IN2014CN03302A - - Google Patents

Info

Publication number
IN2014CN03302A
IN2014CN03302A IN3302CHN2014A IN2014CN03302A IN 2014CN03302 A IN2014CN03302 A IN 2014CN03302A IN 3302CHN2014 A IN3302CHN2014 A IN 3302CHN2014A IN 2014CN03302 A IN2014CN03302 A IN 2014CN03302A
Authority
IN
India
Prior art keywords
image
bulge
tire
inspected
dent
Prior art date
Application number
Inventor
Eiji Takahashi
Toshiyuki Tsuji
Masato Kannaka
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Publication of IN2014CN03302A publication Critical patent/IN2014CN03302A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/027—Tyres using light, e.g. infrared, ultraviolet or holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60C—VEHICLE TYRES; TYRE INFLATION; TYRE CHANGING; CONNECTING VALVES TO INFLATABLE ELASTIC BODIES IN GENERAL; DEVICES OR ARRANGEMENTS RELATED TO TYRES
    • B60C13/00—Tyre sidewalls; Protecting, decorating, marking, or the like, thereof
    • B60C13/003—Tyre sidewalls; Protecting, decorating, marking, or the like, thereof characterised by sidewall curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Abstract

An objective of the present invention is to subtract only the difference between bulge and dent mark heights and compute and acquire only the heights of bulges and dents even when bulges and dents are present so as to overlap in the bulge and dent marks. Provided is a tire shape inspection method for inspecting sidewall surface shape defects in inspected tires using an image of a sample tire having sidewall surfaces on which bulge and dent marks are formed. The method executes the following steps: first as a teaching operation step boundary lines of the bulge and dent marks are detected in a sample source image of a sample tire a mask image is generated which denotes the boundary lines regions are removed from the sample source image which correspond to the boundary lines which are denoted in the mask image and a height offset image is generated which represents the heights of the remaining regions with one or more offset values. Next as an inspection operation step the height offset image is subtracted from an inspection image of the inspected tire the boundary regions which the mask image represents are removed and on the basis of the obtained bulge/dent removal image shape defects of the sidewall surfaces of the inspected tire are inspected.
IN3302CHN2014 2011-11-07 2012-10-02 IN2014CN03302A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011243270A JP5726045B2 (en) 2011-11-07 2011-11-07 Tire shape inspection method and tire shape inspection device
PCT/JP2012/075484 WO2013069389A1 (en) 2011-11-07 2012-10-02 Tire shape inspection method and tire shape inspection device

Publications (1)

Publication Number Publication Date
IN2014CN03302A true IN2014CN03302A (en) 2015-07-03

Family

ID=48289774

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3302CHN2014 IN2014CN03302A (en) 2011-11-07 2012-10-02

Country Status (8)

