IN2010KO00126A - - Google Patents
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- Publication number
- IN2010KO00126A IN2010KO00126A IN126KO2010A IN2010KO00126A IN 2010KO00126 A IN2010KO00126 A IN 2010KO00126A IN 126KO2010 A IN126KO2010 A IN 126KO2010A IN 2010KO00126 A IN2010KO00126 A IN 2010KO00126A
- Authority
- IN
- India
- Prior art keywords
- control apparatus
- testing
- functionality
- test device
- time dependency
- Prior art date
Links
- 238000012360 testing method Methods 0.000 abstract 5
- 238000000034 method Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B17/00—Systems involving the use of models or simulators of said systems
- G05B17/02—Systems involving the use of models or simulators of said systems electric
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing Of Engines (AREA)
- Debugging And Monitoring (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP09002479.5A EP2221697B1 (fr) | 2009-02-20 | 2009-02-20 | Procédé de test d'un appareil de commande et dispositif de test |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2010KO00126A true IN2010KO00126A (fr) | 2015-08-28 |
Family
ID=40810237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN126KO2010 IN2010KO00126A (fr) | 2009-02-20 | 2010-02-10 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8214690B2 (fr) |
EP (1) | EP2221697B1 (fr) |
IN (1) | IN2010KO00126A (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9069643B1 (en) | 2013-12-19 | 2015-06-30 | International Business Machines Corporation | Creating a prerequisite checklist corresponding to a software application |
US10126726B2 (en) * | 2015-07-10 | 2018-11-13 | Mitsubishi Electric Corporation | Apparatus and method for generating program |
GB2547221A (en) * | 2016-02-10 | 2017-08-16 | Testplant Europe Ltd | Method of, and apparatus for, testing computer hardware and software |
CN106094791B (zh) * | 2016-06-14 | 2019-01-08 | 北京汽车股份有限公司 | 车载控制器及其故障时间获取方法、诊断系统和汽车 |
CN111752263B (zh) * | 2020-07-22 | 2021-12-07 | 广州小鹏汽车科技有限公司 | 检测系统、检测方法和存储介质 |
CN112241160B (zh) * | 2020-10-20 | 2022-02-11 | 广州小鹏汽车科技有限公司 | 车辆测试方法、装置、车辆检测系统以及测试板卡 |
CN112306042B (zh) * | 2020-10-30 | 2022-11-04 | 重庆长安汽车股份有限公司 | 一种自动驾驶控制器自动测试系统及方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6457152B1 (en) * | 1998-10-16 | 2002-09-24 | Insilicon Corporation | Device and method for testing a device through resolution of data into atomic operations |
US6415396B1 (en) * | 1999-03-26 | 2002-07-02 | Lucent Technologies Inc. | Automatic generation and maintenance of regression test cases from requirements |
US6871298B1 (en) * | 1999-11-12 | 2005-03-22 | Obsidian Software, Inc. | Method and apparatus that simulates the execution of paralled instructions in processor functional verification testing |
US6804634B1 (en) * | 2000-02-17 | 2004-10-12 | Lucent Technologies Inc. | Automatic generation and regeneration of a covering test case set from a model |
US6829731B1 (en) * | 2000-08-14 | 2004-12-07 | International Business Machines Corporation | Method and system for generating a design-specific test case from a generalized set of bus transactions |
DE102006017824B4 (de) * | 2006-04-13 | 2018-10-11 | Dspace Digital Signal Processing And Control Engineering Gmbh | Methode zum Konstruieren einer Diagnosefunktion |
DE502006008342D1 (de) * | 2006-09-11 | 2010-12-30 | Dspace Gmbh | Verfahren zum Test eines elektronischen Steuerungssystems |
DE102006050112A1 (de) * | 2006-10-25 | 2008-04-30 | Dspace Digital Signal Processing And Control Engineering Gmbh | Verfahren zur Erstellung einer Anforderungsbeschreibung für ein eingebettetes System |
-
2009
- 2009-02-20 EP EP09002479.5A patent/EP2221697B1/fr active Active
-
2010
- 2010-02-10 IN IN126KO2010 patent/IN2010KO00126A/en unknown
- 2010-02-11 US US12/703,917 patent/US8214690B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2221697A1 (fr) | 2010-08-25 |
US8214690B2 (en) | 2012-07-03 |
US20100218046A1 (en) | 2010-08-26 |
EP2221697B1 (fr) | 2020-01-15 |
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