IN2012DN00982A - - Google Patents

Info

Publication number
IN2012DN00982A
IN2012DN00982A IN982DEN2012A IN2012DN00982A IN 2012DN00982 A IN2012DN00982 A IN 2012DN00982A IN 982DEN2012 A IN982DEN2012 A IN 982DEN2012A IN 2012DN00982 A IN2012DN00982 A IN 2012DN00982A
Authority
IN
India
Prior art keywords
cmp
pads
polishing
planarizing
dissipate
Prior art date
Application number
Other languages
English (en)
Inventor
Zhang Yong
Huang David
Sun Lu
Original Assignee
Praxair Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Praxair Technology Inc filed Critical Praxair Technology Inc
Publication of IN2012DN00982A publication Critical patent/IN2012DN00982A/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/08Processes
    • C08G18/10Prepolymer processes involving reaction of isocyanates or isothiocyanates with compounds having active hydrogen in a first reaction step
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/28Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
    • C08G18/40High-molecular-weight compounds
    • C08G18/42Polycondensates having carboxylic or carbonic ester groups in the main chain
    • C08G18/4236Polycondensates having carboxylic or carbonic ester groups in the main chain containing only aliphatic groups
    • C08G18/4238Polycondensates having carboxylic or carbonic ester groups in the main chain containing only aliphatic groups derived from dicarboxylic acids and dialcohols
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/28Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
    • C08G18/40High-molecular-weight compounds
    • C08G18/48Polyethers
    • C08G18/4854Polyethers containing oxyalkylene groups having four carbon atoms in the alkylene group
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/70Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
    • C08G18/72Polyisocyanates or polyisothiocyanates
    • C08G18/74Polyisocyanates or polyisothiocyanates cyclic
    • C08G18/76Polyisocyanates or polyisothiocyanates cyclic aromatic
    • C08G18/7614Polyisocyanates or polyisothiocyanates cyclic aromatic containing only one aromatic ring
    • C08G18/7621Polyisocyanates or polyisothiocyanates cyclic aromatic containing only one aromatic ring being toluene diisocyanate including isomer mixtures
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J9/00Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof
    • C08J9/04Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof using blowing gases generated by a previously added blowing agent
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2110/00Foam properties
    • C08G2110/0041Foam properties having specified density
    • C08G2110/0066≥ 150kg/m3

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Polyurethanes Or Polyureas (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
IN982DEN2012 2009-08-07 2010-07-16 IN2012DN00982A (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/537,862 US8551201B2 (en) 2009-08-07 2009-08-07 Polyurethane composition for CMP pads and method of manufacturing same
PCT/US2010/042281 WO2011016971A1 (en) 2009-08-07 2010-07-16 Polyurethane composition for cmp pads and method of manufacturing same

Publications (1)

Publication Number Publication Date
IN2012DN00982A true IN2012DN00982A (enExample) 2015-04-10

Family

ID=42732397

Family Applications (1)

Application Number Title Priority Date Filing Date
IN982DEN2012 IN2012DN00982A (enExample) 2009-08-07 2010-07-16

Country Status (9)

