IT1064202B - Apparecchiatura per la deflessione elettrostatica di fasci di ioni di alta corrente in un apparecchiatura di scansione - Google Patents

Apparecchiatura per la deflessione elettrostatica di fasci di ioni di alta corrente in un apparecchiatura di scansione

Info

Publication number
IT1064202B
IT1064202B IT7622176A IT2217676A IT1064202B IT 1064202 B IT1064202 B IT 1064202B IT 7622176 A IT7622176 A IT 7622176A IT 2217676 A IT2217676 A IT 2217676A IT 1064202 B IT1064202 B IT 1064202B
Authority
IT
Italy
Prior art keywords
equipment
high current
ion beams
current ion
electrostatic deflection
Prior art date
Application number
IT7622176A
Other languages
English (en)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT1064202B publication Critical patent/IT1064202B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/08Deviation, concentration or focusing of the beam by electric or magnetic means
    • G21K1/087Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1472Deflecting along given lines
    • H01J37/1474Scanning means
    • H01J37/1477Scanning means electrostatic

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Physical Vapour Deposition (AREA)
  • Particle Accelerators (AREA)
IT7622176A 1975-06-30 1976-04-12 Apparecchiatura per la deflessione elettrostatica di fasci di ioni di alta corrente in un apparecchiatura di scansione IT1064202B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/592,013 US3997846A (en) 1975-06-30 1975-06-30 Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus

Publications (1)

Publication Number Publication Date
IT1064202B true IT1064202B (it) 1985-02-18

Family

ID=24368912

Family Applications (1)

Application Number Title Priority Date Filing Date
IT7622176A IT1064202B (it) 1975-06-30 1976-04-12 Apparecchiatura per la deflessione elettrostatica di fasci di ioni di alta corrente in un apparecchiatura di scansione

Country Status (7)

Country Link
US (1) US3997846A (it)
JP (1) JPS524998A (it)
CA (1) CA1054726A (it)
DE (1) DE2623207C2 (it)
FR (1) FR2316721A1 (it)
GB (1) GB1491839A (it)
IT (1) IT1064202B (it)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2389998B1 (it) * 1977-05-05 1981-11-20 Ibm
FR2412939A1 (fr) * 1977-12-23 1979-07-20 Anvar Implanteur d'ions a fort courant
US4556823A (en) * 1983-07-28 1985-12-03 International Business Machines Corporation Multi-function charged particle apparatus
US4686365A (en) * 1984-12-24 1987-08-11 American Cyanamid Company Fourier transform ion cyclothon resonance mass spectrometer with spatially separated sources and detector
JPS6345744A (ja) * 1986-08-11 1988-02-26 Fujitsu Ltd 荷電ビ−ムの偏向法
JP4716399B2 (ja) * 2004-05-21 2011-07-06 株式会社アルバック イオン注入装置の静電偏向器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA652815A (en) * 1962-11-27 Gabor Dennis Ion source
US2237671A (en) * 1939-02-15 1941-04-08 Emi Ltd Electron discharge device
US2957141A (en) * 1958-03-19 1960-10-18 Gen Electric Interval stretcher
US3040205A (en) * 1960-05-31 1962-06-19 Harold R Walker Electrostatic vidicon
US3313969A (en) * 1966-03-25 1967-04-11 Boeing Co Charged particle deflecting apparatus having hemispherical electrodes
US3535880A (en) * 1966-06-14 1970-10-27 Hughes Aircraft Co Ion beam deflection system
NL157452B (nl) * 1968-11-09 1978-07-17 Philips Nv Inrichting met een kathodestraalbuis.
US3665182A (en) * 1969-08-18 1972-05-23 Minnesota Mining & Mfg Elemental analyzing apparatus
DE2242987B2 (de) * 1972-09-01 1980-06-12 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Vorrichtung zur Trennung von neutralen Teilchen und schnellen Ionen von langsamen Ionen
CH583460A5 (it) * 1974-09-30 1976-12-31 Balzers Patent Beteilig Ag

Also Published As

Publication number Publication date
DE2623207A1 (de) 1977-01-27
GB1491839A (en) 1977-11-16
FR2316721A1 (fr) 1977-01-28
CA1054726A (en) 1979-05-15
US3997846A (en) 1976-12-14
FR2316721B1 (it) 1978-11-17
JPS5332039B2 (it) 1978-09-06
DE2623207C2 (de) 1983-05-05
JPS524998A (en) 1977-01-14

Similar Documents

Publication Publication Date Title
GB2059148B (en) Focusing apparatus for double deflection scanning of charged particle beam
MX146634A (es) Mejoras en dispositivo de convergencia magnetica para la convergencia estatica de haces de electrones
IT7809420A0 (it) Sistema di barre collettrici di un interruttore elettrico per alta tensione
ZA761879B (en) Electrostatic precipitator
FR2329069A1 (fr) Procede de projection d'un faisceau de particules chargees
GB2000903B (en) Charged particle beam tube electrostatic deflection apparatus
JPS5252360A (en) Plate electron beam addressing device
GB1547476A (en) Corpuscular beam apparatus
GB2021789B (en) Monitoring voltage using an electron beam probe
IT7850193A0 (it) Apparecchio per la lavorazione dimateriale mediante un fascio di particelle cariche in particolare fascio di elettroni
GB1557226A (en) Corpuscular beam microscopes
IT1064202B (it) Apparecchiatura per la deflessione elettrostatica di fasci di ioni di alta corrente in un apparecchiatura di scansione
GB1549451A (en) Charged particle beam apparatus
GB1544105A (en) Electrostatic precipitator arrangement
JPS52100255A (en) Apparatus for scanning of target by charged particle beam
DK277980A (da) Lodret afboejningskredsloeb for katodestraaleroer
DE2964232D1 (en) Electron beam investigation process and electron impact spectrometer therefor
JPS52124873A (en) Method of deflecting charged particle beam
IT1064057B (it) Procedimento per la preparazione di scambiatori di ioni anfoteri mediante la sostituzione di polimeri idrofili
JPS526462A (en) Particle beam microscope
IT1070563B (it) Apparecchiatura perfezionata per l impiantamento di ioni
JPS51123056A (en) Scanning stereoscopic electron microscope
GB2040556B (en) Alignment apparatus for electron beams of cathode raytubes
IT1072145B (it) Generatore di alta tensione particolarmente per televisori
GB1557800A (en) Corpuscular beam scanning microscopes