IN2014CN04838A - - Google Patents

Info

Publication number
IN2014CN04838A
IN2014CN04838A IN4838CHN2014A IN2014CN04838A IN 2014CN04838 A IN2014CN04838 A IN 2014CN04838A IN 4838CHN2014 A IN4838CHN2014 A IN 4838CHN2014A IN 2014CN04838 A IN2014CN04838 A IN 2014CN04838A
Authority
IN
India
Prior art keywords
substrate
lighting
pixels
acquiring
control
Prior art date
Application number
Inventor
Michel Pichon
Franc Davenne
Arnaud Cereyron
Original Assignee
Saint Gobain
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain filed Critical Saint Gobain
Publication of IN2014CN04838A publication Critical patent/IN2014CN04838A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/74—Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means

Landscapes

  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)

Abstract

The invention relates to a device (1) for analysing one or more at least partially transparent substrates (2) moving relative to the device (1) including: a lighting system (4 6) capable of simultaneously producing different types of lighting in separate lighting areas through which each substrate (2) is to move; a matrix camera (12) capable of acquiring an image transmitted and/or reflected by the substrate(s) (2) of multiple rows of pixels and capable of acquiring simultaneously an image of multiple groups of adjacent rows of pixels that correspond to the aforementioned separate areas respectively; and a control unit (14) comprising a memory (15) in which control programs are stored that can control the camera (12) for various acquisitions synchronised with the speed of travel of the substrate(s) (2).
IN4838CHN2014 2011-12-02 2012-11-28 IN2014CN04838A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1161114A FR2983583B1 (en) 2011-12-02 2011-12-02 DEVICE FOR ANALYZING ASPECT DEFECTS OF A TRANSPARENT SUBSTRATE
PCT/FR2012/052740 WO2013098497A1 (en) 2011-12-02 2012-11-28 Device for analysing blemishes of a transparent substrate

Publications (1)

Publication Number Publication Date
IN2014CN04838A true IN2014CN04838A (en) 2015-09-18

Family

ID=47436085

Family Applications (1)

Application Number Title Priority Date Filing Date
IN4838CHN2014 IN2014CN04838A (en) 2011-12-02 2012-11-28

Country Status (10)

Country Link
US (1) US20140368634A1 (en)
EP (1) EP2786129A1 (en)
KR (1) KR20140096158A (en)
CN (1) CN104067110B (en)
CA (1) CA2859598A1 (en)
DE (1) DE202012013683U1 (en)
EA (1) EA201491082A8 (en)
FR (1) FR2983583B1 (en)
IN (1) IN2014CN04838A (en)
WO (1) WO2013098497A1 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014008596B4 (en) * 2014-06-10 2016-01-28 Grenzebach Maschinenbau Gmbh Apparatus and method for fast and reliable measurement of distortion errors in a produced float glass belt
GB2532056B (en) * 2014-11-07 2019-04-24 Shelton Machines Ltd Apparatus and method for inspecting contact lenses
CN108369194A (en) * 2015-12-16 2018-08-03 株式会社理光 inspection system and inspection method
DE102016100437B4 (en) 2016-01-12 2018-08-02 Stephan Krebs Device for image control
EP3465171B1 (en) * 2016-05-30 2024-07-24 Bobst Mex Sa Surface inspection system and inspection method
CN108072659B (en) * 2016-11-11 2022-05-31 三星显示有限公司 Multi-optical vision apparatus
JP6801156B2 (en) * 2017-01-31 2020-12-16 オムロン株式会社 Sheet inspection device
US10289930B2 (en) * 2017-02-09 2019-05-14 Glasstech, Inc. System and associated for online measurement of the optical characteristics of a glass sheet
JP7229657B2 (en) * 2017-08-22 2023-02-28 王子ホールディングス株式会社 LAMINATED SHEET DEFECT INSPECTION APPARATUS AND SHEET PRODUCT MANUFACTURING METHOD
CN109142378A (en) * 2018-09-17 2019-01-04 凌云光技术集团有限责任公司 A kind of display material open defect detection device
JP2020085587A (en) * 2018-11-21 2020-06-04 日本電気硝子株式会社 Glass plate manufacturing method and glass plate manufacturing device
WO2021240279A1 (en) * 2020-05-29 2021-12-02 Conceria Pasubio S.P.A. Method and apparatus for identifying possible surface defects of a leather hide
EP4229387A4 (en) * 2020-10-15 2024-10-16 Applied Materials Inc In-line metrology systems, apparatus, and methods for optical devices
DE102022133889A1 (en) * 2022-12-19 2024-06-20 Isra Vision Gmbh Method for optical inspection of an object and corresponding inspection device
CN117805124B (en) * 2024-03-01 2024-06-18 杭州乔戈里科技有限公司 Device and method for acquiring inner ring channel image of deep groove ball bearing

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19643017C1 (en) * 1996-10-18 1998-04-23 Innomess Ges Fuer Messtechnik Procedure for the determination of optical defects in large panes
DE19733431A1 (en) * 1997-03-13 1998-09-17 Tema Teubner & Mandewirth Gmbh Arrangement for defect monitoring of sheet=like material, especially transparent or opaque foils
DE10102557B4 (en) * 2001-01-20 2005-11-17 Visotec Gmbh Method and device for checking disk-shaped workpieces for surface or inclusion defects
GB2424781B (en) * 2005-03-30 2007-11-28 Micron Technology Inc High density row ram for column parallel CMOS image sensors
DE102005050882B4 (en) 2005-10-21 2008-04-30 Isra Vision Systems Ag System and method for optical inspection of glass panes
US7567344B2 (en) * 2006-05-12 2009-07-28 Corning Incorporated Apparatus and method for characterizing defects in a transparent substrate
FR2936605B1 (en) * 2008-10-01 2014-10-31 Saint Gobain DEVICE FOR ANALYZING THE SURFACE OF A SUBSTRATE
CN101887030A (en) 2009-05-15 2010-11-17 圣戈本玻璃法国公司 Method and system for detecting defects of surface and/or interior of transparent substrate
EP2253948B1 (en) * 2009-05-22 2013-01-09 Dr. Schenk GmbH Industriemesstechnik Device and method for optical examination of an object
FR2958404B1 (en) * 2010-04-01 2012-04-27 Saint Gobain METHOD AND DEVICE FOR ANALYZING THE OPTICAL QUALITY OF A TRANSPARENT SUBSTRATE
DE102010021853B4 (en) * 2010-05-28 2012-04-26 Isra Vision Ag Device and method for optical inspection of an object
US8761486B2 (en) * 2011-02-22 2014-06-24 Bio-Rad Laboratories, Inc. Line scan cytometry systems and methods

Also Published As

Publication number Publication date
FR2983583A1 (en) 2013-06-07
KR20140096158A (en) 2014-08-04
DE202012013683U1 (en) 2019-07-11
US20140368634A1 (en) 2014-12-18
EP2786129A1 (en) 2014-10-08
WO2013098497A1 (en) 2013-07-04
CN104067110B (en) 2018-05-08
EA201491082A1 (en) 2015-04-30
FR2983583B1 (en) 2013-11-15
CA2859598A1 (en) 2013-07-04
EA201491082A8 (en) 2015-09-30
CN104067110A (en) 2014-09-24

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