IT1314103B1 - Metodo ed apparecchio per la misurazione diretta dell'angolo di fasedi una radiazione. - Google Patents

Metodo ed apparecchio per la misurazione diretta dell'angolo di fasedi una radiazione.

Info

Publication number
IT1314103B1
IT1314103B1 IT1999MI002527A ITMI992527A IT1314103B1 IT 1314103 B1 IT1314103 B1 IT 1314103B1 IT 1999MI002527 A IT1999MI002527 A IT 1999MI002527A IT MI992527 A ITMI992527 A IT MI992527A IT 1314103 B1 IT1314103 B1 IT 1314103B1
Authority
IT
Italy
Prior art keywords
fasedi
radiation
angle
direct measurement
measurement
Prior art date
Application number
IT1999MI002527A
Other languages
English (en)
Inventor
Rainer Huber
Junli Sun
Bernd Leitner
Hans Dr Steinbichler
Original Assignee
Steinbichler Optotechnik Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steinbichler Optotechnik Gmbh filed Critical Steinbichler Optotechnik Gmbh
Publication of ITMI992527A0 publication Critical patent/ITMI992527A0/it
Publication of ITMI992527A1 publication Critical patent/ITMI992527A1/it
Application granted granted Critical
Publication of IT1314103B1 publication Critical patent/IT1314103B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0215—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods by shearing interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IT1999MI002527A 1998-12-07 1999-12-03 Metodo ed apparecchio per la misurazione diretta dell'angolo di fasedi una radiazione. IT1314103B1 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19856400A DE19856400B4 (de) 1998-12-07 1998-12-07 Verfahren und Vorrichtung zur direkten Phasenmessung von Strahlung

Publications (3)

Publication Number Publication Date
ITMI992527A0 ITMI992527A0 (it) 1999-12-03
ITMI992527A1 ITMI992527A1 (it) 2001-06-03
IT1314103B1 true IT1314103B1 (it) 2002-12-04

Family

ID=7890252

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1999MI002527A IT1314103B1 (it) 1998-12-07 1999-12-03 Metodo ed apparecchio per la misurazione diretta dell'angolo di fasedi una radiazione.

Country Status (4)

Country Link
US (1) US6590668B1 (it)
JP (1) JP4505090B2 (it)
DE (1) DE19856400B4 (it)
IT (1) IT1314103B1 (it)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7317535B2 (en) * 2004-09-10 2008-01-08 National Research Council Of Canada Wavelength dispersive fourier transform spectrometer
US7517642B2 (en) * 2004-12-30 2009-04-14 Intel Corporation Plane waves to control critical dimension
DE102017111250A1 (de) * 2017-05-23 2018-11-29 Vse Ag Shearografievorrichtung und Verfahren zur zerstörungsfreien Materialprüfung mittels Shearografie
CN110108221B (zh) 2018-02-01 2022-06-07 卡尔蔡司光电科技有限责任公司 用于通过干涉法来测试轮胎的方法
DE102019103814B3 (de) 2019-02-14 2020-07-02 Hochschule Trier - Trier University of Applied Sciences Vorrichtung zum optischen Messen einer Oberfläche
US10962419B2 (en) 2019-04-09 2021-03-30 Carl Zeiss Optotechnik GmbH Method for testing a tire by interferometry

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4139302A (en) * 1977-02-17 1979-02-13 Dr. Ralph M. Grant Engineering Consultants, Inc. Method and apparatus for interferometric deformation analysis
GB2189315B (en) * 1982-01-21 1988-03-16 Secr Defence Radiation device for distinguishing coherent radiation from incoherent radiation
US4682892A (en) * 1982-08-13 1987-07-28 The Goodyear Tire & Rubber Company Method and apparatus for speckle-shearing interferometric deformation analysis
GB8406690D0 (en) * 1984-03-14 1984-04-18 Secr Defence Remote sensing of gases &c
US4887899A (en) * 1987-12-07 1989-12-19 Hung Yau Y Apparatus and method for electronic analysis of test objects
DE3930632A1 (de) * 1989-09-13 1991-03-14 Steinbichler Hans Verfahren zur direkten phasenmessung von strahlung, insbesondere lichtstrahlung, und vorrichtung zur durchfuehrung dieses verfahrens
JPH06273238A (ja) * 1993-03-24 1994-09-30 Seiko Epson Corp 光学装置
JP3209645B2 (ja) * 1993-10-12 2001-09-17 三菱電機株式会社 位相シフトマスクの検査方法およびその方法に用いる検査装置
DE19513233C2 (de) * 1995-04-07 2001-01-04 Andreas Ettemeyer Verfahren und Vorrichtung zur Bestimmung von Phasen und Phasendifferenzen
GB9610471D0 (en) * 1996-05-18 1996-07-24 Univ Nottingham Optical measurement
JPH1062258A (ja) * 1996-08-20 1998-03-06 Toshiba Corp 位相シフトマスク検査装置

Also Published As

Publication number Publication date
ITMI992527A1 (it) 2001-06-03
DE19856400A1 (de) 2000-06-08
JP2000186964A (ja) 2000-07-04
US6590668B1 (en) 2003-07-08
DE19856400B4 (de) 2009-04-09
ITMI992527A0 (it) 1999-12-03
JP4505090B2 (ja) 2010-07-14

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