IT8086216A0 - Apparecchiatura di calibrazione capacitiva senza contatto - Google Patents

Apparecchiatura di calibrazione capacitiva senza contatto

Info

Publication number
IT8086216A0
IT8086216A0 IT8086216A IT8621680A IT8086216A0 IT 8086216 A0 IT8086216 A0 IT 8086216A0 IT 8086216 A IT8086216 A IT 8086216A IT 8621680 A IT8621680 A IT 8621680A IT 8086216 A0 IT8086216 A0 IT 8086216A0
Authority
IT
Italy
Prior art keywords
calibration equipment
contact capacitive
capacitive calibration
contact
equipment
Prior art date
Application number
IT8086216A
Other languages
English (en)
Other versions
IT1148230B (it
Original Assignee
Gould Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gould Inc filed Critical Gould Inc
Publication of IT8086216A0 publication Critical patent/IT8086216A0/it
Application granted granted Critical
Publication of IT1148230B publication Critical patent/IT1148230B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/287—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
IT86216/80A 1978-03-31 1980-03-07 Apparecchiatura di calibrazione capacitiva senza contatto IT1148230B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/891,957 US4190797A (en) 1978-03-31 1978-03-31 Capacitive gauging system utilizing a low internal capacitance, high impedance amplifier means

Publications (2)

Publication Number Publication Date
IT8086216A0 true IT8086216A0 (it) 1980-03-07
IT1148230B IT1148230B (it) 1986-11-26

Family

ID=25399115

Family Applications (1)

Application Number Title Priority Date Filing Date
IT86216/80A IT1148230B (it) 1978-03-31 1980-03-07 Apparecchiatura di calibrazione capacitiva senza contatto

Country Status (8)

Country Link
US (1) US4190797A (it)
EP (1) EP0004757A1 (it)
JP (1) JPS54133368A (it)
CA (1) CA1138113A (it)
DE (1) DE2952825A1 (it)
FR (1) FR2454084A1 (it)
GB (1) GB2041540B (it)
IT (1) IT1148230B (it)

Families Citing this family (40)

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US4350040A (en) * 1980-06-26 1982-09-21 The United States Of America As Represented By The United States Department Of Energy Capacitance-level/density monitor for fluidized-bed combustor
AU6221380A (en) * 1980-07-07 1982-02-02 Viak A.B. Device for measuring dimensions of an ingot mould
US4481616A (en) * 1981-09-30 1984-11-06 Rca Corporation Scanning capacitance microscope
USRE32457E (en) * 1981-09-30 1987-07-07 Rca Corporation Scanning capacitance microscope
US4476430A (en) * 1982-04-05 1984-10-09 Wright Wade S Non-contact sensor for determining moving flat steel strip shape profile
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4539835A (en) * 1983-10-28 1985-09-10 Control Data Corporation Calibration apparatus for capacitance height gauges
CA1191261A (fr) * 1983-12-14 1985-07-30 Francois Lalonde Appareil de mesure dynamique et sans contact de faibles distances
US4860229A (en) * 1984-01-20 1989-08-22 Ade Corporation Wafer flatness station
GB8405532D0 (en) * 1984-03-02 1984-04-04 Atherton E J Measurement using electrical transducers
US4935700A (en) * 1985-08-09 1990-06-19 Washington Research Foundation Fringe field capacitive sensor for measuring the size of an opening
DE3617373A1 (de) * 1986-05-23 1987-11-26 Mtu Muenchen Gmbh Kapazitives messsystem
US4820971A (en) * 1986-05-29 1989-04-11 Ko Wen Hsiung Precision impedance variation measurement circuit
GB8620966D0 (en) * 1986-08-29 1986-10-08 Analytical Instr Ltd Package tester
US4766389A (en) * 1986-09-03 1988-08-23 Extrude Hone Corporation Capacitor array sensors tactile and proximity sensing and methods of use thereof
EP0277421A1 (en) * 1986-12-05 1988-08-10 The University Of Western Australia Capacitance sensor arrangement
EP0303563A3 (de) * 1987-06-11 1990-03-28 C.A. Weidmüller GmbH & Co. Sensoreinrichtung mit Kompensationsanordnung
GB8718606D0 (en) * 1987-08-06 1987-09-09 Hiltcroft Packaging Systems Lt Monitoring apparatus
CA1332183C (en) * 1989-06-23 1994-09-27 Richard W. Henderson Capacitance probe assembly
EP0425823A1 (en) * 1989-09-29 1991-05-08 Antivision Systems Corp. Electrocstatic imaging apparatus
DE4022563A1 (de) * 1990-04-11 1991-10-17 Flachglas Ag Verfahren zur kontaktlosen messung des elektrischen widerstands eines untersuchungsmaterials
GB9021447D0 (en) * 1990-10-03 1990-11-14 Renishaw Plc Capacitance probes
US5097216A (en) * 1990-10-09 1992-03-17 Agr International, Inc. Apparatus for inspecting the wall thickness of a container and corresponding method
GB2265720B (en) * 1990-11-16 1995-06-14 Moonstone Designs Ltd Device for determining the presence and/or characteristics of an object or a substance
GB2279756B (en) * 1990-11-16 1995-06-07 Moonstone Technology Ltd Device for determining the presence and/or characteristics of an object or a substance
FR2690244B1 (fr) * 1992-01-10 1997-03-21 Leteurtre Jean Procede et/ou dispositif de mise en óoeuvre du procede de mesure capacitive susceptible d'effectuer des mesures dimensionnelles sans contact et de tres haute precision en milieu industriel.
EP0556682B1 (en) * 1992-02-10 1997-12-03 SYEL di FRANCHI A.- MARTOLINI A. & C. s.n.c. Electronic capacitive sensor bar device
US5272443A (en) * 1992-04-22 1993-12-21 Aluminum Company Of America Chatter and profile measuring using capacitor sensors
US5214388A (en) * 1992-05-28 1993-05-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Phase discriminating capacitive array sensor system
FR2705145B1 (fr) * 1993-05-10 1995-08-04 Exa Ingenierie Dispositif de mesure de rectitude.
US5505072A (en) * 1994-11-15 1996-04-09 Tekscan, Inc. Scanning circuit for pressure responsive array
US6144892A (en) * 1996-02-08 2000-11-07 Royal Master Grinders, Inc. Gauging system
US5786698A (en) * 1996-03-07 1998-07-28 Ade Corporation Transducer Bootstrapping apparatus
JP4365908B2 (ja) * 1998-09-04 2009-11-18 キヤノン株式会社 面位置検出装置、露光装置およびデバイス製造方法
US6227938B1 (en) 1998-09-08 2001-05-08 Royal Masters Grinders, Inc. Guidewire position locator
US6476621B1 (en) 2001-06-29 2002-11-05 Ade Corporation Self-bootstrapping transducer interface
US6964205B2 (en) * 2003-12-30 2005-11-15 Tekscan Incorporated Sensor with plurality of sensor elements arranged with respect to a substrate
US6993954B1 (en) * 2004-07-27 2006-02-07 Tekscan, Incorporated Sensor equilibration and calibration system and method
JP6017096B1 (ja) * 2015-10-30 2016-10-26 三菱電機株式会社 ワイヤ放電加工機、ワイヤ放電加工機の制御装置の制御方法及び位置決め方法
USD800983S1 (en) * 2016-08-26 2017-10-24 Shelita Lee Lottery ticket scratcher

