GB2196220B - Object inspection systems - Google Patents

Object inspection systems

Info

Publication number
GB2196220B
GB2196220B GB8721405A GB8721405A GB2196220B GB 2196220 B GB2196220 B GB 2196220B GB 8721405 A GB8721405 A GB 8721405A GB 8721405 A GB8721405 A GB 8721405A GB 2196220 B GB2196220 B GB 2196220B
Authority
GB
United Kingdom
Prior art keywords
inspection systems
object inspection
systems
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB8721405A
Other versions
GB8721405D0 (en
GB2196220A (en
Inventor
Douglas Scott Steele
Jr James Marcas Brown
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB8721405D0 publication Critical patent/GB8721405D0/en
Publication of GB2196220A publication Critical patent/GB2196220A/en
Application granted granted Critical
Publication of GB2196220B publication Critical patent/GB2196220B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
GB8721405A 1986-09-19 1987-09-11 Object inspection systems Expired - Fee Related GB2196220B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US90974086A 1986-09-19 1986-09-19

Publications (3)

Publication Number Publication Date
GB8721405D0 GB8721405D0 (en) 1987-10-21
GB2196220A GB2196220A (en) 1988-04-20
GB2196220B true GB2196220B (en) 1991-02-06

Family

ID=25427750

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8721405A Expired - Fee Related GB2196220B (en) 1986-09-19 1987-09-11 Object inspection systems

Country Status (6)

Country Link
JP (1) JPS63120244A (en)
CA (1) CA1301372C (en)
DE (1) DE3730506A1 (en)
FR (1) FR2604258A1 (en)
GB (1) GB2196220B (en)
IT (1) IT1226645B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3818542C2 (en) * 1988-05-31 1994-05-11 Gerhard Dipl Ing Hoeper Device for testing a technical body
WO2013130467A1 (en) 2012-02-27 2013-09-06 Deec, Inc. Oxygen-rich plasma generators for boosting internal combustion engines
CN104730091B (en) * 2015-02-10 2018-01-16 西安交通大学 The extraction of gas turbine blades defect and analysis method based on region segmentation detection
RU2018134937A (en) 2016-03-07 2020-04-08 Хайтек Пауэр, Инк. METHOD FOR FORMING AND DISTRIBUTING SECOND FUEL FOR THE INTERNAL COMBUSTION ENGINE
US20190234348A1 (en) 2018-01-29 2019-08-01 Hytech Power, Llc Ultra Low HHO Injection

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1587643A (en) * 1977-06-16 1981-04-08 Siemens Ag Tomographic scanning apparatus
EP0134962A2 (en) * 1983-08-15 1985-03-27 General Electric Company Data acquisition circuitry for use in computerized tomography system
EP0234537A2 (en) * 1986-02-25 1987-09-02 General Electric Company X-ray inspection system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE32164E (en) * 1980-12-01 1986-05-27 The University Of Utah Radiographic systems employing multi-linear arrays of electronic radiation detectors
JPS5850453A (en) * 1981-09-21 1983-03-24 Mitsubishi Electric Corp Inspection system of article
US4506327A (en) * 1981-11-23 1985-03-19 General Electric Company Limited-angle imaging using multiple energy scanning
DE3325281C2 (en) * 1983-07-13 1985-09-26 Rheinisch-Westfälischer Technischer Überwachungsverein e.V ., 4300 Essen Method and device for continuous, non-destructive material testing on continuously moving strip material
JPS60123754A (en) * 1983-12-08 1985-07-02 Nippon Kokan Kk <Nkk> Radiation fluoroscopic apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1587643A (en) * 1977-06-16 1981-04-08 Siemens Ag Tomographic scanning apparatus
EP0134962A2 (en) * 1983-08-15 1985-03-27 General Electric Company Data acquisition circuitry for use in computerized tomography system
EP0234537A2 (en) * 1986-02-25 1987-09-02 General Electric Company X-ray inspection system

Also Published As

Publication number Publication date
CA1301372C (en) 1992-05-19
GB8721405D0 (en) 1987-10-21
GB2196220A (en) 1988-04-20
DE3730506A1 (en) 1988-03-24
IT1226645B (en) 1991-01-31
JPS63120244A (en) 1988-05-24
FR2604258A1 (en) 1988-03-25
IT8721931A0 (en) 1987-09-16

Similar Documents

Publication Publication Date Title
GB8722303D0 (en) Automatic inspection system
GB2104214B (en) Inspection system
GB2178537B (en) Gauging system
GB8912064D0 (en) Wafer inspection system
GB8900949D0 (en) Function inspecting system
GB8710945D0 (en) Auto-decompression system
GB8707013D0 (en) Interconnecting systems
GB8625828D0 (en) Inspecting object
EP0251487A3 (en) X-ray systems
EP0244111A3 (en) Imaging systems
EP0246145A3 (en) Pattern inspection system
GB8602084D0 (en) Inspection systems
GB2190569B (en) Image-filing system
GB2191573B (en) Fire-monitoring system
GB2197957B (en) Sensor systems
GB8627993D0 (en) Echosounding system
GB2113828B (en) Inspection systems
GB2196220B (en) Object inspection systems
GB8716630D0 (en) Visual measurement system
GB8712122D0 (en) Optical-electronic system
GB2201819B (en) Detection systems
GB2193336B (en) Imaging systems
GB8629196D0 (en) Article inspection system
GB8609068D0 (en) Coolant-pumping system
GB8611989D0 (en) Egg collecting systems

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19930911