IT8023526A0 - Procedimento per l'assorbimento di contaminanti, difetti o simili in un corpo semiconduttore. - Google Patents

Procedimento per l'assorbimento di contaminanti, difetti o simili in un corpo semiconduttore.

Info

Publication number
IT8023526A0
IT8023526A0 IT8023526A IT2352680A IT8023526A0 IT 8023526 A0 IT8023526 A0 IT 8023526A0 IT 8023526 A IT8023526 A IT 8023526A IT 2352680 A IT2352680 A IT 2352680A IT 8023526 A0 IT8023526 A0 IT 8023526A0
Authority
IT
Italy
Prior art keywords
contaminants
defects
absorption
procedure
semiconductor body
Prior art date
Application number
IT8023526A
Other languages
English (en)
Other versions
IT1150028B (it
IT8023526A1 (it
Inventor
Guenter H Schwuttke
Yang Kuei Hsiung
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT8023526A0 publication Critical patent/IT8023526A0/it
Publication of IT8023526A1 publication Critical patent/IT8023526A1/it
Application granted granted Critical
Publication of IT1150028B publication Critical patent/IT1150028B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
    • H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26—Bombardment with radiation
    • H01L21/263—Bombardment with radiation with high-energy radiation
    • H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/09—Laser anneal
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/093—Laser beam treatment in general

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Recrystallisation Techniques (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
IT23526/80A 1979-11-13 1980-07-18 Procedimento per l'assorbimento di contaminanti,difetti o simili in un corpo semiconduttore IT1150028B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/093,485 US4257827A (en) 1979-11-13 1979-11-13 High efficiency gettering in silicon through localized superheated melt formation

Publications (3)

Publication Number Publication Date
IT8023526A0 true IT8023526A0 (it) 1980-07-18
IT8023526A1 IT8023526A1 (it) 1982-01-18
IT1150028B IT1150028B (it) 1986-12-10

Family

ID=22239219

Family Applications (1)

Application Number Title Priority Date Filing Date
IT23526/80A IT1150028B (it) 1979-11-13 1980-07-18 Procedimento per l'assorbimento di contaminanti,difetti o simili in un corpo semiconduttore

Country Status (5)

Country Link
US (1) US4257827A (it)
EP (1) EP0028737A3 (it)
JP (1) JPS5840334B2 (it)
CA (1) CA1140683A (it)
IT (1) IT1150028B (it)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4325182A (en) * 1980-08-25 1982-04-20 General Electric Company Fast isolation diffusion
US4390392A (en) * 1980-09-16 1983-06-28 Texas Instruments Incorporated Method for removal of minute physical damage to silicon wafers by employing laser annealing
DE3132983A1 (de) * 1981-08-20 1983-03-03 Siemens AG, 1000 Berlin und 8000 München Verfahren zum verbinden eines halbleiterchips mit einem chiptraeger
US4415373A (en) * 1981-11-17 1983-11-15 Allied Corporation Laser process for gettering defects in semiconductor devices
US4401505A (en) * 1982-03-31 1983-08-30 The United States Of America As Represented By The Administrator National Aeronautics And Space Administration Method of increasing minority carrier lifetime in silicon web or the like
DE3246480A1 (de) * 1982-12-15 1984-06-20 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Verfahren zur herstellung von halbleiterscheiben mit getternder scheibenrueckseite
JPS59124136A (ja) * 1982-12-28 1984-07-18 Toshiba Corp 半導体ウエハの処理方法
JPS59171036U (ja) * 1983-04-28 1984-11-15 三菱重工業株式会社 シリンダ−駆動方式切換装置
DE3324551A1 (de) * 1983-07-07 1985-01-17 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Verfahren zur kennzeichnung von halbleiteroberflaechen durch laserstrahlung
US4534804A (en) * 1984-06-14 1985-08-13 International Business Machines Corporation Laser process for forming identically positioned alignment marks on the opposite sides of a semiconductor wafer
US4559086A (en) * 1984-07-02 1985-12-17 Eastman Kodak Company Backside gettering of silicon wafers utilizing selectively annealed single crystal silicon portions disposed between and extending into polysilicon portions
JPH03116820A (ja) * 1989-09-29 1991-05-17 Shin Etsu Handotai Co Ltd ミスフィット転位制御方法
US5066359A (en) * 1990-09-04 1991-11-19 Motorola, Inc. Method for producing semiconductor devices having bulk defects therein
US5977706A (en) * 1996-12-12 1999-11-02 Candescent Technologies Corporation Multi-compartment getter-containing flat-panel device
US6139390A (en) * 1996-12-12 2000-10-31 Candescent Technologies Corporation Local energy activation of getter typically in environment below room pressure
US8138066B2 (en) * 2008-10-01 2012-03-20 International Business Machines Corporation Dislocation engineering using a scanned laser

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3585088A (en) * 1968-10-18 1971-06-15 Ibm Methods of producing single crystals on supporting substrates
US4151008A (en) * 1974-11-15 1979-04-24 Spire Corporation Method involving pulsed light processing of semiconductor devices
DE2537464A1 (de) * 1975-08-22 1977-03-03 Wacker Chemitronic Verfahren zur entfernung spezifischer kristallbaufehler aus halbleiterscheiben
US4053335A (en) * 1976-04-02 1977-10-11 International Business Machines Corporation Method of gettering using backside polycrystalline silicon
US4069068A (en) * 1976-07-02 1978-01-17 International Business Machines Corporation Semiconductor fabrication method for improved device yield by minimizing pipes between common conductivity type regions
US4131487A (en) * 1977-10-26 1978-12-26 Western Electric Company, Inc. Gettering semiconductor wafers with a high energy laser beam
US4137100A (en) * 1977-10-26 1979-01-30 Western Electric Company Forming isolation and device regions due to enhanced diffusion of impurities in semiconductor material by laser
US4144099A (en) * 1977-10-31 1979-03-13 International Business Machines Corporation High performance silicon wafer and fabrication process
US4147563A (en) * 1978-08-09 1979-04-03 The United States Of America As Represented By The United States Department Of Energy Method for forming p-n junctions and solar-cells by laser-beam processing
US4155779A (en) * 1978-08-21 1979-05-22 Bell Telephone Laboratories, Incorporated Control techniques for annealing semiconductors
US4181538A (en) * 1978-09-26 1980-01-01 The United States Of America As Represented By The United States Department Of Energy Method for making defect-free zone by laser-annealing of doped silicon

Also Published As

Publication number Publication date
EP0028737A3 (en) 1983-12-07
EP0028737A2 (en) 1981-05-20
IT1150028B (it) 1986-12-10
JPS5671935A (en) 1981-06-15
IT8023526A1 (it) 1982-01-18
JPS5840334B2 (ja) 1983-09-05
CA1140683A (en) 1983-02-01
US4257827A (en) 1981-03-24

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