IT7949804A0 - Analizzatore automatico dello spessore - Google Patents

Analizzatore automatico dello spessore

Info

Publication number
IT7949804A0
IT7949804A0 IT7949804A IT4980479A IT7949804A0 IT 7949804 A0 IT7949804 A0 IT 7949804A0 IT 7949804 A IT7949804 A IT 7949804A IT 4980479 A IT4980479 A IT 4980479A IT 7949804 A0 IT7949804 A0 IT 7949804A0
Authority
IT
Italy
Prior art keywords
automatic thickness
thickness analyzer
analyzer
automatic
thickness
Prior art date
Application number
IT7949804A
Other languages
English (en)
Inventor
Rudolph Zeblisky
Original Assignee
Kollmorgen Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kollmorgen Tech Corp filed Critical Kollmorgen Tech Corp
Publication of IT7949804A0 publication Critical patent/IT7949804A0/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42—Plated through-holes or plated via connections
    • H05K3/422—Plated through-holes or plated via connections characterised by electroless plating method; pretreatment therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT7949804A 1978-07-19 1979-07-19 Analizzatore automatico dello spessore IT7949804A0 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US92607478A 1978-07-19 1978-07-19

Publications (1)

Publication Number Publication Date
IT7949804A0 true IT7949804A0 (it) 1979-07-19

Family

ID=25452709

Family Applications (1)

Application Number Title Priority Date Filing Date
IT7949804A IT7949804A0 (it) 1978-07-19 1979-07-19 Analizzatore automatico dello spessore

Country Status (11)

Country Link
JP (1) JPS5923363B2 (it)
AT (1) AT377885B (it)
AU (1) AU3884378A (it)
BR (1) BR7805509A (it)
CH (1) CH640343A5 (it)
DE (1) DE2929567C2 (it)
FR (1) FR2431679A1 (it)
GB (1) GB2027212B (it)
IT (1) IT7949804A0 (it)
NL (1) NL7904876A (it)
SE (1) SE448784B (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
US5495178A (en) * 1992-11-10 1996-02-27 Cheng; David Method and apparatus for measuring film thickness
CN108712830B (zh) * 2018-05-30 2021-02-26 广东天承科技股份有限公司 一种电路板的无钯化学镀铜工艺

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3365663A (en) * 1962-06-29 1968-01-23 Shin Mitsubishi Jukogyo Kk Thickness measuring instrument for electro-conductive objects and associated methods
US4042880A (en) * 1974-01-07 1977-08-16 Unit Process Assemblies, Inc. Electrode assembly for measuring the effective thickness of thru-hole plating circuit board workpieces
JPS5262045A (en) * 1975-11-17 1977-05-23 Oki Electric Ind Co Ltd Measuring thickness of non-electrolytic copper plating of through-hole substrate

Also Published As

Publication number Publication date
AU3884378A (en) 1980-02-14
BR7805509A (pt) 1980-03-11
FR2431679A1 (fr) 1980-02-15
GB2027212B (en) 1983-05-05
NL7904876A (nl) 1980-01-22
JPS5517489A (en) 1980-02-06
JPS5923363B2 (ja) 1984-06-01
AT377885B (de) 1985-05-10
FR2431679B1 (it) 1983-06-17
SE7906144L (sv) 1980-01-20
DE2929567C2 (de) 1983-10-13
GB2027212A (en) 1980-02-13
CH640343A5 (de) 1983-12-30
SE448784B (sv) 1987-03-16
ATA497279A (de) 1984-09-15
DE2929567A1 (de) 1980-01-31

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