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3753373A (en) * 1965-10-22 1973-08-21 Bissett Berman Corp Transducer system
US3805150A (en) * 1970-08-17 1974-04-16 Ade Corp Environment immune high precision capacitive gauging system
CH538114A (de) * 1971-05-06 1973-06-15 Bauer Messinstrumente Ag Vorrichtung zur Digitalen, kapazitiven Messung der örtlichen Lage von Trennschichten zwischen mindestens zwei aneinandergrenzenden Medien
US3716782A (en) * 1971-06-03 1973-02-13 J Henry Capacitance gage for measuring small distances
DE2158320B2 (de) * 1971-11-24 1980-04-10 Ferdy Dr. Grenoble Mayer (Frankreich) Vorrichtung zur berührungsfreien relativen Abstandsmessung
US3775679A (en) * 1971-12-09 1973-11-27 Ade Corp Apparatus and method for direct readout of capacitively gauged dimensions
GB1370233A (en) * 1972-01-06 1974-10-16 Goring Kerr Ltd Electrical sorting apparatus
US3984766A (en) * 1974-10-15 1976-10-05 Bactomatic Inc. Digital apparatus for rapidly detecting the growth of and identifying micro-biological organisms
US4160204A (en) * 1974-11-11 1979-07-03 Kaman Sciences Corporation Non-contact distance measurement system
US3986109A (en) * 1975-01-29 1976-10-12 Ade Corporation Self-calibrating dimension gauge
DE2529475C3 (de) * 1975-07-02 1981-10-08 Ewald Max Christian Dipl.-Phys. 6000 Frankfurt Hennig Elektrische Schaltungsanordnung zum zeitabhängigen Messen von physikalischen Größen
US4103226A (en) * 1976-09-15 1978-07-25 Westinghouse Electric Corp. Apparatus for gauging the texture of a conducting surface
US4112355A (en) * 1976-10-22 1978-09-05 Lockheed Corporation Quality and fit measuring apparatus for fasteners and their holes

Also Published As

Publication number Publication date
GB2041540B (en) 1982-11-17
CA1138113A (en) 1982-12-21
IT1148230B (it) 1986-11-26
GB2041540A (en) 1980-09-10
JPS54133368A (en) 1979-10-17
FR2454084B1 (it) 1983-11-18
US4190797A (en) 1980-02-26
DE2952825A1 (de) 1980-09-04
EP0004757A1 (en) 1979-10-17
FR2454084A1 (fr) 1980-11-07

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