IT1226645B - Metodo e apparato per ispezione di oggetti con migliorato rapporto tra segnale e disturbo e ridotto offuscamento di immagine. - Google Patents

Metodo e apparato per ispezione di oggetti con migliorato rapporto tra segnale e disturbo e ridotto offuscamento di immagine.

Info

Publication number
IT1226645B
IT1226645B IT8721931A IT2193187A IT1226645B IT 1226645 B IT1226645 B IT 1226645B IT 8721931 A IT8721931 A IT 8721931A IT 2193187 A IT2193187 A IT 2193187A IT 1226645 B IT1226645 B IT 1226645B
Authority
IT
Italy
Prior art keywords
disturbance
inspection
objects
signal
reduced image
Prior art date
Application number
IT8721931A
Other languages
English (en)
Other versions
IT8721931A0 (it
Inventor
Douglas Scott Steele
James Marcus Brown Jr
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IT8721931A0 publication Critical patent/IT8721931A0/it
Application granted granted Critical
Publication of IT1226645B publication Critical patent/IT1226645B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Hydrogenated Pyridines (AREA)
  • Complex Calculations (AREA)
IT8721931A 1986-09-19 1987-09-16 Metodo e apparato per ispezione di oggetti con migliorato rapporto tra segnale e disturbo e ridotto offuscamento di immagine. IT1226645B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US90974086A 1986-09-19 1986-09-19

Publications (2)

Publication Number Publication Date
IT8721931A0 IT8721931A0 (it) 1987-09-16
IT1226645B true IT1226645B (it) 1991-01-31

Family

ID=25427750

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8721931A IT1226645B (it) 1986-09-19 1987-09-16 Metodo e apparato per ispezione di oggetti con migliorato rapporto tra segnale e disturbo e ridotto offuscamento di immagine.

Country Status (6)

Country Link
JP (1) JPS63120244A (it)
CA (1) CA1301372C (it)
DE (1) DE3730506A1 (it)
FR (1) FR2604258A1 (it)
GB (1) GB2196220B (it)
IT (1) IT1226645B (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3818542C2 (de) * 1988-05-31 1994-05-11 Gerhard Dipl Ing Hoeper Vorrichtung zum Prüfen eines technischen Körpers
KR20190132563A (ko) 2012-02-27 2019-11-27 디이이씨 아이엔씨 내연 기관을 추진하기 위한 산소-풍부 플라즈마 발생기
CN104730091B (zh) * 2015-02-10 2018-01-16 西安交通大学 基于区域分割探测的燃气轮机叶片缺陷提取与分析方法
RU2018134937A (ru) 2016-03-07 2020-04-08 Хайтек Пауэр, Инк. Способ формирования и распределения второго топлива для двигателя внутреннего сгорания
US20190234348A1 (en) 2018-01-29 2019-08-01 Hytech Power, Llc Ultra Low HHO Injection

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1587643A (en) * 1977-06-16 1981-04-08 Siemens Ag Tomographic scanning apparatus
USRE32164E (en) * 1980-12-01 1986-05-27 The University Of Utah Radiographic systems employing multi-linear arrays of electronic radiation detectors
JPS5850453A (ja) * 1981-09-21 1983-03-24 Mitsubishi Electric Corp 物品検査システム
US4506327A (en) * 1981-11-23 1985-03-19 General Electric Company Limited-angle imaging using multiple energy scanning
DE3325281C2 (de) * 1983-07-13 1985-09-26 Rheinisch-Westfälischer Technischer Überwachungsverein e.V ., 4300 Essen Verfahren und Vorrichtung zur fortlaufenden, zerstörungsfreien Werkstoffprüfung an kontinuierlich bewegtem Bandmaterial
US4583240A (en) * 1983-08-15 1986-04-15 General Electric Company Data acquisition circuitry for use in computerized tomography system
JPS60123754A (ja) * 1983-12-08 1985-07-02 Nippon Kokan Kk <Nkk> 放射線透視装置
US4803639A (en) * 1986-02-25 1989-02-07 General Electric Company X-ray inspection system

Also Published As

Publication number Publication date
DE3730506A1 (de) 1988-03-24
GB2196220B (en) 1991-02-06
GB2196220A (en) 1988-04-20
CA1301372C (en) 1992-05-19
FR2604258A1 (fr) 1988-03-25
JPS63120244A (ja) 1988-05-24
GB8721405D0 (en) 1987-10-21
IT8721931A0 (it) 1987-09-16

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IT1226645B (it) Metodo e apparato per ispezione di oggetti con migliorato rapporto tra segnale e disturbo e ridotto offuscamento di immagine.