IN2012DN04974A - - Google Patents

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Publication number
IN2012DN04974A
IN2012DN04974A IN4974DEN2012A IN2012DN04974A IN 2012DN04974 A IN2012DN04974 A IN 2012DN04974A IN 4974DEN2012 A IN4974DEN2012 A IN 4974DEN2012A IN 2012DN04974 A IN2012DN04974 A IN 2012DN04974A
Authority
IN
India
Prior art keywords
scattered light
difference
recorded
determining
signals
Prior art date
Application number
Other languages
English (en)
Inventor
Karl Stengel
Gerhard Haaga
Michael Neuendorf
Raymond Sieg
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of IN2012DN04974A publication Critical patent/IN2012DN04974A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G01N2021/513—Cuvettes for scattering measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
IN4974DEN2012 2010-02-26 2011-01-03 IN2012DN04974A (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE201010002420 DE102010002420A1 (de) 2010-02-26 2010-02-26 Verfahren und Vorrichtung zur Bestimmung der Qualität der Messergebnisse eines Streulichtmessgerätes
PCT/EP2011/050031 WO2011104039A1 (de) 2010-02-26 2011-01-03 Verfahren und vorrichtung zur bestimmung der qualität der messergebnisse eines streulichtmessgerätes

Publications (1)

Publication Number Publication Date
IN2012DN04974A true IN2012DN04974A (de) 2015-09-25

Family

ID=43856153

Family Applications (1)

Application Number Title Priority Date Filing Date
IN4974DEN2012 IN2012DN04974A (de) 2010-02-26 2011-01-03

Country Status (6)

Country Link
US (1) US8873052B2 (de)
EP (1) EP2539688B1 (de)
CN (1) CN102762972B (de)
DE (1) DE102010002420A1 (de)
IN (1) IN2012DN04974A (de)
WO (1) WO2011104039A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5822534B2 (ja) * 2011-05-13 2015-11-24 株式会社日立ハイテクノロジーズ 自動分析装置
TWI754253B (zh) * 2011-08-01 2022-02-01 以色列商諾發測量儀器股份有限公司 控制半導體裝置的製造的方法及系統
US20170059539A1 (en) * 2013-06-14 2017-03-02 Dresser, Inc. Modular metering system
EP3052921B1 (de) 2013-09-30 2018-07-25 Hach Lange GmbH Nephelometrisches turbidimeter und verfahren zur detektion der kontamination einer probenküvette eines nephelometrischen turbidimeters
CN105424558B (zh) * 2015-11-03 2018-05-22 上海理工大学 一种采用蓝光背光照明的燃烧颗粒多参数测量装置及方法
DE102018108538A1 (de) * 2018-04-11 2019-10-17 Audi Ag Verfahren zur Ermittlung von Verkehrsinformationen

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3976891A (en) * 1975-02-18 1976-08-24 Electra-Tronics, Inc. Photoelectric detector for smoke or the like
US4688017A (en) * 1986-05-20 1987-08-18 Cooperbiomedical, Inc. Optical detector circuit for photometric instrument
DE4343897A1 (de) * 1993-12-22 1995-06-29 Bosch Gmbh Robert Vorrichtung zur Dichte- und Konzentrationsbestimmung von sichtbaren Bestandteilen in Fluiden
US5467187A (en) 1994-09-29 1995-11-14 Hf Scientific, Inc. Automatic calibration system for turbidimeters using a pulsing fluid flow to reciprocate a standard in a cuvette
EP0871858B1 (de) * 1995-04-06 2006-09-13 DeLaval Holding AB Verfahren und vorrichtung zur quantitativen bestimmung von teilchen in flüssigkeiten
JPH10170435A (ja) * 1996-12-05 1998-06-26 Daikin Ind Ltd 埃検出装置および埃検出方法
JP3765549B2 (ja) * 1997-02-28 2006-04-12 日本碍子株式会社 ダスト濃度測定方法
US8603772B2 (en) 2007-07-28 2013-12-10 Bug Lab LLC Particle sensor with wide linear range
EP2040075A1 (de) * 2007-09-24 2009-03-25 Julius-Maximilians-Universität Würzburg Verbindungen und Marker für oberflächenverstärkte Raman-Streuung

Also Published As

Publication number Publication date
US20130057859A1 (en) 2013-03-07
EP2539688B1 (de) 2016-12-28
DE102010002420A1 (de) 2011-09-01
EP2539688A1 (de) 2013-01-02
WO2011104039A1 (de) 2011-09-01
US8873052B2 (en) 2014-10-28
CN102762972B (zh) 2015-11-25
CN102762972A (zh) 2012-10-31

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