IN2012DN05264A - - Google Patents

Info

Publication number
IN2012DN05264A
IN2012DN05264A IN5264DEN2012A IN2012DN05264A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A IN 5264DEN2012 A IN5264DEN2012 A IN 5264DEN2012A IN 2012DN05264 A IN2012DN05264 A IN 2012DN05264A
Authority
IN
India
Application number
Inventor
Robert Hartl
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE102010002563 priority Critical
Priority to DE102010040035A priority patent/DE102010040035A1/en
Priority to PCT/EP2011/051786 priority patent/WO2011107321A1/en
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of IN2012DN05264A publication Critical patent/IN2012DN05264A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/318357Simulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequences
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/31835Analysis of test coverage or failure detectability
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
IN5264DEN2012 2010-03-04 2012-06-14 IN2012DN05264A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE102010002563 2010-03-04
DE102010040035A DE102010040035A1 (en) 2010-03-04 2010-08-31 Improvements to backward analysis to determine error masking factors
PCT/EP2011/051786 WO2011107321A1 (en) 2010-03-04 2011-02-08 Improvements in backward analysis for determining fault masking factors

Publications (1)

Publication Number Publication Date
IN2012DN05264A true IN2012DN05264A (en) 2015-08-07

Family

ID=44503068

Family Applications (1)

Application Number Title Priority Date Filing Date
IN5264DEN2012 IN2012DN05264A (en) 2010-03-04 2012-06-14

Country Status (8)

Country Link
US (1) US8732649B2 (en)
EP (1) EP2542904B1 (en)
JP (1) JP5681215B2 (en)
KR (1) KR20130008035A (en)
CN (1) CN102770777B (en)
DE (1) DE102010040035A1 (en)
IN (1) IN2012DN05264A (en)
WO (1) WO2011107321A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9829494B2 (en) 2005-12-01 2017-11-28 Adrenomed Ag Methods of treatment using ADM antibodies
CA2856136A1 (en) 2011-11-16 2013-05-23 Adrenomed Ag Anti-adrenomedullin (adm) antibody or anti-adm antibody fragment or anti-adm non-ig scaffold for reducing the risk of mortality in a patient having a chronic or acute disease or acute condition
JP6193872B2 (en) 2011-11-16 2017-09-06 アドレノメト アクチェンゲゼルシャフト Anti-adrenomedullin (ADM) antibody, anti-ADM antibody fragment or anti-ADM non-Ig scaffold for adjusting fluid balance in patients suffering from chronic or acute diseases
US9304127B2 (en) 2011-11-16 2016-04-05 Adrenomed Ag Anti-adrenomedullin (ADM) antibody or anti-ADM antibody fragment for use in therapy
ES2729710T3 (en) 2011-11-16 2019-11-05 Adrenomed Ag Antiadrenomedulin antibody (ADM) or anti-ADM antibody fragment or non-Ig anti-ADM scaffolding for the prevention or reduction of an organic dysfunction or an organic insufficiency in a patient presenting with a chronic or acute disease or an acute condition
US9402900B2 (en) 2011-11-16 2016-08-02 Adrenomed Ag Methods of modulating adrenomedullin by administering an anti-adrenomedullin (ADM) antibody
US8719747B2 (en) * 2012-01-31 2014-05-06 Mentor Graphics Corporation Single event upset mitigation for electronic design synthesis
WO2014142852A1 (en) * 2013-03-13 2014-09-18 Intel Corporation Vulnerability estimation for cache memory
US9317254B1 (en) * 2013-12-04 2016-04-19 Google Inc. Fault tolerance model, methods, and apparatuses and their validation techniques
US10013581B2 (en) * 2014-10-07 2018-07-03 Nuvoton Technology Corporation Detection of fault injection attacks
US20190065338A1 (en) * 2017-08-30 2019-02-28 Nvidia Corporation Liveness as a factor to evaluate memory vulnerability to soft errors

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61187047A (en) 1985-02-14 1986-08-20 Fujitsu Ltd Logical circuit simulation system
JPH04245338A (en) * 1991-01-31 1992-09-01 Hitachi Ltd Throughput reducing method for fault simulation
US5499249A (en) * 1994-05-31 1996-03-12 At&T Corp. Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs)
CA2159036C (en) * 1994-12-29 1999-01-26 Miron Abramovici Method for identifying untestable & redundant faults in sequential logic circuits
JPH11142482A (en) 1997-11-13 1999-05-28 Fujitsu Ltd Method and device for timing fault diagnosis
US20020188904A1 (en) * 2001-06-11 2002-12-12 International Business Machines Corporation Efficiency of fault simulation by logic backtracking
US7007252B2 (en) * 2003-04-09 2006-02-28 Synopsys, Inc. Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit
US7159199B2 (en) * 2004-04-02 2007-01-02 Stmicroelectronics Limited Method for verifying adequate synchronization of signals that cross clock environments and system
US7246413B2 (en) 2004-05-28 2007-07-24 Charles Portelli Magnetic safety knob for a cabinet door
US7296201B2 (en) * 2005-10-29 2007-11-13 Dafca, Inc. Method to locate logic errors and defects in digital circuits
US20070226572A1 (en) 2005-11-07 2007-09-27 Ming Zhang Soft error rate analysis system
US8230285B2 (en) 2006-02-17 2012-07-24 Jds Uniphase Corporation Protocol analyzer for consumer electronics
JP5045319B2 (en) * 2007-09-03 2012-10-10 日本電気株式会社 Error signal pulse width calculation method and program
JP5672038B2 (en) * 2011-02-10 2015-02-18 富士通株式会社 Verification support device, verification support program, and verification support method

Also Published As

Publication number Publication date
DE102010040035A1 (en) 2011-09-08
EP2542904B1 (en) 2014-04-16
WO2011107321A1 (en) 2011-09-09
CN102770777B (en) 2015-05-20
US20130061104A1 (en) 2013-03-07
JP2013521483A (en) 2013-06-10
CN102770777A (en) 2012-11-07
EP2542904A1 (en) 2013-01-09
JP5681215B2 (en) 2015-03-04
KR20130008035A (en) 2013-01-21
US8732649B2 (en) 2014-05-20

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