GB2196220B - Object inspection systems - Google Patents
Object inspection systemsInfo
- Publication number
- GB2196220B GB2196220B GB8721405A GB8721405A GB2196220B GB 2196220 B GB2196220 B GB 2196220B GB 8721405 A GB8721405 A GB 8721405A GB 8721405 A GB8721405 A GB 8721405A GB 2196220 B GB2196220 B GB 2196220B
- Authority
- GB
- United Kingdom
- Prior art keywords
- inspection systems
- object inspection
- systems
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US90974086A | 1986-09-19 | 1986-09-19 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8721405D0 GB8721405D0 (en) | 1987-10-21 |
GB2196220A GB2196220A (en) | 1988-04-20 |
GB2196220B true GB2196220B (en) | 1991-02-06 |
Family
ID=25427750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8721405A Expired - Fee Related GB2196220B (en) | 1986-09-19 | 1987-09-11 | Object inspection systems |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPS63120244A (en) |
CA (1) | CA1301372C (en) |
DE (1) | DE3730506A1 (en) |
FR (1) | FR2604258A1 (en) |
GB (1) | GB2196220B (en) |
IT (1) | IT1226645B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3818542C2 (en) * | 1988-05-31 | 1994-05-11 | Gerhard Dipl Ing Hoeper | Device for testing a technical body |
WO2013130467A1 (en) | 2012-02-27 | 2013-09-06 | Deec, Inc. | Oxygen-rich plasma generators for boosting internal combustion engines |
CN104730091B (en) * | 2015-02-10 | 2018-01-16 | 西安交通大学 | The extraction of gas turbine blades defect and analysis method based on region segmentation detection |
RU2018134937A (en) | 2016-03-07 | 2020-04-08 | Хайтек Пауэр, Инк. | METHOD FOR FORMING AND DISTRIBUTING SECOND FUEL FOR THE INTERNAL COMBUSTION ENGINE |
US20190234348A1 (en) | 2018-01-29 | 2019-08-01 | Hytech Power, Llc | Ultra Low HHO Injection |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1587643A (en) * | 1977-06-16 | 1981-04-08 | Siemens Ag | Tomographic scanning apparatus |
EP0134962A2 (en) * | 1983-08-15 | 1985-03-27 | General Electric Company | Data acquisition circuitry for use in computerized tomography system |
EP0234537A2 (en) * | 1986-02-25 | 1987-09-02 | General Electric Company | X-ray inspection system |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE32164E (en) * | 1980-12-01 | 1986-05-27 | The University Of Utah | Radiographic systems employing multi-linear arrays of electronic radiation detectors |
JPS5850453A (en) * | 1981-09-21 | 1983-03-24 | Mitsubishi Electric Corp | Inspection system of article |
US4506327A (en) * | 1981-11-23 | 1985-03-19 | General Electric Company | Limited-angle imaging using multiple energy scanning |
DE3325281C2 (en) * | 1983-07-13 | 1985-09-26 | Rheinisch-Westfälischer Technischer Überwachungsverein e.V ., 4300 Essen | Method and device for continuous, non-destructive material testing on continuously moving strip material |
JPS60123754A (en) * | 1983-12-08 | 1985-07-02 | Nippon Kokan Kk <Nkk> | Radiation fluoroscopic apparatus |
-
1987
- 1987-09-03 JP JP62219295A patent/JPS63120244A/en active Pending
- 1987-09-04 CA CA000546180A patent/CA1301372C/en not_active Expired - Fee Related
- 1987-09-11 DE DE19873730506 patent/DE3730506A1/en not_active Withdrawn
- 1987-09-11 GB GB8721405A patent/GB2196220B/en not_active Expired - Fee Related
- 1987-09-14 FR FR8712687A patent/FR2604258A1/en active Pending
- 1987-09-16 IT IT8721931A patent/IT1226645B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1587643A (en) * | 1977-06-16 | 1981-04-08 | Siemens Ag | Tomographic scanning apparatus |
EP0134962A2 (en) * | 1983-08-15 | 1985-03-27 | General Electric Company | Data acquisition circuitry for use in computerized tomography system |
EP0234537A2 (en) * | 1986-02-25 | 1987-09-02 | General Electric Company | X-ray inspection system |
Also Published As
Publication number | Publication date |
---|---|
CA1301372C (en) | 1992-05-19 |
GB8721405D0 (en) | 1987-10-21 |
GB2196220A (en) | 1988-04-20 |
DE3730506A1 (en) | 1988-03-24 |
IT1226645B (en) | 1991-01-31 |
JPS63120244A (en) | 1988-05-24 |
FR2604258A1 (en) | 1988-03-25 |
IT8721931A0 (en) | 1987-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19930911 |