IN2012DN05264A - - Google Patents

Info

Publication number
IN2012DN05264A
IN2012DN05264A IN5264DEN2012A IN2012DN05264A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A IN 5264DEN2012 A IN5264DEN2012 A IN 5264DEN2012A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A
Authority
IN
India
Application number
Other languages
English (en)
Inventor
Robert Hartl
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of IN2012DN05264A publication Critical patent/IN2012DN05264A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/318357—Simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/31835—Analysis of test coverage or failure detectability
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Tests Of Electronic Circuits (AREA)
IN5264DEN2012 2010-03-04 2012-06-14 IN2012DN05264A (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102010002563 2010-03-04
DE102010040035A DE102010040035A1 (de) 2010-03-04 2010-08-31 Verbesserungen der Rückwärts-Analyse zur Bestimmung von Fehlermaskierungsfaktoren
PCT/EP2011/051786 WO2011107321A1 (fr) 2010-03-04 2011-02-08 Améliorations apportées à l'analyse en arrière pour la détermination de facteurs de masquage de dysfonctionnements

Publications (1)

Publication Number Publication Date
IN2012DN05264A true IN2012DN05264A (fr) 2015-08-07

Family

ID=44503068

Family Applications (1)

Application Number Title Priority Date Filing Date
IN5264DEN2012 IN2012DN05264A (fr) 2010-03-04 2012-06-14

Country Status (8)

Country Link
US (1) US8732649B2 (fr)
EP (1) EP2542904B1 (fr)
JP (1) JP5681215B2 (fr)
KR (1) KR20130008035A (fr)
CN (1) CN102770777B (fr)
DE (1) DE102010040035A1 (fr)
IN (1) IN2012DN05264A (fr)
WO (1) WO2011107321A1 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9829494B2 (en) 2005-12-01 2017-11-28 Adrenomed Ag Methods of treatment using ADM antibodies
DK3553084T3 (da) 2011-11-16 2023-02-20 Adrenomed Ag Anti-adrenomedullin (adm)-antistof eller anti-adm-antistoffragment eller anti-adm-non-ig-scaffold til forebyggelse eller reduktion af organdysfunktion eller organsvigt hos en patient med en kronisk eller akut sygdom eller akut tilstand
SG11201402362VA (en) 2011-11-16 2014-06-27 Adrenomed Ag Anti-adrenomedullin (adm) antibody or anti-adm antibody fragment or anti-adm non-ig scaffold for reducing the risk of mortality in a patient having a chronic or acute disease or acute condition
EP2780370B1 (fr) 2011-11-16 2019-09-25 AdrenoMed AG Anticorps anti-adrénomédulline (adm) ou fragment d'anticorps anti-adm ou échafaudage non-ig anti-adm pour l'application thérapeutique en cas d'une maladie aiguë ou d'un état aigu d'un patient pour la stabilisation de la circulation
LT2780371T (lt) 2011-11-16 2019-05-27 Adrenomed Ag Adrenomeduliną (adm) atpažįstantis antikūnas arba anti-adm antikūno fragmentas, arba anti-adm ne ig struktūros karkasas, skirti paciento, sergančio lėtine arba ūmia liga, skysčių pusiausvyros reguliavimui
DK2780717T3 (en) 2011-11-16 2017-02-13 Sphingotec Gmbh ADRENOMEDULLINASSAYS AND METHODS FOR DETERMINING MODERN ADRENOMEDULLIN
US8719747B2 (en) * 2012-01-31 2014-05-06 Mentor Graphics Corporation Single event upset mitigation for electronic design synthesis
WO2014142852A1 (fr) * 2013-03-13 2014-09-18 Intel Corporation Estimation de vulnérabilité d'une mémoire cache
US9317254B1 (en) * 2013-12-04 2016-04-19 Google Inc. Fault tolerance model, methods, and apparatuses and their validation techniques
US10013581B2 (en) * 2014-10-07 2018-07-03 Nuvoton Technology Corporation Detection of fault injection attacks
KR102542723B1 (ko) * 2016-10-27 2023-06-12 삼성전자주식회사 Ser 예측을 위한 시뮬레이션 방법 및 시스템
JP6863460B2 (ja) * 2017-06-05 2021-04-21 富士通株式会社 ソフトエラー検査方法、ソフトエラー検査装置及びソフトエラー検査システム
US10691572B2 (en) * 2017-08-30 2020-06-23 Nvidia Corporation Liveness as a factor to evaluate memory vulnerability to soft errors
US11022649B2 (en) * 2018-11-30 2021-06-01 Arm Limited Stabilised failure estimate in circuits
US10747601B2 (en) * 2018-11-30 2020-08-18 Arm Limited Failure estimation in circuits
CN109634797A (zh) * 2018-12-18 2019-04-16 上海交通大学 一种用寄存器屏蔽窗口分析寄存器架构敏感因子的方法
US11366899B2 (en) 2020-02-18 2022-06-21 Nuvoton Technology Corporation Digital fault injection detector
US11307975B2 (en) 2020-02-20 2022-04-19 International Business Machines Corporation Machine code analysis for identifying software defects
US11663113B2 (en) 2020-02-20 2023-05-30 International Business Machines Corporation Real time fault localization using combinatorial test design techniques and test case priority selection
US11086768B1 (en) * 2020-02-20 2021-08-10 International Business Machines Corporation Identifying false positives in test case failures using combinatorics
US11176026B2 (en) 2020-02-20 2021-11-16 International Business Machines Corporation Assignment of test case priorities based on combinatorial test design model analysis
US11783026B2 (en) * 2021-01-05 2023-10-10 Nuvoton Technology Corporation Processor with in-band fault-injection detection

