IN2014DN07350A - - Google Patents
Info
- Publication number
- IN2014DN07350A IN2014DN07350A IN7350DEN2014A IN2014DN07350A IN 2014DN07350 A IN2014DN07350 A IN 2014DN07350A IN 7350DEN2014 A IN7350DEN2014 A IN 7350DEN2014A IN 2014DN07350 A IN2014DN07350 A IN 2014DN07350A
- Authority
- IN
- India
- Prior art keywords
- objects
- criteria
- user
- storage
- computerized system
- Prior art date
Links
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IL2012/050296 WO2014024178A1 (en) | 2012-08-08 | 2012-08-08 | Method of improving wafer yield |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014DN07350A true IN2014DN07350A (enrdf_load_stackoverflow) | 2015-04-24 |
Family
ID=46881113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN7350DEN2014 IN2014DN07350A (enrdf_load_stackoverflow) | 2012-08-08 | 2012-03-27 |
Country Status (2)
| Country | Link |
|---|---|
| IN (1) | IN2014DN07350A (enrdf_load_stackoverflow) |
| WO (1) | WO2014024178A1 (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11346882B2 (en) | 2017-11-03 | 2022-05-31 | Tokyo Electron Limited | Enhancement of yield of functional microelectronic devices |
| US11244873B2 (en) * | 2018-10-31 | 2022-02-08 | Tokyo Electron Limited | Systems and methods for manufacturing microelectronic devices |
| CN114678284B (zh) * | 2020-12-24 | 2025-04-29 | 紫光同芯微电子有限公司 | 一种晶圆组芯片潜在失效筛选方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3659981B2 (ja) * | 1992-07-09 | 2005-06-15 | アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド | ダイ特定情報に特徴付けられるダイ上の集積回路を含む装置 |
| US6477685B1 (en) * | 1999-09-22 | 2002-11-05 | Texas Instruments Incorporated | Method and apparatus for yield and failure analysis in the manufacturing of semiconductors |
-
2012
- 2012-03-27 IN IN7350DEN2014 patent/IN2014DN07350A/en unknown
- 2012-08-08 WO PCT/IL2012/050296 patent/WO2014024178A1/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| WO2014024178A1 (en) | 2014-02-13 |
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