Country Link
US (1) US9109974B2 (en)
EP (1) EP2789970B1 (en)
JP (1) JP5726045B2 (en)
CN (1) CN104024792B (en)
IN (1) IN2014CN03302A (en)
PT (1) PT2789970T (en)
TW (1) TWI475186B (en)
WO (1) WO2013069389A1 (en)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9361641B2 (en) * 2012-11-21 2016-06-07 Maciej Wisniewski System and method for tire inventory and promotion
US9110032B2 (en) * 2013-03-14 2015-08-18 Integro Technologies Corp. System and methods for inspecting tire wheel assemblies
JP5923054B2 (en) * 2013-04-08 2016-05-24 株式会社神戸製鋼所 Shape inspection device
JP6267481B2 (en) * 2013-10-18 2018-01-24 リコーエレメックス株式会社 Appearance inspection apparatus and appearance inspection method
JP5775132B2 (en) 2013-11-01 2015-09-09 株式会社ブリヂストン Tire inspection equipment
WO2015097635A1 (en) * 2013-12-23 2015-07-02 Pirelli Tyre S.P.A. Method and apparatus for detecting defects on tyres in a tyre production process
JP5831592B2 (en) * 2014-05-09 2015-12-09 横浜ゴム株式会社 Tire trimming apparatus and method
JP6159294B2 (en) * 2014-06-02 2017-07-05 住友ゴム工業株式会社 Tire tread shape measuring method and tread shape measuring apparatus used therefor
FR3022380A1 (en) * 2014-06-13 2015-12-18 Michelin & Cie METHOD FOR PNEUMATIC IMAGE ADJUSTMENT
JP6289283B2 (en) * 2014-06-20 2018-03-07 株式会社ブリヂストン Method for correcting surface shape data of annular rotating body, and appearance inspection device for annular rotating body
JP6413630B2 (en) * 2014-10-28 2018-10-31 株式会社ジェイテクト Infrared stress measurement method and infrared stress measurement apparatus
CN107278261B (en) * 2014-12-22 2020-08-28 倍耐力轮胎股份公司 Method and apparatus for inspecting tyres in a production line
RU2696346C2 (en) 2014-12-22 2019-08-01 Пирелли Тайр С.П.А. Tire production control device on production line
EP3237876B1 (en) * 2014-12-22 2019-02-20 Pirelli Tyre S.p.A. Method and apparatus for detecting defects on tyres in a tyre production process
JP6591762B2 (en) * 2015-02-27 2019-10-16 三菱重工業株式会社 Wear inspection apparatus, wear inspection method and program
US10275874B2 (en) * 2015-06-30 2019-04-30 Pirelli Tyre S.P.A. Method and apparatus for detecting defects on the surface of tyres
EP3414520A1 (en) * 2016-02-12 2018-12-19 Bartell Machinery Systems L.L.C Bead measurement system
CN107121084B (en) 2016-02-25 2023-12-29 株式会社三丰 Measurement method measurement program
CN107121058B (en) * 2016-02-25 2020-09-15 株式会社三丰 Measuring method
KR101802812B1 (en) * 2016-04-20 2017-11-29 주식회사 고영테크놀러지 Inspecting apparatus for product appearance and inspection method for product appearance using the same
CN109344832B (en) * 2018-09-03 2021-02-02 北京市商汤科技开发有限公司 Image processing method and device, electronic equipment and storage medium
CN109325930B (en) * 2018-09-12 2021-09-28 苏州优纳科技有限公司 Boundary defect detection method, device and detection equipment
JP7018380B2 (en) * 2018-11-30 2022-02-10 株式会社神戸製鋼所 Image display method of tire surface and image processing device used for the image display
RU2764644C1 (en) * 2018-11-30 2022-01-19 ДжФЕ СТИЛ КОРПОРЕЙШН Method for detecting surface defects, device for detecting surface defects, method for producing steel materials, method for steel material quality control, steel materials production plant, method for generating models for determining surface defects and a model for determining surface defects
WO2020121306A1 (en) * 2018-12-13 2020-06-18 Uveye Ltd. Method of automatic tire inspection and system thereof
JP7220128B2 (en) * 2019-06-21 2023-02-09 東洋ガラス株式会社 Glass bottle inspection method and glass bottle manufacturing method
CN110766684B (en) * 2019-10-30 2022-03-18 江南大学 Stator surface defect detection system and detection method based on machine vision
CN113516608B (en) * 2020-03-26 2024-03-26 合肥美亚光电技术股份有限公司 Method and device for detecting defects of tire and tire detecting equipment
CN113554582B (en) * 2020-04-22 2022-11-08 中国科学院长春光学精密机械与物理研究所 Defect detection method, device and system for functional hole in electronic equipment cover plate
CN115439476B (en) * 2022-11-07 2023-03-14 成都博视广达科技有限责任公司 Silk-screen defect detection method and device based on image analysis
CN117249778B (en) * 2023-11-20 2024-01-26 雷励(常州)智能科技有限公司 High fault tolerance rate embryo detection device for make-up machine

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910411A (en) * 1988-02-12 1990-03-20 Sumitumo Rubber Industries Apparatus for inspecting a side wall of a tire
US6381547B1 (en) * 2000-06-12 2002-04-30 Foster-Miller, Inc. Tire defect detection system and method
US6831996B1 (en) * 2001-09-24 2004-12-14 Oberg Industries Method for inspecting an automotive wheel and associated apparatus
JP4034168B2 (en) 2002-11-01 2008-01-16 株式会社ブリヂストン Inspection method and apparatus for tire side unevenness state
JP4679073B2 (en) 2004-05-18 2011-04-27 株式会社ブリヂストン Tire unevenness pattern inspection method and tire unevenness pattern inspection apparatus
US7269997B2 (en) * 2004-06-03 2007-09-18 Snap-On Incorporated Non-contact method and system for tire analysis
JP5046688B2 (en) 2007-03-08 2012-10-10 株式会社神戸製鋼所 Tire shape detection device and tire shape detection method
ES2464867T3 (en) * 2007-07-30 2014-06-04 Snap-On Equipment Srl A Unico Socio Procedure and apparatus for determining the geometric dimensions of a vehicle wheel
WO2009148095A1 (en) * 2008-06-04 2009-12-10 株式会社神戸製鋼所 Tire shape inspection method and tire shape inspection device
JP5302701B2 (en) * 2009-02-06 2013-10-02 株式会社神戸製鋼所 Tire shape inspection method, tire shape inspection device
KR100998058B1 (en) * 2008-07-03 2010-12-03 한국타이어 주식회사 Tire uniformity analysis system and method thereof
US8712720B2 (en) * 2008-12-19 2014-04-29 Michelin Recherche at Technigue S.A. Filtering method for improving the data quality of geometric tire measurements
JP5371848B2 (en) * 2009-12-07 2013-12-18 株式会社神戸製鋼所 Tire shape inspection method and tire shape inspection device

Also Published As

Publication number Publication date
EP2789970A1 (en) 2014-10-15
JP2013096972A (en) 2013-05-20
PT2789970T (en) 2018-01-24
CN104024792A (en) 2014-09-03
EP2789970B1 (en) 2018-01-03
WO2013069389A1 (en) 2013-05-16
JP5726045B2 (en) 2015-05-27
CN104024792B (en) 2017-02-15
EP2789970A4 (en) 2015-08-19
US20140283591A1 (en) 2014-09-25
US9109974B2 (en) 2015-08-18
TW201333421A (en) 2013-08-16
TWI475186B (en) 2015-03-01

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