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JPS61187047A (ja) * 1985-02-14 1986-08-20 Fujitsu Ltd 論理回路シミユレ−シヨン方式
JPH04245338A (ja) * 1991-01-31 1992-09-01 Hitachi Ltd 故障シミュレーションにおける処理量削減方法
US5499249A (en) * 1994-05-31 1996-03-12 At&T Corp. Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs)
CA2159036C (fr) * 1994-12-29 1999-01-26 Miron Abramovici Methode de detection de defaillances inverifiables et redondantes dans les circuits logiques sequentiels
JPH11142482A (ja) 1997-11-13 1999-05-28 Fujitsu Ltd タイミング故障診断方法及び装置
US20020188904A1 (en) * 2001-06-11 2002-12-12 International Business Machines Corporation Efficiency of fault simulation by logic backtracking
US7007252B2 (en) * 2003-04-09 2006-02-28 Synopsys, Inc. Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit
US7159199B2 (en) * 2004-04-02 2007-01-02 Stmicroelectronics Limited Method for verifying adequate synchronization of signals that cross clock environments and system
US7246413B2 (en) 2004-05-28 2007-07-24 Charles Portelli Magnetic safety knob for a cabinet door
US7296201B2 (en) * 2005-10-29 2007-11-13 Dafca, Inc. Method to locate logic errors and defects in digital circuits
US20070226572A1 (en) 2005-11-07 2007-09-27 Ming Zhang Soft error rate analysis system
US8230285B2 (en) 2006-02-17 2012-07-24 Jds Uniphase Corporation Protocol analyzer for consumer electronics
JP5045319B2 (ja) * 2007-09-03 2012-10-10 日本電気株式会社 エラー信号パルス幅の計算方法及びプログラム
JP5672038B2 (ja) * 2011-02-10 2015-02-18 富士通株式会社 検証支援装置、検証支援プログラム、および検証支援方法

Also Published As

Publication number Publication date
KR20130008035A (ko) 2013-01-21
DE102010040035A1 (de) 2011-09-08
CN102770777B (zh) 2015-05-20
US8732649B2 (en) 2014-05-20
JP2013521483A (ja) 2013-06-10
EP2542904A1 (fr) 2013-01-09
CN102770777A (zh) 2012-11-07
US20130061104A1 (en) 2013-03-07
WO2011107321A1 (fr) 2011-09-09
EP2542904B1 (fr) 2014-04-16
JP5681215B2 (ja) 2015-03-04

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