IT1241133B - Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere - Google Patents

Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere

Info

Publication number
IT1241133B
IT1241133B IT20099A IT2009990A IT1241133B IT 1241133 B IT1241133 B IT 1241133B IT 20099 A IT20099 A IT 20099A IT 2009990 A IT2009990 A IT 2009990A IT 1241133 B IT1241133 B IT 1241133B
Authority
IT
Italy
Prior art keywords
readers
opaque
measurement
thickness
layer
Prior art date
Application number
IT20099A
Other languages
English (en)
Other versions
IT9020099A0 (it
IT9020099A1 (it
Inventor
Alessandro Masotti
Original Assignee
Electronic Systems Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronic Systems Spa filed Critical Electronic Systems Spa
Priority to IT20099A priority Critical patent/IT1241133B/it
Publication of IT9020099A0 publication Critical patent/IT9020099A0/it
Priority to EP19910103589 priority patent/EP0452665A3/en
Publication of IT9020099A1 publication Critical patent/IT9020099A1/it
Application granted granted Critical
Publication of IT1241133B publication Critical patent/IT1241133B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT20099A 1990-04-20 1990-04-20 Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere IT1241133B (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT20099A IT1241133B (it) 1990-04-20 1990-04-20 Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere
EP19910103589 EP0452665A3 (en) 1990-04-20 1991-03-08 Device and scanning method for measuring the thickness of opaque or transparent coatings of any type using a laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT20099A IT1241133B (it) 1990-04-20 1990-04-20 Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere

Publications (3)

Publication Number Publication Date
IT9020099A0 IT9020099A0 (it) 1990-04-20
IT9020099A1 IT9020099A1 (it) 1991-10-20
IT1241133B true IT1241133B (it) 1993-12-29

Family

ID=11163792

Family Applications (1)

Application Number Title Priority Date Filing Date
IT20099A IT1241133B (it) 1990-04-20 1990-04-20 Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere

Country Status (2)

Country Link
EP (1) EP0452665A3 (it)
IT (1) IT1241133B (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5291269A (en) * 1991-12-06 1994-03-01 Hughes Aircraft Company Apparatus and method for performing thin film layer thickness metrology on a thin film layer having shape deformations and local slope variations
EP0665577A1 (en) * 1994-01-28 1995-08-02 Applied Materials, Inc. Method and apparatus for monitoring the deposition rate of films during physical vapour deposition
DE4423288B4 (de) * 1994-07-02 2006-01-26 Heidelberger Druckmaschinen Ag Anordnung zum Messen der Dicke einer transparenten Beschichtung auf einem Druckerzeugnis
US5555474A (en) * 1994-12-21 1996-09-10 Integrated Process Equipment Corp. Automatic rejection of diffraction effects in thin film metrology
DE10244767A1 (de) * 2002-09-26 2004-04-08 Europäisches Laboratorium für Molekularbiologie Verfahren und Vorrichtung zum Bestimmen des Abstands zwischen einer Referenzebene und einer inneren oder äußeren optischen Grenzfläche eines Objekts sowie Verwendung derselben zum Bestimmen eines Oberflächenprofils eines, inbesondere metallischen, Objekts, Autofokus-Modul, Mikroskop und Verfahren zum Autofokussieren eines Mikroskops
US8315834B2 (en) 2003-12-17 2012-11-20 Siemens Energy, Inc. System and method for measuring coating thickness
DE102004003329B3 (de) * 2004-01-22 2005-10-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur geometrischen Vermessung einer mit einem transparenten Materialfilm bedeckten Oberfläche
US20080158572A1 (en) * 2006-12-27 2008-07-03 Honeywell, Inc. System and method for measurement of thickness of thin films
CN102305588B (zh) * 2011-07-18 2015-07-22 苏州天准科技股份有限公司 一种双激光复合式影像测量系统
AU2014361727B2 (en) 2013-12-09 2019-07-04 Hatch Pty Ltd Measuring apparatus and method for same
CN104848794A (zh) * 2015-05-26 2015-08-19 天津市得艺乐器有限公司 一种架子鼓喷涂检测系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3801349A (en) * 1970-08-07 1974-04-02 Caterpillar Tractor Co Coating a continuous metallic strip with pulverant material with a non-destructive measuring method
GB1483215A (en) * 1973-08-24 1977-08-17 Infra Systems Inc Infrared measuring circuits
JPS61201106A (ja) * 1985-03-05 1986-09-05 Toshiba Corp 透明な膜の撮像方式

Also Published As

Publication number Publication date
EP0452665A2 (en) 1991-10-23
IT9020099A0 (it) 1990-04-20
EP0452665A3 (en) 1992-09-09
IT9020099A1 (it) 1991-10-20

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970414