Country Link
US (2) US8551201B2 (enExample)
EP (1) EP2462178A1 (enExample)
JP (1) JP2013501823A (enExample)
KR (1) KR20120052282A (enExample)
CN (1) CN102574969A (enExample)
IN (1) IN2012DN00982A (enExample)
SG (1) SG178247A1 (enExample)
TW (1) TW201122033A (enExample)
WO (1) WO2011016971A1 (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009053224A1 (de) * 2009-11-06 2011-07-14 Bayer MaterialScience AG, 51373 Verfahren zur Herstellung eines Polyurethanschaums und hieraus erhältlicher Polyurethanschaum
US9144880B2 (en) 2012-11-01 2015-09-29 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Soft and conditionable chemical mechanical polishing pad
CL2013000959A1 (es) * 2013-03-15 2013-08-23 Sika Technology Ag Composicion en base a poliuretano que comprende un prepolimero de poliuretano, un agente de curado que comprende una poliamina aromatica mononuclear, un disolvente y un plastificante; metodo de reparacion de defectos en sustratos elasticos; proceso de union de sustratos flexibles; y uso de dicha composicion.
US9238295B2 (en) * 2013-05-31 2016-01-19 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Soft and conditionable chemical mechanical window polishing pad
US9233451B2 (en) 2013-05-31 2016-01-12 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Soft and conditionable chemical mechanical polishing pad stack
US9238296B2 (en) 2013-05-31 2016-01-19 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer
KR102066002B1 (ko) * 2013-06-10 2020-02-11 삼성전자주식회사 연마 패드 조성물
US9102034B2 (en) 2013-08-30 2015-08-11 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of chemical mechanical polishing a substrate
US20150306731A1 (en) 2014-04-25 2015-10-29 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
US9481070B2 (en) * 2014-12-19 2016-11-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. High-stability polyurethane polishing pad
US9776300B2 (en) * 2015-06-26 2017-10-03 Rohm And Haas Electronic Materials Cmp Holdings Inc. Chemical mechanical polishing pad and method of making same
WO2017056903A1 (ja) * 2015-10-02 2017-04-06 Dic株式会社 ポリウレタンエラストマーの製造方法
US9484212B1 (en) 2015-10-30 2016-11-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing method
CN107452663A (zh) * 2016-05-30 2017-12-08 中芯国际集成电路制造(北京)有限公司 晶圆承载膜
US10722999B2 (en) * 2016-06-17 2020-07-28 Rohm And Haas Electronic Materials Cmp Holdings, Inc. High removal rate chemical mechanical polishing pads and methods of making
US10086494B2 (en) * 2016-09-13 2018-10-02 Rohm And Haas Electronic Materials Cmp Holdings, Inc. High planarization efficiency chemical mechanical polishing pads and methods of making
CN107457716B (zh) * 2017-08-29 2019-11-22 湖北鼎龙控股股份有限公司 化学机械抛光垫的抛光层
US10464187B2 (en) * 2017-12-01 2019-11-05 Rohm And Haas Electronic Materials Cmp Holdings, Inc. High removal rate chemical mechanical polishing pads from amine initiated polyol containing curatives
WO2019198675A1 (ja) * 2018-04-10 2019-10-17 株式会社トクヤマ ポリロタキサンを用いたウレタン樹脂、および研磨用パッド
US12122013B2 (en) * 2019-10-23 2024-10-22 Sk Enpulse Co., Ltd. Composition for polishing pad and polishing pad
JP7513397B2 (ja) * 2020-01-10 2024-07-09 ニッタ・デュポン株式会社 研磨パッド
CN116833900B (zh) * 2023-07-31 2024-01-26 广东工业大学 一种用于半导体晶片化学机械抛光的磁流变弹性抛光垫、制备方法及其应用

