IT7820161A0 - Dispositivo per l'esame di distanze tra oggetti in un'immagine a due dimensioni quantizzata. - Google Patents
Dispositivo per l'esame di distanze tra oggetti in un'immagine a due dimensioni quantizzata.Info
- Publication number
- IT7820161A0 IT7820161A0 IT7820161A IT2016178A IT7820161A0 IT 7820161 A0 IT7820161 A0 IT 7820161A0 IT 7820161 A IT7820161 A IT 7820161A IT 2016178 A IT2016178 A IT 2016178A IT 7820161 A0 IT7820161 A0 IT 7820161A0
- Authority
- IT
- Italy
- Prior art keywords
- quantized
- examining
- distances
- objects
- dimensional image
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE7701565A SE405050B (sv) | 1977-02-11 | 1977-02-11 | Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild |
SE7713716A SE409767B (sv) | 1977-12-02 | 1977-12-02 | Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild |
Publications (2)
Publication Number | Publication Date |
---|---|
IT7820161A0 true IT7820161A0 (it) | 1978-02-10 |
IT1093286B IT1093286B (it) | 1985-07-19 |
Family
ID=26656782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT20161/78A IT1093286B (it) | 1977-02-11 | 1978-02-10 | Dispositivo per l'esame di distanze tra oggetti in un'immagine a due dimensioni quantizzata |
Country Status (8)
Country | Link |
---|---|
US (1) | US4170003A (it) |
JP (1) | JPS53121651A (it) |
CH (1) | CH631854A5 (it) |
DE (1) | DE2805754C2 (it) |
FR (1) | FR2380597B1 (it) |
GB (1) | GB1564181A (it) |
IT (1) | IT1093286B (it) |
NL (1) | NL7801071A (it) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4661984A (en) * | 1977-06-03 | 1987-04-28 | Bentley William A | Line inspection system |
DE2929846A1 (de) * | 1979-07-23 | 1981-03-12 | Siemens AG, 1000 Berlin und 8000 München | Opto-elektronisches pruefsystem zur automatischen beschaffenheitspruefung von leiterplatten, deren zwischenprodukte und druckwerkzeuge |
US4571497A (en) * | 1982-08-19 | 1986-02-18 | Eastman Kodak Company | Method for continuously measuring the perimeter of wrapped objects |
US4567372A (en) * | 1982-08-19 | 1986-01-28 | Eastman Kodak Company | Method for continuously measuring the perimeter of wrapped objects of generally uniform cross-section |
US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
US4776022A (en) * | 1985-04-09 | 1988-10-04 | Aoi Systems, Inc. | System for printed circuit board defect detection |
DE4200173A1 (de) * | 1992-01-07 | 1993-07-08 | Tema Teubner & Mandewirth Gmbh | Verfahren und vorrichtung zur ermittlung des dehnungsverhaltens von prueflingen |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3255437A (en) * | 1961-01-23 | 1966-06-07 | John W Ralls | Electronic recognition |
GB1063140A (en) * | 1964-10-08 | 1967-03-30 | Atomic Energy Authority Uk | Improvements in or relating to tool-setting gauges |
US3671941A (en) * | 1969-05-31 | 1972-06-20 | Iwatsu Electric Co Ltd | Apparatus for judging and processing branches and or crossings for use in automatic curve tracing system |
US3890596A (en) * | 1970-11-12 | 1975-06-17 | Philips Corp | Method of and device for determining significant points of characters |
DE2256617C3 (de) * | 1971-11-19 | 1978-08-31 | Hitachi, Ltd., Tokio | Einrichtung zur Analyse einer Vorlage |
JPS4934385A (it) * | 1972-07-28 | 1974-03-29 | ||
GB1431438A (en) * | 1972-09-11 | 1976-04-07 | Nat Res Dev | Pattern recognition systems and apparatus |
JPS5218136A (en) * | 1975-08-01 | 1977-02-10 | Hitachi Ltd | Signal processing unit |
-
1978
- 1978-01-16 GB GB1601/78A patent/GB1564181A/en not_active Expired
- 1978-01-30 NL NL7801071A patent/NL7801071A/xx not_active Application Discontinuation
- 1978-02-09 JP JP1401978A patent/JPS53121651A/ja active Pending
- 1978-02-09 FR FR7803660A patent/FR2380597B1/fr not_active Expired
- 1978-02-10 CH CH148078A patent/CH631854A5/de not_active IP Right Cessation
- 1978-02-10 IT IT20161/78A patent/IT1093286B/it active
- 1978-02-10 DE DE2805754A patent/DE2805754C2/de not_active Expired
- 1978-02-13 US US05/874,646 patent/US4170003A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
NL7801071A (nl) | 1978-08-15 |
FR2380597A1 (fr) | 1978-09-08 |
GB1564181A (en) | 1980-04-02 |
CH631854A5 (de) | 1982-08-31 |
IT1093286B (it) | 1985-07-19 |
JPS53121651A (en) | 1978-10-24 |
DE2805754A1 (de) | 1978-08-17 |
FR2380597B1 (fr) | 1985-09-27 |
DE2805754C2 (de) | 1986-09-11 |
US4170003A (en) | 1979-10-02 |
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