-20 2003-12-21 Benq Corp Method for phase matching by detecting magnetic flux
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
DE10312884B4 (de) * 2003-03-22 2014-02-27 Dr. Johannes Heidenhain Gmbh Tastsystem
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
ITBO20040182A1 (it) * 2004-04-01 2004-07-01 Marposs Spa Sistema e metodo per il controllo di pezzi meccanici, con trasmissioni di segnali via etere
JP4324012B2 (ja) * 2004-05-20 2009-09-02 日立オムロンターミナルソリューションズ株式会社 変位検知装置および変位検知方法
WO2005121824A2 (en) 2004-06-07 2005-12-22 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
EP1766426B1 (en) 2004-07-07 2013-09-11 Cascade Microtech, Inc. Probe head having a membrane suspended probe
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7316313B1 (en) * 2004-10-15 2008-01-08 Juchau Jason R Heated equipment bag
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
DE102005037101A1 (de) * 2005-08-03 2007-02-08 Krones Ag Verfahren und Vorrichtung zur Wandstärkenkontrolle
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN112431299A (zh) * 2020-11-11 2021-03-02 刘战军 一种水管爆裂应急排水装置

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US4451987A (en) * 1982-06-14 1984-06-05 The Valeron Corporation Touch probe

Also Published As

Publication number Publication date
JPS57182602A (en) 1982-11-10
AU559784B2 (en) 1987-03-19
BE892971A (fr) 1982-08-16
US4401945A (en) 1983-08-30
JPH0432321B2 (pt) 1992-05-29
SE8202683L (sv) 1982-10-31
IT1147865B (it) 1986-11-26
DE3213313C2 (pt) 1993-01-21
FR2505040B1 (fr) 1986-04-18
FR2505040A1 (fr) 1982-11-05
MX151356A (es) 1984-11-12
US4578874A (en) 1986-04-01
GB2097930A (en) 1982-11-10
IT8248308A0 (it) 1982-04-29
CA1172334A (en) 1984-08-07
DE3213313A1 (de) 1982-11-18
GB2097930B (en) 1985-01-23
AU8282282A (en) 1982-11-04

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