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3094495A (en) * 1958-09-15 1963-06-18 Mobay Chemical Corp Process for preparing cellular polyurethanes from mixture of two prepolymers and resulting product
US4980386A (en) 1989-04-28 1990-12-25 Polymer Dynamics Technology, Inc. Methods for the manufacture of energy-attenuating polyurethanes
US5545706A (en) 1995-05-09 1996-08-13 Arco Chemical Technology, L.P. PTMEG polyurethane elastomers employing monofunctional polyethers
US6184262B1 (en) * 1997-09-22 2001-02-06 R. T. Vanderbilt Company, Inc. Benzotriazole stabilizers for polyols and polyurethane foam
US6514301B1 (en) 1998-06-02 2003-02-04 Peripheral Products Inc. Foam semiconductor polishing belts and pads
US6095902A (en) 1998-09-23 2000-08-01 Rodel Holdings, Inc. Polyether-polyester polyurethane polishing pads and related methods
US6723771B2 (en) 2001-04-05 2004-04-20 Uniroyal Chemical Company, Inc. High friction polyurethane elastomers having improved abrasion resistance
US7378454B2 (en) * 2001-04-09 2008-05-27 Toyo Tire & Rubber Co., Ltd. Polyurethane composition and polishing pad
US6866743B2 (en) * 2001-04-12 2005-03-15 Air Products And Chemicals, Inc. Controlled structure polyurethane prepolymers for polyurethane structural adhesives
KR100877390B1 (ko) * 2001-11-13 2009-01-07 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
US7086932B2 (en) 2004-05-11 2006-08-08 Freudenberg Nonwovens Polishing pad
US7074115B2 (en) 2003-10-09 2006-07-11 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad
US20050171224A1 (en) 2004-02-03 2005-08-04 Kulp Mary J. Polyurethane polishing pad
US20060089095A1 (en) * 2004-10-27 2006-04-27 Swisher Robert G Polyurethane urea polishing pad
KR101134058B1 (ko) 2005-05-17 2012-04-16 도요 고무 고교 가부시키가이샤 연마 패드
US8217133B2 (en) 2006-03-08 2012-07-10 Chemtura Corporation Storage stable one component polyurethane system
US7445847B2 (en) * 2006-05-25 2008-11-04 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
US7169030B1 (en) 2006-05-25 2007-01-30 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
JP5008927B2 (ja) * 2006-08-31 2012-08-22 東洋ゴム工業株式会社 研磨パッド
US7371160B1 (en) * 2006-12-21 2008-05-13 Rohm And Haas Electronic Materials Cmp Holdings Inc. Elastomer-modified chemical mechanical polishing pad
US7569268B2 (en) * 2007-01-29 2009-08-04 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
US20090062414A1 (en) 2007-08-28 2009-03-05 David Picheng Huang System and method for producing damping polyurethane CMP pads
US8052507B2 (en) * 2007-11-20 2011-11-08 Praxair Technology, Inc. Damping polyurethane CMP pads with microfillers
US20100035529A1 (en) * 2008-08-05 2010-02-11 Mary Jo Kulp Chemical mechanical polishing pad
JP5634903B2 (ja) * 2010-02-25 2014-12-03 東洋ゴム工業株式会社 研磨パッド
US8758659B2 (en) * 2010-09-29 2014-06-24 Fns Tech Co., Ltd. Method of grooving a chemical-mechanical planarization pad

Also Published As

Publication number Publication date
US8551201B2 (en) 2013-10-08
CN102574969A (zh) 2012-07-11
US20130125473A1 (en) 2013-05-23
JP2013501823A (ja) 2013-01-17
US20110034578A1 (en) 2011-02-10
WO2011016971A1 (en) 2011-02-10
KR20120052282A (ko) 2012-05-23
SG178247A1 (en) 2012-03-29
EP2462178A1 (en) 2012-06-13
TW201122033A (en) 2011-07-01

Similar Documents

Publication Publication Date Title
IN2012DN00982A (enExample)
EP2357059A3 (en) Method for chemical mechanical planarization of a tungsten-containing substrate
WO2010123744A3 (en) Cmp porous pad with particles in a polymeric matrix
TW200940692A (en) Copper-passivating CMP compositions and methods
WO2010129207A3 (en) Polishing silicon carbide
TW200734434A (en) Compositions and methods for tantalum CMP
SG178605A1 (en) Chemical mechanical polishing conditioner
MY148785A (en) Method for producing glass substrate for magnetic disk
MY172804A (en) Method for chemical mechanical polishing silicon wafers
WO2010036358A8 (en) Abrasive compositions for chemical mechanical polishing and methods for using same
TW200735201A (en) CMP method providing reduced thickness variations
SG152978A1 (en) Method for producing a semiconductor wafer with a polished edge
WO2010105240A3 (en) Chemical mechanical planarization using nanodiamond
MY147729A (en) Polishing composition and method utilizing abrasive particles treated with an aminosilane
WO2010120784A8 (en) Chemical mechanical polishing of silicon carbide comprising surfaces
TW200513527A (en) Tunable composition and method for chemical-mechanical planarization with aspartic acid/tolyltriazole
SG150468A1 (en) Chemical mechanical polishing pad with controlled wetting
TW201613721A (en) Chemical mechanical polishing layer formulation with conditioning tolerance
MY149939A (en) Polishing pad
TW200510116A (en) Materials and methods for chemical-mechanical planarization
TW200709893A (en) Polishing pad and method of manufacture
MY141334A (en) Polishing pad and method of producing the same
MY159149A (en) Polishing composition
MY158719A (en) Polishing composition for nickel-phosphorous memory disks
MY167211A (en) Polishing composition, and polishing method and substrate production method using same